CN216593863U - Device for detecting wide temperature requirement of quartz wafer - Google Patents
Device for detecting wide temperature requirement of quartz wafer Download PDFInfo
- Publication number
- CN216593863U CN216593863U CN202123398336.2U CN202123398336U CN216593863U CN 216593863 U CN216593863 U CN 216593863U CN 202123398336 U CN202123398336 U CN 202123398336U CN 216593863 U CN216593863 U CN 216593863U
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- China
- Prior art keywords
- frame
- fixedly connected
- quartz wafer
- detecting
- wide temperature
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- Expired - Fee Related
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- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 title claims abstract description 37
- 239000010453 quartz Substances 0.000 title claims abstract description 36
- 235000012431 wafers Nutrition 0.000 description 25
- 238000009434 installation Methods 0.000 description 13
- 238000001514 detection method Methods 0.000 description 12
- 230000001105 regulatory effect Effects 0.000 description 3
- 229910052500 inorganic mineral Inorganic materials 0.000 description 2
- 239000011707 mineral Substances 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000000149 penetrating effect Effects 0.000 description 2
- 230000000694 effects Effects 0.000 description 1
- 230000008092 positive effect Effects 0.000 description 1
- 229910021489 α-quartz Inorganic materials 0.000 description 1
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- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Abstract
The utility model provides a device for detecting wide temperature requirement of quartz wafer relates to temperature-detecting equipment technical field, including the underframe, the equal fixedly connected with curb plate of underframe both sides surface, the equal threaded connection of every curb plate one side surface has the gim peg, and every gim peg one end is all rotated and is connected with splint, the spacing frame of underframe top fixedly connected with, and the spout has all been seted up near both sides edge in spacing frame top, and it is equipped with the removal frame to slide to inlay between two spout insidely. The utility model discloses during the use, effectively place different temperature check out test set inside the installing frame, and then tie through the rotational positioning, make the preforming effectively carry out different specification temperature check out test set's rigidity restriction, and then tie through the rotation regulation, and then make the gim peg can effectively remove the adjustment clamp plate in-service use position, and then make equipment can conveniently carry out the removal regulation of self mounted position according to the in-service use condition.
Description
Technical Field
The utility model relates to a temperature-detecting equipment technical field especially relates to a device for detecting wide temperature requirement of quartz wafer.
Background
Quartz is one of the main rock-making minerals, generally referred to as low-temperature quartz (alpha-quartz), and is one of the most widely distributed minerals in the quartz family.
However, in the prior art, after the actual quartz wafer is actually used, due to the structural limitation of the existing quartz wafer wide temperature detection equipment, the existing quartz wafer wide temperature detection equipment can only perform data conditions of the quartz wafer of single-position equipment, so that the actual use universality of the equipment is poor, meanwhile, the existing quartz wafer wide temperature detection equipment cannot conveniently adjust the structure of the equipment according to the actual use conditions, and further, the existing quartz wafer wide temperature detection equipment can only be fixedly installed at a specified use position, so that the actual use effect of the equipment is poor.
SUMMERY OF THE UTILITY MODEL
The utility model aims at solving among the prior art that same quartz wafer wide temperature check out test set can only carry out the data detection of single mounted position quartz wafer, and actual mounted position is comparatively fixed simultaneously, can't be convenient carry out the problem that self service position's removal was adjusted according to the in-service use condition, and the device that is used for detecting the wide temperature requirement of quartz wafer that proposes.
In order to achieve the above purpose, the utility model adopts the following technical scheme: a device for detecting the wide temperature requirement of a quartz wafer comprises a bottom frame, wherein side plates are fixedly connected to the outer surfaces of two sides of the bottom frame, an adjusting bolt is connected to the outer surface of one side of each side plate through threads, one end of each adjusting bolt is rotatably connected with a clamping plate, a limiting frame is fixedly connected to the top of the bottom frame, sliding grooves are formed in the top of the limiting frame, close to the edges of the two sides, of the top of each limiting frame, a moving frame is embedded between the inner parts of the two sliding grooves in a sliding mode, two supporting plates are fixedly connected to the top of the moving frame, a first threaded rod is rotatably connected between the opposite outer surfaces of the two supporting plates, a moving frame is connected to the outer surface of the first threaded rod through threads, a pressing frame penetrates through the inner bottom surface of the moving frame in a sliding mode, an installation frame is fixedly connected to the bottom of the pressing frame, a positioning bolt is connected to the outer surface of one side of the installation frame through threads, and one end of the positioning bolt is rotatably connected with a pressing sheet, and the outer surface of one side of the pressing frame is fixedly connected with a lamp body.
Preferably, every the equal fixedly connected with two gag lever posts of splint one side surface, the effective restriction splint actual position of establishing of gag lever post removes, every gag lever post one end all slides and runs through corresponding curb plate one side surface.
Preferably, one of them table wall rotates in spout one side and is connected with the second threaded rod, second threaded rod and removal frame threaded connection, the setting up of second threaded rod can effectively adjust and remove the frame in-service use position.
Preferably, the inner surface wall of the other sliding groove side is fixedly connected with a sliding rod, the sliding rod is arranged to effectively limit the use position of the movable frame, and one end of the sliding rod penetrates through the movable frame in a sliding mode.
Preferably, the bottom surface inside the movable frame is provided with a support rod in a sliding penetrating manner, the support rod is arranged to facilitate installation and arrangement of the support spring, and the top end of the support rod is provided with a top surface inside the pressing frame in a sliding penetrating manner.
Preferably, the outer surface of the supporting rod is slidably sleeved with a supporting spring, and the supporting spring is arranged to effectively limit the support of the pressing frame.
Compared with the prior art, the utility model has the advantages and positive effects that,
1. the utility model discloses in, during the use, effectively place different temperature check out test set inside the installing frame, and then tie through the rotational positioning, make the preforming effectively carry out different specification temperature check out test set's rigidity restriction.
2. The utility model discloses in, through the rotation regulation bolt, and then make the gim peg can effectively remove the adjustment clamp plate in-service use position, and then make equipment can conveniently carry out the removal regulation of self mounted position according to the in-service use condition, and then can effectively adjust through rotation regulation second threaded rod and first threaded rod and remove frame in-service use position, and then according to the lamp body position of actually shining, make temperature-detecting equipment can conveniently remove directly over to quartz wafer, and then under supporting spring's support, the frame is pressed down, make temperature-detecting equipment's sense terminal can effectively laminate with quartz wafer, and then make equipment can carry out the temperature-detecting of the quartz wafer of different specification equipment, effectively improve the extensive nature of equipment in-service use, make equipment can high-efficiently carry out due realization of function.
Drawings
FIG. 1 is a perspective view of an apparatus for detecting a wide temperature requirement of a quartz wafer according to the present invention;
FIG. 2 is a schematic view of a second perspective three-dimensional structure of an apparatus for detecting a wide temperature requirement of a quartz wafer according to the present invention;
FIG. 3 is a cross-sectional perspective view of an apparatus for detecting a wide temperature requirement of a quartz wafer according to the present invention;
fig. 4 is an enlarged view of a portion a in fig. 3 of an apparatus for detecting a requirement of a wide temperature range of a quartz wafer according to the present invention.
Illustration of the drawings: 1. a bottom frame; 2. a side plate; 3. adjusting the bolt; 4. a splint; 5. a limiting frame; 6. a second threaded rod; 7. a movable frame; 8. a first threaded rod; 9. moving the frame; 10. a support bar; 11. a support spring; 12. pressing the frame; 13. a lamp body; 14. installing a frame; 15. and (6) tabletting.
Detailed Description
In order to make the above objects, features and advantages of the present invention more clearly understood, the present invention will be further described with reference to the accompanying drawings and examples. It should be noted that the embodiments and features of the embodiments of the present application may be combined with each other without conflict.
In the following description, numerous specific details are set forth in order to provide a thorough understanding of the present invention, however, the present invention may be practiced in other ways than those specifically described herein, and therefore the present invention is not limited to the limitations of the specific embodiments of the present disclosure.
Embodiment 1, as shown in fig. 1-4, the utility model provides a device for detecting the wide temperature requirement of a quartz wafer, which comprises a bottom frame 1, wherein the establishment of the bottom frame 1 provides the installation basis for the setting of other functional components of the device, and the device is convenient to move and install, the outer surfaces of the two sides of the bottom frame 1 are fixedly connected with side plates 2, the installation setting of the device is convenient to carry out through the establishment of the side plates 2, the outer surface of one side of each side plate 2 is connected with a regulating bolt 3 through screw threads, the establishment of the regulating bolt 3 can effectively regulate the actual use position of the clamping plate 4, so that the device can conveniently move and regulate the installation position, one end of each regulating bolt 3 is rotatably connected with the clamping plate 4, the top of the bottom frame 1 is fixedly connected with a limiting frame 5, the establishment of the limiting frame 5 is convenient to carry out the installation setting of other functional components of the device, the top of the limiting frame 5 is provided with sliding grooves near the edges of the two sides, the establishment of the sliding grooves facilitates the installation and the setting of the second threaded rod 6 and the sliding rod, and simultaneously can effectively limit the actual position movement of the moving frame 7, the moving frame 7 is embedded between the inner parts of the two sliding grooves in a sliding way, the establishment of the moving frame 7 facilitates the installation and the setting of other functional parts of the equipment, and simultaneously can effectively adjust the actual use position of the moving frame 9, the top of the moving frame 7 is fixedly connected with two supporting plates, the establishment of the supporting plates facilitates the installation and the setting of the first threaded rod 8, the first threaded rod 8 is rotatably connected between the opposite outer surfaces of the two supporting plates, the establishment of the first threaded rod 8 facilitates the movement and the adjustment of the use position of the moving frame 9, the outer surface of the first threaded rod 8 is in threaded connection with the moving frame 9, the establishment of the moving frame 9 facilitates the installation and the setting of the temperature detection equipment, and simultaneously can effectively adjust the actual use position of the temperature detection equipment, the inside bottom surface of removal frame 9 slides and runs through there is pressure frame 12, the establishment of pressing frame 12 can effectively adjust the temperature-detecting equipment vertical direction and use the height, press frame 12 bottom fixedly connected with installing frame 14, the establishment of installing frame 14 conveniently carries out the installation setting of temperature-detecting equipment, 14 one side surface threaded connection of installing frame has the gim peg, the establishment of gim peg can effectively carry out the removal regulation of preforming 15 position of use, gim peg and one end are located installing frame 14 inside and rotate and are connected with preforming 15, the establishment of preforming 15 can effectively carry out the temperature-detecting equipment centre gripping fixed, 12 one side surface fixed connection of pressure frame has lamp body 13, the establishment of lamp body 13 makes removal frame 9 can conveniently remove directly over to quartz wafer.
Every 4 one sides of splint surface equal fixedly connected with two gag lever posts, the effective restriction splint 4 actual position of establishhing of gag lever post removes, and every gag lever post one end all slides and runs through corresponding 2 one sides of curb plate surface.
The surface wall rotates in one of them spout one side and is connected with second threaded rod 6, second threaded rod 6 and the removal 7 threaded connection of putting up, and the establishment of second threaded rod 6 can effectively adjust the removal 7 in-service use positions.
The inner surface wall of one side of the other sliding groove is fixedly connected with a sliding rod, the arrangement of the sliding rod can effectively limit the use position of the movable frame 7, and one end of the sliding rod penetrates through the movable frame 7 in a sliding mode.
The inside bottom surface of removal frame 9 slides and runs through there is the bracing piece 10, and the installation that can conveniently carry out supporting spring 11 of setting up of bracing piece 10 sets up, and the bracing piece 10 top slides and runs through the inside top surface of pressure frame 12.
The outer surface of the support rod 10 is slidably sleeved with a support spring 11, and the support spring 11 can effectively limit the support of the pressing frame 12.
The utility model discloses a theory of operation: when the device for detecting the wide temperature requirement of the quartz wafer is used, different temperature detection devices are effectively placed inside the mounting frame 14, the pressing sheet 15 can effectively fix and limit the temperature detection devices with different specifications through the rotary positioning bolt, the adjusting bolt 3 can effectively move the actual use position of the adjusting clamp plate 4 through the rotary adjusting bolt 3, the device can conveniently move and adjust the self mounting position according to the actual use condition, the actual use position of the moving frame 9 can be effectively adjusted through the rotary adjusting of the second threaded rod 6 and the first threaded rod 8, the temperature detection device can conveniently move to the position right above the quartz wafer according to the actual irradiation position of the lamp body 13, the pressing frame 12 is pressed downwards under the support of the support spring 11, and the detection end of the temperature detection device can effectively fit with the quartz wafer, furthermore, the temperature of the quartz wafers of the equipment with different specifications can be detected by the equipment, the actual use universality of the equipment is effectively improved, and the due functions of the equipment can be efficiently realized.
The above description is only a preferred embodiment of the present invention, and is not intended to limit the present invention in other forms, and any person skilled in the art may use the above-mentioned technical contents to change or modify the equivalent embodiment into equivalent changes and apply to other fields, but any simple modification, equivalent change and modification made to the above embodiments according to the technical matters of the present invention will still fall within the protection scope of the technical solution of the present invention.
Claims (6)
1. The device for detecting the wide temperature requirement of the quartz wafer is characterized by comprising a bottom frame (1), side plates (2) are fixedly connected to the outer surfaces of two sides of the bottom frame (1), adjusting bolts (3) are connected to the outer surface of one side of each side plate (2) in a threaded manner, one end of each adjusting bolt (3) is rotatably connected with a clamping plate (4), a limiting frame (5) is fixedly connected to the top of the bottom frame (1), sliding grooves are formed in the top of the limiting frame (5) close to the edges of the two sides, a moving frame (7) is embedded between the insides of the two sliding grooves in a sliding manner, two supporting plates are fixedly connected to the top of the moving frame (7), a first threaded rod (8) is rotatably connected between the opposite outer surfaces of the two supporting plates, a moving frame (9) is connected to the outer surface of the first threaded rod (8) in a threaded manner, and a pressing frame (12) penetrates through the inner bottom surface of the moving frame (9) in a sliding manner, the lamp is characterized in that the bottom of the pressing frame (12) is fixedly connected with a mounting frame (14), the outer surface of one side of the mounting frame (14) is in threaded connection with a positioning bolt, one end of the positioning bolt is located inside the mounting frame (14) and is rotatably connected with a pressing sheet (15), and the outer surface of one side of the pressing frame (12) is fixedly connected with a lamp body (13).
2. The apparatus for detecting a wide temperature requirement of a quartz wafer of claim 1, wherein: every splint (4) one side surface equal fixedly connected with two gag lever posts, every gag lever post one end all slides and runs through corresponding curb plate (2) one side surface.
3. The apparatus for detecting a wide temperature requirement of a quartz wafer of claim 1, wherein: one of them the interior table wall of spout one side rotates and is connected with second threaded rod (6), second threaded rod (6) and removal frame (7) threaded connection.
4. The apparatus for detecting a wide temperature requirement of a quartz wafer of claim 1, wherein: and the inner surface wall of one side of the sliding groove is fixedly connected with a sliding rod, and one end of the sliding rod penetrates through the movable frame (7) in a sliding manner.
5. The apparatus for detecting a wide temperature requirement of a quartz wafer of claim 1, wherein: the bottom surface inside the movable frame (9) is penetrated with a support rod (10) in a sliding manner, and the top end of the support rod (10) is penetrated with the top surface inside the pressing frame (12) in a sliding manner.
6. The apparatus for detecting a wide temperature requirement of a quartz wafer of claim 5, wherein: the outer surface of the support rod (10) is sleeved with a support spring (11) in a sliding manner.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202123398336.2U CN216593863U (en) | 2021-12-30 | 2021-12-30 | Device for detecting wide temperature requirement of quartz wafer |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202123398336.2U CN216593863U (en) | 2021-12-30 | 2021-12-30 | Device for detecting wide temperature requirement of quartz wafer |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN216593863U true CN216593863U (en) | 2022-05-24 |
Family
ID=81631364
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202123398336.2U Expired - Fee Related CN216593863U (en) | 2021-12-30 | 2021-12-30 | Device for detecting wide temperature requirement of quartz wafer |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN216593863U (en) |
-
2021
- 2021-12-30 CN CN202123398336.2U patent/CN216593863U/en not_active Expired - Fee Related
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20220524 |
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| CF01 | Termination of patent right due to non-payment of annual fee |