CN216525540U - Full-size special-shaped single crystal nondestructive testing equipment based on Laue diffraction principle - Google Patents
Full-size special-shaped single crystal nondestructive testing equipment based on Laue diffraction principle Download PDFInfo
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Abstract
The utility model provides information acquisition equipment for nondestructive testing of full-size special-shaped single crystals based on Laue diffraction principle, which comprises: the X-ray detector comprises an X-ray generator (1), a detector (2), a sample table (3) and a zoom lens (4); the sample table (3) is used for clamping a sample to be detected; an included angle between a first sliding rail base (1-2) of the X-ray generator (1) and the horizontal direction is 45 degrees, and a normal line of a micro-area of the sample to be detected and an incident direction of an X-ray beam generated by the X-ray generator (1) form 45 degrees; the detector (2) has an included angle of 135 degrees with the horizontal direction and is used for receiving X-ray diffraction beams emitted out at an included angle of 135 degrees with the Z axis of a laboratory coordinate system; the zoom lens (4) is vertically aligned with the light spot and used for ranging and positioning. According to the scheme of the utility model, data such as orientation, three-dimensional strain tensor and the like of the full-size special-shaped single crystal can be accurately obtained without damage, and the slip direction and the dislocation density can be analyzed and calculated.
Description
Technical Field
The utility model relates to the technical field of nondestructive testing, in particular to equipment for nondestructive testing of full-size special-shaped single crystals based on Laue diffraction principle.
Background
The aircraft engine is called the 'heart' of the airplane, is the source power for the development of military and civil aircrafts and the aviation industry, and has great promotion effect on national economic development and technological progress. The blade is a key part of an aeroengine, and because the blade is used for a long time in a high-temperature environment, the single crystal high-temperature alloy blade is mostly adopted in an advanced engine, but the preparation difficulty of the single crystal blade is extremely high, and the yield is low. The state of the art of single crystal blades for aircraft engines determines the performance and life of aircraft engines. Before the single crystal blade is put into use, the quality evaluation must be carried out by adopting a nondestructive testing technology. However, because the shape of the single crystal blade is complex, no full-size special-shaped single crystal nondestructive testing equipment and technology exist in China, the testing work can be completed only by adopting foreign imported equipment, and the imported equipment cannot perform real-time positioning testing due to orientation and stress, so that the efficiency is low.
The X-ray light source of the X-ray diffraction device in the prior art is vertically incident to the surface of a sample, the detection range of the sample is small, and the detection of the special-shaped sample cannot be realized. The prior art can only obtain the orientation data of a single crystal sample or obtain the residual stress data of the single crystal sample independently, and can not directly measure the single crystal blade. The process of measuring the stress of the single crystal takes long time, the equipment needs to be operated continuously, and the price is high.
SUMMERY OF THE UTILITY MODEL
In order to solve the technical problems, the utility model provides information acquisition equipment for nondestructive detection of a full-size special-shaped single crystal based on a Laue diffraction principle, a system for nondestructive detection of a full-size special-shaped single crystal based on a Laue diffraction principle and a using method, which are used for solving the problems that in the prior art, the acquisition of information of a sample is slow, the detection range is small, and the detection of a special-shaped sample cannot be realized.
According to a first aspect of the present invention, there is provided an information acquisition apparatus for nondestructive testing of a full-size profiled single crystal based on the Laue diffraction principle, the apparatus comprising:
the X-ray detector comprises an X-ray generator (1), a detector (2), a sample table (3) and a zoom lens (4);
the sample table (3) is provided with a four-jaw chuck (3-8) for clamping a sample to be tested; the sample rack is arranged on the linear guide rail of the ball screw sliding table; the sample table (3) comprises an x-axis motor (3-3), a y-axis motor (3-4) and a z-axis motor (3-5) and is used for adjusting the position of the sample table (3);
the X-ray generator (1) is fixed on a first sliding rail base (1-2), the X-ray generator (1) is located on the right side of the sample table (3), an included angle between the first sliding rail base (1-2) and the horizontal direction is 45 degrees, and a normal line of a micro-area of a sample to be detected and an incident direction of an X-ray beam generated by the X-ray generator (1) are 45 degrees; irradiating the sample to be detected by the X-ray beam to form a light spot and generate an X-ray diffraction beam;
the detector (2) is fixed on a second sliding rail base (2-2), the detector (2) is located on the left side of the sample table (3), and an included angle between the second sliding rail base (2-2) and the horizontal direction is 135 degrees, so that an X-ray diffraction beam emitted out at an included angle of 135 degrees with the Z axis of a laboratory coordinate system is received;
the zoom lens (4) is vertically aligned with the light spot and used for ranging and positioning.
According to the scheme of the utility model, the data such as orientation, three-dimensional strain tensor and the like of the full-size special-shaped single crystal can be accurately obtained without loss. The device can be applied to military and civil aircrafts and the aviation industry, and is used for quality evaluation of single crystal blades of an aircraft engine.
The foregoing description is only an overview of the technical solutions of the present invention, and in order to make the technical solutions of the present invention more clearly understood and to implement them in accordance with the contents of the description, the following detailed description is given with reference to the preferred embodiments of the present invention and the accompanying drawings.
Drawings
The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate embodiments of the utility model and, together with the description, serve to explain the principles of the utility model. In the drawings:
FIG. 1 is a schematic top view of a nondestructive inspection apparatus of the present invention;
FIG. 2 is a schematic diagram of the detector and X-ray generator of the present invention;
FIG. 3 is a schematic diagram of the structure of the sample stage and the base according to the present invention.
Detailed Description
Description of reference numerals:
1: an X-ray generator; 1-1: an X-ray generating apparatus body; 1-2: a first slide rail base; 2: a detector; 2-1: a probe body; 2-2: a second slide rail base; 3: a sample stage; 3-1: a sample stage body; 3-2: a linear guide rail; 3-3: an x-axis motor; 3-4: a y-axis motor; 3-5: a z-axis motor; 3-6: a horizontal rotation axis; 3-7: a theta axis of rotation; 3-8: a four-jaw chuck; 4: a zoom lens.
First, the principle of Laue diffraction technique is explained.
The atoms or ions in the crystal are periodically arranged according to a certain rule to form a space lattice. The spatial lattice can be divided into a family of parallel and equally spaced planar lattices (facets). Once the unit cell and basis vectors are determined, the crystal planes can be represented by Miller indices (hkl). The unit cell parameters and the miller index determine the direction of diffraction of the crystal to X-rays. The conditions under which crystalline X-ray diffraction occurs can be described by the Laue equation, which has the scalar expression:
in the formula: a. b and c are unit cell side length; alpha is alpha0、β0、γ0Is the included angle between the incident ray and the basic vector of the unit cell; alpha, beta and gamma are included angles between diffraction lines and base vectors of the crystal cells; h. k and l are 3 positive integers called diffraction indexes; λ is the wavelength of the X-rays.
The X-ray crystal diffraction conditions can also be described by the Bragg (Bragg) equation:
2dsinθ＝nλ
when the stationary crystal is irradiated with white (continuous) X-rays, changing the wavelength λ, this method is called the laue method.
Since there are many facets in the crystal in different directions and spacings, these facets intersect the incident X-rays at different angles θ, whereas the incident X-rays are continuous X-rays, the wavelength λ of which necessarily varies continuously. Therefore, there must be some facets that satisfy the bragg equation to produce diffraction, and these diffraction lines illuminate on the detector to form diffraction spots, called laue spots, and the picture in which laue spots exist is called laue picture.
The traditional crystallography method utilizes monochromatic light X-rays to perform diffraction, obtains a group of available diffraction peaks by rotating a crystal, and finally collects hundreds of diffraction spectrums for research. The white light Laue diffraction technology utilizes multi-wavelength X-ray, only needs single exposure to obtain a whole set of diffraction peaks, and especially on the research of single crystals, the Laue method is widely applied.
The Laue diffraction technology uses continuous X-ray as light source, and the X-ray passes through a fine hole collimator and irradiates to the surface of the single crystal to be measured with approximately parallel light beams. Because the orientation and the interplanar spacing of different crystal planes in the crystal are different, the Bragg condition is met to generate diffraction. And (4) receiving the diffraction ray beams by using a detector, and acquiring X-ray diffraction peak data. And further matching the measured Laue spots through computer software analysis to further obtain the orientation data information of the crystal to be measured.
The information acquisition equipment for nondestructive testing of the full-size heterotype single crystal based on Laue diffraction principle according to one embodiment of the present invention is described below with reference to FIG. 1. As shown in fig. 1-3, the apparatus comprises:
the X-ray detector comprises an X-ray generator (1), a detector (2), a sample table (3) and a zoom lens (4);
the sample table (3) is provided with a four-jaw chuck (3-8) for clamping a sample to be tested; the sample rack is arranged on the linear guide rail of the ball screw sliding table; the sample table (3) comprises an x-axis motor (3-3), a y-axis motor (3-4) and a z-axis motor (3-5) and is used for adjusting the position of the sample table (3);
the X-ray generator (1) is fixed on a first sliding rail base (1-2), the X-ray generator (1) is located on the right side of the sample table (3), an included angle between the first sliding rail base (1-2) and the horizontal direction is 45 degrees, and a normal line of a micro-area of a sample to be detected and an incident direction of an X-ray beam generated by the X-ray generator (1) are 45 degrees; the X-ray beam is used for irradiating the sample to be detected to form a light spot and generate an X-ray diffraction beam;
the detector (2) is fixed on a second sliding rail base (2-2), the detector (2) is located on the left side of the sample table (3), and an included angle between the second sliding rail base (2-2) and the horizontal direction is 135 degrees, so that an X-ray diffraction beam emitted out at an included angle of 135 degrees with the Z axis of a laboratory coordinate system is received;
the zoom lens (4) is vertically aligned with the light spot and used for ranging and positioning.
Furthermore, the X-ray beam is emitted along the direction with the included angle of 45 degrees with the Z axis of the laboratory coordinate system, and irradiates the position of the sample to be detected to form a light spot.
Further, an air pump is arranged in the sample stage (3) and used for adsorbing the sample to be detected on the sample stage.
Furthermore, the X-ray generating device consists of an X-ray tube, a tube sleeve, a high-voltage transformer, a high-voltage control unit and a high-voltage cable. Optionally, the X-ray generator is controlled by a PLC (programmable controller). The high-voltage control unit stabilizes the tube voltage and the tube current by using a silicon controlled closed-loop voltage and current regulating technology to obtain X rays with stable strength. The vertical pipe sleeve comprises a pipe sleeve body and an automatic optical shutter, and can control the opening and closing of the optical shutter.
Furthermore, the relative positions of the first slide rail base (1-2) and the second slide rail base (2-2) are limited and fixed according to an included angle, and the included angle of the two slide rail bases is 90 degrees and is connected by a horizontal base.
Furthermore, the connecting support of the X-ray generator (1) is composed of three sliders in different directions, the X-ray generator (1) can be adjusted manually to move up and down, left and right and back and forth, and the support of the X-ray generator (1) can swing through a rotating shaft and a positioning screw.
Further, a screw rod and a three-phase hybrid stepping motor are connected to the second slide rail base (2-2) and used for enabling the detector (2) to translate along the slide rail direction.
Further, the samples to be detected comprise regular flat plate-shaped single crystal samples, round rod-shaped single crystal samples and special-shaped single crystal samples.
Further, the zoom lens is a zoom lens with a display screen.
Further, the special-shaped single crystal sample is a single crystal blade.
The light path of the device is designed to ensure that the normal of the micro-area of the measuring part is 45 degrees with the incident X-ray light, so as to solve the size limitation of the measured sample.
In this embodiment, the configuration component parameters are shown in the following table:
TABLE 1 parameters of laser profilometers
Wherein, the target material of the X-ray light source adopts a tungsten target.
| Pixel | 100Ip/mm(2MP) |
| Size of |
1/2n |
| Interface | C |
| Focal length | 8-50mm |
| F value | 1.6 |
| Back focal length | 9.7-14.08mm |
| Diaphragm type | Hand operated |
| Angle of view | 41°-7.2° |
| Focusing range | ∝-1m |
| External dimension | Φ42×65.6mm |
TABLE 2 parameters of zoom lens
TABLE 3 parameters of the detector
It should be noted that the embodiments and features of the embodiments may be combined with each other without conflict.
In the embodiments provided in the present invention, it should be understood that the disclosed system, apparatus and method may be implemented in other ways.
The above description is only a preferred embodiment of the present invention, and is not intended to limit the present invention in any way, and any simple modification, equivalent change and modification made to the above embodiment according to the technical spirit of the present invention are still within the scope of the technical solution of the present invention.
Claims (4)
1. A device for nondestructive testing of full-size heterotypic single crystals based on Laue diffraction principle is characterized by comprising:
the X-ray detector comprises an X-ray generator (1), a detector (2), a sample table (3) and a zoom lens (4);
the sample table (3) is provided with a four-jaw chuck (3-8) for clamping a sample to be tested; the sample rack is arranged on the linear guide rail of the ball screw sliding table; the sample table (3) comprises an x-axis motor (3-3), a y-axis motor (3-4) and a z-axis motor (3-5) and is used for adjusting the position of the sample table (3);
the X-ray generator (1) is fixed on a first sliding rail base (1-2), the X-ray generator (1) is located on the right side of the sample table (3), an included angle between the first sliding rail base (1-2) and the horizontal direction is 45 degrees, and a normal line of a micro-area of a sample to be detected and an incident direction of an X-ray beam generated by the X-ray generator (1) are 45 degrees; irradiating the sample to be detected by the X-ray beam to form a light spot and generate an X-ray diffraction beam;
the detector (2) is fixed on a second sliding rail base (2-2), the detector (2) is located on the left side of the sample table (3), and an included angle between the second sliding rail base (2-2) and the horizontal direction is 135 degrees, so that an X-ray diffraction beam emitted out at an included angle of 135 degrees with the Z axis of a laboratory coordinate system is received;
the zoom lens (4) is vertically aligned with the light spot and used for ranging and positioning.
2. The apparatus of claim 1, wherein the X-ray beam exits at a 45 degree included angle with the Z-axis of the laboratory coordinate system.
3. The apparatus according to claim 1, wherein the relative positions of the first slide rail base (1-2) and the second slide rail base (2-2) are fixed according to the limitation of an included angle, and the two slide rail bases are connected by a horizontal base, and the included angle is 90 degrees.
4. The apparatus according to claim 1, wherein the second sled base (2-2) is connected to a lead screw and a three-phase hybrid stepper motor for translating the detector (2) along the sled direction.
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| Application Number | Priority Date | Filing Date | Title |
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| CN202121395239.5U CN216525540U (en) | 2021-06-23 | 2021-06-23 | Full-size special-shaped single crystal nondestructive testing equipment based on Laue diffraction principle |
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| Application Number | Priority Date | Filing Date | Title |
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| CN202121395239.5U CN216525540U (en) | 2021-06-23 | 2021-06-23 | Full-size special-shaped single crystal nondestructive testing equipment based on Laue diffraction principle |
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