CN216434277U

CN216434277U - Testing mechanism for semiconductor

Info

Publication number: CN216434277U
Application number: CN202123034059.7U
Authority: CN
Inventors: 范彩凤
Original assignee: Shanghai Beizhen Electronic Technology Co ltd
Current assignee: Shanghai Beizhen Electronic Technology Co ltd
Priority date: 2021-12-06
Filing date: 2021-12-06
Publication date: 2022-05-03
Anticipated expiration: 2031-12-06

Abstract

The utility model discloses a testing mechanism for semiconductors, which comprises a test board, wherein a positioning bracket is arranged in the middle of the upper side of the test board through a rotating shaft, positioning clamps are arranged on two sides of the upper end of the positioning bracket, an upper bracket is arranged on the upper side of the test board, a first air cylinder is arranged at the top part in the upper bracket through a lead screw, testing equipment is arranged at the lower end of the first air cylinder, the testing equipment is arranged on the upper part of the positioning bracket, the lower end of the rotating shaft is connected with a first motor through a gear set transmission, a PLC control cabinet is arranged on the outer side of the upper bracket, the utility model is convenient for clamping and positioning the two ends of a semiconductor through the positioning clamps arranged on two sides of the upper end of the positioning bracket, the positioning stability is high, the first air cylinder is arranged at the top part in the upper bracket through the lead screw, the testing equipment is arranged at the lower end of the first air cylinder, so as to facilitate the adjustment of the use position of the testing equipment, the efficiency of the test is improved.

Description

Testing mechanism for semiconductor

Technical Field

The utility model relates to a semiconductor test technical field specifically is a accredited testing organization for semiconductor.

Background

The semiconductor is a substance with conductivity between an insulator and a conductor, and the conductivity of the semiconductor is easy to control and can be used as an element material for information processing. Semiconductors are very important from the viewpoint of technological or economic development. The core elements of many electronic products, such as computers, mobile phones, and digital recorders, utilize the conductivity change of semiconductors to process information. Common semiconductor materials are silicon, germanium, gallium arsenide, etc., and silicon is the most influential of various semiconductor materials in commercial applications. After the semiconductor wafer is processed, a test process is required, so that a clamp is required to clamp and fix the semiconductor wafer.

The semiconductor resistivity testing mechanism with application number CN201820433131.2 in the prior art is inconvenient for clamping and positioning a semiconductor, and has poor positioning stability, thereby affecting the precision and efficiency of semiconductor testing.

SUMMERY OF THE UTILITY MODEL

An object of the utility model is to provide a accredited testing organization for semiconductor to solve prior art and be not convenient for carry out the centre gripping location processing to the semiconductor, positional stability is relatively poor moreover, thereby influences the precision of semiconductor test and the problem of the efficiency of test.

In order to achieve the above object, the utility model provides a following technical scheme: the utility model provides a testing mechanism for semiconductor, includes the testboard, the locating support is installed through the pivot in the middle part of the testboard upside, positioning fixture is installed to locating support upper end both sides, the upper bracket is installed to the testboard upside, first cylinder is installed through the lead screw in the top of the upper bracket, test equipment is installed to first cylinder lower extreme, test equipment sets up on locating support upper portion, the pivot lower extreme is connected with first motor through the gear train transmission, the PLC switch board is installed in the upper bracket outside.

Furthermore, pneumatic cylinders are installed at two ends of the lower side of the test board, and a lower support plate is installed on the lower side of the pneumatic cylinders.

Furthermore, the positioning fixture comprises a second cylinder arranged at the outer sides of two ends of the positioning support, one end of the second cylinder is in transmission connection with a positioning clamping seat, and the positioning clamping seat is arranged inside the positioning support.

Furthermore, a positioning groove is formed in the inner side of the positioning clamp seat, and a non-slip mat is installed on the inner side of the positioning groove.

Further, the lead screw comprises a supporting plate arranged at the top in the upper support, the lead screw is rotatably arranged between the supporting plates, a sliding block is arranged on the lead screw in a threaded mode, the first air cylinder is fixedly arranged on the lower side of the sliding block, and one end of the lead screw is in transmission connection with a second motor.

Further, the gear train includes that pivot one end is provided with driven gear, first motor one end transmission is connected with the driving gear, and driven gear and driving gear meshing connection.

Compared with the prior art, the beneficial effects of the utility model are that:

1. the utility model discloses a positioning fixture is installed to locating support upper end both sides, and positioning fixture is connected with the location holder including setting up the second cylinder in the locating support both ends outside, second cylinder one end transmission, is convenient for carry out centre gripping location processing to the semiconductor both ends, and positional stability is high, is convenient for improve the measuring accuracy.

2. The utility model discloses and first cylinder is installed through the lead screw in the top of upper bracket, and test equipment installs at first cylinder lower extreme, and the lead screw can drive test equipment horizontal migration and adjust, and first cylinder is used for driving test equipment lift adjustment for the service position of being convenient for adjust test equipment is favorable to improving the efficiency of test.

3. The utility model discloses because the pivot lower extreme is connected with first motor through the gear train transmission, the gear train includes that pivot one end is provided with driven gear, and first motor one end transmission is connected with the driving gear, and driven gear and driving gear meshing are connected for can drive the pivot horizontal rotation through the motor, thereby can handle the horizontal rotation regulation of locating support, satisfy the test of different horizontal angles and use.

Drawings

The accompanying drawings are included to provide a further understanding of the invention, and are incorporated in and constitute a part of this specification, illustrate embodiments of the invention, and together with the description serve to explain the invention and not to limit the invention. In the drawings:

FIG. 1 is a front view of the overall structure of the present invention;

FIG. 2 is a schematic view of the semiconductor clamping and positioning structure of the present invention;

fig. 3 is an enlarged schematic view of the structure at the position a of the present invention.

In the figure: 1. a test bench; 2. a rotating shaft; 3. positioning the bracket; 4. a second cylinder; 5. an upper bracket; 6. positioning the clamping seat; 7. a support plate; 8. a screw rod; 9. a slider; 10. a first cylinder; 11. testing equipment; 12. a second motor; 13. a PLC control cabinet; 14. a hydraulic cylinder; 15. a lower support plate; 16. a first motor; 17. positioning a groove; 18. a non-slip mat; 19. a driven gear; 20. a drive gear.

Detailed Description

The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative work belong to the protection scope of the present invention.

Referring to fig. 1, 2 and 3, in an embodiment of the present invention, a testing mechanism for a semiconductor includes a testing table 1, a positioning bracket 3 is installed at the middle portion of the upper side of the testing table 1 through a rotating shaft 2, positioning fixtures are installed at both sides of the upper end of the positioning bracket 3, so as to facilitate clamping and positioning processing of both ends of a semiconductor, positioning stability is high, so as to facilitate improvement of testing precision, an upper bracket 5 is installed at the upper side of the testing table 1, a first cylinder 10 is installed at the top portion inside the upper bracket 5 through a lead screw, a testing device 11 is installed at the lower end of the first cylinder 10, the lead screw can drive the testing device 11 to move horizontally and adjust, the first cylinder 10 is used for driving the testing device 11 to move up and down, so as to facilitate adjustment of the use position of the testing device 11, so as to facilitate improvement of testing efficiency, the testing device 11 is installed at the upper portion of the positioning bracket 3, the lower end of the rotating shaft 2 is connected with a first motor 16 through gear set transmission, make and can drive 2 horizontal rotations of pivot through first motor 16 to can satisfy the test of different horizontal angles and use to the processing of 3 horizontal rotation regulation of locating support, PLC switch board 13 is installed in the upper bracket 5 outside, and the control end of each equipment all with PLC switch board 13 electric connection, be convenient for carry out whole controlling.

Preferably, pneumatic cylinder 14 is installed at testboard 1 downside both ends, and extension board 15 is installed down to 14 downside of pneumatic cylinder, is convenient for stabilize the support to testboard 1 downside and handles, the use height that moreover can adjust.

Preferably, positioning fixture is connected with location holder 6 including setting up the second cylinder 4 in the 3 both ends outsides of locating support, 4 one end transmissions of second cylinder, and location holder 6 sets up inside locating support 3 for through the 6 horizontal migration of 4 drive location holders of second cylinder, be convenient for carry out the centre gripping location to the semiconductor both ends and handle, positional stability is high.

Preferably, the positioning groove 17 is formed in the inner side of the positioning holder 6, and the anti-slip pad 18 is mounted on the inner side of the positioning groove 17, so that the two ends of the circular semiconductor wafer can be clamped and positioned conveniently.

Preferably, the lead screw is including setting up backup pad 7 at top in upper bracket 5, and installs lead screw 8 between the backup pad 7 in a rotating manner, and slider 9 is installed to the screw thread on the lead screw 8, and first cylinder 10 fixed mounting has 8 one end transmissions of lead screw to be connected with second motor 12 at slider 9 downside for can drive 11 horizontal migration of test equipment and adjust, be convenient for better test and handle.

Preferably, the gear set comprises a driven gear 19 arranged at one end of the rotating shaft 2, a driving gear 20 is connected to one end of the first motor 16 in a transmission manner, and the driven gear 19 is in meshed connection with the driving gear 20.

The utility model discloses a theory of operation and use flow: positioning fixtures are arranged on two sides of the upper end of the positioning support 3 and comprise second air cylinders 4 arranged on the outer sides of the two ends of the positioning support 3, one ends of the second air cylinders 4 are in transmission connection with positioning clamping seats 6, the second air cylinders 4 drive the positioning clamping seats 6 to move horizontally, clamping and positioning processing on the two ends of a semiconductor is facilitated, positioning stability is high, and testing accuracy is facilitated to be improved; and because 2 lower extremes of pivot are connected with first motor 16 through the gear train transmission for can drive 2 horizontal rotations of pivot through first motor 16, thereby can handle the horizontal rotation regulation of locating support 3, satisfy the test of different horizontal angles and use.

Finally, it should be noted that: although the present invention has been described in detail with reference to the foregoing embodiments, it will be apparent to those skilled in the art that modifications may be made to the embodiments described in the foregoing embodiments, or equivalents may be substituted for elements thereof. Any modification, equivalent replacement, or improvement made within the spirit and principle of the present invention should be included in the protection scope of the present invention.

Claims

1. A test mechanism for a semiconductor comprises a test board (1), and is characterized in that: locating support (3) are installed through pivot (2) in testboard (1) upside middle part, positioning fixture is installed to locating support (3) upper end both sides, upper bracket (5) are installed to testboard (1) upside, first cylinder (10) are installed through the lead screw in upper bracket (5) top, test equipment (11) are installed to first cylinder (10) lower extreme, test equipment (11) set up on locating support (3) upper portion, pivot (2) lower extreme is connected with first motor (16) through the gear train transmission.

2. The test mechanism for a semiconductor according to claim 1, wherein: pneumatic cylinder (14) are installed at testboard (1) downside both ends, extension board (15) down are installed to pneumatic cylinder (14) downside.

3. The test mechanism for a semiconductor according to claim 1, wherein: the positioning fixture comprises second cylinders (4) arranged on the outer sides of two ends of a positioning support (3), one ends of the second cylinders (4) are in transmission connection with positioning clamping seats (6), and the positioning clamping seats (6) are arranged inside the positioning support (3).

4. The test mechanism for a semiconductor according to claim 3, wherein: the inner side of the positioning holder (6) is provided with a positioning groove (17), and the inner side of the positioning groove (17) is provided with an anti-slip pad (18).

5. The test mechanism for a semiconductor according to claim 1, wherein: the lead screw comprises supporting plates (7) arranged at the top in the upper support (5), a lead screw (8) is rotatably arranged between the supporting plates (7), and one end of the lead screw (8) is in transmission connection with a second motor (12).

6. The test mechanism for a semiconductor according to claim 1, wherein: the gear train includes that pivot (2) one end is provided with driven gear (19), first motor (16) one end transmission is connected with driving gear (20), and driven gear (19) and driving gear (20) meshing are connected.