CN216433477U

CN216433477U - Projector optical parameter test probe displacement device

Info

Publication number: CN216433477U
Application number: CN202123155450.2U
Authority: CN
Inventors: 陈斌
Original assignee: Sichuan Changhong Electric Co Ltd
Current assignee: Sichuan Changhong Electric Co Ltd
Priority date: 2021-12-15
Filing date: 2021-12-15
Publication date: 2022-05-03
Anticipated expiration: 2031-12-15

Abstract

The utility model discloses a displacement device for an optical parameter test probe of a projector, which comprises a back plate, a displacement sensor and a displacement sensor, wherein the back plate is used for mounting a measuring probe; the measuring probe is arranged on the back plate in a sliding mode; the front cover plate is rotatably connected to the back plate, and a plurality of measuring holes used for matching optical parameters of different picture sizes are preset on the front cover plate; the measuring hole is opposite to the measuring probe used for testing. Through using the utility model provides a displacement device only needs the switching of one set of device compatible multiple measurement size, and measuring probe adopts the mode of magnetism to inhale, and it is very convenient to switch, the utility model discloses simple structure is reliable, convenient to use.

Description

Projector optical parameter test probe displacement device

Technical Field

The utility model relates to a projecting apparatus technical field, concretely relates to projecting apparatus optical parameter test probe displacement device.

Background

The optical parameters are important performance indexes of the projection product, and directly determine whether the product is qualified or not or the performance grade. The optical testing link is essential for all optical machine manufacturing enterprises or projection complete machine product manufacturing enterprises. The main items of optical parameter measurement are: luminous flux, color coordinates, contrast, color temperature, uniformity, color ratio, color gamut, and the like. Therefore, many products in actual production need to test parameters at 9 points.

The optical parameter measurement method is generally to fix a projection picture to a projection size and then perform optical parameter measurement by 9 measurement probes fixed on a screen. Because the light sources of the projectors are different, the light sources comprise lasers, LEDs and the like, the different light sources determine that the sizes of pictures of the projectors during optical parameter testing are different, for example, the projector of the laser light source is short-focus projection and generally needs to test under a 100-inch picture, the projector of the light sources of the LEDs and the like is medium-long-focus projection and generally needs to test under a 60-inch picture, and when the size of a projection picture changes, the positions of corresponding measuring probes also need to be changed along with the change of the sizes of the pictures. The common projection screen is relatively fixed at a certain projection size, and the test probe is also fixed, so that the test is cumbersome when the size of a projection picture needs to be switched, and even a plurality of test screens suitable for various projection pictures can be manufactured.

SUMMERY OF THE UTILITY MODEL

An object of the utility model is to provide a projecting apparatus optical parameter test probe displacement device to the technical problem who exists among the background art is solved in hope.

In order to achieve the above purpose, the utility model adopts the following technical scheme:

the displacement device for the optical parameter test probe of the projector comprises a back plate, a displacement sensor and a displacement sensor, wherein the back plate is used for mounting a measurement probe; the measuring probe is arranged on the back plate in a sliding mode; the front cover plate is rotatably connected to the back plate, and a plurality of measuring holes used for matching optical parameters of different picture sizes are preset on the front cover plate; the measuring hole is opposite to the measuring probe used for testing.

Further, the back plate is made of a material that can be attracted by a magnet. The back plate is selected to be made of a material that can be attracted by a magnet in order to facilitate adjustment of the position of the measurement probe according to the test.

Further, the back plate is a back iron plate. The back iron plate is chosen in view of low cost.

Further, the measuring probe is connected with the back plate through a magnet. Optionally, a magnet is mounted on the back of the measurement probe to cooperate with a back plate of a material that is attracted to the magnet, thereby facilitating adjustment of the measurement probe.

Furthermore, the top of the front cover plate and the top of the back plate are connected through hinges. Through the hinge connection, the front cover plate can be opened through the hinge when the measuring probe needs to be adjusted.

Further, the side portions of the front cover plate and the back plate are connected through a hydraulic support rod. The hydraulic support rod is used for assisting in opening the front cover plate, and the function of saving manpower is achieved.

Furthermore, the back plate is installed on the whole frame, and calipers used for locking the front cover plate are arranged at the bottom of the whole frame. The effect of calliper is with front shroud locking, places the during operation, and the front shroud appears rocking, influences the optics test.

Furthermore, a handle is arranged on the front cover plate.

Furthermore, the bottom of the integral frame is provided with universal wheels.

Furthermore, the upright posts of the integral frame are telescopic rods.

The projector optical parameter test probe displacement device disclosed in the present application may bring beneficial effects including but not limited to: when projection measurement size is adjusted to needs, the position of the coordinate adjustment probe that the contrast back iron plate corresponds, reserve the measuring hole that the front shroud needs to use, use the end cap to plug up all the other holes, then use the marker pen to pass through the measuring hole and do the mark on back iron plate, upwards lift the front shroud, adjust this position with measuring probe, put down the front shroud again and can realize swiftly switching projection measurement size, only need the switching of one set of device compatible multiple measurement size, and measuring probe adopts the mode of magnetism to inhale, it is very convenient to switch, the utility model discloses simple structure is reliable, convenient to use.

Drawings

FIG. 1 is a schematic structural diagram of a displacement device of an optical parameter testing probe of a projector in an embodiment;

illustration of the drawings: 1-front cover plate, 2-measuring hole, 3-hydraulic support rod, 4-back plate, 5-measuring probe, 6-integral frame, 7-universal wheel, 8-handle and 9-caliper.

Detailed Description

In order to make the objects, technical solutions and advantages of the present application more apparent, the present application is described in further detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the present application and are not intended to limit the present application.

On the contrary, this application is intended to cover any alternatives, modifications, equivalents, and alternatives that may be included within the spirit and scope of the application as defined by the appended claims. Furthermore, in the following detailed description of the present application, certain specific details are set forth in order to provide a better understanding of the present application. It will be apparent to one skilled in the art that the present application may be practiced without these specific details.

A projector optical parameter test probe displacement device according to an embodiment of the present application will be described in detail below with reference to fig. 1. It is to be noted that the following examples are only for explaining the present application and do not constitute a limitation to the present application. The socket referred to in this embodiment refers to a socket into which one or more circuit wires are inserted, through which the wires can be inserted to facilitate connection with other circuits, and the socket is fixed on the panel of the chassis by screws or threads.

In the embodiment of the application, as shown in fig. 1, the projector optical parameter test probe displacement device may include an integral frame, a back iron plate, an optical parameter measurement probe, a hydraulic support rod, a hinge, and a front cover plate, wherein the back iron plate is installed on the integral frame, measurement probe positions corresponding to various projection sizes are marked on the iron plate according to the measurement points of the grid nine, a connection block is added to the back of the optical parameter measurement probe, a small magnet is installed on the back of the optical parameter measurement probe, and the measurement probe is adsorbed on the measurement point position corresponding to the iron plate according to a required position. The front cover plate is made of a black acrylic plate which does not return light, measuring holes of which the projection sizes correspond to the measuring probes are reserved on the front cover plate, and the front cover plate is connected with the top of the back plate through hinges. Through the hinge connection, the front cover plate can be opened through the hinge when the measuring probe needs to be adjusted. The side parts of the front cover plate and the back plate are connected through a hydraulic support rod. The hydraulic support rod is used for assisting in opening the front cover plate, and the function of saving manpower is achieved.

When the projection size needs to be adjusted, the front cover plate assembly is lifted upwards, the front cover plate assembly is supported by the hydraulic support rod, the position of the measuring probe is adjusted according to the required projection size by comparing the coordinate position marked on the iron plate, the corresponding measuring hole is reserved in the front cover plate assembly, the rest hole sites are blocked by plugs, the front cover plate assembly is put down, the measuring probe is aligned with the measuring hole of the front cover plate, and then the measurement of the optical parameters is carried out.

In some embodiments, the back plate is made of a material that can be attracted by a magnet. The back plate is made of a material that can be attracted by a magnet, so that the position of the measuring probe can be adjusted according to different tests. Preferably, the back plate is a back iron plate. The back iron plate is chosen in view of low cost.

Preferably, the measurement probe is connected to the back plate via a magnet. Optionally, a magnet is mounted on the back of the measurement probe to cooperate with a back plate of a material that is attracted to the magnet, thereby facilitating adjustment of the measurement probe.

Furthermore, the back plate is installed on the whole frame, and calipers used for locking the front cover plate are arranged at the bottom of the whole frame. The effect of calliper is with front shroud locking, places the during operation, and the front shroud appears rocking, influences the optics test. The bottom of the whole frame is provided with universal wheels, so that the universal wheels are convenient to move and more flexible to use. Of course, the upright posts of the integral frame can be telescopic rods. The back plate is convenient to have more practical use condition and the height of the back plate is adjusted.

In some embodiments, a handle is provided on the front cover plate. The front cover plate can be conveniently opened through the handle.

When the projection size needs to be adjusted, the front cover plate is lifted upwards, the front cover plate assembly is supported by the hydraulic support rod, the position of the measuring probe is adjusted according to the required projection size by comparing the coordinate position marked on the iron plate, the corresponding measuring hole position is reserved in the front cover plate assembly, the rest hole positions are blocked by plugs, the front cover plate assembly is put down, the measuring probe is aligned with the measuring hole of the front cover plate, and then the measurement of the optical parameters is carried out.

The above description is only exemplary of the present invention and should not be taken as limiting the scope of the present invention, as any modifications, equivalents, improvements and the like made within the spirit and principles of the present invention are intended to be included within the scope of the present invention.

Claims

1. A displacement device for an optical parameter test probe of a projector is characterized by comprising:

a back plate for mounting a measurement probe;

the measuring probe is arranged on the back plate in a sliding mode;

the front cover plate is rotatably connected to the back plate, and a plurality of measuring holes used for matching optical parameters of different picture sizes are preset on the front cover plate; the measuring hole is opposite to the measuring probe used for testing.

2. The projector optical parameter test probe displacement device of claim 1, wherein the back plate is made of a material that can be attracted by a magnet.

3. The projector optical parameter test probe displacement device of claim 2, wherein the back plate is a back iron plate.

4. The projector optical parameter test probe displacement device of claim 2, wherein the measurement probe is connected to the back plate through a magnet.

5. The projector optical parameter test probe displacement device of any one of claims 1 to 4, wherein the top of the front cover plate and the top of the back plate are connected by a hinge.

6. The projector optical parameter test probe displacement device of any one of claims 1 to 4, wherein the side portions of the front cover plate and the back plate are connected by hydraulic support rods.

7. The projector optical parameter test probe displacement device of claim 6, wherein the back plate is mounted on a unitary frame, and the bottom of the unitary frame is provided with a clamp for locking a front cover plate.

8. The projector optical parameter test probe displacement device of claim 6, wherein a handle is provided on the front cover plate.

9. The projector optical parameter test probe displacement device of claim 7, wherein the bottom of the integral frame is provided with universal wheels.

10. The projector optical parameter test probe displacement device of claim 7, wherein the upright of the integral frame is a telescopic rod.