CN216387302U - Movable chip test platform - Google Patents
Movable chip test platform Download PDFInfo
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- CN216387302U CN216387302U CN202122999696.1U CN202122999696U CN216387302U CN 216387302 U CN216387302 U CN 216387302U CN 202122999696 U CN202122999696 U CN 202122999696U CN 216387302 U CN216387302 U CN 216387302U
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Abstract
The utility model discloses a mobile chip testing platform, comprising: the test platform comprises a platform body, a test panel and a support frame, wherein a protection groove is formed in the platform body, the inner side of the protection groove is connected with the test panel in a sliding mode, buffer grooves are symmetrically formed in the platform body, and the inner side of each buffer groove is provided with the support frame in a sliding mode. The test panel is arranged on the inner side of the protection groove in a lifting mode, the protection groove can be covered through the dustproof protection plate, and the test platform is conveniently protected from dust after being used; the universal wheels are arranged to facilitate the movement of the test platform, the cushion pad and the first spring can be used for buffering when the test platform is moved and bumped, and meanwhile, the positioning pin is inserted into the inner side of the buffer groove to position the support frame so as to prevent the test platform from shaking up and down when the test platform is used.
Description
Technical Field
The utility model relates to the technical field of chip test tables, in particular to a movable chip test platform.
Background
The LED chip is a solid semiconductor device, the heart of the LED is a semiconductor wafer, one end of the wafer is attached to a support, the other end of the wafer is a cathode, the other end of the wafer is connected with an anode of a power supply, the whole wafer is packaged by epoxy resin, the LED chip is also called an LED light-emitting chip and is a core component of an LED lamp, and the LED chip needs to be detected on a test board before the LED chip leaves a factory.
The types of the chip test tables are various, some chip test tables may be idle for a period of time, and dust falls on instruments on the surfaces of the chip test tables, so that the sensitivity of the chip test tables is damaged, and errors occur in the chip test process; and the test bench structure is large and inconvenient to move.
SUMMERY OF THE UTILITY MODEL
The utility model aims to provide a movable chip testing platform to solve the problem that the testing platform is lack of dustproof protection after being used.
In order to achieve the purpose, the utility model provides the following technical scheme: a mobile chip test platform comprising: the test platform comprises a platform body, a test panel and a support frame, wherein a protection groove is formed in the platform body, the inner side of the protection groove is connected with the test panel in a sliding mode, buffer grooves are symmetrically formed in the platform body, and the inner side of each buffer groove is provided with the support frame in a sliding mode.
Preferably, the symmetry is provided with the connecting block on the platform body, and connecting block both ends symmetry pivot is connected with dustproof protection shield, and dustproof protection shield rotates the usable floor area that can increase test platform to both sides, and dustproof protection shield rotates inwards to close really, can carry out dustproof protection to protection inslot test panel.
Preferably, ejector rods are symmetrically arranged on the test panel, and the dustproof protection plate is jacked up when the test panel is upwards arranged on the ejector rods.
Preferably, install electronic jar on the platform body, electronic jar's flexible end is connected with the test panel, and electronic jar promotes test panel rebound, with test panel up end lifting to with the connecting block parallel and level, then can test the use.
Preferably, a first spring and a buffer pad are respectively arranged between the buffer groove and the support frame, and the device can buffer through the arrangement of the first spring and the buffer pad when moving.
Preferably, the protection groove inner wall symmetry is provided with the mounting groove, and the inboard slip of mounting groove is provided with the locating pin, is connected with the second spring between locating pin and the mounting groove, and when test platform used, electronic jar promoted test panel rebound, and the butt locating pin makes the locating pin insert the inside downward butt support frame of dashpot and makes the blotter hug closely to the support frame, can prevent to rock from top to bottom when test platform used to the support frame location.
Preferably, the lower extreme of support frame is provided with the universal wheel, and the universal wheel sets up the removal that makes things convenient for test platform.
Compared with the prior art, the utility model has the beneficial effects that:
1. the test panel is arranged on the inner side of the protection groove in a lifting mode, the protection groove can be covered through the dustproof protection plate, and the test platform is conveniently protected from dust after being used.
2. When the test platform is used, the dustproof protection plate is lapped on the platform body, so that the use area of the test platform can be increased.
3. The universal wheels are arranged to facilitate the movement of the test platform, the buffer cushion and the first spring can buffer the movement during bumping, and meanwhile, the positioning pin is inserted into the inner side of the buffer groove to position the support frame, so that the test platform can be prevented from shaking up and down during use.
Drawings
FIG. 1 is a cross-sectional view of the overall structure of the present invention;
FIG. 2 is an elevational view of the overall construction of the present invention;
in the figure: 1 platform body, 11 dashpots, 12 blotters, 13 first springs, 14 mounting grooves, 15 locating pins, 16 second springs, 17 protection grooves, 18 connecting blocks, 19 dustproof protection plates, 2 test panels, 21 ejector pins, 3 electric cylinders, 4 support frames, 41 universal wheels.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
Example 1
Referring to fig. 1 and 2, a mobile chip testing platform is shown, which includes: platform body 1, test panel 2 and support frame 3 are provided with protection groove 17 on the platform body 1, and the inboard sliding connection of protection groove 17 has test panel 2, and the symmetry is provided with dashpot 11 on the platform body 1, and 11 inboard slides of dashpot are provided with support frame 4.
The symmetry is provided with connecting block 18 on the platform body 1, and connecting block 18 both ends symmetry pivot is connected with dustproof protection shield 19, and dustproof protection shield 19 rotates the usable floor area that can increase test platform to both sides, and dustproof protection shield 19 rotates inwards to close really, can carry out dustproof protection to test panel 2 in the protective tank 17.
Install electronic jar 3 on the platform body 1, electronic jar 3's flexible end is connected with test panel 2, and electronic jar 3 promotes test panel 2 rebound, with test panel 2 up end lifting to with connecting block 18 parallel and level, then can test the use.
When this device used: electronic jar 3 shrink drives test panel 2 along the inside removal of protection groove 17, with test panel 2 income protection groove 17 inboard then, then close the reality with dustproof protection shield 19 inside rotation, can carry out dustproof protection to test panel 2 in the protection groove 17.
Example 2
Referring to fig. 1, in this embodiment, a mobile chip testing platform is further described in example 1, which includes: platform body 1, test panel 2 and support frame 4 are provided with protection groove 17 on the platform body 1, and the inboard sliding connection of protection groove 17 has test panel 2, and the symmetry is provided with dashpot 11 on the platform body 1, and 11 inboard slides of dashpot are provided with support frame 4.
The connecting blocks 18 are symmetrically arranged on the platform body 1, the symmetrical rotating shafts at two ends of the connecting blocks 18 are connected with the dustproof protection plates 19, and the dustproof protection plates 19 can increase the using area of the test platform by rotating towards two sides.
In this embodiment, when test platform used, electronic jar 3 promoted test panel 2 rebound and will prevent dust protection board 19 jack-up through ejector pin 21, then will prevent dust protection board 19 to both sides rotation and overlap joint on platform body 1, can increase test platform's usable floor area through preventing dust protection board 19.
Example 3
Referring to fig. 1, another embodiment of the present invention is further illustrated, in which a mobile chip testing platform includes: platform body 1, test panel 2 and support frame 4 are provided with protection groove 17 on the platform body 1, and the inboard sliding connection of protection groove 17 has test panel 2, and the symmetry is provided with dashpot 11 on the platform body 1, and 11 inboard slides of dashpot are provided with support frame 4.
Install electronic jar 3 on the platform body 1, electronic jar 3's flexible end is connected with test panel 2, and electronic jar 3 promotes test panel 2 rebound, with test panel 2 up end lifting to with connecting block 18 parallel and level, then can test the use.
A first spring 13 and a cushion pad 12 are respectively provided between the cushion groove 11 and the support frame 4, and the device can be cushioned by the arrangement of the first spring 13 and the cushion pad 12 during movement.
The lower extreme of support frame 4 is provided with universal wheel 41, and the setting of universal wheel 41 makes things convenient for test platform's removal.
In this embodiment, when test platform removes, make things convenient for test platform's removal through the setting of universal wheel 41, and at the removal in-process, support frame 4 moves along dashpot 11 and can avoid jolting the influence that causes test platform for the buffering through the setting of first spring 13 and blotter 12, simultaneously when test platform uses, electronic jar 3 promotes test panel 2 rebound, test panel 2 butt locating pin 15 makes locating pin 15 insert 11 inboard downward butt support frame 4 in the dashpot, make support frame 4 hug closely blotter 12, it influences the operation to rock about can preventing test platform use to fix a position support frame 4.
It is noted that, herein, relational terms such as first and second, and the like may be used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Also, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus.
Although embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that changes, modifications, substitutions and alterations can be made in these embodiments without departing from the principles and spirit of the utility model, the scope of which is defined in the appended claims and their equivalents.
Claims (7)
1. A mobile chip test platform, comprising:
platform body (1), test panel (2) and support frame (4), be provided with protection groove (17) on platform body (1), protection groove (17) inboard sliding connection has test panel (2), the symmetry is provided with dashpot (11) on platform body (1), dashpot (11) inboard slip is provided with support frame (4).
2. A mobile chip test platform according to claim 1, wherein: the platform is characterized in that connecting blocks (18) are symmetrically arranged on the platform body (1), and two ends of each connecting block (18) are symmetrically connected with dustproof protection plates (19) in a rotating mode.
3. A mobile chip test platform according to claim 1, wherein: ejector rods (21) are symmetrically arranged on the test panel (2).
4. A mobile chip test platform according to claim 1, wherein: install electronic jar (3) on platform body (1), the flexible end of electronic jar (3) is connected with test panel (2).
5. A mobile chip test platform according to claim 1, wherein: a first spring (13) and a cushion pad (12) are respectively arranged between the buffer groove (11) and the support frame (4).
6. A mobile chip test platform according to claim 1, wherein: protection groove (17) inner wall symmetry is provided with mounting groove (14), and mounting groove (14) inboard slides and is provided with locating pin (15), is connected with second spring (16) between locating pin (15) and mounting groove (14).
7. A mobile chip test platform according to claim 1, wherein: the lower end of the support frame (4) is provided with a universal wheel (41).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202122999696.1U CN216387302U (en) | 2021-12-01 | 2021-12-01 | Movable chip test platform |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202122999696.1U CN216387302U (en) | 2021-12-01 | 2021-12-01 | Movable chip test platform |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN216387302U true CN216387302U (en) | 2022-04-26 |
Family
ID=81220097
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202122999696.1U Active CN216387302U (en) | 2021-12-01 | 2021-12-01 | Movable chip test platform |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN216387302U (en) |
-
2021
- 2021-12-01 CN CN202122999696.1U patent/CN216387302U/en active Active
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