CN216386860U - Three show HP-U dew point hygrometer - Google Patents
Three show HP-U dew point hygrometer Download PDFInfo
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- CN216386860U CN216386860U CN202122608298.2U CN202122608298U CN216386860U CN 216386860 U CN216386860 U CN 216386860U CN 202122608298 U CN202122608298 U CN 202122608298U CN 216386860 U CN216386860 U CN 216386860U
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- dew point
- relative humidity
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- 238000001514 detection method Methods 0.000 claims abstract description 119
- 239000004065 semiconductor Substances 0.000 claims abstract description 20
- 239000007789 gas Substances 0.000 claims description 162
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 claims description 16
- 238000004140 cleaning Methods 0.000 claims description 15
- 229910052757 nitrogen Inorganic materials 0.000 claims description 8
- 230000001105 regulatory effect Effects 0.000 claims description 6
- 238000003860 storage Methods 0.000 claims description 4
- 238000005259 measurement Methods 0.000 abstract description 7
- VNWKTOKETHGBQD-UHFFFAOYSA-N methane Chemical compound C VNWKTOKETHGBQD-UHFFFAOYSA-N 0.000 description 24
- 239000003345 natural gas Substances 0.000 description 12
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 10
- 230000001681 protective effect Effects 0.000 description 7
- 239000000428 dust Substances 0.000 description 5
- 230000005494 condensation Effects 0.000 description 4
- 238000009833 condensation Methods 0.000 description 4
- 239000000835 fiber Substances 0.000 description 4
- 230000003287 optical effect Effects 0.000 description 3
- 230000002411 adverse Effects 0.000 description 2
- 238000001816 cooling Methods 0.000 description 2
- 239000000203 mixture Substances 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000005693 optoelectronics Effects 0.000 description 2
- BASFCYQUMIYNBI-UHFFFAOYSA-N platinum Chemical compound [Pt] BASFCYQUMIYNBI-UHFFFAOYSA-N 0.000 description 2
- 238000010926 purge Methods 0.000 description 2
- 239000002253 acid Substances 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 239000000356 contaminant Substances 0.000 description 1
- 230000001276 controlling effect Effects 0.000 description 1
- 230000002596 correlated effect Effects 0.000 description 1
- 230000007797 corrosion Effects 0.000 description 1
- 238000005260 corrosion Methods 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000007599 discharging Methods 0.000 description 1
- 230000007613 environmental effect Effects 0.000 description 1
- 239000003344 environmental pollutant Substances 0.000 description 1
- 239000005457 ice water Substances 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 238000007726 management method Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 229910052697 platinum Inorganic materials 0.000 description 1
- 231100000719 pollutant Toxicity 0.000 description 1
- 229920006395 saturated elastomer Polymers 0.000 description 1
- 238000007790 scraping Methods 0.000 description 1
- 238000007789 sealing Methods 0.000 description 1
- 230000000087 stabilizing effect Effects 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
- 239000004753 textile Substances 0.000 description 1
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- Investigating Or Analysing Materials By Optical Means (AREA)
- Investigating Or Analyzing Materials Using Thermal Means (AREA)
Abstract
The utility model discloses a three-display HP-U dew point hygrometer, which comprises a gas temperature display instrument, a relative humidity display instrument, a dew point temperature display instrument, a relative humidity calculator, a first gas detection chamber and a second gas detection chamber, and an air inlet pipeline connected with the first gas detection chamber and the second gas detection chamber, wherein dew point mirrors are arranged at the bottoms of the inner cavities of the first gas detection chamber and the second gas detection chamber, resistance thermometers are respectively arranged in the first gas detection chamber and the second gas detection chamber, a semiconductor refrigerator arranged at the bottom of the dew-point mirror is arranged in the first gas detection chamber, the top parts of the inner cavities of the first gas detection chamber and the second gas detection chamber are respectively provided with a reflection photoresistor, a scattering photoresistor and a light source, the direct current adjusting power supply receives the signal transmitted from the comparator and adjusts the magnitude of direct current to control the refrigerating capacity of the semiconductor refrigerator. The utility model has the characteristic of accurate measurement.
Description
Technical Field
The utility model relates to the technical field of dew point detection, in particular to a three-display HP-U dew point hygrometer.
Background
In engineering, the temperature and humidity of air are two relevant thermal parameters, which have the same important significance. For example, in the electronic industry, the air humidity level determines the yield of products in the electronic industry; in the textile industry, fiber strength is affected by the relative humidity in the air; in the printing industry, the level of air humidity determines the print quality.
In the natural gas industry, the presence of moisture in natural gas can have an impact on natural production, processing, gathering, and the like. For example, the water content in natural gas is too high, and the throttle valve is blocked due to ice-water mixture generated by throttling and cooling; if liquid water exists during the transportation of the natural gas pipeline, the corrosion rate of the acid components to the pipeline wall and related parts can be accelerated, the service life of the pipeline can be adversely affected, and the operation and management benefits of natural gas enterprises can also be adversely affected. The moisture content of natural gas is an important indicator of the natural gas industry, and has strict requirements for moisture in natural gas. In the specification GB50251-2003, the dew point of water in the natural gas transported by a pipe is 5 ℃ lower than the lowest environmental temperature under the transportation condition. Accurate determination of the moisture content of natural gas is of great importance to the natural gas industry.
The water content of a gas can be expressed in terms of the water dew point, and its saturated water content depends on the conditions of temperature, pressure and composition of the gas. When the amount of water vapor contained in the gas reaches saturation under a certain pressure, the temperature at which condensation and condensation begin is called the natural gas water dew point temperature (hereinafter referred to as dew point temperature), and the existing measuring mechanism has the defect of inaccurate measurement. We therefore improved this by providing a three-display HP-U dew point hygrometer.
SUMMERY OF THE UTILITY MODEL
In order to solve the technical problems, the utility model provides the following technical scheme:
the utility model discloses a three-display HP-U dew-point hygrometer, which comprises a gas temperature display, a relative humidity display, a dew-point temperature display, a relative humidity calculator, a first gas detection chamber, a second gas detection chamber and an air inlet pipeline connected with the first gas detection chamber and the second gas detection chamber, wherein dew-point mirrors are arranged at the bottoms of inner cavities of the first gas detection chamber and the second gas detection chamber, resistance thermometers are respectively arranged in the first gas detection chamber and the second gas detection chamber, a semiconductor refrigerator arranged at the bottom of the dew-point mirror is arranged in the first gas detection chamber, and the gas temperature display is electrically connected with the resistance thermometers in the second gas detection chamber; the relative humidity display instrument is electrically connected with the relative humidity calculator; the relative humidity calculator is electrically connected with the resistance thermometer in the first gas detection chamber and the resistance thermometer in the second gas detection chamber; the resistance thermometer in the first gas detection chamber is electrically connected with a dew point temperature display instrument, and the resistance thermometer in the second gas detection chamber is electrically connected with a gas temperature display instrument; the semiconductor refrigerator is electrically connected with a direct current regulating power supply; and a cleaning mechanism for cleaning the surface of the dew-point mirror is arranged in the first gas detection chamber and the second gas detection chamber. The top of the inner cavity of each of the first gas detection chamber and the second gas detection chamber is provided with a reflection photoresistor, a scattering photoresistor and a light source, the reflection photoresistor and the scattering photoresistor are connected with an amplifier through a photoelectric bridge circuit, the amplifier is electrically connected with a comparator, the comparator is electrically connected with a direct current adjusting power supply, and the direct current adjusting power supply receives signals transmitted from the comparator and adjusts the direct current to control the refrigerating capacity of the semiconductor refrigerator.
As a preferable technical scheme of the utility model, the gas inlet pipeline is connected with a protective gas inlet pipeline, the end part of the protective gas inlet pipeline is connected with a nitrogen storage tank, and the protective gas inlet pipeline is provided with a nitrogen control valve.
In a preferred embodiment of the present invention, the first gas detection chamber and the second gas detection chamber are each provided with a pressure gauge for detecting an internal pressure value.
As a preferred technical solution of the present invention, the first gas detection chamber and the second gas detection chamber are both provided with a gas release pipe, and the gas release pipe is provided with an outlet control valve.
As a preferable technical scheme of the utility model, the gas inlet pipeline is respectively connected with the first gas detection chamber and the second gas detection chamber through a delivery branch pipe, and the delivery branch pipe is provided with an inlet control valve.
As a preferable technical scheme of the utility model, a fan is arranged at the inlet end of the air inlet pipeline.
As a preferred technical scheme of the utility model, the cleaning mechanism comprises a base plate arranged on the periphery of the dew point mirror, a pair of reciprocating screw rods and a limiting polished rod which are arranged in parallel are arranged on the base plate, a sliding block reciprocating along the reciprocating screw rods is arranged on the reciprocating screw rods, a limiting sliding sleeve moving along the limiting polished rod is arranged on the limiting polished rod, and a scraping plate for cleaning the surface of the dew point mirror is arranged on the sliding block and the limiting sliding sleeve.
The utility model has the beneficial effects that:
the three-display HP-U dew-point hygrometer is characterized in that a first gas detection chamber and a second gas detection chamber are arranged to convey detected gas to the gas detection chambers, the detected gas is firstly used for purging the detection chambers, original gas in the gas detection chambers is removed, the three-display HP-U dew-point hygrometer is sealed and placed still, the pressure of the detected gas is stabilized, the influence of the pressure on a measurement result is eliminated, and a dew-point mirror cleaning mechanism is arranged to automatically clean a dew-point mirror, so that the surface of the dew-point mirror is clean and bright, and errors are reduced; in addition, the dew point formation is determined by comparing two groups of photoelectric signals, so that the dew point and the relative humidity of clean gas can be measured, the dew point and the relative humidity of gas containing dust, fibers and other pollutants can also be measured, and the application range is wider; and the dew point temperature, the gas temperature and the relative humidity are displayed at the same time, so that the operation is simple and the use is convenient.
Drawings
The accompanying drawings, which are included to provide a further understanding of the utility model and are incorporated in and constitute a part of this specification, illustrate embodiments of the utility model and together with the description serve to explain the principles of the utility model and not to limit the utility model. In the drawings:
FIG. 1 is a schematic view of a three-display HP-U dew point hygrometer according to the present invention;
FIG. 2 is a schematic diagram of the cleaning mechanism of a three-display HP-U dew point hygrometer of the present invention.
In the figure: 1. a gas temperature display instrument; 2. a relative humidity display; 3. a dew point temperature display instrument; 4. a relative humidity calculator; 5. a first gas detection chamber; 6. a second gas detection chamber; 7. a reflective photoresistor; 8. a scattering photoresistor; 9. a light source; 10. a dew point mirror; 11. a resistance thermometer; 12. a semiconductor refrigerator; 13. a direct current regulated power supply; 14. an electro-optical bridge circuit; 15. an amplifier; 16. a comparator; 17. introducing protective gas into the pipeline; 18. a nitrogen storage tank; 20. a nitrogen control valve; 21. a pressure gauge; 22. discharging the air pipe; 23. an outlet control valve; 24. a delivery branch pipe; 25. an inlet control valve; 26. an air intake duct; 27. a cleaning mechanism; 28. a reciprocating screw rod; 29. a limit polished rod; 30. a slider; 31. a limiting sliding sleeve; 32. a squeegee; 33. a substrate; 34. a fan.
Detailed Description
The preferred embodiments of the present invention will be described in conjunction with the accompanying drawings, and it will be understood that they are described herein for the purpose of illustration and explanation and not limitation.
Example (b): as shown in fig. 1 and fig. 2, the HP-U dew-point hygrometer of the present invention comprises a gas temperature display 1, a relative humidity display 2, a dew-point temperature display 3, a relative humidity calculator 4, a first gas detection chamber 5 and a second gas detection chamber 6, and an air inlet pipe 26 connected to the first gas detection chamber 5 and the second gas detection chamber 6, wherein a dew-point mirror 10 is disposed at the bottom of the inner cavity of the first gas detection chamber 5 and the second gas detection chamber 6, resistance thermometers 11 are disposed in the first gas detection chamber 5 and the second gas detection chamber 6, a semiconductor refrigerator 12 mounted at the bottom of the dew-point mirror is disposed in the first gas detection chamber 5, and the gas temperature display 1 is electrically connected to the resistance thermometers 11 in the second gas detection chamber 6 to display temperature data; the relative humidity display instrument 2 is electrically connected with the relative humidity calculator 4 and displays relative humidity data; the relative humidity calculator 4 is electrically connected with the resistance thermometer 11 in the first gas detection chamber 5 and the resistance thermometer 11 in the second gas detection chamber 6, and calculates relative humidity data of the first gas detection chamber 5 and the second gas detection chamber 6 through a built-in program; the resistance thermometer 11 in the first gas detection chamber 5 is electrically connected with the dew point temperature display 3, and the resistance thermometer 11 in the second gas detection chamber 6 is electrically connected with the gas temperature display 1; the semiconductor refrigerator 12 is electrically connected with a direct current regulating power supply 13; the first gas detection chamber 5 and the second gas detection chamber 6 are provided with a cleaning mechanism 27 for cleaning the surface of the dew-point mirror 10. The top of the inner cavity of each of the first gas detection chamber 5 and the second gas detection chamber 6 is provided with a reflection photoresistor 7, a scattering photoresistor 8 and a light source 9, the reflection photoresistor 7 and the scattering photoresistor 8 are connected with an amplifier 15 through a photoelectric bridge circuit 14, the amplifier 15 is electrically connected with a comparator 16, the comparator 16 is electrically connected with a direct current regulation power supply 13, and the direct current regulation power supply 13 receives signals transmitted from the comparator 16 and regulates the magnitude of direct current to control the refrigerating capacity of the semiconductor refrigerator 12. The photoelectric bridge circuit 14 is connected with the reflection photoresistor 7, the scattering photoresistor 8 and the amplifier 15, converts received optical signals of the reflection photoresistor 7 and the scattering photoresistor 8 into electric signals and transmits the electric signals to the amplifier 15, and the reflection photoresistor 7 is arranged in the gas detection chamber, receives light rays reflected by the dew-point mirror 10 and transmits the optical signals to the photoelectric bridge circuit 14 connected with the reflection photoresistor and the scattering photoresistor 8;
the scattering photoresistor 8 is arranged in the gas detection chamber, receives light scattered by the dew-point mirror 10 and transmits optical signals to an optoelectronic bridge circuit 14 connected with the dew-point mirror;
and the light source 9 is arranged in the gas detection chamber and emits light to irradiate the surface of the dew-point mirror 10. Dew point mirrors 10 installed in the first gas detection chamber 5 and the second gas detection chamber 6, connected to the platinum thermistor thermometer 11, receive light emitted from the light source 9 and reflect or scatter the light. An amplifier 15 connected to the optical-electrical bridge 14 and the comparator 16, for receiving and amplifying the electrical signal transmitted from the optical-electrical bridge 14, and transmitting the amplified electrical signal to the comparator 16;
the direct current adjusting power supply 13 is connected with the comparator 16 and the semiconductor refrigerator 12, receives the signal transmitted from the comparator 16, and adjusts the magnitude of direct current to control the refrigerating capacity of the semiconductor refrigerator 12;
the comparator 16 is connected to the amplifier 15 and the dc regulated power supply 13, compares the signals transmitted from the first gas detection chamber 5 and the second gas detection chamber 6, which are converted and amplified, by a built-in analyzer, transmits the comparison signal to the dc regulated power supply 13, and regulates the magnitude of the dc current to control the cooling capacity of the semiconductor refrigerator 1212.
Two sets of identical optoelectronic systems are provided in the first gas detection chamber 5 and the second gas detection chamber 6, respectively. A semiconductor refrigerator 12 is installed below the dew point mirror 10 in the first gas detection chamber 5, and no semiconductor refrigerator 12 is installed below the dew point mirror 10 in the first gas detection chamber 5. As the semiconductor refrigerator 12 refrigerates in the first gas detection chamber 5, the temperature of the dew point mirror 10 is reduced, and when the dew point temperature is reached, condensate is formed on the surface of the dew point mirror 10, and at the moment, condensate and dust are on the surface of the dew point mirror 10 (if the detected gas is clean enough, only condensate is on the surface of the dew point mirror 10); and the temperature in the second gas detection chamber 6 is not reduced, and the surface of the dew point mirror 10 is only provided with dust (if the detected gas is clean enough, the surface of the dew point mirror 10 is clean and has no objects). When the dew point temperature of the gas is reached, the light source 9 irradiates the surface of the dew point mirror 10 to generate different photoelectric signals, and the signals are compared by a comparator 16 arranged at the downstream of the photoelectric system to control the direct current adjusting power supply 13, so that the refrigerating capacity of the semiconductor refrigerator 12 is controlled.
An electric resistance thermometer 11 is installed below the dew point mirror 10 of the first gas detection chamber 5 and the second gas detection chamber 6, and the dew point temperature and the temperature of the gas to be measured are measured and displayed by the dew point temperature meter and the gas temperature display instrument 1. The dew point temperature and the gas temperature are respectively correlated with the saturated water vapor pressure, and the relative humidity is calculated by the relative humidity calculator 4 and displayed on the relative humidity display 2. Therefore, the measured gas temperature display instrument 1, the dew point temperature display instrument 3 and the relative humidity display instrument 2 form a three-display system, relevant data can be read in real time, and the three-display system is time-saving, labor-saving, simple and convenient.
The gas to be detected in the detection chamber is cooled by a semiconductor refrigerator 12 in a first gas detection chamber 5, the surface conditions of two dew point mirrors 10 are the same before the temperature reaches the dew point temperature (clean gas: no object exists on the surface of the dew point mirrors 10; polluted gas: dust, fiber and the like exist on the surface of the dew point mirrors 10), the light emitted by a light source 9 irradiates the surface of the dew point mirrors 10, the reflection and scattering conditions are the same, light signals received by two sets of photoresistors are consistent, the current of a direct current adjusting power supply 13 is increased after the signals are amplified and compared, the refrigerating capacity is increased, and the temperature of the dew point mirrors 10 is reduced; when the dew point temperature in the first gas detection chamber 5 is reached, water vapor in the gas is condensed on the dew point mirrors 10, no refrigerator in the second gas detection chamber 6 has no condensation phenomenon on the surfaces of the dew point mirrors 10, the surface conditions of the two dew point mirrors 10 are different, the reflection and scattering conditions of light rays are changed, light ray signals received by the photoresistor are changed, the current of the direct current adjusting power supply 13 is adjusted after the signals are amplified and compared, the refrigerating capacity is reduced, and the temperature of the dew point mirrors 10 is automatically increased; when the dew condensation does not occur, the temperature of the dew point mirror 10 is automatically reduced, and finally the temperature of the dew point mirror 10 reaches dynamic balance, at this moment, the temperature is the dew point temperature of the measured gas, and the dew point temperature is measured by the resistance thermometer 11 and displayed on the dew point temperature display instrument 3. Meanwhile, the temperature measured by the resistance thermometer 11 arranged below the dew-point mirror 10 in the second gas detection chamber 6 is the temperature of the gas to be measured, and is displayed by the gas temperature display instrument 1. The dew point temperature and gas temperature signals are transmitted to a relative humidity calculator 4, relative humidity data are calculated through a built-in program and displayed through a relative humidity display instrument 2.
The utility model utilizes the fan 34 to convey the detected gas to the first gas detection chamber 5 and the second gas detection chamber, firstly cleans the surface of the dew point mirror 10 to ensure the surface of the dew point mirror 10 to be smooth, and then purges the gas detection chamber to remove the original gas in the gas detection chamber; and then closing the outlet control valve 23, continuously inflating until the pressure value of the indoor gas reaches 100KPa, closing the fan 34 and the inlet control valve 25, sealing and standing, stabilizing the pressure of the measured gas, and eliminating the influence of the pressure on the measurement result. If contaminants such as dust, fibers, etc. contained in the gas are deposited on the surface of the dew point mirror 10.
The gas inlet pipeline 26 is connected with a protective gas inlet pipeline 17, the end part of the protective gas inlet pipeline 17 is connected with the nitrogen storage tank 18, and the protective gas inlet pipeline 17 is provided with a nitrogen control valve 20.
All be equipped with the pressure gauge 21 that detects the internal pressure value on first gas detection room 5 and the second gas detection room 6, detect the indoor pressure value of first gas detection room 5 and the second gas detection room 6.
The first gas detection chamber 5 and the second gas detection chamber 6 are both provided with a gas release pipe 22, and the gas release pipe 22 is provided with an outlet control valve 23 for controlling the flowing state of gas.
The gas inlet pipe 26 is connected to the first gas detection chamber 5 and the second gas detection chamber 6 via the delivery branch pipe 24, and the delivery branch pipe 24 is provided with an inlet control valve 25.
The inlet end of the inlet duct 26 is provided with a fan 34.
Finally, it should be noted that: although the present invention has been described in detail with reference to the foregoing embodiments, those skilled in the art will understand that various changes, modifications and substitutions can be made without departing from the spirit and scope of the utility model as defined by the appended claims. Any modification, equivalent replacement, or improvement made within the spirit and principle of the present invention should be included in the protection scope of the present invention.
Claims (7)
1. The utility model provides a three show HP-U dew point hygrometers, includes gaseous temperature display appearance (1), relative humidity display appearance (2), dew point temperature display appearance (3), relative humidity calculator (4), first gaseous detection room (5) and second gaseous detection room (6) to and the intake duct (26) that link to each other with first gaseous detection room (5) and second gaseous detection room (6), its characterized in that: dew point mirrors (10) are arranged at the bottoms of the inner cavities of the first gas detection chamber (5) and the second gas detection chamber (6), resistance thermometers (11) are arranged in the first gas detection chamber (5) and the second gas detection chamber (6), a semiconductor refrigerator (12) installed at the bottoms of the dew point mirrors is arranged in the first gas detection chamber (5), and the gas temperature display instrument (1) is electrically connected with the resistance thermometers (11) in the second gas detection chamber (6); the relative humidity display instrument (2) is electrically connected with the relative humidity calculator (4); the relative humidity calculator (4) is electrically connected with a resistance thermometer (11) in the first gas detection chamber (5) and a resistance thermometer (11) in the second gas detection chamber (6); the resistance thermometer (11) in the first gas detection chamber (5) is electrically connected with the dew point temperature display instrument (3), and the resistance thermometer (11) in the second gas detection chamber (6) is electrically connected with the gas temperature display instrument (1); the semiconductor refrigerator (12) is electrically connected with a direct current regulating power supply (13); the surface cleaning device comprises a first gas detection chamber (5) and a second gas detection chamber (6), wherein a cleaning mechanism (27) for cleaning the surface of a dew-point mirror (10) is arranged in the first gas detection chamber (5) and the second gas detection chamber (6), the tops of inner cavities of the first gas detection chamber (5) and the second gas detection chamber (6) are respectively provided with a reflection photoresistor (7), a scattering photoresistor (8) and a light source (9), the reflection photoresistor (7) and the scattering photoresistor (8) are connected with an amplifier (15) through a photoelectric bridge circuit (14), the amplifier (15) is electrically connected with a comparator (16), the comparator (16) is electrically connected with a direct current adjusting power supply (13), and the direct current adjusting power supply (13) receives signals transmitted from the comparator (16) and adjusts the size of direct current to control the refrigerating capacity of a semiconductor refrigerator (12).
2. The HP-U dew point hygrometer according to claim 1, wherein a shielding gas inlet pipe (17) is connected to the gas inlet pipe (26), the end of the shielding gas inlet pipe (17) is connected to a nitrogen storage tank (18), and a nitrogen control valve (20) is disposed on the shielding gas inlet pipe (17).
3. A triple-display HP-U dew point hygrometer according to claim 2, characterised in that said first (5) and second (6) gas detection chambers are provided with pressure gauges (21) for detecting the internal pressure values.
4. The HP-U dew point hygrometer according to claim 2, wherein each of the first and second gas detection chambers (5, 6) has a gas release tube (22), and the gas release tube (22) has an outlet control valve (23).
5. The HP-U dew point hygrometer according to claim 2, wherein said inlet duct (26) is connected to the first gas detection chamber (5) and to the second gas detection chamber (6) through a branch duct (24), and wherein the branch duct (24) is provided with an inlet control valve (25).
6. A triple-display HP-U dew point hygrometer according to claim 1, characterised in that the inlet duct (26) has a fan (34) at its inlet end.
7. The HP-U dew point hygrometer according to claim 1, wherein the cleaning mechanism (27) comprises a base plate (33) disposed at the periphery of the dew point mirror (10), the base plate (33) is provided with a pair of parallel reciprocating lead screw (28) and a limiting polished rod (29), the reciprocating lead screw (28) is provided with a slide block (30) which reciprocates along the reciprocating lead screw (28), the limiting polished rod (29) is provided with a limiting sliding sleeve (31) which moves along the limiting polished rod (29), and the slide block (30) and the limiting sliding sleeve (31) are provided with a scraper (32) for cleaning the surface of the dew point mirror (10).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202122608298.2U CN216386860U (en) | 2021-10-28 | 2021-10-28 | Three show HP-U dew point hygrometer |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202122608298.2U CN216386860U (en) | 2021-10-28 | 2021-10-28 | Three show HP-U dew point hygrometer |
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| Publication Number | Publication Date |
|---|---|
| CN216386860U true CN216386860U (en) | 2022-04-26 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202122608298.2U Expired - Fee Related CN216386860U (en) | 2021-10-28 | 2021-10-28 | Three show HP-U dew point hygrometer |
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| Country | Link |
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| CN (1) | CN216386860U (en) |
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2021
- 2021-10-28 CN CN202122608298.2U patent/CN216386860U/en not_active Expired - Fee Related
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Granted publication date: 20220426 |