CN216213251U - Transmission electron microscope with near field optical scanning function - Google Patents

Transmission electron microscope with near field optical scanning function Download PDF

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Publication number
CN216213251U
CN216213251U CN202122283832.7U CN202122283832U CN216213251U CN 216213251 U CN216213251 U CN 216213251U CN 202122283832 U CN202122283832 U CN 202122283832U CN 216213251 U CN216213251 U CN 216213251U
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electron microscope
transmission electron
optical scanning
field optical
scanning function
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CN202122283832.7U
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Chinese (zh)
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姜伟
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Yiying Technology Shanghai Co ltd
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Yiying Technology Shanghai Co ltd
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Abstract

The utility model discloses a transmission electron microscope with a near-field optical scanning function, which comprises a bearing table and a protection mechanism, wherein the top of the bearing table is provided with the protection mechanism, the protection mechanism is formed by combining a protection shell, a baffle, a buckle and a hinge, the outer side wall of the protection shell is connected with the outer side wall of the baffle through the hinge, and the outer side wall of the baffle is provided with the buckle. The conveying mechanism is convenient for conveying the washed wheels to increase the speed of pretreatment; the wheel can be fixed by the clamping mechanism to avoid falling when moving.

Description

Transmission electron microscope with near field optical scanning function
Technical Field
The utility model relates to the technical field of transmission electron microscopes, in particular to a transmission electron microscope with a near-field optical scanning function.
Background
The transmission electron microscope is a large experimental device for material microstructure characterization, and can achieve atomic resolution. Conventional transmission electron microscopes have only a structural characterization function. The spectrum technology is another powerful means for material characterization, is applicable to various samples such as physics, chemistry and even biomedicine, and the spatial resolution of the spectrum technology is generally in the range from macroscopic scale to mesoscale. Near-field spectroscopy techniques developed in recent years have increased spatial resolution to the nanometer scale. How to combine the spectroscopic technique with the transmission electron microscope becomes the focus of research of researchers.
Patent No. 201210518692.X discloses a transmission electron microscope with near field optical scanning function, including the transmission electron microscope body, the cartridge has the sample pole on the transmission electron microscope body, the sample anchor clamps that are used for loading the sample are installed to the one end of this sample pole, sample pole cavity sets up, the internal positioner that stretches to the sample that is provided with of pole, the last fiber probe who gathers and introduce near field optical signal of installing of positioner, make fiber probe be close to or paste on the sample through control positioner, fiber probe and excitation light source and/or optical signal analysis instrument optical fiber connection, realize near field optical signal's bidirectional transmission. The utility model realizes the observation and characterization of the conventional structure of a sample material by using a transmission electron microscope, simultaneously can carry out near-field spectroscopy characterization on the sample by using the optical fiber probe, realizes the one-to-one correlation between the microstructure and the optical property of the sample, can also simultaneously use the optical fiber probe with a metal coating to measure the electric transport property of the sample, and is the huge extension of the functions of the transmission electron microscope.
The transmission electron microscope with the near-field optical scanning function has the following disadvantages: 1. the electron microscope does not effectively protect the detected object, so that dust falls on the glass slide to influence the shooting image quality; 2. the electron microscope is not firmly fixed enough to the slide glass, so that the slide glass easily slides to influence the observation of people. To this end, we propose a transmission electron microscope with a near-field optical scanning function.
SUMMERY OF THE UTILITY MODEL
The utility model mainly aims to provide a transmission electron microscope with a near-field optical scanning function, which is convenient for conveying washed wheels by a conveying mechanism to increase the speed of pretreatment; the wheel can be fixed through the clamping mechanism and prevented from falling when moving, and the problem in the background art can be effectively solved.
In order to achieve the purpose, the utility model adopts the technical scheme that:
the utility model provides a transmission electron microscope with near field optical scanning function, includes the plummer, still includes protection machanism, protection machanism is installed at the top of plummer, protection machanism comprises protecting crust, baffle, buckle and hinge combination, hinged joint is passed through with the lateral wall of baffle to the lateral wall of protecting crust, the buckle is installed to the lateral wall of baffle.
Further, the slide glass fixing device comprises a fixing mechanism, wherein the fixing mechanism is installed at the top of the bearing table and can fix the slide glass.
Further, fixed establishment comprises objective table, spring and clamp splice combination, the circular slot has been seted up at the top of plummer, the inside wall welding of circular slot has the spring, the spring has two sets ofly to be the symmetric welding in the inside wall both sides of circular slot, the other end welding clamp splice of spring can be fixed through two sets of clamp splices the slide glass.
Furthermore, the transmission electron microscope main part is installed at the top of protective housing and the input of transmission electron microscope main part is located the inside wall top of protective housing, conveniently observes slide glass material.
Further, the PC display is installed at the top of plummer, the output of transmission electron microscope main part and the input electric connection of PC display make things convenient for personnel to observe through the PC display.
Compared with the prior art, the utility model has the following beneficial effects: 1. the protection mechanism is arranged at the top of the bearing table and consists of a protection shell, a baffle, a buckle and a hinge, the protection shell is arranged at the top of the bearing table, a transmission electron microscope main body is arranged at the top of the protection shell, the outer side wall of the protection shell is connected with the outer side wall of the baffle through the hinge, so that the baffle can rotate on the outer side wall of the protection shell, the buckle is arranged on the outer side wall of the baffle, the baffle can be fixed on the outer side wall of the protection shell through the buckle, and the glass slide is positioned on the inner side wall of the protection shell, so that dust can be prevented from falling into the outer side wall of the glass slide to influence the shooting image quality;
2. fixed establishment is installed at the top of plummer, fixed establishment is by the objective table, spring and clamp splice combination constitute, the objective table is located the inside wall of protecting crust, the circular slot has been seted up at the top of objective table, the inside wall welding of circular slot has the spring of a set of symmetry, the other end welding of spring has the clamp splice, place the slide glass between two sets of clamp splices, thereby the clamp splice extrudees the spring, a set of opposite effort is applyed to the spring after the spring receives the extrusion, thereby the spring promotes the clamp splice and makes two sets of clamp splices fix the slide glass, avoid slide glass to slide and influence the observation.
Drawings
Fig. 1 is a schematic diagram of an overall structure of a transmission electron microscope with a near-field optical scanning function according to the present invention.
Fig. 2 is a schematic structural diagram of a fixing mechanism of a transmission electron microscope with a near-field optical scanning function according to the present invention.
In the figure: 1. a bearing table; 2. a transmission electron microscope body; 3. a protection mechanism; 301. a protective shell; 302. a baffle plate; 303. buckling; 304. a hinge; 4. a fixing mechanism; 401. an object stage; 402. a spring; 403. a clamping block; 5. a circular groove; 6. a PC display.
Detailed Description
In order to make the technical means, the creation characteristics, the achievement purposes and the effects of the utility model easy to understand, the utility model is further described with the specific embodiments.
As shown in fig. 1-2, a transmission electron microscope with a near-field optical scanning function includes a carrier 1, and further includes a protection mechanism 3, where the protection mechanism 3 is installed on the top of the carrier 1, the protection mechanism 3 is formed by combining a protection shell 301, a baffle 302, a buckle 303 and a hinge 304, an outer side wall of the protection shell 301 is connected with an outer side wall of the baffle 302 through the hinge 304, and the buckle 303 is installed on an outer side wall of the baffle 302.
The slide glass fixing device comprises a bearing table 1 and is characterized by further comprising a fixing mechanism 4, wherein the fixing mechanism 4 is installed at the top of the bearing table 1, and the fixing mechanism 4 can fix a slide glass.
The fixing mechanism 4 is composed of an object stage 401, a spring 402 and clamping blocks 403, a circular groove 5 is formed in the top of the object stage 401, the spring 402 is welded on the inner side wall of the circular groove 5, the spring 402 is symmetrically welded on two sides of the inner side wall of the circular groove 5 in two groups, the clamping blocks 403 are welded on the other end of the spring 402, and glass slides can be fixed through the two groups of clamping blocks 403.
Wherein, transmission electron microscope main part 2 and transmission electron microscope main part 2's input is located the inside wall top of protecting shell 301, conveniently observes slide glass material is installed at the top of protecting shell 301.
Wherein, PC display 6 is installed at the top of plummer 1, transmission electron microscope main part 2's output and the input electric connection of PC display make things convenient for personnel to observe through PC display 6.
It should be noted that, in the present invention, when the tem with the near-field optical scanning function works, the top of the platform 1 is installed with the protection mechanism 3, the protection mechanism 3 is composed of a protection shell 301, a baffle 302, a buckle 303 and a hinge 304, the top of the platform 1 is installed with the protection shell 301, the top of the protection shell 301 is installed with the tem body 2, the outer sidewall of the protection shell 301 is connected with the outer sidewall of the baffle 302 through the hinge 304, so that the baffle 302 can rotate on the outer sidewall of the protection shell 301, the outer sidewall of the baffle 302 is installed with the buckle 303, the baffle 302 can be fixed on the outer sidewall of the protection shell 301 through the buckle 303, the glass slide is located on the inner sidewall of the protection shell 301 so as to prevent dust from falling into the outer sidewall of the glass slide to affect shooting, the top of the platform 1 is installed with the fixing mechanism 4, the fixing mechanism 4 is composed of a stage 401, and the glass slide is fixed on the glass slide, Spring 402 and clamp splice 403 make up and constitute, objective table 1 is located the inside wall of protecting crust 301, circular slot 5 has been seted up at objective table 1's top, the inside wall welding of circular slot 5 has the spring 402 of a set of symmetry, the other end welding of spring 402 has clamp splice 403, place the slide between two sets of clamp splices 403, thereby clamp splice 403 extrudees spring 402, spring 402 receives the extrusion back spring 402 and applys a set of opposite effort, thereby spring 402 promotes clamp splice 403 and makes two sets of clamp splice 403 fix the slide, avoid the slide to slide and influence the observation.
The foregoing shows and describes the general principles and broad features of the present invention and advantages thereof. It will be understood by those skilled in the art that the present invention is not limited to the embodiments described above, which are described in the specification and illustrated only to illustrate the principle of the present invention, but that various changes and modifications may be made therein without departing from the spirit and scope of the present invention, which fall within the scope of the utility model as claimed. The scope of the utility model is defined by the appended claims and equivalents thereof.

Claims (5)

1. The utility model provides a transmission electron microscope with near field optical scanning function, includes plummer (1), its characterized in that still includes protection machanism (3), protection machanism (3) are installed to the top of plummer (1), protection machanism (3) comprise protecting crust (301), baffle (302), buckle (303) and hinge (304) combination, the lateral wall of protecting crust (301) passes through hinge (304) with the lateral wall of baffle (302) and is connected, buckle (303) are installed to the lateral wall of baffle (302).
2. A transmission electron microscope having a near field optical scanning function according to claim 1, characterized in that: still include fixed establishment (4), fixed establishment (4) are installed at the top of plummer (1).
3. A transmission electron microscope having a near field optical scanning function according to claim 2, characterized in that: fixed establishment (4) comprise objective table (401), spring (402) and clamp splice (403) combination, circular slot (5) have been seted up at the top of objective table (401), the inside wall welding of circular slot (5) has spring (402), spring (402) have two sets ofly to be the inside wall both sides of symmetric welding in circular slot (5), the other end welding clamp splice (403) of spring (402).
4. A transmission electron microscope having a near field optical scanning function according to claim 1, characterized in that: transmission electron microscope main part (2) and transmission electron microscope main part's (2) input are located the inside wall top of protecting crust (301) are installed to the top of protecting crust (301).
5. A transmission electron microscope having a near field optical scanning function according to claim 4, characterized in that: the PC display (6) is installed at the top of plummer (1), and the output of transmission electron microscope main part (2) and the input electric connection of PC display.
CN202122283832.7U 2021-09-22 2021-09-22 Transmission electron microscope with near field optical scanning function Active CN216213251U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202122283832.7U CN216213251U (en) 2021-09-22 2021-09-22 Transmission electron microscope with near field optical scanning function

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202122283832.7U CN216213251U (en) 2021-09-22 2021-09-22 Transmission electron microscope with near field optical scanning function

Publications (1)

Publication Number Publication Date
CN216213251U true CN216213251U (en) 2022-04-05

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