CN216209344U

CN216209344U - EMC static immunity test sample pin parameter measurement's anchor clamps

Info

Publication number: CN216209344U
Application number: CN202122740668.8U
Authority: CN
Inventors: 李贵艳; 李旭; 贾晋; 吴小珊
Original assignee: Chongqing Qingyan Science And Technology Automobile Intelligent Technology Research Institute Co ltd; Chongqing Qingyan Technology Electronic Technology Co ltd; Chongqing University of Technology
Current assignee: Chongqing Qingyan Science And Technology Automobile Intelligent Technology Research Institute Co ltd; Chongqing Qingyan Technology Electronic Technology Co ltd; Chongqing University of Technology
Priority date: 2021-11-10
Filing date: 2021-11-10
Publication date: 2022-04-05
Anticipated expiration: 2031-11-10

Abstract

The utility model relates to the technical field of EMC test equipment clamps, and particularly discloses a clamp for measuring the parameters of pins of an EMC static immunity test sample, which comprises a conductive metal interface and a lead structure, wherein one end of the conductive metal interface is provided with a pin inserting part, and the other end of the conductive metal interface is provided with a connecting part; the lead structure comprises an inner conductor which is in conductive connection with the connecting part; the conductive metal interface can be used as a sample pin fixture structure, so that on one hand, the pin parameter value can be measured more accurately, the test precision is improved, and the test time is shortened; on the other hand, the whole structure is small in size and convenient to use, and the loss of raw materials is remarkably reduced; has high practical value.

Description

EMC static immunity test sample pin parameter measurement's anchor clamps

Technical Field

The utility model relates to the technical field of EMC test equipment clamps, in particular to a clamp for measuring the parameters of pins of an EMC static immunity test sample.

Background

The static immunity test is an important item in the EMC test, static charges are easily generated in a dry atmospheric environment and places with synthetic fabrics, the body of an operator can be directly grounded or charges are generated through static induction, and the damage of electronic equipment is mostly caused by static electricity at present. In the test, the pin parameters of the sample need to be tested and recorded for multiple times, and the performance of the sample can be judged through the variation range of the pin parameters. At present, the clamp for measuring the parameters of the pins is usually of a clamp type at the tail end of the wire, the size is large, but along with the safety of a further protection sample, a long protection shell is designed on the outer side of the pin, the space is narrow, the wire clamp type clamp cannot accurately clamp the pins to test the pins, the pins are easily damaged by the large clamp, and the clamp can cause test errors to a certain extent.

SUMMERY OF THE UTILITY MODEL

Aiming at the defects in the prior art, the utility model aims to provide the clamp for measuring the parameters of the pins of the EMC static immunity test sample, which can reduce the test error.

The technical scheme adopted by the utility model is as follows: a clamp for measuring the parameters of pins of an EMC (electro magnetic compatibility) static immunity test sample comprises a conductive metal interface and a lead structure, wherein one end of the conductive metal interface is provided with a pin inserting part, and the other end of the conductive metal interface is provided with a connecting part; the wire structure comprises an inner conductor in conductive connection with the connecting part, and an insulating layer wraps the inner conductor.

Among this technical scheme, the conductive metal interface can regard as sample pin anchor clamps structure to use, and when using, the pin grafting portion that the conductive metal interface can insert the pin and ensure its and pin good contact to can keep certain space with pin one side, link to each other with the inner conductor through connecting portion, the inner conductor can be connected with the test instrument electricity and through the instrument then can be accurate read pin parameter, in order to reduce experimental error. According to the technical scheme, on one hand, the pin parameter value can be measured more accurately, so that the test precision is improved, and the test time is shortened; on the other hand, the whole structure is small in size and convenient to use, and the loss of raw materials is reduced.

Further, the periphery of the conductive metal interface is provided with a handheld portion, and the surface of the handheld portion is provided with insulating anti-skidding lines.

Furthermore, the end of the inner conductor, which is far away from the conductive metal interface, is provided with a test connecting end, and the test connecting end is provided with a detachable connector.

Furthermore, the outer surface of the insulating layer is wrapped with a protective layer.

Furthermore, a protective ring for fixing the wire structure is sleeved on the connecting part.

Furthermore, the inner wall of the pin insertion part is provided with a conductive contact layer.

Furthermore, the outer surface of the pin insertion part is provided with a protective coating.

The utility model has the beneficial effects that: the conductive metal interface can be used as a sample pin fixture structure, the pin inserting part of the conductive metal interface can be inserted into a pin to ensure that the pin is in good contact with the pin, the inner conductor can be electrically connected with a test instrument and can accurately read pin parameters through the instrument, and on one hand, the utility model can accurately measure pin parameter values so as to improve the test precision and reduce the test time; on the other hand, the whole structure is small in size and convenient to use, and the loss of raw materials is reduced; the utility model has compact structure, convenient use and higher practical value.

Drawings

In order to more clearly illustrate the detailed description of the utility model or the technical solutions in the prior art, the drawings that are needed in the detailed description of the utility model or the prior art will be briefly described below. Throughout the drawings, like elements or portions are generally identified by like reference numerals. In the drawings, elements or portions are not necessarily drawn to scale.

Fig. 1 is a structural diagram of a jig for measuring parameters of pins of an EMC electrostatic immunity test sample according to an embodiment of the present invention.

Reference numerals: conductive metal interface 100, pin jack 110, connecting part 120, handheld part 130, inner conductor 200, insulating layer 300, connector 400, guard ring 500.

Detailed Description

Embodiments of the present invention will be described in detail below with reference to the accompanying drawings. The following examples are only for illustrating the technical solutions of the present invention more clearly, and therefore are only examples, and the protection scope of the present invention is not limited thereby.

It is to be noted that, unless otherwise specified, technical or scientific terms used herein shall have the ordinary meaning as understood by those skilled in the art to which the utility model pertains.

As shown in fig. 1, an embodiment of the present invention provides a fixture for measuring pin parameters of an EMC electrostatic immunity test sample, which can accurately measure pin parameter values to improve test accuracy and reduce test duration, and has a small overall structure volume and convenient use, and can reduce loss of raw materials. The connector specifically comprises a conductive metal interface 100 and a wire structure, wherein one end of the conductive metal interface 100 is provided with a pin insertion part 110, and the other end of the conductive metal interface is provided with a connecting part 120; the lead structure includes an inner conductor 200 electrically connected to the connection portion 120, and the inner conductor 200 is surrounded by an insulating layer 300. Through the arrangement, the conductive metal interface 100 provided in the embodiment can be used as a sample pin fixture structure, when in use, the pin insertion part 110 of the conductive metal interface 100 can be inserted into a pin to ensure good contact with the pin, and can keep a certain space with one side of the pin, and is connected with the inner conductor 200 through the connecting part 120, and the inner conductor 200 can be electrically connected with a test instrument and can accurately read pin parameters through the instrument, so that test errors are reduced.

As shown in fig. 1, in order to facilitate the operation of the technician, in the embodiment, a handheld portion 130 is disposed on the periphery of the conductive metal interface 100, and the surface of the handheld portion 130 is provided with an insulating anti-slip pattern. Like this, set up handheld portion 130 and can improve the convenience of operation to handheld portion 130 has insulating anti-skidding line, can avoid causing the influence to the test.

As mentioned above, when performing the test operation, the inner conductor 200 needs to be connected to the test instrument, and the end of the inner conductor 200 away from the conductive metal interface 100 is provided with the test connection end, which is provided with the detachable connector 400. Set up connector 400 and more make things convenient for grafting test equipment, effectively improve the test convenience.

As shown in fig. 1, the inner conductor 200 in this embodiment is protected by an insulating layer 300, and in order to avoid the insulating layer 300 from being damaged by abrasion, the outer surface of the insulating layer 300 is wrapped with a protective layer in this embodiment; the protective layer is arranged, so that the clamp structure can be prevented from being damaged due to too fast abrasion. In this embodiment, a guard ring 500 for fixing the wire structure is further sleeved on the connecting portion 120. The guard ring 500 can prevent the lead structure from bending and breaking or falling off.

In practice, pin mating part 110 needs to mate with a pin of a sample, as shown in fig. 1, and in order to ensure good contact, this embodiment provides a conductive contact layer on the inner wall of pin mating part 110, and a protective coating on the outer surface of pin mating part 110. Thus, the provision of the conductive contact layer enables pin mating part 110 to form a good conductive contact with the pin structure, and the provision of the protective coating ensures that the structure is protected.

Finally, it should be noted that: the above embodiments are only used to illustrate the technical solution of the present invention, and not to limit the same; while the utility model has been described in detail and with reference to the foregoing embodiments, it will be understood by those skilled in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some or all of the technical features may be equivalently replaced; such modifications and substitutions do not depart from the spirit and scope of the present invention, and they should be construed as being included in the following claims and description.

Claims

1. A clamp for measuring the parameters of pins of an EMC static immunity test sample is characterized in that the clamp comprises a base and a clamping head; the conductive metal connector comprises a conductive metal connector (100) and a wire structure, wherein one end of the conductive metal connector (100) is provided with a pin inserting part (110), and the other end of the conductive metal connector is provided with a connecting part (120); the lead structure comprises an inner conductor (200) in conductive connection with the connecting part (120), and an insulating layer (300) wraps the inner conductor (200).

2. The fixture for EMC static immunity test sample pin parameter measurement of claim 1, wherein; the periphery of the conductive metal interface (100) is provided with a handheld part (130), and the surface of the handheld part (130) is provided with insulating anti-skidding lines.

3. The fixture for EMC static immunity test sample pin parameter measurement of claim 1, wherein; the one end that electrically conductive metal interface (100) was kept away from in inner conductor (200) is equipped with the test link, the test link is equipped with detachable connector (400).

4. The fixture for EMC static immunity test sample pin parameter measurement of claim 1, wherein; the outer surface of the insulating layer (300) is wrapped with a protective layer.

5. The fixture for EMC static immunity test sample pin parameter measurement of claim 1, wherein; the connecting part (120) is sleeved with a protective ring (500) for fixing a wire structure.

6. The fixture for EMC static immunity test sample pin parameter measurement of claim 1, wherein; and a conductive contact layer is arranged on the inner wall of the pin inserting part (110).

7. The fixture for EMC static immunity test sample pin parameter measurement of claim 1, wherein; and a protective coating is arranged on the outer surface of the pin inserting part (110).