CN216179761U

CN216179761U - Adjustable test fixture for discrete semiconductor device

Info

Publication number: CN216179761U
Application number: CN202120641987.0U
Authority: CN
Inventors: 刘清宽
Original assignee: Individual
Current assignee: Individual
Priority date: 2021-03-30
Filing date: 2021-03-30
Publication date: 2022-04-05
Anticipated expiration: 2031-03-30

Abstract

The utility model discloses an adjustable test fixture for a discrete semiconductor device, which comprises a base, wherein the upper end side wall of the base is fixedly connected with a workbench, the upper end side wall of the workbench is fixedly connected with a first limiting slide rail, the first limiting slide rail is connected with two clamping plates through two first sliding blocks matched with the first limiting slide rail, the inner side walls of the two clamping plates are respectively provided with a rubber coating, the two clamping plates are positioned on the same plane, and the outer wall of one side of the first limiting slide rail is fixedly connected with a motor. According to the utility model, through the cooperation of a plurality of groups of structures, the semiconductor sorting pieces to be tested can be clamped according to the test requirements, and the bidirectional screw can be used for driving the first bevel gear to rotate, so that the second bevel gear also rotates, the threaded rod can be driven to rotate, and the position of the transverse plate is changed, so that different tests can be simultaneously carried out on the two semiconductor sorting pieces, the working time of the whole test is further reduced, and the workload of workers is reduced.

Description

Adjustable test fixture for discrete semiconductor device

Technical Field

The utility model relates to the technical field of semiconductors, in particular to an adjustable test fixture for a discrete semiconductor device.

Background

The semiconductor discrete device has the advantages of high switching frequency, low loss, low on-resistance, large on-state current, small volume and the like, is increasingly widely applied to the aspects of solar inverters, high-voltage DC/DC converters, motors, power supplies and the like, has larger and larger demand, and must screen out unqualified products through a test process in order to ensure the quality of the products, so the test is an indispensable link for ensuring the quality of the products.

In the prior art, most clamps for discrete semiconductor devices can only be used for clamping the devices in a single mode, and stable devices need to be tested in different types independently, so that the working time of the whole test is increased, and the workload of workers is increased.

SUMMERY OF THE UTILITY MODEL

The utility model aims to solve the problem that in the prior art, a plurality of clamps for semiconductor discrete devices cannot simultaneously carry out different types of tests, and provides an adjustable test clamp for the semiconductor discrete devices.

In order to achieve the purpose, the utility model adopts the following technical scheme:

the utility model provides an adjustable test fixture of discrete device of semiconductor, includes the base, the upper end lateral wall fixedly connected with workstation of base, the first spacing slide rail of upper end lateral wall fixedly connected with of workstation, first spacing slide rail is connected with two splint, two through two first sliders rather than matching the inboard lateral wall of splint all is equipped with rubber coating, and two splint are located the coplanar, one side outer wall fixedly connected with motor of first spacing slide rail, the sealed one side lateral wall that runs through first spacing slide rail of output shaft of motor, and the output shaft fixedly connected with two-way screw rod of motor, two first sliders are run through to the both ends difference screw thread of two-way screw rod.

Preferably, one end of the bidirectional screw, which is far away from the motor, is fixedly connected with a first rotating rod, the first rotating rod penetrates through the side wall of the other side of the first limiting slide rail in a sealing manner, and one end of the first rotating rod, which is far away from the bidirectional screw, is fixedly connected with a first bevel gear.

Preferably, the upper end lateral wall fixedly connected with straight board of workstation, one side lateral wall fixedly connected with second spacing slide rail of straight board, and the second spacing slide rail is connected with the diaphragm through the second slider rather than matcing.

Preferably, the lower end of the second limiting slide rail is provided with a second bevel gear matched with the first bevel gear, the upper end side wall of the second bevel gear is fixedly connected with a second rotating rod, the second rotating rod penetrates through the lower end side wall of the second limiting slide rail in a sealing manner, one end, far away from the second bevel gear, of the second rotating rod is fixedly connected with a threaded rod, threads of the threaded rod penetrate through the second slide block, and one end, far away from the second bevel gear, of the threaded rod is connected with the upper end inner wall of the second limiting slide rail through a rotating shaft.

Preferably, the upper end side wall of the workbench is fixedly connected with a base, and the upper end side wall of the base is fixedly connected with a first rubber block.

Preferably, the lower extreme lateral wall of diaphragm has the second block rubber who matches with first block rubber through the connection of multiunit spring, and the second block rubber is located the coplanar with first block rubber.

The utility model has the following beneficial effects:

1. the two clamping plates can be close to or far away from each other by driving the bidirectional screw rod to rotate through the adjusting motor, so that the semiconductor classified piece to be tested can be clamped according to the testing requirement, and the semiconductor classified piece to be tested can be conveniently tested by a worker;

2. the two-way screw rod can drive the first bevel gear to rotate, the second bevel gear also rotates, the threaded rod can be driven to rotate, and the position of the transverse plate is changed, so that different tests can be performed on the two semiconductor classifying pieces simultaneously, the working time of the whole test is reduced, and the workload of workers is reduced.

Drawings

Fig. 1 is a schematic structural diagram of an adjustable test fixture for a semiconductor discrete device according to the present invention;

FIG. 2 is a schematic view of the structure at A in FIG. 1;

fig. 3 is a schematic top view of an adjustable test fixture for semiconductor discrete devices according to the present invention.

In the figure: the device comprises a base 1, a workbench 2, a first limiting slide rail 3, a clamping plate 4, a motor 5, a bidirectional screw 6, a first rotating rod 7, a first bevel gear 8, a straight plate 9, a second limiting slide rail 10, a transverse plate 11, a second bevel gear 12, a second rotating rod 13, a threaded rod 14, a base 15, a first rubber block 16 and a second rubber block 17.

Detailed Description

The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments.

Referring to fig. 1-3, an adjustable test fixture for discrete semiconductor devices comprises a base 1, a workbench 2 is fixedly connected to the upper side wall of the base 1, a first limit slide rail 3 is fixedly connected to the upper side wall of the workbench 2, the first limit slide rail 3 is connected to two clamp plates 4 through two first slide blocks matched with the first limit slide rail 3, the inner side walls of the two clamp plates 4 are both provided with rubber coatings, the two clamp plates 4 are located on the same plane, a motor 5 is fixedly connected to the outer wall of one side of the first limit slide rail 3, an output shaft of the motor 5 penetrates through the side wall of one side of the first limit slide rail 3 in a sealing manner, a bidirectional screw 6 is fixedly connected to the output shaft of the motor 5, two ends of the bidirectional screw 6 respectively penetrate through the two first slide blocks in a threaded manner, a first rotating rod 7 is fixedly connected to one end of the bidirectional screw 6 far away from the motor 5, the first rotating rod 7 penetrates through the other side wall of the first limit slide rail 3 in a sealing manner, one end of the first rotating rod 7, which is far away from the bidirectional screw 6, is fixedly connected with a first bevel gear 8, the motor 5 can drive the bidirectional screw 6 to rotate, and the two clamping plates 4 can be close to or far away from each other, so that a device to be tested can be clamped, and the first bevel gear 8 can be driven to rotate under the action of the first rotating rod 7;

a straight plate 9 is fixedly connected to the upper end side wall of the workbench 2, a second limit slide rail 10 is fixedly connected to one side wall of the straight plate 9, the second limit slide rail 10 is connected to a transverse plate 11 through a second slide block matched with the second limit slide rail 10, a second bevel gear 12 matched with the first bevel gear 8 is arranged at the lower end of the second limit slide rail 10, a second rotating rod 13 is fixedly connected to the upper end side wall of the second bevel gear 12, the second rotating rod 13 penetrates through the lower end side wall of the second limit slide rail 10 in a sealing manner, a threaded rod 14 is fixedly connected to one end, far away from the second bevel gear 12, of the second rotating rod 13, the threaded rod 14 penetrates through the second slide block in a threaded manner, one end, far away from the second bevel gear 12, of the threaded rod 14 is connected to the upper end inner wall of the second limit slide rail 10 through a rotating shaft, under the meshing action of the first bevel gear 8 and the second bevel gear 12, the first bevel gear 8 drives the second bevel gear 12 to rotate, under the action of the second rotating rod 13, the threaded rod 14 can be rotated, so that the position of the transverse plate 11 can be moved;

the upper end lateral wall fixedly connected with base 15 of workstation 2, the first block rubber 16 of upper end lateral wall fixedly connected with of base 15, the lower extreme lateral wall of diaphragm 11 has the second block rubber 17 that matches with first block rubber 16 through multiunit spring coupling, second block rubber 17 is located the coplanar with first block rubber 16, when placing the device that needs to carry out the test on first block rubber 16, the position through diaphragm 11 removes the position that drives second block rubber 17 and removes, can grasp the device that needs to carry out the test under the effect of multiunit spring.

In the utility model, when a semiconductor discrete device needs to be tested, one semiconductor sorting piece is arranged between two clamping plates 4, the other semiconductor sorting piece is arranged on a first rubber block 16, a bidirectional screw 6 can be driven to rotate through an adjusting motor 5, so that the two clamping plates 4 can be close to or far away from each other, and then one semiconductor sorting piece is stabilized according to the test requirement, then the rotation of the bidirectional screw 6 can be utilized to drive the rotation of a first bevel gear 8 under the action of a first rotating rod 7, and a second bevel gear 12 also can be rotated, a threaded rod 14 can be rotated under the action of a second rotating rod 13, so that a transverse plate 11 can be moved upwards or downwards, and under the action of a plurality of groups of springs and a second rubber plate, the other semiconductor sorting piece is stabilized according to the other test requirement, and different tests can be simultaneously carried out on the two semiconductor sorting pieces, thereby reducing the working time of the whole test and further lightening the workload of workers.

The above description is only for the preferred embodiment of the present invention, but the scope of the present invention is not limited thereto, and any person skilled in the art should be considered to be within the technical scope of the present invention, and equivalent alternatives or modifications according to the technical solution of the present invention and the inventive concept thereof should be covered by the scope of the present invention.

Claims

1. An adjustable test fixture for semiconductor discrete devices, which comprises a base (1) and is characterized in that, the upper end side wall of the base (1) is fixedly connected with a workbench (2), the upper end side wall of the workbench (2) is fixedly connected with a first limiting slide rail (3), the first limiting slide rail (3) is connected with two clamping plates (4) through two first sliding blocks matched with the first limiting slide rail, the inner side walls of the two clamping plates (4) are respectively provided with a rubber coating, and the two clamping plates (4) are positioned on the same plane, the outer wall of one side of the first limit slide rail (3) is fixedly connected with a motor (5), the output shaft of the motor (5) penetrates through the side wall of one side of the first limiting slide rail (3) in a sealing way, and the output shaft of the motor (5) is fixedly connected with a bidirectional screw (6), and two ends of the bidirectional screw (6) respectively penetrate through the two first sliding blocks in a threaded manner.

2. The adjustable test fixture for the semiconductor discrete device according to claim 1, wherein a first rotating rod (7) is fixedly connected to one end, away from the motor (5), of the bidirectional screw (6), the first rotating rod (7) penetrates through the side wall of the other side of the first limiting slide rail (3) in a sealing mode, and a first bevel gear (8) is fixedly connected to one end, away from the bidirectional screw (6), of the first rotating rod (7).

3. The adjustable test fixture for the semiconductor discrete device according to claim 1, wherein a straight plate (9) is fixedly connected to the upper side wall of the workbench (2), a second limit slide rail (10) is fixedly connected to one side wall of the straight plate (9), and a transverse plate (11) is connected to the second limit slide rail (10) through a second slide block matched with the second limit slide rail.

4. The adjustable test fixture for the semiconductor discrete device according to claim 3, wherein a second bevel gear (12) matched with the first bevel gear (8) is arranged at the lower end of the second limit slide rail (10), a second rotating rod (13) is fixedly connected to the upper side wall of the second bevel gear (12), the second rotating rod (13) penetrates through the lower side wall of the second limit slide rail (10) in a sealing mode, a threaded rod (14) is fixedly connected to one end, away from the second bevel gear (12), of the second rotating rod (13), the threaded rod (14) penetrates through the second sliding block in a threaded mode, and one end, away from the second bevel gear (12), of the threaded rod (14) is connected with the upper inner wall of the second limit slide rail (10) through a rotating shaft.

5. The adjustable test fixture for the semiconductor discrete device according to claim 1, characterized in that a base (15) is fixedly connected to the upper side wall of the worktable (2), and a first rubber block (16) is fixedly connected to the upper side wall of the base (15).

6. The adjustable test fixture for the semiconductor discrete device, as recited in claim 3, characterized in that the lower side wall of the horizontal plate (11) is connected with a second rubber block (17) matched with the first rubber block (16) through a plurality of groups of springs, and the second rubber block (17) and the first rubber block (16) are located on the same plane.