CN216117909U

CN216117909U - Integrated circuit test equipment

Info

Publication number: CN216117909U
Application number: CN202122587197.1U
Authority: CN
Inventors: 陈益群; 徐刚; 袁泉; 王泽山
Original assignee: Ningbo Qunzi Microelectronics Co ltd
Current assignee: Ningbo Qunxin Microelectronics Co ltd
Priority date: 2021-10-26
Filing date: 2021-10-26
Publication date: 2022-03-22
Anticipated expiration: 2031-10-26

Abstract

The utility model discloses integrated circuit test equipment, and relates to the technical field of integrated circuits. The adjustable type automatic loading device comprises a base, an adjusting mechanism and a placing platform, wherein the placing platform is positioned at the top of the base and fixedly connected with the base, the adjusting mechanism is positioned at one side of the placing platform and fixedly connected with the base, the adjusting mechanism comprises a handle and an adjusting unit, the bottom of the handle is movably connected with the adjusting unit, the adjusting unit comprises a gear and two racks, and the two racks are respectively positioned at two sides of the gear and meshed with each other. The distance between the back ends of the two rack phases is adjusted, so that the test point is adapted, the handle is pressed downwards to enable the sleeve to descend along with the test point, a plurality of integrated circuits can be tested, and the problem that the distance between the two pins is changed manually and is troublesome is solved; through fixing the block rubber on the roof, prevent that the circuit board from sliding in the test procedure, solved and directly placed and cause the problem of circuit board wearing and tearing easily at the desktop.

Description

Integrated circuit test equipment

Technical Field

The utility model belongs to the technical field of integrated circuits, and particularly relates to integrated circuit testing equipment.

Background

The integrated circuit is a miniature electronic device or component, and adopts a certain process to interconnect the elements of transistor, resistor, capacitor and inductor, etc. required in a circuit and the wiring together, so that the electronic element is miniaturized and has low power consumption, and when the integrated circuit is produced, it must be tested, but its practical use still has the following defects:

1. the existing integrated circuit test equipment has relatively low test efficiency, and often cannot test due to the contact problem of a contact point during test, so that the test cost of the integrated circuit is increased, and the integrated circuit needs to be tested uniformly after a plurality of integrated circuits are produced, but the existing test equipment is troublesome because the distance between two pins is manually changed;

2. when the existing integrated circuit testing equipment is used, the integrated circuit is mostly directly placed on a desktop for testing, the integrated circuit is easily contaminated and dirt is easily prevented from being used, and after pins are pressed down, the bottom surface of a circuit board is easily rubbed with the desktop, so that the abrasion condition is easily caused.

Therefore, the existing ic testing equipment cannot meet the practical requirements, so that there is a strong need for improved techniques to solve the above problems.

SUMMERY OF THE UTILITY MODEL

The utility model aims to provide integrated circuit testing equipment, which adapts to a testing point by adjusting the distance between the back ends of two rack phases, can test a plurality of integrated circuits by pressing a handle downwards to enable a sleeve to descend along with the handle, and solves the problem that the distance between two pins is changed manually and is troublesome; through fixing the block rubber on the roof, prevent that the circuit board from sliding in the test procedure, solved and directly placed and cause the problem of circuit board wearing and tearing easily at the desktop.

In order to solve the technical problems, the utility model is realized by the following technical scheme:

the utility model relates to integrated circuit testing equipment which comprises a base, an adjusting mechanism and a placing platform, wherein the placing platform is positioned at the top of the base and fixedly connected with the base, the adjusting mechanism is positioned at one side of the placing platform and fixedly connected with the base, the adjusting mechanism comprises a handle and an adjusting unit, the bottom of the handle is movably connected with the adjusting unit, the adjusting unit is controlled by the handle to lift, so that two pins of the adjusting unit are pressed against two points to be tested, the adjusting unit comprises a gear and two racks, the two racks are respectively positioned at two sides of the gear and meshed with each other, when the gear rotates, the two racks simultaneously slide in opposite directions, and then the distance between the back ends of the two racks can be adjusted, so that the integrated circuit testing equipment is suitable for a test point.

Furthermore, the base comprises an outer frame and a display screen, a master control switch is fixedly connected to the side face of the outer frame and used for controlling a whole equipment circuit, the top face of the outer frame is fixedly connected with the display screen on one side of the placing platform, the lower side of the display screen is fixedly connected with a plurality of sub-control switches with the outer frame, parameters of a measured point can be directly observed, and the distance between two voltage pins in the integrated circuit board can be measured through a regulating unit, so that subsequent improvement is facilitated.

Furthermore, the adjusting mechanism further comprises a vertical plate and an arched frame, the vertical plate is fixedly connected to the top surface of the outer frame, a transmission block is fixedly connected to the top of the vertical plate, the outer side of the transmission block is fixedly connected with the arched frame, the top of the handle is rotatably connected with the top of the arched frame, the two sides of the middle of the handle are rotatably connected with connecting strips, the bottom of each connecting strip is rotatably connected with a sleeve, the handle is lifted upwards to enable the sleeve to ascend along with the sleeve, the sleeve descends otherwise, the handle rotates to a larger extent under the action of the two connecting strips, the ascending distance of the sleeve is shorter, so that the measured point is found more accurately, and the adjusting unit is movably clamped at the bottom of the sleeve.

Further, place the platform includes bottom plate, joint post and roof, the equal fixedly connected with joint post of four corners of bottom plate top surface, the roof is located the bottom plate top, and with the joint post joint that slides, the outer cylinder winding of joint post has the spring, by the effect of spring, when the adjusting unit pushes down integrated circuit board, but the decline altitude of decline of avoiding then the adjusting unit is too big and damage the circuit board.

Furthermore, the adjusting unit further comprises a transmission guide pillar and a knob, the transmission guide pillar is movably clamped inside the sleeve and connected with a conducting wire through the transmission block, the transmission guide pillar is rotatable, sliding rails are fixedly connected to the two sides of the bottom of the transmission guide pillar, the gear is rotatably connected with the bottom of the transmission guide pillar, the knob is fixedly connected to the top of the gear, the transmission guide pillar penetrates through the knob, then the knob is rotated to enable the gear to rotate, so that two racks are adjusted, the racks are respectively clamped inside the two sliding rails in a sliding mode, and pins are fixedly connected to the back of the two racks.

Furthermore, a plurality of mounting holes are formed in the top surface of the outer frame, and the vertical plate and the bottom plate are fixedly connected through bolts respectively.

Further, the bottom fixedly connected with lantern ring of bow-shaped frame, the sleeve runs through the lantern ring, makes the sleeve remain vertical lift all the time, avoids the regulating unit slope to inconvenient and test point location contact.

Further, the surface activity joint of roof has a plurality of rubber blocks, and the rubber block is fixed on the roof according to integrated circuit board's bottom surface, avoids circuit board bottom surface direct contact roof to cause wearing and tearing, and prevents that circuit board from sliding in the test procedure.

The utility model has the following beneficial effects:

1. according to the utility model, the knob is rotated, the gear rotates, then the two racks slide reversely at the same time, the distance between the back ends of the two racks is adjusted, so that the test point is adapted, the handle is pressed downwards to enable the sleeve to descend along with the handle, a plurality of integrated circuits can be tested, and the problem that the distance between the two pins is changed manually and is troublesome is solved.

2. According to the utility model, the rubber block is fixed on the top plate, so that the bottom surface of the circuit board is prevented from directly contacting the top plate to cause abrasion, and the circuit board is prevented from sliding in the test process, thereby solving the problem that the circuit board is easily abraded when directly placed on a desktop.

Drawings

In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings used in the description of the embodiments will be briefly introduced below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and it is obvious for those skilled in the art that other drawings can be obtained according to the drawings without creative efforts.

FIG. 1 is a schematic view of the overall structure of the present invention;

FIG. 2 is a schematic view of a base structure of the present invention;

FIG. 3 is a schematic view of an adjustment mechanism according to the present invention;

FIG. 4 is a schematic view of the handle attachment of the present invention;

FIG. 5 is a schematic view of the structure of the adjusting unit of the present invention;

FIG. 6 is a schematic view of a slide rail connection structure according to the present invention;

fig. 7 is a schematic structural diagram of the placement platform of the present invention.

In the drawings, the components represented by the respective reference numerals are listed below:

100. a base; 110. an outer frame; 120. mounting holes; 130. a master control switch; 140. a display screen; 150. a sub-control switch; 200. an adjustment mechanism; 210. a vertical plate; 220. a conductive block; 230. an arched frame; 240. a collar; 250. a handle; 260. a connecting strip; 270. a sleeve; 280. an adjustment unit; 281. a guide post; 282. a slide rail; 283. a gear; 284. a knob; 285. a rack; 286. a pin; 300. placing a platform; 310. a base plate; 320. a clamping column; 330. a top plate; 340. a spring; 350. a rubber block.

Detailed Description

The technical solution in the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention.

Referring to fig. 1-7, the present invention is an integrated circuit testing apparatus, including a base 100, an adjusting mechanism 200 and a placing platform 300, wherein the placing platform 300 is fixedly connected to the top of the base 100, the adjusting mechanism 200 is positioned at one side of the placing platform 300 and is fixedly connected to the base 100, the adjusting mechanism 200 includes a handle 250 and an adjusting unit 280, the bottom of the handle 250 is movably connected to the adjusting unit 280, the handle 250 controls the lifting of the adjusting unit 280, so that two pins 286 of the adjusting unit 280 press two points to be tested, the adjusting unit 280 includes a gear 283 and two racks 285, the two racks 285 are respectively engaged with two sides of the gear 283, when the gear 283 rotates, the two racks 285 simultaneously slide in opposite directions, so as to adjust the distance between the opposite ends of the two racks 285, thereby adapting to the testing point.

As shown in fig. 2, the base 100 includes an outer frame 110 and a display screen 140, a main control switch 130 is fixedly connected to a side surface of the outer frame 110 for controlling the whole device circuit, the top surface of the outer frame 110 is fixedly connected to the display screen 140 at one side of the placing platform 300, a plurality of sub-control switches 150 are fixedly connected to a lower side of the display screen 140 and the outer frame 110, parameters of a measured point can be directly observed, and the distance between two voltage pins in the integrated circuit board can be measured through the adjusting unit 280, thereby facilitating subsequent improvement; the top surface of the outer frame 110 is formed with a plurality of mounting holes 120, and the vertical plate 210 and the bottom plate 310 are respectively fixedly connected by bolts.

As shown in fig. 3-6, the adjusting mechanism 200 further includes a vertical plate 210 and an arc frame 230, the vertical plate 210 is fixedly connected to the top surface of the outer frame 110, the top of the vertical plate 210 is fixedly connected with a conducting block 220, the outer side of the conducting block 220 is fixedly connected with the arc frame 230, the top of the handle 250 is rotatably connected with the top of the arc frame 230, two sides of the middle of the handle 250 are rotatably connected with connecting bars 260, the bottom end of the connecting bar 260 is rotatably connected with a sleeve 270, the handle 250 is lifted upwards to enable the sleeve 270 to ascend along with the sleeve, otherwise, the handle descends, and under the action of the two connecting bars 260, the rotating amplitude of the handle 250 is larger, and the ascending and descending distance of the sleeve 270 is smaller, so as to more accurately find the measured point, and the adjusting unit 280 is movably clamped at the bottom of the sleeve 270; the adjusting unit 280 further comprises a transmission post 281 and a knob 284, wherein the transmission post 281 is movably clamped inside the sleeve 270, a conducting wire is connected with the transmission block 220, the transmission post 281 can rotate, slide rails 282 are fixedly connected to two sides of the bottom of the transmission post 281, a gear 283 is rotatably connected with the bottom of the transmission post 281, the top of the gear 283 is fixedly connected with the knob 284, the transmission post 281 penetrates through the knob 284, the gear 283 rotates by rotating the knob 284, so that two racks 285 are adjusted, the two racks 285 are respectively clamped inside the two slide rails 282 in a sliding manner, and the opposite back ends of the two racks 285 are fixedly connected with pins 286; the bottom of bow-shaped frame 230 is fixedly connected with lantern ring 240, and sleeve 270 runs through lantern ring 240, makes sleeve 270 remain vertical lift all the time, avoids adjusting unit 280 slope to inconvenient and test point position contact.

As shown in fig. 7, the placing platform 300 includes a bottom plate 310, clamping posts 320 and a top plate 330, the clamping posts 320 are fixedly connected to four corners of the top surface of the bottom plate 310, the top plate 330 is located above the bottom plate 310 and slidably clamped with the clamping posts 320, springs 340 are wound on outer cylindrical surfaces of the clamping posts 320, and under the action of the springs 340, when the adjusting unit 280 presses down the integrated circuit board, the height of the circuit board can be lowered, so that the circuit board is prevented from being damaged due to the excessively large lowering height of the adjusting unit 280; the surface activity joint of roof 330 has a plurality of rubber blocks 350, and rubber block 350 is fixed on roof 330 according to integrated circuit board's bottom surface, avoids circuit board bottom surface direct contact roof 330 to cause wearing and tearing, and prevents that the circuit board from sliding in the test procedure.

The working principle is as follows:

during the use, fix rubber block 350 on roof 330 according to integrated circuit board's bottom surface, avoid circuit board bottom surface direct contact roof 330 to cause wearing and tearing, and prevent that the circuit board from sliding in the test procedure, through rotating knob 284, gear 283 rotates, then two rack 285 simultaneous reverse slip, adjust two rack 285 distance between the end that carries on the back mutually, thereby the adaptation test point, handle 250 makes sleeve 270 follow its decline downwards pushed down, and by the effect of two connecting strips 260, handle 250 pivoted range is great, and the distance that sleeve 270 goes up and down is less, thereby more accurate searching the position of being surveyed.

The above are only preferred embodiments of the present invention, and the present invention is not limited thereto, and any modification, equivalent replacement, and improvement made to the technical solutions described in the above embodiments, and to some of the technical features thereof, are included in the scope of the present invention.

Claims

1. An integrated circuit test equipment, includes base (100), adjustment mechanism (200) and place platform (300), its characterized in that: the utility model discloses a set up the top fixed connection that place platform (300) were located base (100), adjustment mechanism (200) are located one side of place platform (300) and with base (100) fixed connection, adjustment mechanism (200) include handle (250) and adjusting unit (280), the bottom swing joint adjusting unit (280) of handle (250), adjusting unit (280) include gear (283) and two rack (285), and two rack (285) are located the both sides meshing of gear (283) respectively.

2. The integrated circuit testing apparatus according to claim 1, wherein the base (100) comprises an outer frame (110) and a display screen (140), a master control switch (130) is fixedly connected to a side surface of the outer frame (110), the display screen (140) is fixedly connected to a top surface of the outer frame (110) and located on one side of the placement platform (300), and a plurality of sub-control switches (150) are fixedly connected to a lower side of the display screen (140) and the outer frame (110).

3. The integrated circuit testing device according to claim 1, wherein the adjusting mechanism (200) further comprises a vertical plate (210) and an arc-shaped frame (230), the vertical plate (210) is fixedly connected to the top surface of the outer frame (110), a conductive block (220) is fixedly connected to the top of the vertical plate (210), the arc-shaped frame (230) is fixedly connected to the outer side of the conductive block (220), the top of the handle (250) is rotatably connected to the top of the arc-shaped frame (230), the connecting strips (260) are rotatably connected to both sides of the middle of the handle (250), the sleeves (270) are rotatably connected to the bottom ends of the connecting strips (260), and the adjusting unit (280) is movably clamped to the bottoms of the sleeves (270).

4. The integrated circuit testing device according to claim 1, wherein the placement platform (300) comprises a bottom plate (310), clamping columns (320) and a top plate (330), the clamping columns (320) are fixedly connected to four corners of the top surface of the bottom plate (310), the top plate (330) is located above the bottom plate (310) and slidably clamped with the clamping columns (320), and springs (340) are wound around the outer cylindrical surfaces of the clamping columns (320).

5. The integrated circuit testing device according to claim 1, wherein the adjusting unit (280) further comprises a transmission post (281) and a knob (284), the transmission post (281) is movably clamped inside the sleeve (270), slide rails (282) are fixedly connected to two sides of the bottom of the transmission post (281), the gear (283) is rotatably connected to the bottom of the transmission post (281), the knob (284) is fixedly connected to the top of the gear (283), the two racks (285) are respectively clamped inside the two slide rails (282) in a sliding manner, and pins (286) are fixedly connected to opposite ends of the two racks (285).

6. The integrated circuit testing apparatus of claim 2, wherein the top surface of the outer frame (110) is formed with a plurality of mounting holes (120) for fixedly connecting the vertical plate (210) and the bottom plate (310) via bolts.

7. An integrated circuit testing device according to claim 3, characterized in that a collar (240) is fixedly attached to the bottom of the bow (230), the sleeve (270) extending through the collar (240).

8. An IC testing device according to claim 4, wherein the top plate (330) has a plurality of rubber blocks (350) removably snap-fitted to its surface.