CN216051874U

CN216051874U - Novel simple, easy, efficient and low-cost open/short circuit test circuit

Info

Publication number: CN216051874U
Application number: CN202121619606.5U
Authority: CN
Inventors: 林茂; 梁会锋; 于涛; 李晨琳
Original assignee: Shanghai Sinomicon Electronic Co ltd
Current assignee: Shanghai Sinomicon Electronic Co ltd
Priority date: 2021-07-16
Filing date: 2021-07-16
Publication date: 2022-03-15
Anticipated expiration: 2031-07-16

Abstract

The utility model discloses a novel simple, high-efficiency and low-cost open-short circuit test circuit which comprises a test circuit IC1, wherein a tested circuit IC2 is connected to the test circuit 1, the test circuit IC1 comprises an AD1 pin and an AD2 pin, the tested circuit IC2 comprises a GND pin and a VDD pin, and the AD1 pin and the AD2 pin are respectively connected with the VDD pin and the GND pin. According to the utility model, the AD1 pin and the AD2 pin are matched with the pull-up resistor R1 and the pull-down resistor R2 to realize the detection of the reverse protection effect of the protection diode, and the test steps are simplified by simultaneously connecting a plurality of test pins and a plurality of tested pins one by one, so that the labor cost is reduced, and the test efficiency is increased.

Description

Novel simple, easy, efficient and low-cost open/short circuit test circuit

Technical Field

The utility model relates to the technical field of open-short circuit testing, in particular to a novel simple, easy, efficient and low-cost open-short circuit testing circuit.

Background

In the manufacturing process of the integrated circuit, an open-short circuit test is one of necessary technologies, the open-short circuit test can detect the quality of the produced integrated circuit and ensure the safe and effective work of the integrated circuit, generally, each pin of the integrated circuit is provided with a bleeder circuit or a protection circuit, the bleeder circuit or the protection circuit is composed of two diodes which are connected end to end, and the function of opening and short circuit of the pins of the integrated circuit can be realized by testing the states of the diodes.

The common scheme of the existing open-short circuit test circuit is to detect the voltage of two end-to-end diodes on the pins of the tested integrated circuit one by one, namely to judge the state of the diodes by detecting the terminal voltage of the diodes, thereby knowing the open-short circuit condition, but the detection one by one takes longer time, the detection efficiency is low, a large amount of manpower is consumed, and the test cost is increased.

SUMMERY OF THE UTILITY MODEL

The utility model aims to solve the defects in the prior art and provides a novel simple, high-efficiency and low-cost open-short circuit test circuit.

In order to achieve the purpose, the utility model adopts the following technical scheme:

the utility model provides a novel simple and easy high-efficient low-cost open short circuit test circuit, includes test circuit IC1, be connected with circuit under test IC2 on the test circuit 1, including AD1 pin and AD2 pin on the test circuit IC1, including GND pin and VDD pin on the circuit under test IC2, VDD pin and GND pin are connected respectively to AD1 pin and AD2 pin.

Preferably, the test circuit IC1 includes a VCC pin and a VSS pin, and the VCC pin and the VSS pin are connected to an external power supply.

Preferably, the test circuit IC1 includes a plurality of test pins thereon, and the circuit-under-test IC2 includes a plurality of pins under test, and the plurality of test pins are connected to the plurality of pins under test in a one-to-one correspondence.

Preferably, each pin to be tested is connected with two protection diodes connected end to end in series, the AD1 pin is connected with a pull-up resistor R1, and the AD2 pin is connected with a pull-down resistor R2.

The utility model has the following beneficial effects:

1. through AD1 pin and AD2 pin's AD detection function, cooperation pull-up resistance R1 and pull-down resistance R2 can detect protection diode to the reverse protection effect of being surveyed the pin to GND and protection diode to VDD to being surveyed the reverse protection effect of pin, can open the short circuit detection to two protection diodes on being surveyed the pin fast, and detection speed is fast, and efficiency is higher.

2. The testing device has the advantages that the plurality of testing pins and the plurality of tested pins are connected one by one, the internal resistance states of the testing pins and the tested pins are changed, one-by-one detection can be realized, the repeated continuous contact connection detection is not needed, the detection steps are simplified, the labor force of manual detection is reduced, and the testing cost is reduced.

In summary, the utility model realizes the detection of the reverse protection effect of the protection diode by the AD1 pin and the AD2 pin in cooperation with the pull-up resistor R1 and the pull-down resistor R2, simplifies the test steps by simultaneously connecting a plurality of test pins and a plurality of tested pins one by one, reduces the labor cost and increases the test efficiency.

Drawings

FIG. 1 is a schematic diagram of a circuit composition of a novel simple, efficient and low-cost open/short circuit test circuit according to the present invention;

fig. 2 is a circuit diagram of a novel simple, efficient and low-cost open-short circuit test circuit according to the present invention.

Detailed Description

The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments.

Referring to fig. 1-2, a novel simple, easy, efficient and low-cost open/short circuit test circuit comprises a test circuit IC1, a tested circuit IC2 is connected to the test circuit 1, an AD1 pin and an AD2 pin are included on the test circuit IC1, a GND pin and a VDD pin are included on the tested circuit IC2, and an AD1 pin and an AD2 pin are respectively connected to the VDD pin and the GND pin.

The test circuit IC1 comprises a VCC pin and a VSS pin, the VCC pin and the VSS pin are connected with an external power supply, the external power supply supplies power to the test circuit IC1, and the AD1 pin and the AD2 pin are respectively connected with a VDD pin and a GND pin, so that the external power supply supplies power to the tested circuit IC2 through the test circuit IC 1.

The test circuit IC1 comprises a plurality of test pins, the tested circuit IC2 comprises a plurality of tested pins, the plurality of test pins are connected with the plurality of tested pins in a one-to-one correspondence manner, the plurality of test pins and the plurality of tested pins are connected at one time, repeated test operation can be reduced, labor force is reduced, test cost is reduced, and test efficiency is improved.

The terminal voltage detection method comprises the steps that two protection diodes which are connected in series end to end are connected to each tested pin, the anodes of the two protection diodes which are connected in series are grounded, the cathodes of the two protection diodes are connected with a VDD pin, the AD1 pin is connected with a pull-up resistor R1, the AD2 pin is connected with a pull-down resistor R2, and the port voltage detection of the two protection diodes is achieved through the pull-up resistor R1 of the AD1 pin and the pull-down resistor R2 of the AD2 pin.

The characteristic test of the protection diode needs to be carried out one by one, a tested pin sets a high level or a low level of a test pin connected with the tested pin according to the test requirement, and other pins keep a high-impedance state.

According to the utility model, the reverse protection effect of the tested pin on the protection diode of GND is tested, the tested pin is set to be at low level through the tested circuit IC2, the AD2 pin starts the AD detection function, and simultaneously the pull-up resistor R1 inside is started, so that a current loop is formed from VCC to the tested pin, and whether the protection diode of the tested pin on GND is normal can be judged by judging the voltage detected by the AD2 pin;

the reverse protection effect of the tested pin on the VDD protection diode is tested, the tested pin is set to be at a high level, the AD1 pin starts an AD detection function, and meanwhile, an internal pull-down resistor R2 is started, so that a current loop is formed from the tested pin to VSS, and whether the tested pin is normal to the VDD protection diode can be judged by judging the voltage detected by the AD1 pin.

The above description is only for the preferred embodiment of the present invention, but the scope of the present invention is not limited thereto, and any person skilled in the art should be considered to be within the technical scope of the present invention, and equivalent alternatives or modifications according to the technical solution of the present invention and the inventive concept thereof should be covered by the scope of the present invention.

Claims

1. The utility model provides a novel simple and easy high-efficient low-cost open short circuit test circuit, includes test circuit IC1, its characterized in that, be connected with circuit under test IC2 on the test circuit 1, including AD1 pin and AD2 pin on the test circuit IC1, including GND pin and VDD pin on the circuit under test IC2, VDD pin and GND pin are connected respectively to AD1 pin and AD2 pin.

2. The novel simple efficient low-cost open-short circuit test circuit as claimed in claim 1, wherein said test circuit IC1 comprises a VCC pin and a VSS pin, and said VCC pin and said VSS pin are connected to an external power source.

3. The novel simple, efficient and low-cost open-short circuit test circuit as claimed in claim 1, wherein said test circuit IC1 comprises a plurality of test pins, and said circuit under test IC2 comprises a plurality of pins under test, and a plurality of said test pins are connected to a plurality of pins under test in a one-to-one correspondence.

4. The novel simple efficient low-cost open-short circuit test circuit as claimed in claim 3, wherein each of the tested pins is connected with two protection diodes connected in series end to end, the AD1 pin is connected with a pull-up resistor R1, and the AD2 pin is connected with a pull-down resistor R2.