CN216013581U - Battery chip test module - Google Patents

Battery chip test module Download PDF

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Publication number
CN216013581U
CN216013581U CN202122201683.5U CN202122201683U CN216013581U CN 216013581 U CN216013581 U CN 216013581U CN 202122201683 U CN202122201683 U CN 202122201683U CN 216013581 U CN216013581 U CN 216013581U
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chip
diode
resistor
module
pin
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梁琪
蔺会民
王志云
曾利强
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Shenzhen Harding Energy Co ltd
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Shenzhen Harding Energy Co ltd
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Abstract

The utility model discloses a battery chip test module relates to battery power and calculates chip test technical field, has solved the order cycle length that current test equipment exists, and equipment is expensive, the technical problem of the technical problem that unsuitable small batch production firm used. The utility model discloses a test unit, display element, protection circuit and battery chip, test unit and display element are connected, and protection circuit and test unit, display element all are connected, and battery chip passes through protection circuit and is connected with test unit, tests through test unit, and the test result shows through display element. The utility model is used for component equipment is few, simple structure, and development cost is lower, and can reach fine detection effect and efficiency, can be applied to the test demand that small batch production firm calculated the chip to battery power.

Description

Battery chip test module
Technical Field
The utility model relates to a lithium cell production test technical field especially relates to a battery chip test module.
Background
With the progress of economic globalization and the increasing demand for energy, finding new energy storage devices has become a focus of attention in the field related to new energy. The Lithium Ion Battery (LIB) is the battery system with the best comprehensive performance at present, has the characteristics of high specific energy, long cycle life, small volume, light weight, no memory effect, no pollution and the like, is rapidly developed into a new generation of energy storage power supply, and is used for power support in the fields of information technology, electric vehicles, hybrid vehicles, aerospace and the like. The electric quantity of the lithium battery can be gradually consumed along with the use of the equipment, in order to reduce the accidental or premature stop of the equipment, the residual electric quantity of the battery of the equipment needs to be monitored in real time, so that the plug can be timely charged or fully charged, the accident of explosion is prevented, and the electricity meter chip is a device special for comprehensively monitoring the battery.
At present, some test equipment of finished lithium batteries specially manufactured according to the scheme of a battery electric quantity calculation chip BQ20Z75 are available on the market, but the test equipment has the problems of expensive equipment, long customization period, high development cost and the like; some devices specially designed for compatibly testing various types of electric quantity chips exist on the market, but the devices are expensive due to long ordering period and are not suitable for small-batch manufacturers.
SUMMERY OF THE UTILITY MODEL
An object of the utility model is to provide a battery chip test module to solve the order cycle length that current test equipment exists, equipment is expensive, the technical problem that unsuitable small batch production firm used. The utility model provides a plurality of technical effects that preferred technical scheme among a great deal of technical scheme can produce see the explanation below in detail.
In order to achieve the above purpose, the utility model provides a following technical scheme:
the utility model provides a battery chip testing module, which is used for testing a battery chip and is characterized by comprising an MCU processing module, a temperature acquisition module, a display module and an external load interface module; the temperature acquisition module, the display module and the external load interface module are all connected with the MCU processing module; the MCU processing module is connected with an external load and the battery chip through the external load interface module and is used for acquiring and testing data of the battery chip; the temperature acquisition module acquires temperature data of the battery chip through the MCU processing module, converts the temperature data into digital information and sends the digital information to the MCU processing module for testing; and the MCU processing module displays the test result through the display module.
Preferably, the battery chip testing module further comprises a power supply module connected with the MCU processing module, the temperature acquisition module, the display module and the external load interface module; the power supply module comprises a capacitor C1 and a capacitor C2 which are connected in parallel, wherein one ends of the capacitor C1 and the capacitor C2 are both grounded, the other ends of the capacitor C1 and the capacitor C2 are connected with each other, and a connection point is used for outputting rated voltage outwards.
Preferably, the MCU processing module includes a first chip U1, a work instruction circuit, a voice prompt circuit, a port control circuit, a test control circuit, and a reset circuit; the work indication circuit, the sound prompt circuit, the port control circuit, the test control circuit and the reset circuit are all connected with the first chip U1; the model of the first chip U1 is P-NANOV 3.
Preferably, the operation indicating circuit comprises a triode Q1, a light emitting diode D1 and a resistor R1 which are connected in series in sequence; the base of the triode Q1 is connected with the pin 1 of the first chip U1, the collector of the triode Q1 is connected with the rated voltage, and the emitter of the triode Q1 is connected with the anode of the light-emitting diode D1; the cathode of the light emitting diode D1 is connected with one end of the resistor R1, and the other end of the resistor R1 is grounded.
Preferably, the sound prompt circuit comprises a buzzer, a diode D2 and a winding resistor RX 1; the positive electrode of the buzzer and the negative electrode of the diode D2 are both connected with the pin 23 of the first chip U1, the negative electrode of the buzzer and the positive electrode of the diode D2 are both connected with one end of the winding resistor RX1, and the other end of the winding resistor RX1 is grounded.
Preferably, the port control circuit comprises a winding resistor RX2, a transistor Q2, a diode D3 and a relay switch K; one end of the winding resistor RX2 is connected with the pin 22 of the first chip U1, and the other end of the winding resistor RX2 is connected with the base of the triode Q2; the emitter of the triode Q2 is connected with the rated voltage, and the collector of the triode Q2 is connected with the cathode of the diode and the pin 1 of the relay switch K; the anode of the diode is connected with the pin 2 of the relay switch K and is grounded; a pin 3 of the relay switch K is connected with a first port of the battery chip testing module, a pin 4 of the relay switch K is connected with a second port of the battery chip testing module, and a pin 5 of the relay switch K is reserved; the first port and the second port are interfaces for data communication between the battery chip testing module and the battery chip as well as between the battery chip testing module and an external load.
Preferably, the test control circuit comprises a switch S1 and a resistor R2; the pin 20 of the first chip U1 is connected between the switch S1 and the resistor R2, one end of the switch S1 is grounded, and one end of the resistor R2 is connected to the rated voltage; the reset circuit comprises a switch S2 and a resistor R3; the pin 13 of the first chip U1 is connected between the switch S2 and the resistor R3, one end of the switch S2 is grounded, and one end of the resistor R3 is connected to the rated voltage.
Preferably, the temperature acquisition module comprises a second chip U2, a light emitting diode D4, a resistor R4 and a resistor R5; the model of the second chip U2 is DS18B 20; a pin 1 of the second chip U2 is connected with the cathode of the light emitting diode D4 and grounded, a pin 2 of the second chip U2 and one end of the resistor R4 are both connected with a pin 21 of the first chip U1, a pin 3 of the second chip U2, the other end of the resistor R4 and one end of the resistor R5 are all connected, and the connection point is connected with the rated voltage; the other end of the resistor R5 is connected with the anode of the light-emitting diode D4.
Preferably, the display module includes a third chip U3, a fourth chip U4; the models of the third chip U3 and the fourth chip U4 are both LCD 2004; the pins 1 of the third chip U3 and the fourth chip U4 are connected with the pin 14 of the first chip U1 and grounded; the pins 2 of the third chip U3 and the fourth chip U4 are both connected with the pin 12 of the first chip U1, and the connection point is connected with the rated voltage; the pins 3 of the third chip U3 and the fourth chip U4 are connected with the pins 8 of the first chip U1; the pins 4 of the third chip U3 and the fourth chip U4 are connected with the pins 9 of the first chip U1.
Preferably, the external load interface module includes a diode D5, a diode D6, a diode D7, a diode D8, a resistor R6, a resistor R7, a third port, a fourth port, and a fifth port; the anode of the diode D5, the cathode of the diode D6 and one end of the resistor R6 are all connected with the connection points of the pin 4 of the third chip and the pin 4 of the fourth chip and are communicated with the fourth port through wires; the cathode of the diode D5 is connected with the other end of the resistor R6, and the connection point is connected with the rated voltage; the anode of the diode D6 is grounded; the anode of the diode D7, the cathode of the diode D8 and one end of the resistor R7 are all connected with the connection points of the pin 3 of the third chip and the pin 3 of the fourth chip and are communicated with the third port through wires; the cathode of the diode D7 is connected with the other end of the resistor R7, and the connection point is connected with the rated voltage; the anode of the diode D8 is grounded; the fifth port is grounded; the third port, the fourth port and the fifth port are used for being connected with the battery chip, and the fifth port is also connected with the external load.
Implement the utility model discloses a technical scheme among the above-mentioned technical scheme has following advantage or beneficial effect:
the utility model discloses a set up MCU processing module, temperature acquisition module, display module, external load interface module and realize testing battery power calculation chip, and then realize carrying out comparatively comprehensive test to voltage difference, current precision, temperature measurement precision, effective chemistry ID, key status flag bit etc. before the finished product battery shipment, and do not need external computer, only need an external electronic load appearance and a 5V power can. Therefore, the testing module of the utility model adopts few component devices, has simple structure and lower development cost, and can reach good detection effect and efficiency, thereby improving the production testing efficiency, reducing the production cost and improving the product quality; furthermore, the utility model discloses can be applied to the test demand that small batch production firm calculated the chip to battery power.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings used in the description of the embodiments are briefly introduced below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained without inventive work, and in the drawings:
fig. 1 is a circuit diagram of a battery chip testing module according to an embodiment of the present invention.
In the figure: 1. an MCU processing module; 11. an operation indication circuit; 12. a voice prompt circuit; 13. a port control circuit; 14. a test control circuit; 15. a reset circuit; 2. a temperature acquisition module; 3. a display module; 4. the external load interface module; 5. and a power supply module.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention more apparent, various exemplary embodiments to be described below will refer to the accompanying drawings, which form a part hereof, and in which are described various exemplary embodiments that may be employed to implement the present invention. The same numbers in different drawings identify the same or similar elements unless otherwise indicated. The implementations described in the exemplary embodiments below are not intended to represent all implementations consistent with the present disclosure. It is to be understood that they are merely examples of processes, methods, apparatus, etc., consistent with certain aspects of the present disclosure, as detailed in the appended claims, and that other embodiments may be used or structural and functional modifications may be made to the embodiments set forth herein without departing from the scope and spirit of the present disclosure.
In the description of the present invention, it is to be understood that the terms "central," "longitudinal," "lateral," and the like are used in the orientations and positional relationships illustrated in the accompanying drawings for convenience in describing the present invention and for simplicity in description, and do not indicate or imply that the elements so referred to must have a particular orientation, be constructed and operated in a particular orientation. The terms "first", "second", etc. are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. The term "plurality" means two or more. The terms "coupled" and "connected" are to be construed broadly and may include, for example, a fixed connection, a removable connection, a unitary connection, a mechanical connection, an electrical connection, a communicative connection, a direct connection, an indirect connection via intermediate media, and may include, but are not limited to, a connection between two elements or an interactive relationship between two elements. The term "and/or" includes any and all combinations of one or more of the associated listed items. The specific meaning of the above terms in the present invention can be understood according to specific situations by those skilled in the art.
In order to explain the technical solution of the present invention, the following description is made by way of specific examples, and only the portions related to the embodiments of the present invention are shown.
As shown in FIG. 1, the utility model provides a battery chip test module for test battery chip, including MCU processing module 1, temperature acquisition module 2, display module 3 and external load interface module 4. Specifically, the temperature acquisition module 2, the display module 3 and the external load interface module 4 are all connected with the MCU processing module 1. The MCU processing module 1 is connected with the battery chip through an external load interface module 4 and is used for acquiring and testing data of the battery chip; the temperature acquisition module 2 acquires temperature data of the battery chip through the MCU processing module 1, converts the temperature data into digital information and sends the digital information to the MCU processing module 1 for testing, and the MCU processing module 1 displays a test result through the display module 3. The battery chip is the electric quantity chip of lithium cell, for example the finished product lithium cell that the model is BQ20Z75 chip preparation, can realize testing voltage difference, current precision, temperature measurement precision, effective chemistry ID, key state flag etc. before the shipment to the finished product lithium cell through this test module, and need not external computer, only need external an electronic load appearance and a 5V power can. The production test efficiency of the lithium battery can be improved, the production cost of the lithium battery can be reduced, the product quality of the lithium battery can be improved, and the lithium battery can meet the test requirements of small-batch manufacturers.
Further, this battery chip test module of implementing still includes the power module 5 who all connects with MCU processing module 1, temperature acquisition module 2, display module 3, external load interface module 4. Specifically, the power supply module 5 includes a capacitor C1 and a capacitor C2 connected in parallel to each other. One ends of the capacitor C1 and the capacitor C2 are grounded, the other ends of the capacitor C1 and the capacitor C2 are connected with each other, and a connection point (a rated voltage output end) is used for outputting rated voltage outwards, wherein the rated voltage is 5V. Furthermore, the capacitors C1 and C2 are used as power input filter capacitors, so as to make the external output 5V dc power supply more stable and reliable. The input power of the power supply module 5 is an external adapter power supply, such as a charger. More specifically, the MCU processing module 1 includes a first chip U1, a work instruction circuit 11, a sound prompt circuit 12, a port control circuit 13, a test control circuit 14, and a reset circuit 15. The work indication circuit 11, the voice prompt circuit 12, the port control circuit 13, the test control circuit 14 and the reset circuit 15 are all connected to the first chip U1. In the embodiment, the model number of the first chip U1 is preferably P-NANOV 3. The size of the P-NANOV3 is very small, the size of the module can be effectively reduced, and the double-row pins are led out to be directly inserted on a bread board and can be flexibly connected with other modules through DuPont terminals.
It should be noted that the first chip U1 further includes an input voltage Vin and a data output serial port Dout. The input voltage Vin is supplied with power through the USB, and a user can read test data stored in the first chip U1 (register) at the time of test through the data output serial port Dout. According to the utility model discloses a design, need be forbidden with input voltage Vin and data output serial ports Dout, and carry out data transmission through the external electronic load appearance of external load interface module 4 to and provide the 5V power through a power supply module. The P-NANOV3 has 30 pins, of which 10 are used in this embodiment. Wherein, pin 1(D13) is used as I2C data bus, and is connected to the working indication circuit 11, for example, when the indicator light is red, it indicates that the module is in test state; the a4 analog port corresponding to the pin 8 is used as an I2C data bus in this embodiment, and is connected to the display module 3 and the external load interface module 4 for displaying and acquiring test data; the a5 analog port corresponding to the pin 9 is used as an I2C clock bus in this embodiment, is connected to the display module 3 and the external load interface module 4, and is used for clock synchronization during testing; the pin 12 is a bidirectional power supply pin and is connected with the power supply module 5(5V external power supply); the pin 13(RST) is a system reset pin and connected to the reset circuit 15; the pin 14 is GND and is connected to a ground end; the pin 20(D2) is an external interrupt, is connected to the test control circuit 14, and implements an interrupt or retest through the test control circuit 14, and triggers an interrupt when the test control circuit 14 outputs a low level, or a rising edge and a falling edge; the pin 21(D3) is used as an SPI bus, is connected with the temperature acquisition module 2 and is used for acquiring the temperature data of a battery chip of the battery; a pin 22(D4) digital input or output connected to the port control circuit 13 for input and output of test data; pin 23(D5) is a digital input or output. And the voice prompt circuit 12 is connected to pre-warn the detected abnormal data or perform voice prompt on the working state of the module.
Further, the operation indication circuit 11 includes a transistor Q1, a light emitting diode D1, and a resistor R1 connected in series in this order. Specifically, the base (B) of the triode Q1 is connected with the pin 1 of the first chip U1, the collector (C) thereof is connected with the rated voltage, and the emitter (E) thereof is connected with the anode (a) of the light emitting diode D1; the cathode (K) of the light emitting diode D1 is connected to one end of the resistor R1, and the other end of the resistor R1 is grounded. The light emitting diode D1 of this embodiment is a red light emitting diode, and when this module is in the test process, indicates through giving instructions red light, or when the test data exists unusually, is used for red light scintillation early warning. The sound prompt circuit 12 includes a buzzer, a diode D2, and a winding resistor RX 1. Specifically, the anode of the buzzer and the cathode of the diode D2 are both connected to the pin 23 of the first chip U1, the cathode of the buzzer and the anode of the diode D2 are both connected to one end of the winding resistor RX1, and the other end of the winding resistor RX1 is grounded. The voice prompt circuit 12 is used for early warning of detected abnormal data or performing voice prompt on the working state of the module.
Further, the port control circuit 13 includes a winding resistor RX2, a transistor Q2, a diode D3, and a relay switch K. Specifically, one end of the winding resistor RX2 is connected to the pin 22 of the first chip U1, and the other end thereof is connected to the base (B) of the transistor Q2; an emitter (E) of the triode Q2 is connected with rated voltage, and a collector (C) of the triode Q2 is connected with the cathode of the diode and a pin 1 of the relay switch K; the anode of the diode is connected with the pin 2 of the relay switch K and is grounded; a pin 3 of the relay switch K is connected with a first port J2-2 of the battery chip testing module, a pin 4 of the relay switch K is connected with a second port J2-1 of the battery chip testing module, and a pin 5 of the relay switch K is reserved; the first port J2-2 and the second port J2-1 are interfaces for data communication between the battery chip testing module and the battery chip and between the battery chip and external equipment (e.g., a PC). It should be noted that the relay switch K is a 5-pin relay, the pins 1 and 2 are connected to a non-polar coil, the pin 3 is a COM common terminal, the pin 4 is NC (normally closed), and the pin 5 is NO (normally open). Further, the test control circuit 14 includes a switch S1 and a resistor R2. The pin 20 of the first chip U1 is connected between the switch S1 and the resistor R2, one end of the switch S1 is grounded, and one end of the resistor R2 is connected to a rated voltage. The reset circuit 15 includes a switch S2 and a resistor R3. The pin 13 of the first chip U1 is connected between the switch S2 and the resistor R3, one end of the switch S2 is grounded, and one end of the resistor R3 is connected to a rated voltage.
The temperature acquisition module 2 of this implementation includes second chip U2, emitting diode D4, resistance R4 and resistance R5, and the preferred model of the second chip U2 of this implementation is DS18B 20. Specifically, a pin 1 of the second chip U2 is connected with a negative electrode of the light emitting diode D4 and grounded, a pin 2 of the second chip U2 and one end of the resistor R4 are both connected with a pin 21 of the first chip U1, a pin 3 of the second chip U2, the other end of the resistor R4 and one end of the resistor R5 are both connected, and a connection point is connected to a rated voltage; the other end of the resistor R5 is connected to the anode of the led D4. It should be noted that pin 1 of the second chip U2 is GND, pin 2 is DATA, the digital signal input/output terminal, and pin 3 is an external power supply input terminal. The DS18B20 is a commonly used digital temperature sensor, and when the sensor is connected to the first chip U1 in a single bus interface manner, only one port line is needed to achieve bidirectional communication. The single bus has the advantages of good economy, strong anti-interference capability, suitability for on-site temperature measurement in severe environment, convenience in use and the like, and the DS18B20 has the characteristics of small volume, low hardware overhead, strong anti-interference capability and high precision, so that the cost and the volume of the module can be effectively reduced.
The display module 3 of the present embodiment includes a third chip U3 and a fourth chip U4, and the models of the third chip U3 and the fourth chip U4 are preferably LCDs 2004. Specifically, pin 1 of the third chip U3 and pin 1 of the fourth chip U4 are both connected to pin 14 of the first chip U1 and grounded; the pins 2 of the third chip U3 and the fourth chip U4 are both connected with the pin 12 of the first chip U1, and the connection point is connected with rated voltage; the pins 3 of the third chip U3 and the fourth chip U4 are connected with the pins 8 of the first chip U1; pins 4 of the third chip U3 and the fourth chip U4 are connected to pins 9 of the first chip U1. It should be noted that pin 1 of the third chip U3 and the fourth chip U4 is GND, pin 2 is an external power input terminal, pin 3(SDA) is a data input interface, and pin 4(SCL) is a clock data interface.
The external load interface module 4 of this embodiment includes a diode D5, a diode D6, a diode D7, a diode D8, a resistor R6, a resistor R7, a third port J1-1, a fourth port J1-2, and a fifth port J1-3. Specifically, the anode of the diode D5, the cathode of the diode D6, and one end of the resistor R6 are all connected to a connection point of a pin 4 of the third chip and a pin 4 of the fourth chip and are connected to the fourth port J1-2 through a wire, the anode of the diode D5 is connected to the cathode of the diode D6, the cathode of the diode D5 is connected to one end of the resistor R6, the connection point is connected to a rated voltage, the anode of the diode D6 is grounded, and the other end of the resistor R6 is connected between the diode D5 and the diode D6. The anode of the diode D7, the cathode of the diode D8 and one end of the resistor R7 are connected with the connection point of the pin 3 of the third chip and the pin 3 of the fourth chip and are communicated with the third port J1-1 through a lead, the anode of the diode D7 is connected with the cathode of the diode D8, the cathode of the diode D7 is connected with one end of the resistor R7, the connection point is connected with rated voltage, the anode of the diode D8 is grounded, and the other end of the resistor R7 is connected between the diode D7 and the diode D8. The fifth port J1-3 is grounded, the third port J1-1, the fourth port J1-2 and the fifth port J1-3 are used for being connected with an electronic load instrument, and the electronic load instrument is connected with an electric quantity chip of the lithium battery.
The battery chip testing module of this embodiment still includes the casing (not illustrated in the figure) that is used for encapsulation and protects MCU processing module 1, temperature acquisition module 2, display module 3 and external load interface module 4, and this casing can pass through 3D and print design appearance structure.
To sum up, this embodiment realizes testing battery power calculating chip through setting up MCU processing module, temperature acquisition module, display module, external load interface module, and then realizes carrying out comparatively comprehensive test to voltage difference, current precision, temperature measurement accuracy, effective chemical ID, key status flag bit etc. before the finished product battery shipment, and this module does not need external computer, only need external an electronic load appearance and a 5V power can. In addition, the test module has the advantages of less adopted element equipment, simple structure and lower development cost, and can achieve good detection effect and efficiency, thereby improving the production test efficiency, reducing the production cost and improving the product quality; furthermore, the utility model discloses can be applied to the test demand that small batch production firm calculated the chip to battery power.
While the invention has been described with reference to a preferred embodiment, it will be understood by those skilled in the art that various changes may be made and equivalents may be substituted for elements thereof without departing from the spirit and scope of the invention. In addition, many modifications may be made to adapt a particular situation or material to the teachings of the invention without departing from the essential scope thereof. Therefore, the present invention is not limited to the specific embodiments disclosed herein, and all embodiments falling within the scope of the claims of the present application belong to the protection scope of the present invention.

Claims (10)

1. A battery chip testing module is used for testing a battery chip and is characterized by comprising an MCU processing module, a temperature acquisition module, a display module and an external load interface module;
the temperature acquisition module, the display module and the external load interface module are all connected with the MCU processing module;
the MCU processing module is connected with the battery chip through the external load interface module and is used for acquiring and testing data of the battery chip; the temperature acquisition module acquires temperature data of the battery chip through the MCU processing module, converts the temperature data into digital information and sends the digital information to the MCU processing module for testing;
and the MCU processing module displays the test result through the display module.
2. The battery chip testing module of claim 1, further comprising a power supply module connected to the MCU processing module, the temperature acquisition module, the display module, and the external load interface module;
the power supply module comprises a capacitor C1 and a capacitor C2 which are connected in parallel, wherein one ends of the capacitor C1 and the capacitor C2 are both grounded, the other ends of the capacitor C1 and the capacitor C2 are connected with each other, and a connection point is used for outputting rated voltage outwards.
3. The battery chip testing module set of claim 2, wherein the MCU processing module comprises a first chip U1, a working indication circuit, a voice prompt circuit, a port control circuit, a test control circuit, and a reset circuit;
the work indication circuit, the sound prompt circuit, the port control circuit, the test control circuit and the reset circuit are all connected with the first chip U1;
the model of the first chip U1 is P-NANOV 3.
4. The battery chip testing module set of claim 3, wherein the operation indicating circuit comprises a transistor Q1, a light emitting diode D1 and a resistor R1 connected in series in sequence;
the base of the triode Q1 is connected with the pin 1 of the first chip U1, the collector of the triode Q1 is connected with the rated voltage, and the emitter of the triode Q1 is connected with the anode of the light-emitting diode D1; the cathode of the light emitting diode D1 is connected with one end of the resistor R1, and the other end of the resistor R1 is grounded.
5. The battery chip testing module set of claim 4, wherein the sound prompt circuit comprises a buzzer, a diode D2 and a winding resistor RX 1;
the anode of the buzzer and the cathode of the diode D2 are both connected to the pin 23 of the first chip U1, the cathode of the buzzer and the anode of the diode D2 are both connected to one end of the winding resistor RX1, and the other end of the winding resistor RX1 is grounded.
6. The battery chip test module set forth in claim 5, wherein the port control circuit comprises a winding resistor RX2, a transistor Q2, a diode D3, and a relay switch K;
one end of the winding resistor RX2 is connected with the pin 22 of the first chip U1, and the other end of the winding resistor RX2 is connected with the base of the triode Q2;
the emitter of the triode Q2 is connected with the rated voltage, and the collector of the triode Q2 is connected with the cathode of the diode and the pin 1 of the relay switch K;
the anode of the diode is connected with the pin 2 of the relay switch K and is grounded;
a pin 3 of the relay switch K is connected with a first port of the battery chip testing module, a pin 4 of the relay switch K is connected with a second port of the battery chip testing module, and a pin 5 of the relay switch K is reserved;
the first port and the second port are interfaces for data communication between the battery chip testing module and the battery chip and between the battery chip testing module and external equipment respectively.
7. The battery chip test module of claim 6, wherein the test control circuit comprises a switch S1 and a resistor R2;
the pin 20 of the first chip U1 is connected between the switch S1 and the resistor R2, one end of the switch S1 is grounded, and one end of the resistor R2 is connected to the rated voltage;
the reset circuit comprises a switch S2 and a resistor R3;
the pin 13 of the first chip U1 is connected between the switch S2 and the resistor R3, one end of the switch S2 is grounded, and one end of the resistor R3 is connected to the rated voltage.
8. The battery chip testing module set of claim 7, wherein the temperature collecting module comprises a second chip U2, a light emitting diode D4, a resistor R4 and a resistor R5;
the model of the second chip U2 is DS18B 20;
a pin 1 of the second chip U2 is connected with the cathode of the light emitting diode D4 and grounded, a pin 2 of the second chip U2 and one end of the resistor R4 are both connected with a pin 21 of the first chip U1, a pin 3 of the second chip U2, the other end of the resistor R4 and one end of the resistor R5 are all connected, and the connection point is connected with the rated voltage;
the other end of the resistor R5 is connected with the anode of the light-emitting diode D4.
9. The battery chip test module according to claim 8, wherein the display module comprises a third chip U3, a fourth chip U4;
the models of the third chip U3 and the fourth chip U4 are both LCD 2004;
the pins 1 of the third chip U3 and the fourth chip U4 are connected with the pin 14 of the first chip U1 and grounded;
the pins 2 of the third chip U3 and the fourth chip U4 are both connected with the pin 12 of the first chip U1, and the connection point is connected with the rated voltage;
the pins 3 of the third chip U3 and the fourth chip U4 are connected with the pins 8 of the first chip U1;
the pins 4 of the third chip U3 and the fourth chip U4 are connected with the pins 9 of the first chip U1.
10. The battery chip testing module of claim 9, wherein the external load interface module comprises a diode D5, a diode D6, a diode D7, a diode D8, a resistor R6, a resistor R7, a third port, a fourth port, and a fifth port;
the anode of the diode D5, the cathode of the diode D6 and one end of the resistor R6 are all connected with the connection points of the pin 4 of the third chip and the pin 4 of the fourth chip and are communicated with the fourth port through wires; the anode of the diode D5 is connected with the cathode of the diode D6, the cathode of the diode D5 is connected with one end of the resistor R6, and the connection point is connected with the rated voltage; the anode of the diode D6 is grounded; the other end of the resistor R6 is connected between the diode D5 and the diode D6;
the anode of the diode D7, the cathode of the diode D8 and one end of the resistor R7 are all connected with the connection points of the pin 3 of the third chip and the pin 3 of the fourth chip and are communicated with the third port through wires; the anode of the diode D7 is connected with the cathode of the diode D8, the cathode of the diode D7 is connected with one end of the resistor R7, and the connection point is connected with the rated voltage; the anode of the diode D8 is grounded; the other end of the resistor R7 is connected between the diode D7 and the diode D8;
the fifth port is connected to ground.
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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN116819287A (en) * 2023-08-28 2023-09-29 成都电科星拓科技有限公司 Power IC self-detection method

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN116819287A (en) * 2023-08-28 2023-09-29 成都电科星拓科技有限公司 Power IC self-detection method
CN116819287B (en) * 2023-08-28 2023-11-17 成都电科星拓科技有限公司 Power IC self-detection method

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