CN216013499U - High-efficient accurate multichannel thermistor testing arrangement - Google Patents
High-efficient accurate multichannel thermistor testing arrangement Download PDFInfo
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- CN216013499U CN216013499U CN202121325547.0U CN202121325547U CN216013499U CN 216013499 U CN216013499 U CN 216013499U CN 202121325547 U CN202121325547 U CN 202121325547U CN 216013499 U CN216013499 U CN 216013499U
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Abstract
This novel high-efficient accurate multichannel thermistor testing arrangement involves thermistor chip resistance test accuracy and improves work efficiency, and this kind of multichannel thermistor test equipment mainly contains intelligent direct current low resistance tester and data analysis software and thermistor chip resistance test fixture and constitutes. The data analysis terminal is electrically connected to the multi-path intelligent direct current resistance tester, the multi-path intelligent direct current resistance tester is electrically connected to the thermistor chip test fixture, and the chip carrier plate is placed on the thermistor chip test fixture. The utility model has the beneficial effects that: the resistance value of the thermistor chip is detected through the thermistor chip testing jig, and the multi-path intelligent direct current resistance tester adjusts the tested value and receives the detected value and sends the value to the data analysis terminal, so that the resistance value test of the thermistor chip is improved, the accuracy of the resistance value of the thermistor chip is effectively improved, and meanwhile, the production efficiency is greatly improved.
Description
Technical Field
This novel high-efficient accurate multichannel thermistor testing arrangement involves thermistor test equipment field, especially involves chip resistance test field.
Background
The resistance value of the thermistor chip is reduced by silver after the blank sheet is sintered, and the silver brushing diameter of the whole batch of products is determined by the resistance value obtained after sampling, so that the resistance value range of the whole batch of products can meet the required requirement.
When using single-channel thermistor tester to test the sample because test fixture is simple (by test wire and copper connection point survey), the operation personnel need test the chip on the one hand, carries out the computer on the other hand and types, and data make mistakes easily, and is inefficient, also can't satisfy the quick growth requirement of production at the chip selective examination in-process after reducing in bulk. Therefore, it is the most urgent matter to improve the resistance testing capability of the thermistor chip.
The researcher finally releases the testing device with the fastest testing speed and convenient operation through a large amount of test data verification in the last year, so that the direct, efficient and accurate multichannel thermistor testing device is displayed, the accuracy of the resistance value of the testing chip is improved, and the production efficiency is also improved.
SUMMERY OF THE UTILITY MODEL
The utility model aims to provide a high-efficiency, accurate and multi-path thermistor testing device.
An efficient and accurate multi-path thermistor testing device, comprising: the data analysis terminal is electrically connected with the multi-path intelligent direct current resistance tester, the multi-path intelligent direct current resistance tester is electrically connected with the thermistor chip test fixture, and the chip carrier plate is placed on the thermistor chip test fixture.
Specifically, thermistor chip test fixture mainly by detect base, chip support plate mount pad, push down and detect the masterplate and push down the cylinder and constitute, push down the cylinder and install on detecting the base through the support and drive through the push rod and push down and detect the masterplate and move from top to bottom along the spacing slide bar in four corners, push down and detect the masterplate and be located the top of chip support plate mount pad.
Specifically, the chip carrier mounting seat is provided with a chip slot which is recessed downwards, and the chip carrier is placed in the chip slot of the chip carrier mounting seat.
Specifically, the front end of the detection base is provided with a rotary switch, a descending button and an ascending button.
Specifically, the pressing detection template is at least provided with a detection probe, the detection probes correspond to the hole sites of the chip carrier plate one by one, the detection probes are electrically connected to the multi-path intelligent direct-current resistance tester, and the detection probes are used for contacting the silver surface of the chip and detecting the resistance of the chip.
The utility model has the beneficial effects that: the resistance value of the thermistor chip is detected through the thermistor chip testing jig, and the multi-path intelligent direct current resistance tester adjusts the tested value and receives the detected value and sends the value to the data analysis terminal, so that the resistance value test of the thermistor chip is improved, the accuracy of the resistance value of the thermistor chip is effectively improved, and meanwhile, the production efficiency is greatly improved.
Drawings
FIG. 1 is a schematic structural diagram of the present invention.
Description of the labeling: the device comprises a detection base 1, a chip carrier plate mounting seat 2, a downward pressing detection template 3, a downward pressing cylinder 4, a detection probe 5 and a chip carrier plate 6.
Detailed Description
The drawings are for illustrative purposes only and are not to be construed as limiting the patent; for the purpose of better illustrating the embodiments, certain features of the drawings may be omitted, enlarged or reduced, and do not represent the size of an actual product; it will be understood by those skilled in the art that certain well-known structures in the drawings and descriptions thereof may be omitted. The positional relationships depicted in the drawings are for illustrative purposes only and are not to be construed as limiting the present patent.
As shown in fig. 1, an efficient and accurate multi-channel thermistor testing device comprises: the data analysis terminal is electrically connected with the multi-path intelligent direct current resistance tester, the multi-path intelligent direct current resistance tester is electrically connected with the thermistor chip test fixture, and the chip carrier plate is placed on the thermistor chip test fixture.
According to the scheme, the thermistor chip test fixture is mainly composed of a detection base, a chip carrier plate mounting seat, a downward pressing detection template and a downward pressing cylinder, the downward pressing cylinder is installed on the detection base through a support and drives the downward pressing detection template to move up and down along limiting slide rods at four corners through a push rod, and the downward pressing detection template is located above the chip carrier plate mounting seat. The chip carrier plate mounting seat is provided with a chip groove position which is sunken downwards, and the chip carrier plate is placed in the chip groove position of the chip carrier plate mounting seat. The front end of the detection base is provided with a rotary switch, a descending button and an ascending button. The pressing detection template is at least provided with a detection probe, the detection probes correspond to the hole sites of the chip carrier plate one by one, and the detection probes are electrically connected to the multi-path intelligent direct current resistance tester.
And (3) detection: 1. and placing the chip carrier plate on the thermistor chip test fixture after the chip is placed on the chip carrier plate. 2. And pressing down a descending button, connecting a detection probe on the detection template to a chip placed on the chip carrier plate by pressing down, and pressing down a test button to test. 3. The tested data is sent to data analysis software for analysis.
This high-efficient accurate multichannel thermistor testing arrangement adopts multichannel intelligent direct current resistance tester, and the instrument has multichannel scanning test function, and multi-functional array keyboard cooperates with software, and the demonstration is directly perceived. The data analysis software is matched with the intelligent direct-current low-resistance tester and the data analysis software, so that the obtained data is accurate, and the speed of testing the resistance value of the thermosensitive chip is obviously improved. The thermistor chip resistance jig can effectively eliminate the error of a test line by measuring the high-precision constant current flowing through the thermistor chip and five ends. By improving the multi-channel thermistor testing equipment, the accuracy of the resistance value of the thermistor chip is effectively improved, and meanwhile, the production efficiency is greatly improved.
It should be understood that the above-described embodiments of the present invention are merely examples for clearly illustrating the present invention, and are not intended to limit the embodiments of the present invention. Other variations and modifications will be apparent to persons skilled in the art in light of the above description. And are neither required nor exhaustive of all embodiments. Any modification, equivalent replacement, and improvement made within the spirit and principle of the present invention should be included in the protection scope of the claims of the present invention.
Claims (5)
1. An efficient and accurate multi-path thermistor testing device comprises: data analysis terminal, multichannel intelligent direct current resistance tester, chip carrier plate and thermistor chip test fixture, its characterized in that: the data analysis terminal is electrically connected to the multi-path intelligent direct current resistance tester, the multi-path intelligent direct current resistance tester is electrically connected to the thermistor chip test jig, and the chip carrier plate is placed on the thermistor chip test jig.
2. An efficient and accurate multi-channel thermistor testing device according to claim 1, characterized in that: thermistor chip test fixture mainly by detect base, chip support plate mount pad, push down and detect the masterplate and push down the cylinder and constitute, push down the cylinder and install on detecting the base through the support and drive through the push rod and push down and detect the masterplate and move from top to bottom along the spacing slide bar in four corners, push down and detect the masterplate and be located the top of chip support plate mount pad.
3. An efficient and accurate multi-channel thermistor testing device according to claim 2, characterized in that: the chip carrier plate mounting seat is provided with a chip groove position which is sunken downwards, and the chip carrier plate is placed in the chip groove position of the chip carrier plate mounting seat.
4. An efficient and accurate multi-path thermistor testing device according to claim 3, characterized in that: the front end of the detection base is provided with a rotary switch, a descending button and an ascending button.
5. The apparatus according to claim 4, wherein the apparatus further comprises: the pressing detection template is at least provided with a detection probe, the detection probes correspond to the hole sites of the chip carrier plate one by one, and the detection probes are electrically connected to the multi-path intelligent direct current resistance tester.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202121325547.0U CN216013499U (en) | 2021-06-15 | 2021-06-15 | High-efficient accurate multichannel thermistor testing arrangement |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202121325547.0U CN216013499U (en) | 2021-06-15 | 2021-06-15 | High-efficient accurate multichannel thermistor testing arrangement |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN216013499U true CN216013499U (en) | 2022-03-11 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202121325547.0U Active CN216013499U (en) | 2021-06-15 | 2021-06-15 | High-efficient accurate multichannel thermistor testing arrangement |
Country Status (1)
| Country | Link |
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| CN (1) | CN216013499U (en) |
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2021
- 2021-06-15 CN CN202121325547.0U patent/CN216013499U/en active Active
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