CN215990818U - Radio frequency test system - Google Patents
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- CN215990818U CN215990818U CN202122357811.5U CN202122357811U CN215990818U CN 215990818 U CN215990818 U CN 215990818U CN 202122357811 U CN202122357811 U CN 202122357811U CN 215990818 U CN215990818 U CN 215990818U
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Abstract
The utility model discloses a radio frequency test system. The radio frequency test system comprises: the device comprises a test terminal, an interface conversion device, complete equipment to be tested and a comprehensive tester. The test terminal is respectively and electrically connected with the interface conversion device and the comprehensive tester, and the complete equipment to be tested is respectively and electrically connected with the interface conversion device and the comprehensive tester. The interface conversion device is used for connecting the test terminal and the complete equipment to be tested, so that the compatibility of the test terminal is improved, and the radio frequency test of the communication module of the complete equipment to be tested with different chip schemes is realized.
Description
Technical Field
The utility model relates to the field of wireless communication, in particular to a radio frequency test system.
Background
High frequency electromagnetic waves with long distance transmission capability are called radio frequency, and the radio frequency technology is widely used in the field of wireless communication, wherein, in order to ensure the product quality, radio frequency tests are required to be carried out on wireless products before the wireless products leave factories. In a conventional technical means, two ways are generally adopted for performing radio frequency testing, one way is to perform testing through a testing tool provided by a chip manufacturer, different testing tools are used in different chip schemes, but the testing tools can communicate with other equipment through a processor interface, at the moment, the testing tools cannot directly control a communication module to perform radio frequency testing, and the other way is that a communication module of the whole equipment is connected with a comprehensive tester in a signaling mode to perform testing. At present, a test tool compatible with different chip schemes of the whole device is needed to perform radio frequency calibration and radio frequency test of the communication module.
SUMMERY OF THE UTILITY MODEL
The utility model provides a radio frequency test system, aiming at solving the technical problem of how to carry out radio frequency test on a communication module by being compatible with chip schemes of different complete equipment.
In order to achieve the above object, the present invention provides a radio frequency test system, including: the system comprises a test terminal, an interface conversion device, complete equipment to be tested and a comprehensive tester; the test terminal is respectively and electrically connected with the interface conversion device and the comprehensive tester, and the complete machine equipment to be tested is respectively and electrically connected with the interface conversion device and the comprehensive tester.
Optionally, an input module and an interface microcontroller are arranged inside the interface conversion device; the input module is electrically connected with the interface microcontroller, and the interface microcontroller is respectively electrically connected with the test terminal and the complete machine equipment to be tested.
Optionally, the input module comprises a key.
Optionally, a complete machine microcontroller and a communication module are arranged inside the complete machine device to be tested, and the communication module is electrically connected with the complete machine microcontroller and the comprehensive tester respectively.
Optionally, the complete machine microcontroller is electrically connected with an interface microcontroller arranged inside the interface conversion device.
Optionally, a radio frequency port is arranged in the communication module, and the radio frequency port is electrically connected with the comprehensive tester.
Optionally, the radio frequency test system includes a power supply, and the power supply is electrically connected to the test terminal, the interface conversion device, the complete device to be tested, and the comprehensive tester, respectively.
Optionally, an interface is disposed in the interface conversion device, and an electrical connection with the test terminal and the complete device to be tested is established through the interface.
Optionally, the interface is at least one of a USB, a network port or a UART port.
Optionally, the radio frequency test system includes a plurality of alternative complete devices to be tested; and the equipment state of the standby complete equipment to be tested is set to be a starting-up state.
The technical scheme of the utility model is that the test terminal, the interface conversion device, the complete equipment to be tested and the comprehensive tester are arranged, wherein the test terminal is respectively and electrically connected with the interface conversion device and the comprehensive tester, and the complete equipment to be tested is respectively and electrically connected with the interface conversion device and the comprehensive tester. The interface conversion device is respectively connected with the test terminal and the complete equipment to be tested, so that the compatibility of the test terminal is improved, and the radio frequency test of the communication module of the complete equipment to be tested with different chip schemes is realized.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to the structures shown in the drawings without creative efforts.
FIG. 1 is a block diagram of an RF test system according to an embodiment of the present invention;
FIG. 2 is a block diagram showing the structure of an interface conversion apparatus in FIG. 1;
FIG. 3 is a block diagram of the overall device under test of FIG. 1;
FIG. 4 is a block diagram of an overall RF test system according to an embodiment of the utility model.
The reference numbers illustrate:
| reference numerals | Name (R) | Reference numerals | Name (R) |
| 1 | Radio |
30 | Whole equipment to be tested |
| 10 | |
31 | Microcontroller for |
| 20 | |
32 | |
| 21 | |
40 | Comprehensive |
| 22 | |
50 | Power supply |
The implementation, functional features and advantages of the objects of the present invention will be further explained with reference to the accompanying drawings.
Detailed Description
The technical solutions in the embodiments will be described clearly and completely with reference to the drawings in the embodiments, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
It should be noted that all the directional indications (such as up, down, left, right, front, and rear … …) in the present embodiment are only used to explain the relative positional relationship between the components, the movement, and the like in a specific posture (as shown in the drawings), and if the specific posture is changed, the directional indication is changed accordingly.
In addition, the descriptions related to "first", "second", etc. in the present invention are for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include at least one such feature. In addition, technical solutions between various embodiments may be combined with each other, but must be realized by a person skilled in the art, and when the technical solutions are contradictory or cannot be realized, such a combination should not be considered to exist, and is not within the protection scope of the present invention.
As shown in fig. 1, the present invention provides a radio frequency test system 1.
The radio frequency test system 1 comprises: the system comprises a test terminal 10, an interface conversion device 20, complete equipment to be tested 30 and a comprehensive tester 40; the test terminal 10 is electrically connected to the interface conversion device 20 and the comprehensive tester 40, respectively, and the complete machine device 30 to be tested is electrically connected to the interface conversion device 20 and the comprehensive tester 40, respectively. The test terminal 10 is configured to send a test instruction to the interface conversion apparatus 20; the interface conversion device 20 is configured to receive a test instruction sent by the test terminal 10, and send the test instruction to the complete device to be tested 30; the complete device to be tested 30 is configured to receive the test instruction sent by the interface conversion apparatus 20, and execute the test operation corresponding to the test instruction.
In this embodiment, the test terminal 10 may be a terminal device such as a computer, a tablet, or a notebook, and the test terminal 10 includes a test tool for performing a test. The whole device to be tested 30 refers to a device to be tested, such as a mobile phone, a tablet, a 4G/5G router, an internet of things gateway, and the like. The test instruction is an instruction for controlling the device under test to perform a related test operation, and the test instruction can enable the complete device under test 30 to determine the test operation to be performed. The test instructions may be radio frequency calibration, e.g., radio frequency parameter calibration; it may also be a radio frequency test, e.g. a radio frequency power test, a sensitivity test. The test operation is an operation of performing a test. The test terminal 10 is electrically connected to the interface conversion device 20, and sends a test instruction to the complete device under test 30. Specifically, a tester triggers the operation of a related test tool in the test terminal 10 to enable the test terminal 10 to determine a test instruction, and sends the test instruction to the interface conversion device 20 electrically connected to the test instruction, the interface conversion device 20 is electrically connected to the complete equipment to be tested 30, after receiving the test instruction sent by the test terminal 10, the test instruction sent by the test terminal 10 is forwarded to the complete equipment to be tested 30, and after receiving the test instruction, the complete equipment to be tested 30 executes a related test operation according to the test instruction.
The comprehensive tester 40 is electrically connected with the test terminal 10 and the complete machine equipment to be tested 30 respectively. The comprehensive tester 40 is used for sending test data to the test terminal 10 electrically connected with the comprehensive tester; the test terminal 10 is further configured to receive the test data, and obtain a test result according to the test data.
The comprehensive tester 40 is electrically connected to the test terminal 10, and is configured to send test data generated by analysis during test interaction with the complete device under test 30 to the test terminal 10, so that the test terminal 10 obtains a test result according to the test data after receiving the test data. For example, when performing radio frequency calibration, parameters in the complete device to be tested 30 need to be adjusted, after the test terminal 10 sends a relevant test instruction to the complete device to be tested 30 through the interface conversion device 20 electrically connected to the test terminal, the complete device to be tested 30 sends a corresponding parameter test signal to the comprehensive tester 40 according to the test instruction, the comprehensive tester 40 analyzes the parameter test signal to obtain relevant parameter information of the complete device to be tested 30, the parameter information is test data, the comprehensive tester 40 sends the parameter information to the test terminal 10 electrically connected to the comprehensive tester 40, and after obtaining the parameter information, the test terminal 10 can compare a standard value with the current parameter information to correspondingly adjust the relevant parameters in the complete device to be tested 30. It can be understood that, when testing the radio frequency emission performance of the complete device under test 30, the complete device under test 30 sends a signal to the comprehensive tester 40; when testing the rf receiving performance of the complete device under test 30, the integrated tester 40 sends an rf signal to the complete device under test 30.
The interface conversion device 20 forwards the test instruction, and forwards the test instruction sent by the test terminal 10 electrically connected to the interface conversion device 20 to the complete device under test 30 electrically connected to the interface conversion device 20, or forwards the instruction sent from the complete device under test 30 to the test terminal 10 through the interface conversion device 20. The situation that the test terminal 10 needs to be replaced according to the chip scheme of the complete machine device 30 to be tested due to the fact that the complete machine device 30 to be tested is directly connected with the test terminal 10 to cause interface incompatibility is avoided, interface conversion between the complete machine device 30 to be tested and the test terminal 10 is achieved through the interface conversion device 20, the test tool in the test terminal 10 is enabled to get rid of dependence on the communication terminal interface in the complete machine device 30 to be tested, compatibility and utilization rate of the test tool are improved, and therefore radio frequency testing of the complete machine device 30 to be tested with different chip schemes is achieved.
Specifically, the interface conversion device 20 is further configured to generate a communication instruction, and send the communication instruction to the complete device under test 30; the complete device to be tested 30 is further configured to receive the communication instruction, enter a transparent transmission mode according to the communication instruction, and execute a test operation in the transparent transmission mode.
In this embodiment, it should be noted that the communication instruction is an instruction for controlling the complete device under test 30 to enter a data transmission mode, where the data transmission mode is a transparent transmission mode, that is, the communication device is only responsible for transmitting the transmitted content from the source address to the destination address regardless of the transmitted service content, and does not change the service data content. The communication command refers to an AT command (Attention, greedy command), wherein an AT command set is transmitted from a Terminal Equipment (TE) or a Data Terminal Equipment (DTE) to a Terminal Adapter (TA) or a Data Circuit Terminal Equipment (DCE). The functions of a Mobile Station (MS) are controlled by the TA, TE sending an AT command to interact with GSM network services. The user can control the aspects of calling, short message, telephone book, data service, fax and the like through the AT instruction. In this embodiment, after the interface conversion device 20 generates the communication instruction, the communication instruction is sent to the complete device under test 30, so that the complete device under test 30 enters a transparent transmission mode according to the received communication instruction, and in the transparent transmission mode, the complete device under test 30 performs a test operation.
The communication instruction generated by the interface conversion device 20 controls the complete equipment to be tested 30 to enter the transparent transmission mode, so that bidirectional transparent transmission communication from the test terminal 10 to the complete equipment to be tested 30 and from the complete equipment to be tested 30 to the test terminal 10 is realized, transmission of the test instruction is realized, and the compatibility of the test system is improved.
Further, referring to fig. 2, the interface conversion device 20 is internally provided with an input module 21 and an interface microcontroller 22; the input module 21 is electrically connected with the interface microcontroller 22; the interface microcontroller 22 is electrically connected to the test terminal 10 and the complete device under test 30, respectively.
The input module 21 is configured to detect an input trigger signal, and send the trigger signal to the interface microcontroller 22 when the trigger signal is detected; the interface microcontroller 22 is configured to receive the trigger signal sent by the input module 21, generate a communication instruction according to the trigger signal, and send the communication instruction to the complete device to be tested 30 electrically connected to the communication instruction.
In this embodiment, it should be noted that the trigger signal is related information input by the tester to the interface conversion apparatus 20, and the trigger signal is trigger condition information of the operation of the interface conversion apparatus 20. The interface conversion device 20 is internally provided with an input module 21 and an interface microcontroller 22, it is understood that the input module 21 may also be provided outside the interface conversion device 20, and electrically connected to the interface conversion device 20; the input module 21 can be electrically connected with the interface microcontroller 22, and the input module 21 can be in communication connection with the interface microcontroller 22; the input module 21 can be other input modules 21 for acquiring the requirements of testers, such as keys, a touch screen, a remote controller and the like; the interface Microcontroller 22 is an MCU (Microcontroller Unit). In this embodiment, the input module 21 includes a key, the interface conversion device 20 detects that the key (the input module 21) is pressed by a tester, that is, detects a trigger signal, the input module 21 sends the trigger signal to the interface microcontroller 22 connected to the input module, and the interface microcontroller 22 generates a communication instruction after receiving the trigger signal, where the communication instruction is a preset instruction for controlling the complete device 30 to be tested, and the interface microcontroller 22 sends the communication instruction to the complete device 30 to be tested.
By arranging the independent interface conversion device 20, the flexible application capability of the interface conversion device 20 is improved, and the input module 21 is arranged on the interface conversion device 20 to obtain the test intention of the tester, so that the test requirement of the tester is met.
In particular, the interface microcontroller 22 comprises a device adaptation program; the device adapter program is in an editable state. In this embodiment, it should be noted that the device adaptation program refers to a program in the interface microcontroller 22, and the simple instruction control automation of the interface microcontroller 22 on the complete device 30 to be tested can be realized through the device adaptation program, specifically, a communication instruction is preset through the device adaptation program, and when the interface microcontroller 22 receives a trigger signal, the communication instruction can be automatically sent to the complete device 30 to be tested. The device adaptation program is in an editable state, that is, the device adaptation program in the interface microcontroller 22 can be modified according to the difference of the MCU modules in the complete device under test 30, so as to implement instruction adaptation for different complete devices under test 30. Thereby improving the compatibility of the interface conversion device 20; the labor and time cost of the test are saved by realizing the simple instruction automation of the whole equipment 30 to be tested.
Further, referring to fig. 3, a complete machine microcontroller 31 and a communication module 32 are arranged inside the complete machine device to be tested 30; the communication module 32 is electrically connected to the complete machine microcontroller 31 and the comprehensive tester 40, respectively. The whole machine microcontroller 31 is configured to receive the communication instruction, enter a transparent transmission mode according to the communication instruction, and control the communication module 32 to execute a test operation in the transparent transmission mode.
Specifically, the complete machine microcontroller 31 is electrically connected to the interface microcontroller 22 disposed inside the interface conversion device 20.
The whole device to be tested 30 comprises a whole microcontroller 31 and a communication module 32, the whole microcontroller 31 is connected with the interface microcontroller 22 in the interface conversion device 20, and the whole microcontroller 31 receives a communication instruction sent by the interface microcontroller 22 and performs a transparent transmission mode according to the communication instruction. The whole Machine microcontroller 31 is an MCU in the whole Machine equipment, and the communication module 32 is a M2M (Machine-to-Machine/Man, communication protocol) module. The whole microcontroller 31 is connected with the communication module 32, and after entering the transparent transmission mode, the whole microcontroller 31 controls the communication module 32 to execute the test operation in the transparent transmission mode.
The interface microcontroller 22 controls the complete machine microcontroller 31 to enter a transparent transmission mode, so that bidirectional transparent transmission communication between the interface microcontroller 22 and the complete machine microcontroller 31 is realized, bidirectional transparent transmission communication between the interface conversion device and the complete machine equipment 30 to be tested is realized, and the compatibility of the interface conversion device 20 to the complete machine equipment 30 to be tested is improved.
Further, referring to fig. 4, the radio frequency test system 1 includes a comprehensive tester 40, and the comprehensive tester 40 is electrically connected to the communication module 32.
The comprehensive tester is specially used for testing RF signal related performance of GSM/TDSCDMA/CDMA2000/WCDMA/LTE products, comprises a mobile phone, a tablet, a 4G/5G router, an Internet of things gateway and the like, is not only suitable for design and development of products, but also can be well used for RF performance calibration and detection of the products in the production process. Each integrated measuring device includes a VSG (vector signal generator) and a VSA (vector analyzer). The VSG can be used as a signal source, and can select to generate a signal of a specific mode to test the receiving performance of a product by matching with a related signal configuration file preset by equipment; the VSA is used for analyzing the received signal and outputting various index parameters related to the signal so as to consider the quality of the signal, and is suitable for the transmission performance test of the product RF module. The integrated tester 40 included in the radio frequency test system 1 is used for acquiring a test signal sent by the complete equipment to be tested 30 when testing the radio frequency emission performance of the complete equipment to be tested 30; the integrated tester 40 is also configured to transmit a signal to the complete device under test 30 when testing the rf receiving performance of the complete device under test 30. Wherein, the integrated tester 40 is connected with the communication module 32 in the complete machine device 30 to be tested. The comprehensive tester 40 and the whole equipment to be tested can be electrically connected or in communication connection. In this example, a non-signaling test mode is used, and therefore, the integrated tester 40 does not need to support a signaling function. After receiving the test instruction sent by the interface conversion device 20, the communication module 32 determines a corresponding test signal according to the test instruction, and sends the test signal to the comprehensive tester 40, so that the comprehensive tester 40 generates test data after receiving the test signal. The test signal refers to the relevant information of the test interaction between the communication module 32 and the comprehensive tester 40; the test data refers to data information obtained by analyzing the test signal by the integrated tester 40. For example, when performing radio frequency calibration, parameters in the complete device to be tested 30 need to be adjusted, the communication module 32 in the complete device to be tested 30 sends corresponding parameter test signals to the comprehensive tester 40 according to the test instruction, and the comprehensive tester 40 analyzes the parameter test signals to obtain relevant parameter information of the complete device to be tested 30, where the parameter information is test data. In one embodiment, the integrated tester 40, such as a spectrum analyzer, in the rf testing system 1 may be replaced according to a specific test item.
Specifically, the communication module 32 is provided with a radio frequency port; the radio frequency port is electrically connected with the comprehensive tester 40. The communication module 32 can also be connected to the comprehensive tester 40 through a radio frequency connector.
The communication module 32 in the complete equipment to be tested 30 is connected with the comprehensive tester 40, so that the comprehensive tester 40 can accurately acquire the radio frequency test information in the complete equipment to be tested 30, the corresponding test data can be determined, and the accuracy of radio frequency test can be improved; and a non-signaling test mode is selected, so that the test time is shortened, the input cost of the comprehensive tester 40 is reduced, and the test cost is further reduced.
Further, the radio frequency test system 1 includes a power supply 50, and the power supply 50 is electrically connected to the test terminal 10, the interface conversion device 20, the complete device to be tested 30, and the comprehensive tester 40, respectively. The power supply 50 is used for providing electric energy for the test terminal 10, the interface conversion device 20, the complete machine equipment to be tested 30 and the comprehensive tester 40.
Further, an interface is disposed in the interface conversion device 20, and an electrical connection with the test terminal 10 and the complete device to be tested 30 is established through the interface.
Specifically, the interface is at least one of a USB, a network port or a UART port.
The interface conversion device 20 is provided with a plurality of different interfaces, for example, interfaces of interface types such as a USB (Universal Serial Bus) interface, a network interface, and a UART (Universal Asynchronous Receiver/Transmitter) interface. The interface conversion device 20 is provided with a plurality of different interfaces connected with the test terminal 10 for connecting the test terminal 10; the interface conversion device 20 is provided with a plurality of different interfaces with the whole device under test 30 for connecting the whole device under test 30.
By arranging a plurality of different interface modes on the interface conversion device 20, the compatibility of the interface conversion device 20 to the test terminal 10 and the complete device to be tested 30 is improved, and the utilization rate of the test terminal 10 is further improved.
Further, the radio frequency test system 1 includes a plurality of alternative complete equipment to be tested 30; the equipment state of the alternative complete equipment to be tested is set to be a starting-up state, and the alternative complete equipment to be tested is used for replacing the complete equipment to be tested 30 after the complete equipment to be tested 30 is tested; the alternative complete equipment to be tested is further configured to execute a test operation corresponding to the alternative complete equipment to be tested 30.
The radio frequency test system 1 includes a plurality of alternative complete equipment to be tested, and the test of the complete equipment to be tested 30 can be started only when the complete equipment to be tested 30 is in a power-on state and the complete equipment to be tested 30 is completely started. And arranging a plurality of complete equipment to be tested 30 as alternative complete equipment to be tested, and replacing the position of the complete equipment to be tested 30 after the test of the complete equipment to be tested 30 currently is finished, so as to test the alternative complete equipment to be tested. For example, when the communication module 32 of the complete device under test 30 performs a test operation, the alternative complete device under test 30 is powered on, so as to ensure that at least 3 complete devices under test are in a power-on state.
The standby complete equipment to be tested can be started and powered on in advance, so that the time for waiting for the startup and the powering on of the complete equipment to be tested 30 before each test is saved, and the test efficiency is improved.
The above description is only a preferred embodiment of the present invention, and not intended to limit the scope of the present invention, and all modifications and equivalents of the technical solutions of the present invention, which are made by using the contents of the present specification and the accompanying drawings, or directly/indirectly applied to other related technical fields, are included in the scope of the present invention.
Claims (10)
1. A radio frequency test system, the radio frequency test system comprising: the system comprises a test terminal, an interface conversion device, complete equipment to be tested and a comprehensive tester; the test terminal is respectively and electrically connected with the interface conversion device and the comprehensive tester, and the complete machine equipment to be tested is respectively and electrically connected with the interface conversion device and the comprehensive tester.
2. The radio frequency test system according to claim 1, wherein the interface conversion device is internally provided with an input module and an interface microcontroller; the input module is electrically connected with the interface microcontroller, and the interface microcontroller is respectively electrically connected with the test terminal and the complete machine equipment to be tested.
3. The radio frequency test system of claim 2, wherein the input module comprises a key.
4. The radio frequency test system according to claim 1, wherein a complete machine microcontroller and a communication module are disposed inside the complete machine device under test, and the communication module is electrically connected to the complete machine microcontroller and the comprehensive tester, respectively.
5. The radio frequency test system according to claim 4, wherein the complete machine microcontroller is electrically connected to an interface microcontroller provided inside the interface conversion apparatus.
6. The radio frequency test system according to claim 4, wherein a radio frequency port is disposed in the communication module, and the radio frequency port is electrically connected to the integrated tester.
7. The rf test system of claim 1, wherein the rf test system comprises a power supply, and the power supply is electrically connected to the test terminal, the interface conversion device, the whole device under test, and the integrated tester, respectively.
8. The radio frequency test system according to claim 1, wherein an interface is provided in the interface conversion apparatus, and an electrical connection with the test terminal and the complete device under test is established through the interface.
9. The radio frequency test system of claim 8, wherein the interface is at least one of a USB, a network port, or a UART port.
10. The radio frequency test system of any one of claims 1-9, wherein the radio frequency test system comprises a plurality of alternative complete machine devices under test; and the equipment state of the standby complete equipment to be tested is set to be a starting-up state.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202122357811.5U CN215990818U (en) | 2021-09-27 | 2021-09-27 | Radio frequency test system |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202122357811.5U CN215990818U (en) | 2021-09-27 | 2021-09-27 | Radio frequency test system |
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| Publication Number | Publication Date |
|---|---|
| CN215990818U true CN215990818U (en) | 2022-03-08 |
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| CN202122357811.5U Active CN215990818U (en) | 2021-09-27 | 2021-09-27 | Radio frequency test system |
Country Status (1)
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|---|---|
| CN (1) | CN215990818U (en) |
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2021
- 2021-09-27 CN CN202122357811.5U patent/CN215990818U/en active Active
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