CN215813189U

CN215813189U - Semiconductor chip packaging test automatic classification device

Info

Publication number: CN215813189U
Application number: CN202121898480.XU
Authority: CN
Inventors: 陈德拥
Original assignee: Shenzhen Dexin Micro Electric Technology Co ltd
Current assignee: Shenzhen Dexin Micro Electric Technology Co ltd
Priority date: 2021-08-13
Filing date: 2021-08-13
Publication date: 2022-02-11
Anticipated expiration: 2031-08-13

Abstract

The utility model provides an automatic classification device for semiconductor chip packaging test, which belongs to the technical field of chip testers and comprises a chip tester, wherein a second hollow groove is formed in the side end of the chip tester; the driving roller is rotatably connected to the close ends of the two fixing rods, the side end of the driving roller movably penetrates through the side end of one fixing rod and extends forwards, and the close ends of the two fixing rods are rotatably connected with a plurality of driven rollers; before the chip gets into the chip tester, the sorting mechanism can separate qualified and unqualified chip for the chip tester is difficult for appearing unqualified chip when testing the chip, has not only practiced thrift the time, and the availability factor is also higher.

Description

Semiconductor chip packaging test automatic classification device

Technical Field

The utility model belongs to the technical field of chip testers, and particularly relates to an automatic classification device for semiconductor chip packaging tests.

Background

The chip detector is a tool for detecting the chip, the type of the detected chip is input through a keyboard, for example, the detected chip is 74LS04, the chip can be input after being input 04, then a confirming key is pressed, the system can detect the chip, the type, the name and the logic expression of the chip and whether the chip can normally work or not are displayed through a display module, or an automatic detection key is directly pressed, and the same effect can be achieved.

In the prior art, after the chip is processed and packaged, a defective chip inevitably occurs, and when a test is required, if the defective chip occurs, the defective chip needs to be manually taken out, and then the next chip is tested, which wastes a lot of time.

SUMMERY OF THE UTILITY MODEL

The utility model aims to provide an automatic sorting device for semiconductor chip packaging test, which aims to solve the problem that when a chip tester in the prior art tests chips, unqualified chips can be encountered, and at the moment, the unqualified chips need to be taken out manually, but the time is wasted.

In order to achieve the purpose, the utility model provides the following technical scheme:

an automatic sorting apparatus for semiconductor chip package testing, comprising:

the side end of the chip tester is provided with a second hollow groove, and the side end of the chip tester is fixedly connected with two fixing rods;

the driving roller is rotatably connected to the close ends of the two fixing rods, the side end of the driving roller movably penetrates through the side end of one fixing rod and extends forwards, and the close ends of the two fixing rods are rotatably connected with a plurality of driven rollers;

the conveying belt is sleeved on the circumferential surfaces of the driving roller and the driven rollers, the lower end of one fixing rod is fixedly connected with a first supporting plate, the upper end of the first supporting plate is fixedly connected with a first motor, and the output shaft of the first motor is fixedly connected with the side end of the driving roller;

the classification mechanism comprises a detection device, a PLC controller, a second support plate, a second motor, a connecting block, a hollow rod, a slide rod and a limiting block, the lower end of the detection device is fixedly connected with the upper end of one of the fixing rods, the side ends of the PLC and the second supporting plate are fixedly connected with the side end of one of the fixing rods, the lower end of the second motor is fixedly connected with the upper end of the second supporting plate, the PLC is in signal connection with the detection device and the second motor, the side end of the connecting block is fixedly connected with the output shaft of the second motor, the circumferential inner wall of the hollow rod is connected with the circumferential surface of the connecting block in a sliding manner, the side end fixed connection of slide bar is in the side of hollow pole, the side end fixed connection of stopper is in the side of one of them dead lever, slide bar sliding connection is in one side inner wall of stopper.

As a preferable scheme of the utility model, a collecting box is fixedly connected to a side end of one of the fixing rods, and a limiting plate is fixedly connected to an upper end of the collecting box.

As a preferable scheme of the present invention, an upper end of one of the fixing rods is fixedly connected with a hollow block, and the sliding rod is slidably connected to an inner wall of one side of the hollow block.

As a preferred embodiment of the present invention, two support rods are fixedly connected to the side end of the chip tester, and the upper ends of the two support rods are respectively and fixedly connected to the lower ends of the two fixing rods.

As a preferable scheme of the present invention, the lower end of the chip tester is provided with a plurality of first hollow grooves, and inner walls of both sides of the plurality of first hollow grooves are rotatably connected with rollers.

As a preferable scheme of the utility model, a handle is fixedly connected to a side end of the chip tester, and an anti-slip sleeve is fixedly connected to a circumferential surface of the handle.

Compared with the prior art, the utility model has the beneficial effects that:

1. in this scheme, the chip is before getting into the chip tester, and sorting mechanism can part qualified and unqualified chip for the chip tester is difficult for appearing unqualified chip in the test chip, has not only practiced thrift the time, and the availability factor is also higher.

2. In this scheme, the gyro wheel can be used to be driven by the chip tester and remove for people are more convenient when removing the chip tester, and the handle can be used to connect the chip tester, makes people more convenient when promoting the chip tester.

3. In this scheme, the collecting box can be used to collect unqualified chip, is convenient for deposit and lets people take, and the limiting plate can be used to spacing chip that is pushed away by the slide bar for the inside that the chip can be accurate falls into the collecting box.

Drawings

The accompanying drawings, which are included to provide a further understanding of the utility model and are incorporated in and constitute a part of this specification, illustrate embodiments of the utility model and together with the description serve to explain the principles of the utility model and not to limit the utility model. In the drawings:

FIG. 1 is a perspective view of the present invention;

FIG. 2 is a bottom view of the present invention;

FIG. 3 is an enlarged view of a portion of the conveyor belt of the present invention;

fig. 4 is a partially enlarged view of the PLC controller of the present invention.

In the figure: 1. a chip tester; 2. a handle; 3. a roller; 4. a conveyor belt; 5. a support bar; 6. a first motor; 7. a first hollow groove; 8. an anti-slip sleeve; 9. a first support plate; 10. a collection box; 11. a drive roll; 12. a driven roller; 13. a limiting plate; 14. fixing the rod; 15. a detection device; 16. a PLC controller; 17. a second support plate; 18. a second motor; 19. connecting blocks; 20. a hollow shaft; 21. a slide bar; 22. a limiting block; 23. a hollow block; 24. a second hollow channel.

Detailed Description

The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.

Example 1

Referring to fig. 1-4, the present invention provides the following technical solutions:

a second hollow groove 24 is formed in the side end of the chip tester 1, and two fixing rods 14 are fixedly connected to the side end of the chip tester 1;

the driving roller 11 is rotatably connected to the close ends of the two fixing rods 14, the side end of the driving roller 11 movably penetrates through the side end of one of the fixing rods 14 and extends forwards, and the close ends of the two fixing rods 14 are rotatably connected with a plurality of driven rollers 12;

the conveying belt 4 is sleeved on the circumferential surfaces of the driving roller 11 and the driven rollers 12, the lower end of one fixed rod 14 is fixedly connected with a first supporting plate 9, the upper end of the first supporting plate 9 is fixedly connected with a first motor 6, and the output shaft of the first motor 6 is fixedly connected with the side end of the driving roller 11;

a sorting mechanism which comprises a detection device 15, a PLC 16, a second support plate 17 and a second motor 18, connecting block 19, hollow rod 20, slide bar 21 and stopper 22, the lower extreme fixed connection of detection device 15 is in the upper end of one of them dead lever 14, the side of PLC controller 16 and second backup pad 17 all fixed connection is in the side of one of them dead lever 14, the lower extreme fixed connection of second motor 18 is in the upper end of second backup pad 17, PLC controller 16 and detection device 15 and second motor 18 signal connection, the side fixed connection of connecting block 19 is in the output shaft of second motor 18, the circumference inner wall sliding connection of hollow rod 20 is in the circumferential surface of connecting block 19, the side fixed connection of slide bar 21 is in the side of hollow rod 20, the side fixed connection of stopper 22 is in the side of one of them dead lever 14, slide bar 21 sliding connection is in the one side inner wall of stopper 22.

In the embodiment of the present invention, the left end of the chip tester 1 is provided with a second hollow groove 24, the left end of the chip tester 1 is fixedly connected with two fixing rods 14, the front end of the driving roller 11 movably penetrates the front ends of the fixing rods 14 at the front side and extends forwards, the lower ends of the fixing rods 14 at the front side are fixedly connected with a first supporting plate 9, the output shaft of a first motor 6 is fixedly connected with the front end of the driving roller 11, the lower end of a detection device 15 is fixedly connected with the upper ends of the fixing rods 14 at the rear side, the front ends of a PLC controller 16 and a second supporting plate 17 are fixedly connected with the rear ends of the fixing rods 14 at the rear side, the right end of a connecting block 19 is fixedly connected with the output shaft of a second motor 18, the rear end of a sliding rod 21 is fixedly connected with the front end of a hollow rod 20, the front end of a limiting block 22 is fixedly connected with the rear end of the fixing rods 14 at the rear side, the lower end of the sliding rod 21 is connected with the lower inner wall of the limiting block 22, the inner circumferential wall of the conveyor belt 4 is sleeved on the circumferential surfaces of the drive roller 11 and the driven rollers 12, so that when the drive roller 11 rotates, the conveyor belt 4 can be driven to move through friction force, the conveyor belt 4 can be used for placing chips, the chip can be detected by the detection device 15 conveniently, the second hollow groove 24 can be used for receiving the detected chips, the detected qualified chips can flow into the chip tester 1 and test the chips, the fixing rod 14 can be used for placing the drive roller 11 and the driven rollers 12, so that the conveyor belt 4 can move, the driven rollers 12 can be used for supporting the conveyor belt 4 together with the drive roller 11, so that the length of the conveyor belt 4 is longer, more chips can be placed, the first supporting plate 9 can be used for supporting the first motor 6, so that the output shaft of the first motor 6 can be connected with the drive roller 11, and the first motor 6 can be used for providing power for the drive roller 11, so that the driving roller 11 can drive the conveyor belt 4 to move, the detection device 15 can be used for detecting the condition of the chip, when the chip is detected to be unqualified, a signal is sent to the PLC controller 16, the PLC controller 16 then sends a signal to the second motor 18, so that the second motor 18 is started, the PLC controller 16 can be used for receiving the signal of the detection device 15 and sending a signal to the second motor 18, so that the second motor 18 is started, the second support plate 17 can be used for supporting the second motor 18, so that the second motor 18 and the connecting block 19 can be stably connected together, the second motor 18 can be used for driving the connecting block 19 to move, so that the connecting block 19 can drive the hollow rod 20 to linearly reciprocate, the connecting block 19 is S-shaped and can be driven by the second motor 18 to do circular motion so as to push the hollow rod 20 to move left and right, the hollow rod 20 can be used for driving the slide rod 21 to move, make slide bar 21 can push away unqualified chip, and return to the normal position, be difficult for influencing subsequent chip that is moving, the quad slit has been seted up to stopper 22's rear end, can be used to place and spacing slide bar 21, make slide bar 21 can stabilize the upside at conveyer belt 4, be convenient for promote unqualified chip, sorting mechanism can be used for separately qualified and unqualified chip, make chip tester 1 in the test chip, be difficult for appearing unqualified chip, and the availability factor is higher.

Referring to fig. 3, a collecting box 10 is fixedly connected to a side end of one of the fixing rods 14, and a limiting plate 13 is fixedly connected to an upper end of the collecting box 10.

In this embodiment: the front end fixedly connected with collecting box 10 of the dead lever 14 that is located the front side, collecting box 10 can be used to collect unqualified chip, is convenient for deposit and let people take, and limiting plate 13 can be used to spacing chip that is pushed away by slide bar 21 for the chip can be accurate fall into the inside of collecting box 10.

Referring to fig. 4, a hollow block 23 is fixedly connected to an upper end of one of the fixing rods 14, and the sliding rod 21 is slidably connected to an inner wall of one side of the hollow block 23.

In this embodiment: the upper end fixedly connected with hollow block 23 of the dead lever 14 that is located the rear side, the lower extreme sliding connection of slide bar 21 is in the lower inner wall of hollow block 23, and hollow block 23 can be used to spacing slide bar 21 for slide bar 21 is when removing, and is more stable.

Specifically, referring to fig. 1, two support rods 5 are fixedly connected to the side end of the chip tester 1, and the upper ends of the two support rods 5 are respectively and fixedly connected to the lower ends of two fixing rods 14.

In this embodiment: two bracing pieces 5 of chip tester 1's left end fixedly connected with, bracing piece 5 can be used to support dead lever 14 for dead lever 14 is more stable in chip tester 1's left side, is difficult for breaking away from in chip tester 1.

Referring to fig. 2, a plurality of first hollow grooves 7 are formed at the lower end of the chip tester 1, and inner walls of both sides of the plurality of first hollow grooves 7 are rotatably connected to the rollers 3.

In this embodiment: the inner wall all rotates around a plurality of first hollow grooves 7 and is connected with gyro wheel 3, and first hollow groove 7 can be used to place gyro wheel 3 for gyro wheel 3 can rotate, and gyro wheel 3 can be used to be driven by chip tester 1 and remove, makes people more convenient when removing chip tester 1.

Specifically referring to fig. 2, a handle 2 is fixedly connected to a side end of the chip tester 1, and an anti-slip sleeve 8 is fixedly connected to a circumferential surface of the handle 2.

In this embodiment: chip tester 1's right-hand member fixedly connected with handle 2, handle 2 can be used to connect chip tester 1 for people are promoting chip tester 1, and is more convenient, and antiskid cover 8 can be used to the antiskid, makes people when holding handle 2, and the difficult slip is more stable.

The working principle and the using process of the utility model are as follows: when the device is used, the first supporting plate 9 is started firstly, the first supporting plate 9 drives the driving roller 11 to rotate, meanwhile, the driving roller 11 drives the conveyor belt 4 to move due to friction, meanwhile, the driven roller 12 is driven by the conveyor belt 4 to rotate, then, the chip is placed on the upper side of the conveyor belt 4, the detection device 15 detects the chip, if the chip is detected to be unqualified, the detection device 15 sends a signal to the PLC controller 16, the PLC controller 16 sends a signal to the second motor 18, so that the second motor 18 is started, meanwhile, the second motor 18 drives the connecting block 19 to rotate, meanwhile, the hollow rod 20 is driven by the connecting block 19 to move, meanwhile, the hollow rod 20 drives the sliding rod 21 to move, then, the front side of the sliding rod 21 pushes the unqualified chip to the inside of the collecting box 10, by using the device, qualified chips and unqualified chips can be separated, so that the chip tester 1 is not easy to test unqualified chips when testing the chips, the time is saved, and the efficiency is higher.

Finally, it should be noted that: although the present invention has been described in detail with reference to the foregoing embodiments, it will be apparent to those skilled in the art that changes may be made in the embodiments and/or equivalents thereof without departing from the spirit and scope of the utility model. Any modification, equivalent replacement, or improvement made within the spirit and principle of the present invention should be included in the protection scope of the present invention.

Claims

1. An automatic sorting apparatus for semiconductor chip package testing, comprising:

the testing device comprises a chip tester (1), wherein a second hollow groove (24) is formed in the side end of the chip tester (1), and two fixing rods (14) are fixedly connected to the side end of the chip tester (1);

the driving roller (11) is rotatably connected to the close ends of the two fixing rods (14), the side end of the driving roller (11) movably penetrates through the side end of one fixing rod (14) and extends forwards, and the close ends of the two fixing rods (14) are rotatably connected with a plurality of driven rollers (12);

the conveying belt (4) is sleeved on the circumferential surfaces of the driving roller (11) and the driven rollers (12), the lower end of one fixing rod (14) is fixedly connected with a first supporting plate (9), the upper end of the first supporting plate (9) is fixedly connected with a first motor (6), and the output shaft of the first motor (6) is fixedly connected with the side end of the driving roller (11);

the sorting mechanism comprises a detection device (15), a PLC (programmable logic controller) (16), a second supporting plate (17), a second motor (18), a connecting block (19), a hollow rod (20), a sliding rod (21) and a limiting block (22), wherein the lower end of the detection device (15) is fixedly connected to the upper end of one of the fixing rods (14), the side ends of the PLC (16) and the second supporting plate (17) are fixedly connected to the side end of one of the fixing rods (14), the lower end of the second motor (18) is fixedly connected to the upper end of the second supporting plate (17), the PLC (16) is in signal connection with the detection device (15) and the second motor (18), the side end of the connecting block (19) is fixedly connected to an output shaft of the second motor (18), and the circumferential inner wall of the hollow rod (20) is in sliding connection with the circumferential surface of the connecting block (19), the side end of the sliding rod (21) is fixedly connected to the side end of the hollow rod (20), the side end of the limiting block (22) is fixedly connected to the side end of one of the fixing rods (14), and the sliding rod (21) is slidably connected to the inner wall of one side of the limiting block (22).

2. The semiconductor chip package test automatic sorting device of claim 1, wherein: the side end of one of the fixing rods (14) is fixedly connected with a collecting box (10), and the upper end of the collecting box (10) is fixedly connected with a limiting plate (13).

3. The semiconductor chip package test automatic sorting device of claim 2, wherein: the upper end of one of the fixed rods (14) is fixedly connected with a hollow block (23), and the sliding rod (21) is connected to the inner wall of one side of the hollow block (23) in a sliding mode.

4. The semiconductor chip package test automatic sorting device of claim 3, wherein: the chip tester is characterized in that two supporting rods (5) are fixedly connected to the side end of the chip tester (1), and the upper ends of the two supporting rods (5) are respectively and fixedly connected to the lower ends of the two fixing rods (14).

5. The semiconductor chip package test automatic sorting device of claim 4, wherein: a plurality of first hollow grooves (7) have been seted up to the lower extreme of chip tester (1), and is a plurality of the both sides inner wall in first hollow groove (7) all rotates and is connected with gyro wheel (3).

6. The semiconductor chip package test automatic sorting device of claim 5, wherein: the side end of the chip tester (1) is fixedly connected with a handle (2), and the circumferential surface of the handle (2) is fixedly connected with an anti-slip sleeve (8).