CN215768870U - A testing arrangement for IC chip - Google Patents
A testing arrangement for IC chip Download PDFInfo
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- CN215768870U CN215768870U CN202121293046.9U CN202121293046U CN215768870U CN 215768870 U CN215768870 U CN 215768870U CN 202121293046 U CN202121293046 U CN 202121293046U CN 215768870 U CN215768870 U CN 215768870U
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- magnetic attraction
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- dehumidifying
- fan
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Abstract
The utility model discloses a testing device for an IC chip, which comprises a tester body, a storage box, a dehumidifying mechanism and a dustproof mechanism, wherein the dehumidifying mechanism and the dustproof mechanism are arranged on the storage box; the dehumidifying mechanism comprises a sponge block, a clapboard, an air hole, a dehumidifying motor, a rotating shaft and a fan; dustproof mechanism includes backup pad, ionic wind machine, goes out tuber pipe, wind-guiding fill and support arm, and backup pad side surface is connected with the inside rear side surface of receiver. According to the moisture-proof test box, the dehumidification motor drives the fan to rotate, the fan provides wind power to blow off water vapor on the test instrument and accelerate evaporation, the air holes in the partition plate can guide the water vapor to the sponge blocks to complete isolation, the sponge blocks on the bottom surface inside the storage box can adsorb the water vapor to complete collection, and moisture-proof protection is completed; the ion fan ionizes air, the air outlet pipe and the air guide hopper guide out the ionized air to blow and eliminate static on the surface of the chip slot so as to prevent dust and sundries from being adsorbed, and the dust and sundries on the cover plate are pulled open and blown out easily to finish the cleaning work of the dust and sundries.
Description
Technical Field
The utility model relates to the technical field of chip testing, in particular to a testing device for an IC chip.
Background
An IC chip is a chip formed by placing an integrated circuit formed by a large number of microelectronic components (transistors, resistors, capacitors, etc.) on a plastic substrate. The IC chip comprises a wafer chip and a packaging chip, and the corresponding IC chip production line consists of a wafer production line and a packaging production line.
Integrated Circuit (IC) chip must detect strictly after the encapsulation process just can guarantee the quality of product, and the IC chip test generally uses the IC chip tester to test, and the IC chip tester generally comprises components such as tester organism, chip slot, function button, display screen, power source, transmission interface, receiver.
IC chip tester chip slot exposes outside and is infected with dust debris easily under prior art, influences the circuit operation, and personnel's clearance is also troublesome hard, just carries out simple packing of accomodating through the receiver after test work, and steam gets into the corrosion damage equipment easily, and for this reason, we propose a testing arrangement for IC chip.
SUMMERY OF THE UTILITY MODEL
The utility model mainly aims to provide a testing device for an IC chip, which can effectively solve the problems that in the background technology, a chip slot of an IC chip tester is exposed outside and is easy to be infected with dust and sundries, the operation of a circuit is influenced, personnel are troublesome and labor-consuming to clean, and after the testing work is finished, the simple storage and packaging are carried out only through a storage box, so that water vapor is easy to enter and corrode and damage equipment.
In order to solve the technical problems, the utility model is realized by the following technical scheme: a testing device for IC chips comprises a tester body, a storage box, a dehumidifying mechanism and a dustproof mechanism, wherein the dehumidifying mechanism and the dustproof mechanism are arranged on the storage box;
the dehumidifying mechanism comprises a sponge block, a partition plate, a dehumidifying motor, a rotating shaft and a fan, wherein the sponge block is arranged on the bottom surface inside the containing box, the sponge block mainly adsorbs water vapor, the upper surface of the partition plate is connected with the lower surface of the tester body and is positioned above the sponge block, sixty-four air holes are formed in the partition plate, the dehumidifying motor is arranged on the top surface inside the containing box, the output end of the dehumidifying motor is connected with one end of the rotating shaft, the other end of the rotating shaft is provided with the fan, and the fan is positioned right above the tester body;
dustproof mechanism includes backup pad, ionic wind machine, goes out tuber pipe, wind-guiding fill and support arm, backup pad side surface is connected and is located the baffle top with the inside rear side surface of receiver, and the backup pad is located tester body rear, ionic wind machine sets up in the backup pad upper surface, ionic wind machine output is connected with play tuber pipe one end, it is provided with the wind-guiding fill to go out the tuber pipe other end, the air-out end of wind-guiding fill is towards the chip slot on the tester body, it is provided with support arm and support arm one end and backup pad upper surface connection to go out tuber pipe week side.
Preferably, the storage box further comprises a handle, and a buffer component, a closing component and a fixing component which are arranged on the storage box, wherein the handle is arranged on one side surface of the storage box.
Preferably, the buffering subassembly includes fixed sleeve, connecting sleeve and buffer spring, fixed sleeve, connecting sleeve and buffer spring all are equipped with four, four fixed sleeve all sets up and is two bisymmetry arrangements on the axis of receiver bottom surface on the inside bottom surface of receiver, four the connecting sleeve upper surface all is connected with the baffle lower surface, every be provided with a buffer spring between the inside bottom surface of fixed sleeve and the inside top surface of a connecting sleeve, the main fixed buffer spring of fixed sleeve, connecting sleeve and buffer spring mainly support the baffle.
Preferably, the closing component includes apron and stirring piece, first spout has been seted up to the receiver front side surface, inside apron activity set up and the first spout, the apron can slide on first spout, the apron front side surface is provided with stirring piece.
Preferably, the subassembly that fixes includes splint and slide bar, splint are equipped with two and are located the baffle top, every first through-hole has all been seted up to splint inside, the slide bar activity sets up in the inside just slide bar both ends of first through-hole respectively with the inside both sides surface connection of receiver, splint can slide on the slide bar.
Preferably, the seal assembly further comprises a magnetic attraction column and a magnetic attraction hole, wherein the magnetic attraction column and the magnetic attraction hole are respectively provided with two magnetic attraction columns which are movably arranged on the front side surface of the cover plate and two magnetic attraction holes which are arranged on the groove wall of one side of the first sliding groove, the position size of the magnetic attraction hole is matched with the magnetic attraction column, and the magnetic attraction column and the magnetic attraction hole are magnetically attracted to be connected to fix the cover plate.
Preferably, fixed subassembly still includes clamping bolt and positive and negative motor, clamping bolt in proper order with two splint threaded connection, clamping bolt one end is connected with positive and negative motor output, the clamping bolt other end is provided with dog and the dog is located the splint outside.
Compared with the prior art, the testing device for the IC chip has the following beneficial effects:
according to the moisture-proof tester, the dehumidification motor is arranged on the top surface inside the storage box to drive the fan to rotate, wind power is provided to blow the tester body after the driven fan rotates, so that water vapor on the tester can be blown off and evaporated at an accelerated speed, the water vapor can be drained to the sponge block through the air holes in the partition plate to complete isolation, the water vapor can be collected in a concentrated manner through the sponge block on the bottom surface inside the storage box, and personnel can thoroughly eliminate the water vapor only by taking out and extruding the sponge block, so that the moisture-proof protection of the tester is completed; through ionic wind machine with air ionization, derive the static that bloies and eliminate chip slot surface after the ionization through going out tuber pipe and wind-guiding fill and can prevent that dust debris from adsorbing, pull open apron dust debris and blown out the receiver and easily accomplished the cleaning work to dust debris, protected the operation of circuit.
Of course, it is not necessary for any product in which the utility model is practiced to achieve all of the above-described advantages at the same time.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings used in the description of the embodiments will be briefly introduced below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and it is obvious for those skilled in the art that other drawings can be obtained according to the drawings without creative efforts.
FIG. 1 is a schematic diagram of an overall structure of a testing apparatus for IC chips according to the present invention;
FIG. 2 is a schematic diagram of a front view of a testing apparatus for IC chips according to the present invention;
FIG. 3 is a schematic cross-sectional view taken along line A-A of FIG. 2 according to the present invention;
FIG. 4 is a schematic diagram of an internal structure of a testing apparatus for IC chips according to the present invention;
FIG. 5 is a schematic top view of a testing apparatus for IC chips according to the present invention.
In the drawings, the components represented by the respective reference numerals are listed below:
1. a tester body; 2. a storage box; 3. a sponge block; 4. a partition plate; 5. air holes are formed; 6. a dehumidifying motor; 7. a rotating shaft; 8. a fan; 9. a support plate; 10. an ion blower; 11. an air outlet pipe; 12. a wind guide hopper; 13. a support arm; 14. a handle; 15. fixing the sleeve; 16. a connecting sleeve; 17. a buffer spring; 18. a cover plate; 19. a shifting block; 20. a splint; 21. a slide bar; 22. a magnetic attraction column; 23. magnetic attraction holes; 24. clamping the bolt; 25. a positive and negative motor; 26. and a stop block.
Detailed Description
In order to make the technical means, the creation characteristics, the achievement purposes and the effects of the utility model easy to understand, the utility model is further described with the specific embodiments.
In the description of the present invention, it should be noted that the terms "upper", "lower", "inner", "outer", "front", "rear", "both ends", "one end", "the other end", and the like indicate orientations or positional relationships based on those shown in the drawings, and are only for convenience of description and simplicity of description, but do not indicate or imply that the referred device or element must have a specific orientation, be constructed in a specific orientation, and be operated, and thus, should not be construed as limiting the present invention. Furthermore, the terms "first" and "second" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance.
In the description of the present invention, it is to be noted that, unless otherwise explicitly specified or limited, the terms "mounted," "disposed," "connected," and the like are to be construed broadly, such as "connected," which may be fixedly connected, detachably connected, or integrally connected; can be mechanically or electrically connected; they may be connected directly or indirectly through intervening media, or they may be interconnected between two elements. The specific meanings of the above terms in the present invention can be understood in specific cases to those skilled in the art.
Referring to fig. 1 to 5, the present invention is a testing apparatus for IC chips, including a tester body 1, a storage box 2, and a dehumidifying mechanism and a dust-proof mechanism disposed on the storage box 2;
the dehumidifying mechanism comprises a sponge block 3, a partition plate 4, a dehumidifying motor 6, a rotating shaft 7 and a fan 8, wherein the sponge block 3 is arranged on the bottom surface inside the containing box 2, the sponge block 3 mainly adsorbs water vapor, the upper surface of the partition plate 4 is connected with the lower surface of the tester body 1 and is positioned above the sponge block 3, sixty four air holes 5 are formed in the partition plate 4, the dehumidifying motor 6 is arranged on the top surface inside the containing box 2, the output end of the dehumidifying motor 6 is connected with one end of the rotating shaft 7, the other end of the rotating shaft 7 is provided with the fan 8, and the fan 8 is positioned right above the tester body 1;
dustproof mechanism includes backup pad 9, ionic wind machine 10, go out tuber pipe 11, wind-guiding fill 12 and support arm 13, 9 side surfaces of backup pad are connected and are located 4 tops of baffle with the inside rear side surface of receiver 2, and backup pad 9 is located 1 rear of tester body, ionic wind machine 10 sets up in the backup pad 9 upper surface, ionic wind machine 10 output is connected with play tuber pipe 11 one end, it is provided with wind-guiding fill 12 to go out the tuber pipe 11 other end, the air-out end of wind-guiding fill 12 is towards the chip slot on the tester body 1, it is provided with support arm 13 and support arm 13 one end and backup pad 9 upper surface connection to go out tuber pipe 11 all sides.
Buffer unit includes fixed sleeve 15, connecting sleeve 16 and buffer spring 17, fixed sleeve 15, connecting sleeve 16 and buffer spring 17 all are equipped with four, four fixed sleeve 15 all set up on 2 inside bottom surfaces of receiver and be two bisymmetry arrangements on the axis of 2 bottom surfaces of receiver, four 16 upper surfaces of connecting sleeve all with 4 lower surface connections of baffle, be provided with a buffer spring 17 between 15 inside bottom surfaces of every fixed sleeve and the 16 inside top surfaces of a connecting sleeve, 15 main fixed buffer spring 17 of fixed sleeve, connecting sleeve 16 and buffer spring 17 mainly support baffle 4.
The sealing assembly comprises a cover plate 18 and a poking block 19, a first sliding groove is formed in the front side surface of the storage box 2, the cover plate 18 is movably arranged in the first sliding groove, the cover plate 18 can slide on the first sliding groove, and the poking block 19 is arranged on the front side surface of the cover plate 18.
The fixed subassembly that includes splint 20 and slide bar 21, splint 20 are equipped with two and are located 4 tops of baffle, and the first through-hole has all been seted up to every splint 20 inside, and the slide bar 21 activity sets up in the inside just slide bar 21 both ends of first through-hole respectively with the inside both sides surface connection of receiver 2, and splint 20 can slide on slide bar 21.
The seal assembly further comprises a magnetic attraction column 22 and a magnetic attraction hole 23, the magnetic attraction column 22 and the magnetic attraction hole 23 are both provided with two magnetic attraction columns 22, the two magnetic attraction columns 22 are movably arranged on the front side surface of the cover plate 18, the two magnetic attraction holes 23 are all arranged on the groove wall of one side of the first sliding groove, the position size of the magnetic attraction hole 23 is matched with the magnetic attraction column 22, and the magnetic attraction column 22 and the magnetic attraction hole 23 are magnetically attracted to be connected to fix the cover plate 18.
The fixed component further comprises a clamping bolt 24 and a positive and negative motor 25, the clamping bolt 24 is sequentially in threaded connection with the two clamping plates 20, one end of the clamping bolt 24 is connected with the output end of the positive and negative motor 25, and the other end of the clamping bolt 24 is provided with a stop block 26 and the stop block 26 is located on the outer side of the clamping plate 20.
The working principle of the utility model is as follows;
when the tester is used by a person, the poking block 19 is pulled to drive the cover plate 18 to slide to open the storage box 2, the positive and negative motors 25 rotate to drive the clamping bolts 24 to rotate, the clamping plates 20 in threaded connection with the clamping bolts 24 are pulled apart, the tester body 1 is taken out to perform chip testing, after the testing is finished, the tester body 1 is placed on the partition plate 4, the positive and negative motors 25 reversely rotate to drive the clamping bolts 24 to reversely rotate, the clamping plates 20 in threaded connection with the clamping bolts 24 are pushed to be close to clamp and fix the tester body 1, the dehumidifying motor 6 operates to control the rotating shaft 7 to rotate, the fan 8 rotates along with the rotating to generate wind power to blow the tester body 1, water vapor is blown off and falls onto the sponge block 3 from the air holes 5 on the partition plate 4, the sponge block 3 adsorbs and collects the water vapor, the sponge block 3 is taken out and is extruded to thoroughly discharge the water vapor, the ion fan 10 operates to ionize the air, the ionized air is blown out by the air outlet pipe 11 and blown to the chip slot on the tester body 1 from the air guide hopper 12, the dust impurities for eliminating static electricity are blown out of the storage box 2 to complete dust removal, the cover plate 18 is pulled back, and the magnetic suction column 22 is inserted into the magnetic suction hole 23 to fix the cover plate 18 through magnetic adsorption. The type of the dehumidifying motor 6 is H4131-58KV, the type of the ion fan 10 is SL-001, and the type of the positive and negative motor 25 is JS-50T.
The foregoing shows and describes the general principles and broad features of the present invention and advantages thereof. It will be understood by those skilled in the art that the present invention is not limited to the embodiments described above, which are described in the specification and illustrated only to illustrate the principle of the present invention, but that various changes and modifications may be made therein without departing from the spirit and scope of the present invention, which fall within the scope of the utility model as claimed. The scope of the utility model is defined by the appended claims and equivalents thereof.
Claims (7)
1. The testing device for the IC chip is characterized by comprising a tester body (1), a storage box (2), a dehumidifying mechanism and a dustproof mechanism, wherein the dehumidifying mechanism and the dustproof mechanism are arranged on the storage box (2);
the dehumidifying mechanism comprises a sponge block (3), a partition plate (4), a dehumidifying motor (6), a rotating shaft (7) and a fan (8), wherein the sponge block (3) is arranged on the bottom surface inside the storage box (2), the upper surface of the partition plate (4) is connected with the lower surface of the tester body (1) and is positioned above the sponge block (3), sixty four air holes (5) are formed in the partition plate (4), the dehumidifying motor (6) is arranged on the top surface inside the storage box (2), the output end of the dehumidifying motor (6) is connected with one end of the rotating shaft (7), the other end of the rotating shaft (7) is provided with the fan (8), and the fan (8) is positioned right above the tester body (1);
dustproof mechanism includes backup pad (9), ionic wind machine (10), goes out tuber pipe (11), wind-guiding fill (12) and support arm (13), backup pad (9) side surface is connected and is located baffle (4) top with the inside rear side surface of receiver (2), and backup pad (9) are located tester body (1) rear, ionic wind machine (10) set up in backup pad (9) upper surface, ionic wind machine (10) output is connected with play tuber pipe (11) one end, it is provided with wind-guiding fill (12) to go out tuber pipe (11) other end, the air-out end of wind-guiding fill (12) is towards the chip slot on tester body (1), it is provided with support arm (13) and support arm (13) one end and backup pad (9) upper surface connection to go out tuber pipe (11) week side.
2. A test apparatus for IC chips according to claim 1, wherein: receiver (2) still include handle (14) and set up buffer unit, closing member and the fixed subassembly on receiver (2), handle (14) set up on receiver (2) side surface.
3. A test apparatus for IC chips according to claim 2, wherein: buffer unit includes fixed sleeve (15), connecting sleeve (16) and buffer spring (17), fixed sleeve (15), connecting sleeve (16) and buffer spring (17) all are equipped with four, four fixed sleeve (15) all set up on the inside bottom surface of receiver (2) and are two bisymmetry arrangements, four on the axis of receiver (2) bottom surface connecting sleeve (16) upper surface all is connected with baffle (4) lower surface, every be provided with a buffer spring (17) between fixed sleeve (15) inside bottom surface and the inside top surface of a connecting sleeve (16).
4. A test apparatus for IC chips according to claim 2, wherein: the sealing assembly comprises a cover plate (18) and a poking block (19), a first sliding groove is formed in the front side surface of the storage box (2), the cover plate (18) is movably arranged in the first sliding groove, and the poking block (19) is arranged on the front side surface of the cover plate (18).
5. A test apparatus for IC chips according to claim 2, wherein: fixed subassembly includes splint (20) and slide bar (21), splint (20) are equipped with two and are located baffle (4) top, every splint (20) are inside all to have seted up first through-hole, slide bar (21) activity sets up in first through-hole inside and slide bar (21) both ends respectively with receiver (2) inside both sides surface connection.
6. A test apparatus for IC chips according to claim 4, wherein: the seal assembly further comprises a magnetic attraction column (22) and a magnetic attraction hole (23), wherein the magnetic attraction column (22) and the magnetic attraction hole (23) are respectively provided with two magnetic attraction columns (22) and two magnetic attraction holes (23), the magnetic attraction columns (22) are movably arranged on the front side surface of the cover plate (18), the magnetic attraction holes (23) are respectively arranged on one side groove wall of the first sliding groove, and the magnetic attraction holes (23) are matched with the magnetic attraction columns (22).
7. A test apparatus for IC chips according to claim 5, wherein: the fixed subassembly still includes clamping bolt (24) and positive and negative motor (25), clamping bolt (24) in proper order with two splint (20) threaded connection, clamping bolt (24) one end is connected with positive and negative motor (25) output, clamping bolt (24) other end is provided with dog (26) and dog (26) are located the splint (20) outside.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202121293046.9U CN215768870U (en) | 2021-06-10 | 2021-06-10 | A testing arrangement for IC chip |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202121293046.9U CN215768870U (en) | 2021-06-10 | 2021-06-10 | A testing arrangement for IC chip |
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| Publication Number | Publication Date |
|---|---|
| CN215768870U true CN215768870U (en) | 2022-02-08 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202121293046.9U Active CN215768870U (en) | 2021-06-10 | 2021-06-10 | A testing arrangement for IC chip |
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| CN (1) | CN215768870U (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN115378858A (en) * | 2022-08-18 | 2022-11-22 | 重庆大学 | Multi-environment signal tester of communication equipment |
| CN115683862A (en) * | 2022-11-09 | 2023-02-03 | 徐州市沂芯微电子有限公司 | Chip packaging detection machine capable of detecting press-fitting quality and implementation method thereof |
| CN116774007A (en) * | 2023-06-12 | 2023-09-19 | 恒业世纪安全技术有限公司 | Testing device for fire-fighting telephone host circuit board |
-
2021
- 2021-06-10 CN CN202121293046.9U patent/CN215768870U/en active Active
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN115378858A (en) * | 2022-08-18 | 2022-11-22 | 重庆大学 | Multi-environment signal tester of communication equipment |
| CN115683862A (en) * | 2022-11-09 | 2023-02-03 | 徐州市沂芯微电子有限公司 | Chip packaging detection machine capable of detecting press-fitting quality and implementation method thereof |
| CN115683862B (en) * | 2022-11-09 | 2023-12-26 | 徐州市沂芯微电子有限公司 | Chip packaging detector capable of detecting packaging quality and implementation method thereof |
| CN116774007A (en) * | 2023-06-12 | 2023-09-19 | 恒业世纪安全技术有限公司 | Testing device for fire-fighting telephone host circuit board |
| CN116774007B (en) * | 2023-06-12 | 2023-12-15 | 恒业世纪安全技术有限公司 | Testing device for fire-fighting telephone host circuit board |
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