CN215728595U - Semiconductor insulation testing device - Google Patents
Semiconductor insulation testing device Download PDFInfo
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- CN215728595U CN215728595U CN202121649327.3U CN202121649327U CN215728595U CN 215728595 U CN215728595 U CN 215728595U CN 202121649327 U CN202121649327 U CN 202121649327U CN 215728595 U CN215728595 U CN 215728595U
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Abstract
The utility model discloses a semiconductor insulation testing device which comprises a shell assembly and a current sensor, wherein a contraction assembly and an electric shock prevention shielding assembly are sequentially arranged in the shell assembly from bottom to top, a positioning assembly is arranged at one end of the contraction assembly, a storage battery and the current sensor are sequentially arranged on the rear wall of the interior of the shell assembly from left to right, the contraction assembly comprises a first spring, a concave block, a plurality of sections of telescopic rods and contact electrodes, the upper end and the lower end of the concave block are connected with the plurality of sections of telescopic rods, and the contact electrodes are arranged in the concave block. This semiconductor insulation test device compares with current ordinary semiconductor insulation test device, also can carry out the centre gripping location to the semiconductor when can stably detecting the semiconductor to be convenient for electrode and semiconductor contact make equipment form complete return circuit and detect, equipment can shelter from the semiconductor at the during operation simultaneously, thereby prevents that the user from electrocuting.
Description
Technical Field
The utility model relates to the technical field of semiconductors, in particular to a semiconductor insulation testing device.
Background
The semiconductor is a substance with conductivity between an insulator and a conductor, the conductivity of the semiconductor is easy to control, the semiconductor can be used as a component material for information processing, and the semiconductor needs to be tested by using a semiconductor insulation testing device before being selected.
The existing semiconductor insulation testing device is easy to have the condition of instable installation when in use, thereby influencing the effect of equipment inspection, so that the existing semiconductor insulation testing device cannot well meet the use requirements of people, and technical innovation is carried out on the basis of the existing semiconductor insulation testing device aiming at the condition.
SUMMERY OF THE UTILITY MODEL
The utility model aims to provide a semiconductor insulation testing device, which aims to solve the problem that the conventional semiconductor insulation testing device cannot well meet the use requirements of people because the conventional semiconductor insulation testing device is easy to be instably mounted during use and affects the equipment inspection effect.
In order to achieve the purpose, the utility model provides the following technical scheme: the utility model provides an insulating testing arrangement of semiconductor, includes casing subassembly and current sensor, casing subassembly's inside is followed supreme shrink subassembly and the protection against electric shock of having set gradually down and is sheltered from the subassembly, and the one end of shrink subassembly is provided with locating component, casing subassembly's inside back wall has set gradually battery and current sensor from a left side to the right side, the shrink subassembly includes first spring, concave piece, multisection telescopic link and contact electrode, and the one end of first spring is connected with concave piece, the upper and lower both ends of concave piece are connected with multisection telescopic link, and the inside of concave piece is provided with contact electrode.
Preferably, the concave block forms an elastic telescopic result with the shell assembly through the first spring and the multiple telescopic rods, and the first spring is fixedly connected with the concave block.
Preferably, the shell assembly comprises a lower shell, a partition plate, a hinge, an upper shell and a display screen, the partition plate is arranged inside the lower shell, the upper end of the lower shell is connected with the upper shell through the hinge, and the display screen is arranged inside the upper shell.
Preferably, the upper shell and the lower shell form a rotating structure through a hinge, and the partition plate and the lower shell are welded.
Preferably, the positioning assembly comprises a second spring, an extrusion block and a sliding block, the upper end of the second spring is connected with the extrusion block, and the sliding block is arranged on one side of the extrusion block.
Preferably, the electric shock prevention shielding assembly comprises a winding box, a winding shaft, an insulating transparent film and a coil spring, the winding shaft is connected to the upper end and the lower end of the winding box, and the insulating transparent film and the coil spring are sequentially arranged outside the winding shaft from the middle to the upper side and the lower side.
Preferably, the winding shaft and the winding box form an elastic telescopic structure through the coil spring, and the winding shaft and the coil spring are fixedly connected.
Compared with the prior art, the utility model has the following beneficial effects: the equipment can stably detect the semiconductor and also can clamp and position the semiconductor, so that the electrode is convenient to contact with the semiconductor, the equipment forms a complete loop for detection, and meanwhile, the equipment can shield the semiconductor during working, so that a user is prevented from electric shock;
1. according to the device, the semiconductor is arranged between the two concave blocks, the concave blocks can fix the semiconductor through the elastic telescopic structure formed by the concave blocks and the shell assembly through the multiple telescopic rods, the first spring and the shell assembly, and meanwhile, the elastic telescopic structure can enable the contact electrode to be in close contact with the semiconductor, so that the device can conveniently detect the semiconductor;
2. according to the utility model, through the arrangement of the concave block, the second spring of the contact electrode, the extrusion block and the sliding block, the extrusion block of the device forms an elastic structure through the second spring and the contraction assembly, the semiconductor can be held and positioned through the elastic structure, so that the semiconductor can be contacted with the contact electrode no matter the size of the semiconductor, and the extrusion block can limit the extrusion block through the sliding structure formed between the sliding block and the concave block;
3. according to the utility model, through the arrangement of the winding box, the winding shaft, the insulating transparent film and the coil spring, the device can draw the insulating transparent film out of the winding box after use, so that a semiconductor is shielded, a user is prevented from electric shock caused by mistaken touch of the semiconductor, and meanwhile, the insulating transparent film can be automatically rewound by virtue of the elastic rotating structure formed between the coil spring and the winding box by virtue of the winding shaft.
Drawings
FIG. 1 is a schematic front view of the present invention;
FIG. 2 is a schematic bottom sectional view of the present invention;
fig. 3 is a schematic view of a partial cross-sectional structure of the electric shock shielding assembly of the present invention.
In the figure: 1. a housing assembly; 101. a lower housing; 102. a partition plate; 103. a hinge; 104. an upper housing; 105. a display screen; 2. a retraction assembly; 201. a first spring; 202. a concave block; 203. a multi-section telescopic rod; 204. a contact electrode; 3. a positioning assembly; 301. a second spring; 302. extruding the block; 303. a slider; 4. a storage battery; 5. a current sensor; 6. an electric shock prevention shielding component; 601. a rolling box; 602. a winding shaft; 603. an insulating transparent film; 604. a coil spring.
Detailed Description
As shown in fig. 1 to 3, a semiconductor insulation testing device comprises a housing assembly 1 and a current sensor 5, wherein a contraction assembly 2 and an electric shock protection shielding assembly 6 are sequentially arranged in the housing assembly 1 from bottom to top, a positioning assembly 3 is arranged at one end of the contraction assembly 2, a storage battery 4 and the current sensor 5 are sequentially arranged on the rear wall of the interior of the housing assembly 1 from left to right, the contraction assembly 2 comprises a first spring 201, a concave block 202, a multi-section telescopic rod 203 and a contact electrode 204, one end of the first spring 201 is connected with the concave block 202, the upper end and the lower end of the concave block 202 are connected with the multi-section telescopic rod 203, the contact electrode 204 is arranged in the concave block 202, the concave block 202 forms an elastic telescopic result with the housing assembly 1 through the first spring 201 and the multi-section telescopic rod 203, and the first spring 201 is fixedly connected with the concave block 202;
As shown in fig. 1, the housing assembly 1 includes a lower housing 101, a partition plate 102, a hinge 103, an upper housing 104 and a display screen 105, wherein the partition plate 102 is disposed inside the lower housing 101, the upper end of the lower housing 101 is connected to the upper housing 104 through the hinge 103, the display screen 105 is mounted inside the upper housing 104, the upper housing 104 forms a rotating structure with the lower housing 101 through the hinge 103, and the partition plate 102 is welded to the lower housing 101;
the upper shell 104 is convenient for a user to open the upper shell 104 through a rotating structure formed between the hinge 103 and the lower shell 101, the partition plate 102 can isolate electrical parts of the device, and the display screen 105 can display a detection result of the device.
As shown in fig. 1, the positioning assembly 3 includes a second spring 301, a pressing block 302 and a sliding block 303, the upper end of the second spring 301 is connected to the pressing block 302, and the sliding block 303 is arranged on one side of the pressing block 302;
the pressing block 302 forms an elastic structure with the contraction component 2 through the second spring 301, the elastic structure can be used for clamping and positioning the semiconductor, the semiconductor can be in contact with the contact electrode 204 regardless of the size, and the pressing block 302 can limit the pressing block 302 through a sliding structure formed between the sliding block 303 and the concave block 202.
As shown in fig. 3, the electric shock preventing shielding assembly 6 includes a winding box 601, a winding shaft 602, an insulating transparent film 603 and a coil spring 604, wherein the winding shaft 602 is connected to the upper and lower ends of the winding box 601, the insulating transparent film 603 and the coil spring 604 are sequentially disposed from the middle to the upper and lower sides outside the winding shaft 602, the winding shaft 602 forms an elastic telescopic structure with the winding box 601 through the coil spring 604, and the winding shaft 602 is fixedly connected with the coil spring 604;
the insulating transparent film 603 can be drawn out of the winding box 601, so that the semiconductor is shielded, a user is prevented from electric shock caused by mistaken touch of the semiconductor, and meanwhile, the insulating transparent film 603 can be automatically rewound by means of the elastic rotating structure formed between the winding shaft 602 and the winding box 601.
The working principle is as follows: when using the semiconductor insulation test apparatus, first, upper case 104 is opened by upper case 104 through a rotation structure formed between hinge 103 and lower case 101. Then the semiconductor is clamped between two concave blocks 202, the concave blocks 202 can clamp the semiconductor through the multi-section telescopic rod 203 and the elastic telescopic structure formed between the first spring 201 and the lower shell 101, so that the contact electrode 204 can be in close contact with the semiconductor, then the extrusion block 302 can clamp and position the semiconductor through the second spring 301 and the elastic sliding structure formed between the sliding block 303 and the concave blocks 202 through the extrusion block 302, then the insulating transparent film 603 is drawn out and hung on the other side of the lower shell 101, so that the semiconductor is shielded, a user is prevented from electric shock, then the equipment is opened to supply power to the storage battery 4, the current in the circuit is detected through the current sensor 5, so that the insulating degree of the semiconductor is calculated, the detection result is displayed through the display screen 105, and the hook on the insulating transparent film 603 is loosened after the detection is finished, the semiconductor after detection is taken down after the insulating transparent film 603 is rewound by the winding shaft 602 through the elastic rotating structure formed between the coil spring 604 and the winding box 601.
Claims (7)
1. The utility model provides an insulating testing arrangement of semiconductor, its characterized in that, includes casing subassembly (1) and current sensor (5), the inside of casing subassembly (1) is from supreme shrink subassembly (2) and the protection against electric shock of having set gradually and is sheltered from subassembly (6) down, and the one end of shrink subassembly (2) is provided with locating component (3), the inside back wall of casing subassembly (1) has set gradually battery (4) and current sensor (5) from a left side to the right side, shrink subassembly (2) include first spring (201), spill piece (202), multisection telescopic link (203) and contact electrode (204), and the one end of first spring (201) is connected with spill piece (202), the upper and lower both ends of spill piece (202) are connected with multisection telescopic link (203), and the inside of spill piece (202) is provided with contact electrode (204).
2. The semiconductor insulation testing device according to claim 1, wherein the concave block (202) forms an elastic expansion and contraction result with the housing assembly (1) through the first spring (201) and the multi-section expansion rod (203), and the first spring (201) is fixedly connected with the concave block (202).
3. The semiconductor insulation testing device according to claim 1, characterized in that the housing assembly (1) comprises a lower housing (101), a partition (102), a hinge (103), an upper housing (104) and a display screen (105), the partition (102) is arranged inside the lower housing (101), the upper end of the lower housing (101) is connected with the upper housing (104) through the hinge (103), and the display screen (105) is mounted inside the upper housing (104).
4. The semiconductor insulation testing device according to claim 3, wherein the upper housing (104) and the lower housing (101) form a rotating structure through the hinge (103), and the partition plate (102) and the lower housing (101) are welded.
5. A semiconductor insulation testing device according to claim 1, characterized in that the positioning assembly (3) comprises a second spring (301), a pressing block (302) and a sliding block (303), the upper end of the second spring (301) is connected with the pressing block (302), and the sliding block (303) is arranged on one side of the pressing block (302).
6. The semiconductor insulation testing device according to claim 1, wherein the electric shock shielding assembly (6) comprises a winding box (601), a winding shaft (602), an insulating transparent film (603) and a coil spring (604), the winding shaft (602) is connected to the upper end and the lower end of the winding box (601), and the insulating transparent film (603) and the coil spring (604) are sequentially arranged outside the winding shaft (602) from the middle to the upper side and the lower side.
7. The semiconductor insulation testing device according to claim 6, wherein the winding shaft (602) passes through an elastic telescopic structure formed between the coil spring (604) and the winding box (601), and the winding shaft (602) is fixedly connected with the coil spring (604).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202121649327.3U CN215728595U (en) | 2021-07-20 | 2021-07-20 | Semiconductor insulation testing device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202121649327.3U CN215728595U (en) | 2021-07-20 | 2021-07-20 | Semiconductor insulation testing device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN215728595U true CN215728595U (en) | 2022-02-01 |
Family
ID=79987947
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202121649327.3U Active CN215728595U (en) | 2021-07-20 | 2021-07-20 | Semiconductor insulation testing device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN215728595U (en) |
-
2021
- 2021-07-20 CN CN202121649327.3U patent/CN215728595U/en active Active
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