CN215641401U

CN215641401U - Novel capacitive screen test fixture

Info

Publication number: CN215641401U
Application number: CN202121912329.7U
Authority: CN
Inventors: 彭建新
Original assignee: Jiangxi Holitech Technology Co Ltd
Current assignee: Jiangxi Holitech Technology Co Ltd
Priority date: 2021-08-16
Filing date: 2021-08-16
Publication date: 2022-01-25
Anticipated expiration: 2031-08-16

Abstract

A novel capacitive screen test fixture comprises an SIU test module, a bakelite box body and a bakelite box cover, the bakelite box body is of a hollow square cavity structure with an opening at the upper end, the bakelite box cover is detachably covered on the opening at the upper end of the bakelite box body, the SIU testing module is fixedly arranged in the bakelite box body, one side of the bakelite box body is provided with an empty avoiding groove aligned with the SIU testing module, one side of the SIU testing module aligned with the empty avoiding groove is provided with a power supply interface, the bakelite box body is also fixedly provided with a USB interface, the USB interface is electrically connected with the SIU testing module, one side of the bakelite box body is provided with a USB empty avoiding groove aligned with the USB interface, the top of the SIU testing module is provided with a key, a testing interface and a power switch, and the bakelite box covers are respectively provided with clearance grooves aligned with the bakelite box covers. The utility model can effectively protect the SIU test module and prevent the SIU test module from being damaged due to static electricity or other reasons during testing.

Description

Novel capacitive screen test fixture

Technical Field

The utility model relates to the technical field of backlight testing, in particular to a novel capacitive screen testing jig.

Background

At present, the capacitive screen can leave a factory only by being subjected to power-on test in the factory manufacturing process, when the capacitive screen is tested, the capacitive screen is generally connected with an SIU test module through an adapter to be subjected to power-on display test, but the SIU test module is generally directly exposed when the capacitive screen is tested by the SIU test module at present, and is easily influenced by static electricity in the test process, so that the accuracy of the test result of the capacitive screen is influenced, and the SIU test module has no effective protection measure and is very easily damaged in the use process.

SUMMERY OF THE UTILITY MODEL

The utility model aims to overcome the defects in the prior art, provides a novel capacitive screen testing jig, and solves the problems that when an SIU testing module is adopted to carry out power-on testing on a capacitive screen in the prior art, the SIU testing module is generally directly exposed and is easily influenced by static electricity in the testing process, so that the accuracy of the testing result of the capacitive screen is influenced, and the SIU testing module has no effective protection measures and is very easily damaged in the using process.

In order to achieve the purpose, the utility model adopts the technical scheme that:

a novel capacitive screen test fixture comprises an SIU test module, an bakelite box body and a bakelite box cover, wherein the bakelite box body is of a hollow square cavity structure with an opening at the upper end, the bakelite box cover is detachably covered on the opening at the upper end of the bakelite box body, the SIU test module is fixedly installed in the bakelite box body, one side of the bakelite box body is provided with a clearance groove aligned with the SIU test module, one side of the SIU test module aligned with the clearance groove is provided with a power supply interface, the inside of the bakelite box body is also fixedly provided with a USB interface, the USB interface is electrically connected with the SIU test module, one side of the bakelite box body is provided with a USB clearance groove aligned with the USB interface, the top of the SIU test module is provided with a row of keys and a test interface, the bakelite box cover is provided with a key clearance groove and a test interface clearance groove, the key clearance groove and the test interface clearance groove are respectively aligned with the key and the test interface, one side of the SIU test module, which is close to the clearance groove, is provided with a power switch, and the bakelite box cover is provided with a switch clearance groove aligned with the power switch.

Further, a plurality of mounting holes are uniformly formed in the bakelite box body along the circumferential direction of the bakelite box body, a plurality of mounting through holes matched with the mounting holes are formed in the bakelite box cover along the circumferential direction of the bakelite box body, when the bakelite box cover covers the bakelite box body, the mounting holes are aligned with the mounting through holes, and fixing screws are driven into the mounting holes through the mounting through holes, so that the bakelite box cover is fixed onto the bakelite box body.

Furthermore, the top of the clearance groove is provided with a U-shaped notch, and the U-shaped notch is communicated with the switch clearance groove in an aligned manner.

Furthermore, a reserved groove is formed in one side of the USB clearance groove.

This use novel simple structure, and reasonable design, the accessible sets up SIU test module in the bakelite box fixedly, then it is sealed with the upper end opening of bakelite box through the bakelite case lid again, because bakelite box and bakelite case lid all adopt the bakelite material of preventing static to make, consequently can prevent effectively that SIU test module from receiving the influence of static in the test process, the accuracy of capacitive screen at the test result of circular telegram test in-process has been guaranteed, and bakelite box and bakelite case lid still can play the guard action to the SIU test module that sets up in the bakelite box, prevent that it from being damaged in the use. When the device is used for conducting power-on testing on the capacitive screen, the testing interface can be made to be connected with the adapter through the testing interface clearance groove in the bakelite box cover, then the testing interface is connected with the capacitive screen through the adapter, then the USB interface is connected with the computer through the USB clearance groove, then the power supply is connected with the external power supply through the power supply interface, finally the power switch on the SIU testing module is turned on, and the power supply is switched on to conduct testing. The utility model can isolate the SIU test module through the bakelite box body and the bakelite box cover in the test process, thereby preventing the accuracy of the test result from being influenced by static electricity.

Drawings

FIG. 1 is a schematic diagram of the apparatus of the present invention;

FIG. 2 is a schematic view of the installation structure of the SIU test module in the bakelite box;

in the figure: 1. SIU test module, 2, bakelite box, 3, bakelite case lid, 4, clearance groove, 5, power source, 6, USB interface, 7, USB clearance groove, 8, button, 9, test interface, 10, button clearance groove, 11, test interface clearance groove, 12, switch, 13, switch clearance groove, 14, mounting hole, 15, installation via hole, 16, "U" font breach, 17, reserve groove.

Detailed Description

The present invention will be described in further detail with reference to the accompanying drawings.

The novel capacitive screen test fixture shown in fig. 1-2 comprises an SIU test module 1, an bakelite box 2 and a bakelite box cover 3, wherein the bakelite box 2 is a hollow square cavity structure with an open upper end, the bakelite box cover 3 is detachably covered on the open upper end of the bakelite box 2, the SIU test module 1 is fixedly installed in the bakelite box 2, one side of the bakelite box 2 is provided with a clearance groove 4 aligned with the SIU test module 1, one side of the SIU test module 1 aligned with the clearance groove 4 is provided with a power interface 5, the bakelite box is further internally provided with a USB interface 6, the USB interface 6 is electrically connected with the SIU test module 1, one side of the bakelite box 2 is provided with a USB clearance groove 7 aligned with the USB interface 6, the top of the SIU test module 1 is provided with a row of keys 8 and a test interface 9, a key clearance groove 10 and a test interface clearance groove 11 are formed in the bakelite box cover 3, the key clearance groove 10 and the test interface clearance groove 11 are respectively aligned with the key 8 and the test interface 9, a power switch 12 is arranged on one side, close to the clearance groove 4, of the SIU test module 1, and a switch clearance groove 13 aligned with the power switch 12 is formed in the bakelite box cover 3; the bakelite box body 2 is uniformly provided with a plurality of mounting holes 14 along the circumferential direction, the bakelite box cover 3 is provided with a plurality of mounting through holes 15 matched with the mounting holes 14 along the circumferential direction, when the bakelite box cover 3 covers the bakelite box body 2, the mounting holes 14 are aligned with the mounting through holes 15, and fixing screws can be driven into the mounting holes 14 through the mounting through holes 15, so that the bakelite box cover 3 is fixed on the bakelite box body 2; the top of the clearance groove 4 is provided with a U-shaped notch 16, and the U-shaped notch 16 is communicated with the switch clearance groove 13 in an aligned manner; one side of the USB clearance groove 7 is provided with a reserved groove 17, and the reserved groove 17 can be used for clearance of other test interfaces.

This use novel simple structure, reasonable in design, the accessible sets up SIU test module 1 fixed in bakelite box 2, then it is sealed with the upper end opening of bakelite box 2 through bakelite case lid 3 again, because bakelite box 2 and bakelite case lid 3 all adopt the bakelite material of preventing static to make, consequently can effectively prevent SIU test module 1 from receiving the influence of static in the test process, the accuracy of capacitive screen at the test result of circular telegram test in-process has been guaranteed, and bakelite box 2 and bakelite case lid 3 still can play the guard action to SIU test module 1 who sets up in bakelite box 2, prevent that it from being damaged in the use. When the device is used for carrying out power-on test on the capacitive screen, the test interface 9 external adapter can be firstly connected through the test interface clearance groove 11 on the bakelite box cover 3, then the adapter is connected with the capacitive screen, then the USB interface 6 is connected with a computer through the USB clearance groove 7, then the power supply is connected with the external power supply through the power supply interface 5, finally the power switch 12 on the SIU test module 1 is opened, and the power supply is switched on for testing. According to the utility model, the SIU testing module 1 can be isolated through the bakelite box body 2 and the bakelite box cover 3 in the testing process, so that the accuracy of a testing result is prevented from being influenced by static electricity, and the bakelite box body 2 and the bakelite box cover 3 can also play a role in protecting the SIU testing module 1 and prevent the SIU testing module from being damaged in the using process.

The above-described embodiments are illustrative of the present invention and not restrictive, it being understood that various changes, modifications, substitutions and alterations can be made herein without departing from the principles and spirit of the utility model, the scope of which is defined by the appended claims and their equivalents.

Claims

1. The utility model provides a novel capacitive screen test fixture, includes SIU test module (1), bakelite box (2) and bakelite case lid (3), its characterized in that, bakelite box (2) are the square cavity class structure of upper end open-ended cavity, bakelite case lid (3) detachably cover in on the upper end opening of bakelite box (2), SIU test module (1) fixed mounting in bakelite box (2), one side of bakelite box (2) seted up one with the dead slot (4) of keeping away that SIU test module (1) aligns, SIU test module (1) aligns one side of keeping away dead slot (4) has seted up one power source (5), bakelite box is internal (2) still fixed mounting has one USB interface (6), USB interface (6) with SIU test module (1) electric connection, one side of bakelite box (2) seted up one with USB dead slot (7) are kept away to USB that USB interface (6) align) The device comprises a base, a power switch (4) and a test interface (9), wherein a row of keys (8) and the test interface (9) are arranged at the top of the SIU test module (1), a key clearance groove (10) and a test interface clearance groove (11) are formed in the bakelite box cover (3), the key clearance groove (10) and the test interface clearance groove (11) are respectively aligned with the keys (8) and the test interface (9), one side, close to the clearance groove (4), of the SIU test module (1) is provided with a power switch (12), and a switch clearance groove (13) aligned with the power switch (12) is formed in the bakelite box cover (3).

2. The novel capacitive screen testing jig is characterized in that the bakelite box body (2) is uniformly provided with a plurality of mounting holes (14) along the circumferential direction, the bakelite box cover (3) is provided with a plurality of mounting through holes (15) matched with the mounting holes (14) along the circumferential direction, when the bakelite box cover (3) covers the bakelite box body (2), the mounting holes (14) are aligned with the mounting through holes (15), and fixing screws can be driven into the mounting holes (14) through the mounting through holes (15), so that the bakelite box cover (3) is fixed on the bakelite box body (2).

3. The novel capacitive screen testing jig is characterized in that a U-shaped notch (16) is formed in the top of the clearance groove (4), and the U-shaped notch (16) is communicated with the switch clearance groove (13) in an aligned mode.

4. The novel capacitive screen testing jig is characterized in that a reserved groove (17) is formed in one side of the USB clearance groove (7).