CN215575604U - Sampling probe, probe array and electromagnetic field measurement system - Google Patents
Sampling probe, probe array and electromagnetic field measurement system Download PDFInfo
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- CN215575604U CN215575604U CN202120988658.3U CN202120988658U CN215575604U CN 215575604 U CN215575604 U CN 215575604U CN 202120988658 U CN202120988658 U CN 202120988658U CN 215575604 U CN215575604 U CN 215575604U
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Abstract
The utility model provides a sampling probe, a sampling probe array and an electromagnetic field measurement system, wherein the sampling probe comprises a radiation plate and a feed plate; the radiating plate comprises a substrate and two orthogonal dipoles, jacks are formed in the substrate, each dipole is provided with a pair of radiating arms, each pair of radiating arms is arranged on two sides of each jack, connecting lines of the radiating arms are intersected with the jacks, and first bonding pads are arranged at the end parts, close to the jacks, of the radiating arms; two sides of the feed board are respectively provided with a pair of feed lines and a pair of ground lines, one end of the feed board extends to form a plug part, and two opposite sides of the plug part are provided with four second bonding pads which are correspondingly connected with the feed lines and the ground lines one by one; the plug portion of the feed board is inserted into the jack, and the first pad and the second pad are welded to each other. The sampling probe is simple in structure, small in size and light in weight, and is favorable for forming a sampling probe array for measuring the specific absorption rate of a tested device.
Description
Technical Field
The utility model relates to the technical field of electromagnetic field measurement, in particular to a sampling probe, a probe array and an electromagnetic field measurement system.
Background
Under the action of the external electromagnetic field, an induced electromagnetic field is generated in a human body, and various organs of the human body are all lossy media, so the internal electromagnetic field generates current, and the electromagnetic energy is absorbed and dissipated. The SAR is called an electromagnetic wave absorption ratio or specific absorption rate, the SAR means electromagnetic power absorbed or consumed by human tissue with unit mass, the unit is W/kg, and the SAR is used for measuring the radiation influence of the electromagnetic wave energy of a mobile phone or a wireless product on a human body.
In order to obtain three-dimensional electromagnetic field distribution in a certain space, a space electromagnetic field needs to be subjected to planar sampling, in the existing electromagnetic field testing system for SAR testing, a servo mechanism carries a single sampling probe to realize mechanical scanning, the single sampling probe moves one by one to realize data sampling, and the servo scanning sampling method is relatively time-consuming.
SUMMERY OF THE UTILITY MODEL
The primary object of the present invention is to provide a sampling probe that is small in size and has good electrical performance.
Another object of the present invention is to provide a probe array using the above sampling probe.
Still another object of the present invention is to provide an electromagnetic field measuring system using the above probe array.
In order to achieve the above purpose, the utility model provides the following technical scheme:
in a first aspect, there is provided a sampling probe comprising: the feed board supports the radiation board and feeds the radiation board; the radiating plate comprises a substrate and two mutually orthogonal dipoles arranged on the substrate, jacks are formed in the substrate, the jacks penetrate through the substrate in the thickness direction, each dipole is provided with a pair of radiating arms, each pair of radiating arms are respectively arranged on two sides of each jack, connecting lines of the radiating arms are intersected with the jacks, and first bonding pads are arranged at the end parts, close to the jacks, of the radiating arms; one side of the feed board is provided with a pair of feed lines respectively connected with one radiation arm of each of the two dipoles, the other side of the feed board is provided with a pair of ground lines connected with the other radiation arm of each of the two dipoles, one end of the feed board extends to form a plug part, and two opposite sides of the plug part are provided with four second bonding pads which are correspondingly connected with the feed lines and the ground lines one by one; the plug portion of the feed board is inserted into the jack, and the first pad and the second pad are welded to each other.
Optionally, the pair of feed lines are respectively provided with a first parallel double line, a first transition part and a microstrip interface which are connected in sequence, the parallel double line is connected with the second pad, and the microstrip interface is used for connecting to an external feed network.
Optionally, the first parallel double line is provided with a wavy line segment.
Optionally, the pair of ground wires are respectively provided with a second parallel double wire and a second transition portion which are connected, the second transition portion is gradually widened along a direction away from the second parallel double wire, and the ends of the pair of second transition portions away from the second parallel double wire are connected to form a ground plane.
Optionally, the ground plane is provided with a hollow portion.
Optionally, one end of each of the two conductor strips of the second parallel double line near the second transition part is intersected with each other, a fracture is arranged at the position of the intersection of the two conductor strips, two ends of the fracture are connected with the metal via hole through a jumper wire positioned on the other side of the feed board, and the other conductor strip penetrates through the fracture and forms a gap with the end part of the fracture.
As a second aspect, it relates to a probe array comprising a plurality of sub-arrays, each sub-array being provided with at least one of the above-mentioned sampling probes.
As a third aspect, an electromagnetic field measurement system is provided, which includes the probe array and a feed network for feeding the probe array, where the feed network includes a matrix switch circuit, the matrix switch circuit has two sets of input ports arranged corresponding to two polarization directions and two output ports correspondingly connected to the two sets of input ports, the input ports of each set are multiple, and multiple input ports of each set are connected to dipoles in the same polarization direction in the sampling probe array in a one-to-one correspondence manner and are selectively switchable to communicate with the output ports.
Optionally, the matrix switch circuit includes a plurality of first switch groups and second switch groups, the first switch groups are connected to the sub-arrays in a one-to-one correspondence, and the second switch groups are connected to ends of all the first switch groups, which are far away from the dipoles; the first switch group is provided with the input port, and the second switch group is provided with the output port.
Optionally, the first switch group comprises a first-stage switch unit composed of a plurality of double-pole double-throw switches, a second-stage switch unit composed of a plurality of single-pole four-throw switches, and a third-stage switch unit composed of two single-pole six-throw switches;
the second switch group comprises a four-stage switch unit consisting of a plurality of single-pole four-throw switches and a five-stage switch unit consisting of two single-pole six-throw switches;
the first-stage switch unit, the second-stage switch unit, the third-stage switch unit, the fourth-stage switch unit and the fifth-stage switch unit are sequentially cascaded, and the second-stage switch unit to the fifth-stage switch unit are divided into two groups to work in two orthogonal polarization directions correspondingly.
The technical scheme provided by the utility model has the beneficial effects that:
the sampling probe provided by the utility model adopts the technical scheme that the conductor strip is arranged on the substrate to form the dipole, the feed board is inserted into the substrate to realize the feed of the dipole, and the sampling probe has the advantages of simple structure, small size and better electrical performance. The first parallel double lines are provided with wavy line segments for compensating the redundant length of the grounding line and ensuring that the phase delay of the feeder line signal line is consistent with that of the grounding line. The ground plane cutout forms a hollowed-out portion for adjusting impedance matching of the feed network.
The electromagnetic field measuring system comprises a sampling probe array, a matrix switch circuit is arranged to feed the sampling probe array, and the matrix switch circuit can be switched to obtain the amplitude and phase of any two antenna units in the sampling probe array, so that amplitude-phase sampling data of a plane radiation near field of equipment such as a mobile phone can be obtained, a three-dimensional electromagnetic field in the area can be further calculated according to a near field far field conversion algorithm, and the specific absorption rate of the equipment to be measured can be obtained through the distribution of the three-dimensional electromagnetic field.
Drawings
In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the drawings used in the description of the embodiments of the present invention will be briefly described below.
FIG. 1 is a schematic diagram of a sampling array structure of an electromagnetic field measurement system according to an embodiment of the present invention;
FIG. 2 is a schematic perspective view of a sampling probe according to an embodiment of the present invention;
FIG. 3 is a top view of a radiation plate of the sampling probe of FIG. 2;
fig. 4 is a schematic perspective view of the radiation plate shown in fig. 2;
FIG. 5 is a schematic diagram of a feed line structure of a feed plate of the sampling probe shown in FIG. 2;
FIG. 6 is a schematic diagram of a ground line structure of a feed board of the sampling probe shown in FIG. 2;
fig. 7 is a schematic diagram of a connection structure of a sub-array and a first switch set according to an embodiment of the present invention;
FIG. 8 is a schematic diagram of a plurality of sub-array output interfaces of a sampling array according to an embodiment of the present invention;
fig. 9 is a schematic diagram of a connection structure of a first switch set and a second switch set according to an embodiment of the present invention.
Detailed Description
Embodiments of the present invention will be described in more detail below with reference to the accompanying drawings. While certain embodiments of the present invention are shown in the drawings, it should be understood that the present invention may be embodied in various forms and should not be construed as limited to the embodiments set forth herein, but rather are provided for a more thorough and complete understanding of the present invention. It should be understood that the drawings and the embodiments of the present invention are illustrative only and are not intended to limit the scope of the present invention.
It should be understood that the various steps recited in the method embodiments of the present invention may be performed in a different order and/or performed in parallel. Moreover, method embodiments may include additional steps and/or omit performing the illustrated steps. The scope of the utility model is not limited in this respect.
The term "include" and variations thereof as used herein are open-ended, i.e., "including but not limited to". The term "coupled" may refer to direct coupling or indirect coupling via intermediate members (elements). The term "one embodiment" means "at least one embodiment"; the term "another embodiment" means "at least one additional embodiment"; the term "some embodiments" means "at least some embodiments". Relevant definitions for other terms will be given in the following description.
It should be noted that the terms "first", "second", and the like in the present invention are only used for distinguishing the devices, modules or units, and are not used for limiting the devices, modules or units to be different devices, modules or units, and are not used for limiting the sequence or interdependence relationship of the functions executed by the devices, modules or units.
Referring to fig. 1 to 9, the utility model provides a sampling probe, a probe array using the sampling probe, and an electromagnetic field measurement system, which are suitable for performing planar sampling on a spatial electromagnetic field to obtain three-dimensional electromagnetic field distribution in a certain space.
In one embodiment, the probe array is composed of twenty sub-arrays, each sub-array has twenty sampling probes (the sampling probes are dual-polarized probes), amplitude-phase sampling data of a plane radiation near field of a device such as a mobile phone can be obtained through amplitude and phase data of any two sampling probes, so that a three-dimensional electromagnetic field in the area can be further calculated according to a near field-far field conversion algorithm, and the specific absorption rate of the device to be tested can be obtained through three-dimensional electromagnetic field distribution.
Correspondingly, a matrix switch circuit is arranged in a feed network of the electromagnetic field measurement system, the matrix switch circuit is provided with a plurality of input ports and two output ports, the input ports are correspondingly connected with feed ports of the sampling probes one by one, the two output ports correspondingly work in two orthogonal polarization directions, and the input ports are selectively connected with the output ports in a switching mode, so that two paths of amplitude-phase sampling signals of each sampling probe can be obtained, and the specific absorption rate of the tested equipment is calculated.
Referring to fig. 2 to 6, the sampling probe includes a radiation plate 10 and a feeding plate 20 for supporting and feeding the radiation plate.
The radiation plate comprises a substrate 105 made of a dielectric and two dipoles arranged on the substrate and orthogonal to each other, each of the two dipoles being provided with two radiation arms and operating in two orthogonal polarization directions, for example a +45 ° polarization direction and a-45 ° polarization direction.
The base plate 105 is provided with a jack 106, the jack penetrates through the base plate along the thickness direction, the two pairs of radiation arms 101-104 are respectively arranged on two sides of the jack, the connecting line of each pair of radiation arms is intersected with the jack, and first welding pads 1010-1040 are arranged at the end parts, close to the jack, of the radiation arms.
The feed board 20 includes a dielectric plate 200, one surface of which is provided with a pair of feed lines 202 and 204 respectively connected to one radiation arm of each of two dipoles, and the other surface of which is provided with a pair of ground lines 205 connected to the other radiation arm of each of the two dipoles, one end of the feed board extends to form a plug portion (not shown, the same applies below), and two opposite surfaces of the plug portion are provided with four second pads 2010-2040 connected to the feed lines and the ground lines in a one-to-one correspondence manner.
The plug portion of the feeding board 20 is inserted into the insertion hole 106 of the radiation board 10, and the first pad and the second pad are welded to each other in a one-to-one correspondence to form a welding point 203.
Optionally, the pair of feed lines 202, 204 are each provided with a first parallel double line 2021, 2041, a first transition 2022, 2042 and a microstrip interface connected in sequence, the parallel double line is connected with the second pad, and the microstrip interface is used for connecting to an external feed network. Preferably, the first parallel double line is provided with a wavy line segment for compensating the redundant length of the ground wire and ensuring that the signal wire and the ground reference are in phase delay consistency.
Optionally, the pair of ground lines 205 are respectively provided with a second parallel double line 2011, 2031 and a second transition 2012, 2032, which are connected, the second transition gradually widens in a direction away from the second parallel double line, and ends of the pair of second transitions, which are away from the second parallel double line, are connected to form a ground plane. Preferably, the ground plane is provided with a hollow-out portion 207 for adjusting the impedance matching of the feed network.
Optionally, the two conductor strips of the second parallel twinax cross each other at an end near the second transition, wherein one conductor strip is provided with a break at the crossing position, both ends of the break are connected with the metal via 206 through a jumper 208 at the other side of the feed board, and the other conductor strip passes through the break and forms a gap with the end of the break.
Referring to fig. 7 to 9, the feed network includes a matrix switch circuit, the matrix switch circuit has two sets of input ports corresponding to two polarization directions and two output ports corresponding to the two sets of input ports, the number of the input ports of each set is multiple, and the multiple input ports of each set are connected with dipoles in the same polarization direction in the sampling probe array in a one-to-one correspondence manner and are selectively switchable to communicate with the output ports.
Optionally, the matrix switch circuit includes a plurality of first switch groups and second switch groups, the first switch groups are connected to the sub-arrays in a one-to-one correspondence, and the second switch groups are connected to ends of all the first switch groups, which are far away from the dipoles; the first switch group is provided with the input port, and the second switch group is provided with the output port.
Optionally, the first switch group comprises a first-stage switch unit composed of a plurality of double-pole double-throw switches, a second-stage switch unit composed of a plurality of single-pole four-throw switches, and a third-stage switch unit composed of two single-pole six-throw switches; the second switch group comprises a four-stage switch unit consisting of a plurality of single-pole four-throw switches and a five-stage switch unit consisting of two single-pole six-throw switches; the first-stage switch unit, the second-stage switch unit, the third-stage switch unit, the fourth-stage switch unit and the fifth-stage switch unit are sequentially cascaded, and the second-stage switch unit to the fifth-stage switch unit are divided into two groups to work in two orthogonal polarization directions correspondingly.
In one embodiment, the feed network of a sub-array comprising 20 sampling probes is shown in fig. 7, and 20 antenna units comprise 40 independent rf terminals of a 1-a 10, B1-B10, C1-C10, and D1-D10. A40 x2 matrix switch network consisting of twenty double-pole double-throw (DPDT) radio frequency switches, ten single-pole four-throw (SP4T) switches and two single-pole six-throw (SP6T) switches is adopted to gate forty radio frequency signals into two ports, and the feed network can gate any two paths of the forty radio frequency signals to output ports (E1 and F1).
Twenty groups of antenna sub-arrays are adopted, each sub-array adopts a feed switch network shown in fig. 7, and twenty signals of E1-E10 and F1-F10 are generated, as shown in fig. 8. The twenty signals pass through a 40x2 matrix switch network to gate the signals into two paths, as shown in fig. 9, finally a 800x2 switch gate network is realized, and finally signals P1 and P2 are output.
Therefore, amplitude detection and phase detection can be carried out, the amplitude and phase of any two antenna units in the 20x20 antenna array can be obtained by switching the feed network, amplitude-phase sampling data of a plane radiation near field of equipment such as a mobile phone and the like can be obtained, a three-dimensional electromagnetic field in the area can be further calculated according to a near field far field conversion algorithm, and the specific absorption rate of the equipment to be tested can be obtained through the distribution of the three-dimensional electromagnetic field.
The foregoing description is only exemplary of the preferred embodiments of the utility model and is illustrative of the principles of the technology employed. It will be understood by those skilled in the art that the scope of the present invention is not limited to the specific combination of the above-mentioned features, and other embodiments can be made by combining the above-mentioned features or their equivalents without departing from the spirit of the present invention. For example, the above features are replaced with (but not limited to) features having similar functions of the present invention.
Although the subject matter has been described in language specific to structural features and/or methodological acts, it is to be understood that the subject matter defined in the appended claims is not necessarily limited to the specific features or acts described above. Rather, the specific features and acts described above are disclosed as example forms of implementing the claims.
Claims (10)
1. A sampling probe, comprising: the feed board supports the radiation board and feeds the radiation board;
the radiating plate comprises a substrate and two mutually orthogonal dipoles arranged on the substrate, jacks are formed in the substrate, the jacks penetrate through the substrate in the thickness direction, each dipole is provided with a pair of radiating arms, each pair of radiating arms are respectively arranged on two sides of each jack, connecting lines of the radiating arms are intersected with the jacks, and first bonding pads are arranged at the end parts, close to the jacks, of the radiating arms;
one side of the feed board is provided with a pair of feed lines respectively connected with one radiation arm of each of the two dipoles, the other side of the feed board is provided with a pair of ground lines connected with the other radiation arm of each of the two dipoles, one end of the feed board extends to form a plug part, and two opposite sides of the plug part are provided with four second bonding pads which are correspondingly connected with the feed lines and the ground lines one by one;
the plug portion of the feed board is inserted into the jack, and the first pad and the second pad are welded to each other.
2. The sampling probe of claim 1, wherein the pair of feed lines are each provided with a first parallel twin line, a first transition and a microstrip interface connected in series, the parallel twin lines interfacing with the second pad, the microstrip interface for connection to an external feed network.
3. The sampling probe of claim 2, wherein the first parallel doublet is provided with a wavy line segment.
4. The sampling probe of claim 1, wherein the pair of ground wires are each provided with a second parallel twin wire and a second transition portion that meet, the second transition portion gradually widens in a direction away from the second parallel twin wire, and ends of the pair of second transition portions that meet away from the second parallel twin wire form a ground plane.
5. The sampling probe of claim 4, wherein the ground plane is provided with a hollowed out portion.
6. The sampling probe of claim 4, wherein the two conductor strips of the second parallel bifilar intersect at an end adjacent the second transition, one of the conductor strips having a break at the intersection, the break having ends connected to the metal via by a jumper located on the other side of the feed plate, the other conductor strip passing through the break and forming a gap with the end of the break.
7. A probe array comprising a plurality of sub-arrays, each sub-array provided with at least one sampling probe according to any one of claims 1 to 6.
8. An electromagnetic field measuring system comprising the probe array of claim 7 and a feed network for feeding the probe array, the feed network comprising a matrix switch circuit having two sets of input ports arranged corresponding to two polarization directions and two output ports connected to the two sets of input ports, the input ports of each set being provided in plurality, the plurality of input ports of each set being connected to dipoles of the same polarization direction in the array of sampling probes in a one-to-one correspondence and being selectively switchable to communicate with the output ports.
9. An electromagnetic field measuring system according to claim 8, wherein the matrix switch circuit comprises a plurality of first switch groups and second switch groups, the first switch groups are connected with the sub-arrays in a one-to-one correspondence, and the second switch groups are connected with one ends of all the first switch groups far away from the dipoles; the first switch group is provided with the input port, and the second switch group is provided with the output port.
10. The electromagnetic field measurement system of claim 9, wherein the first switch set comprises a primary switch unit comprised of a plurality of double pole double throw switches, a secondary switch unit comprised of a plurality of single pole four throw switches, and a tertiary switch unit comprised of two single pole six throw switches;
the second switch group comprises a four-stage switch unit consisting of a plurality of single-pole four-throw switches and a five-stage switch unit consisting of two single-pole six-throw switches;
the first-stage switch unit, the second-stage switch unit, the third-stage switch unit, the fourth-stage switch unit and the fifth-stage switch unit are sequentially cascaded, and the second-stage switch unit to the fifth-stage switch unit are divided into two groups to work in two orthogonal polarization directions correspondingly.
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202120988658.3U CN215575604U (en) | 2021-05-10 | 2021-05-10 | Sampling probe, probe array and electromagnetic field measurement system |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202120988658.3U CN215575604U (en) | 2021-05-10 | 2021-05-10 | Sampling probe, probe array and electromagnetic field measurement system |
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| CN215575604U true CN215575604U (en) | 2022-01-18 |
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| CN202120988658.3U Active CN215575604U (en) | 2021-05-10 | 2021-05-10 | Sampling probe, probe array and electromagnetic field measurement system |
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