CN215575383U - Connector test probe - Google Patents
Connector test probe Download PDFInfo
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- CN215575383U CN215575383U CN202121279429.0U CN202121279429U CN215575383U CN 215575383 U CN215575383 U CN 215575383U CN 202121279429 U CN202121279429 U CN 202121279429U CN 215575383 U CN215575383 U CN 215575383U
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- contact
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Abstract
The utility model discloses a connector test probe, which can prolong the test life, does not need frequent replacement, saves the test time and reduces the cost, and comprises a contact shell and a connection shell which are sequentially connected, wherein an outer conductor spring is connected between the contact shell and the connection shell, the contact shell, the connection shell and the outer conductor spring form an elastic outer conductor, one end of the contact shell, which is far away from the connection shell, is provided with a shell plane used for contacting with the end surface of a tested object, and one end of the connection shell, which is far away from the contact shell, is provided with a connection port; be provided with the needle axle and the needle tubing that connect gradually in contact shell and the connection shell, and the needle tubing is located the one end that is close to connection port, and the one end that the needle tubing was kept away from to the needle axle has the needle axle plane that is used for with the testee contact, is connected with the inner conductor spring between needle axle and the needle tubing, and needle axle, needle tubing and inner conductor spring form elastic inner conductor, are provided with first insulator and second insulator between the both ends of inner conductor and the outer conductor respectively.
Description
Technical Field
The utility model relates to the technical field of radio frequency probes, in particular to a connector test probe.
Background
At present, the impedance design of a 5G base station antenna is provided with three sets of connectors of a board to a board, and the interconnection of an upper PCB and a lower PCB is realized. The design scheme has low cost and high reliability, and is very suitable for bundling test because the three-piece structure allows a certain capacity deviation in each direction. The three-piece set also bears the antenna performance test requirement besides the interconnection function. Before the two PCBs are interconnected, the performance of each PCB needs to be tested in advance, and the two PCBs can be connected after the requirements are met. The structure shown in figure 1 is adopted in the prior art, and the floating adapter 1 ' and the female adapter 2 ' are added, so that the structure has the defects that the test service life of the female adapter 2 ' is short, the service life of a material of a shell with a slotted structure reaches the limit and is easy to break after repeated tests, the test efficiency is reduced due to frequent replacement, and the cost is greatly improved.
Disclosure of Invention
In order to solve the problems in the prior art, the utility model provides a connector test probe which can prolong the test life, does not need to be frequently replaced, saves the test time and reduces the cost.
In order to achieve the above purpose, the technical scheme adopted by the utility model is as follows: the contact shell, the connecting shell and the outer conductor spring form an elastic outer conductor, a shell plane used for being in contact with the end face of a measured object is arranged at one end, away from the connecting shell, of the contact shell, and a connecting port is formed at one end, away from the contact shell, of the connecting shell; contact casing with be provided with the needle shaft and the needle tubing that connect gradually in the connection casing, just the needle tubing is located and is close to connection port's one end, the needle shaft is kept away from the one end of needle tubing has the needle shaft plane that is used for with the testee contact, the needle shaft with be connected with the inner conductor spring between the needle tubing, the needle shaft the needle tubing with the inner conductor spring forms elastic inner conductor, the both ends of inner conductor with be provided with first insulator and second insulator between the outer conductor respectively.
Furthermore, one end of the connection shell, which is close to the contact shell, is provided with a cylindrical end, one end of the contact shell, which is close to the connection shell, is sleeved on the cylindrical end, the outer conductor spring is sleeved on the cylindrical end, and two ends of the outer conductor spring are respectively abutted against the connection shell and the contact shell.
Furthermore, the diameter of one end of the contact shell is larger than that of the other end of the contact shell, the large-diameter end of the contact shell is sleeved on the cylindrical end, and the end face of the small-diameter end of the contact shell is provided with the shell plane.
Furthermore, a flange is arranged at a position, close to the connecting port, of the connecting shell, and a third insulator is arranged between the flange and the connecting shell.
Further, the flange and the third insulator are both fixedly sleeved on the cylindrical end.
Further, the flange is connected with a cylinder clamp, and the cylinder clamp is configured to drive the flange to drive the connector test probe to contact with a tested object.
Furthermore, the flange is provided with a plurality of mounting holes along the circumference, and the fastener passes through the mounting holes and is fixedly connected with the cylinder clamp.
Furthermore, an inner hole is formed in one end, close to the needle shaft, of the needle tube, one end, close to the needle shaft, of the needle shaft is inserted into the inner hole, the inner conductor spring is installed in the inner hole, and two ends of the inner conductor spring abut against the needle shaft and the needle tube respectively.
Furthermore, the diameter of one end of the needle shaft is larger than that of the other end of the needle shaft, the large-diameter end of the needle shaft is inserted into the inner hole of the needle tube, and the small-diameter end of the needle shaft is provided with the needle shaft plane.
Further, the connection port is an SMA threaded interface.
Compared with the prior art, the contact shell, the connecting shell and the outer conductor spring are connected to form an elastic outer conductor, and the needle shaft, the needle tube and the inner conductor spring are connected to form an elastic inner conductor, so that when in testing, the connector testing probe of the utility model does not collide with a PCB (printed circuit board) to be tested but contacts in a buffering mode, the outer conductor is allowed to have an axial offset stroke L, and the inner conductor has a radial offset angle alpha, so that the connector testing probe of the utility model has axial and radial offset capacities, can realize simultaneous connection testing of board-end connectors of a plurality of antenna PCB boards, can bear ten thousand testing service lives, does not need frequent replacement, saves testing time, indirectly reduces purchasing cost, and can be completely attached to the antenna PCB due to the action of elastic force, has good contact and is not eccentric, the problem of poor contact caused by the unevenness of the PCB is solved; in addition, the end of the contact shell, which is far away from the connection shell, is provided with a shell plane which is used for being in contact with the end face of a tested object, and the end of the needle shaft, which is far away from the needle tube, is provided with a needle shaft plane which is used for being in contact with the tested object, so that the contact between the inner conductor and the outer conductor and the board end connector of the antenna PCB is changed into plane contact from inner wall contact.
Furthermore, the flange can be connected with the cylinder clamp, the flange is driven by the cylinder clamp to drive the connector test probe to be in contact with a tested object, so that automatic test is facilitated, and test time is saved.
Furthermore, the connecting port is a standard SMA (shape memory alloy) interface with a threaded structure, and in the probe testing process, the performance is stable, the consistency is good, the standard structure is mature and stable, the frequency is high, and the processing is simple.
Drawings
FIG. 1 is a schematic diagram of a prior art configuration;
FIG. 2 is a schematic structural diagram of an embodiment of the present invention;
FIG. 3 is a side view of an embodiment of the present invention;
FIG. 4 is a schematic illustration of test offset capacity for an embodiment of the present invention;
FIG. 5 is a schematic diagram of the inner and outer conductor contact pattern of an embodiment of the present invention;
the connector comprises a 1 '-floating adapter, a 2' -female adapter, a 1-contact shell, a 101-shell plane, a 2-pin shaft, a 201-pin shaft plane, a 3-first insulator, a 4-outer conductor spring, a 5-inner conductor spring, a 6-connecting shell, a 7-needle tube, an 8-third insulator, a 9-flange, a 91-mounting hole, a 10-second insulator, an 11-connecting port and a 12-PCB.
Detailed Description
The present invention will be further explained with reference to the drawings and specific examples in the specification, and it should be understood that the examples described are only a part of the examples of the present application, and not all examples. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.
The embodiment of the utility model provides a connector test probe, which is suitable for testing the connection of a board end connector of a PCB (printed circuit board) 12 of an antenna, in particular to the connection test of a three-piece connector of the antenna, and referring to the drawings of fig. 2 to 5, the connector test probe comprises a contact shell 1 and a connection shell 6 which are sequentially connected, an outer conductor spring 4 is connected between the contact shell 1 and the connection shell 6, the contact shell 1, the connection shell 6 and the outer conductor spring 4 form an elastic outer conductor, one end of the contact shell 1, which is far away from the connection shell 6, is provided with a shell plane 101 for contacting with the end surface of a tested object, and one end of the connection shell 6, which is far away from the contact shell 1, is provided with a connection port 11; be provided with needle axle 2 and needle tubing 7 that connect gradually in contact shell 1 and the connection shell 6, and needle tubing 7 is located the one end that is close to connection port 11, and the one end that needle axle 2 kept away from needle tubing 7 has the needle axle plane 201 that is used for with the testee contact, is connected with inner conductor spring 5 between needle axle 2 and the needle tubing 7, and needle axle 2, needle tubing 7 and inner conductor spring 5 form elastic inner conductor, are provided with first insulator 3 and second insulator 10 between the both ends of inner conductor and the outer conductor respectively.
It can be understood that the contact housing 1, the connection housing 6 and the outer conductor spring 4 of the present embodiment are connected to form an elastic outer conductor, and the needle shaft 2, the needle tube 7 and the inner conductor spring 5 are connected to form an elastic inner conductor, so that, during testing, the connector test probe of the present embodiment does not collide with the PCB 12 to be tested, but contacts in a buffer manner, allowing the outer conductor to have an axial offset stroke L, and the inner conductor to have a radial offset angle α, so that the connector test probe of the present embodiment has axial and radial offset capacities, can simultaneously test the board-end connectors of a plurality of antenna PCB 12, and can endure ten thousand test lives, without frequent replacement, save test time, indirectly reduce procurement cost, and because of the elastic force, the connector test probe of the present invention can be completely attached to the antenna PCB 12, the contact is good, the eccentricity is avoided, and the problem of poor contact caused by the unevenness of the PCB 12 is solved; in addition, one end of the contact shell 1, which is far away from the connection shell 6, is provided with a shell plane 101 for contacting with the end surface of the tested object, and one end of the needle shaft 2, which is far away from the needle tube 7, is provided with a needle shaft plane 201 for contacting with the tested object, so that the contact between the inner conductor and the outer conductor and the board-end connector of the antenna PCB 12 is changed into plane contact from inner wall contact, namely, the shell plane 101 is in close contact with the end surface of the board-end connector, and the needle shaft plane 201 is in contact with a contact pin of the board-end connector.
Specifically, one end of the connection housing 6 close to the contact housing 1 has a cylindrical end, one end of the contact housing 1 close to the connection housing 6 is sleeved on the cylindrical end, the outer conductor spring 4 is sleeved on the cylindrical end, and two ends of the outer conductor spring 4 are respectively abutted against the connection housing 6 and the contact housing 1. Preferably, the diameter of one end of the contact housing 1 is larger than that of the other end, the large diameter end of the contact housing 1 is sleeved on the cylindrical end, and the end surface of the small diameter end of the contact housing 1 is provided with a housing plane 101.
Specifically, the connection housing 6 is provided with a flange 9 at a position close to the connection port 11, and a third insulator 8 is provided between the flange 9 and the connection housing 6. The flange 9 and the third insulator 8 are both fixedly sleeved at the cylindrical end of the connecting shell 6. The probe is fixed through the flange 9 during the test of this embodiment, ensures that the probe can not wholly deviate and rotate.
Preferably, the flange 9 is connected with a cylinder clamp, and the cylinder clamp is configured to drive the flange 9 to bring the connector test probe into contact with the tested object. More preferably, the flange 9 is provided with a plurality of mounting holes 91 along the circumferential direction, and the fastening member passes through the mounting holes 91 to be fixedly connected with the cylinder clamp. The flange 9 of this embodiment's axial sets up two mounting holes 91, and the cylinder anchor clamps can be connected through fasteners such as bolts to flange 9, utilizes cylinder anchor clamps drive flange to drive connector test probe and testee contact, conveniently carries out automated testing, practices thrift test time.
Specifically, one end of the needle tube 7 close to the needle shaft 2 is provided with an inner hole, one end of the needle shaft 2 close to the needle tube 7 is inserted into the inner hole, the inner conductor spring 5 is installed in the inner hole, and two ends of the inner conductor spring 5 are respectively abutted against the needle shaft 2 and the needle tube 7. Preferably, the diameter of one end of the needle shaft 2 is larger than that of the other end, the large diameter end of the needle shaft 2 is inserted into the inner hole of the needle tube 7, and the small diameter end of the needle shaft 2 is provided with a needle shaft plane 201.
Preferably, the connection port 11 is an SMA threaded interface, and during a probe test process, the performance is stable, the consistency is good, the standard structure is mature and stable, the frequency is high, and the processing is simple.
During assembly of the embodiment, the inner conductor spring 5 is firstly arranged in an inner hole of the needle tube 7, one end of the needle shaft 2 with the large diameter is inserted into the inner hole of the needle tube 7 to form the inner conductor with elasticity, and two ends of the inner conductor are assembled with the first insulator 3 and the second insulator 10 into a whole, so that the inner conductor is fixed; then on putting flange 9, third insulator 8, outer conductor spring 4 cover into the cylinder end of connecting casing 6 in proper order, put the big one end cover of contact housing 1 diameter to the cylinder end of connecting casing 6, through specific tool interference fit, compress tightly connection housing 6 and contact housing 1, constitute and take elastic outer conductor, other parts such as other installation connection port 11.
During this embodiment test, pass mounting hole 91 through the bolt and fix on cylinder anchor clamps, cylinder anchor clamps push down and drive flange 9 and push down, make probe and measured object contact, until casing plane 101 and needle shaft plane 201 and measured object terminal surface contact, stop to push down, test can.
By integrating the double-rotator structure, the utility model improves the product testing efficiency, saves the testing time, reduces the product replacement cost and prolongs the testing service life.
Finally, it should be noted that: the above embodiments are only used to illustrate the technical solution of the present invention, and not to limit the same; although the present invention has been described in detail with reference to the foregoing embodiments, it will be understood by those of ordinary skill in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some or all of the technical features may be equivalently replaced; and the modifications or the substitutions do not make the essence of the corresponding technical solutions depart from the scope of the technical solutions of the embodiments of the present invention.
Claims (10)
1. The connector test probe is characterized by comprising a contact shell (1) and a connection shell (6) which are sequentially connected, wherein an outer conductor spring (4) is connected between the contact shell (1) and the connection shell (6), the contact shell (1), the connection shell (6) and the outer conductor spring (4) form an elastic outer conductor, a shell plane (101) used for being in contact with the end face of a tested object is arranged at one end, away from the connection shell (6), of the contact shell (1), and a connection port (11) is arranged at one end, away from the contact shell (1), of the connection shell (6); contact casing (1) with be provided with needle axle (2) and needle tubing (7) that connect gradually in connecting casing (6), just needle tubing (7) are located and are close to the one end of connection port (11), needle axle (2) are kept away from the one end of needle tubing (7) has needle axle plane (201) that is used for with the testee contact, needle axle (2) with be connected with between needle tubing (7) inner conductor spring (5), needle axle (2) needle tubing (7) with inner conductor spring (5) form elastic inner conductor, the both ends of inner conductor with be provided with first insulator (3) and second insulator (10) between the outer conductor respectively.
2. A connector test probe according to claim 1, wherein one end of the connection housing (6) close to the contact housing (1) has a cylindrical end, one end of the contact housing (1) close to the connection housing (6) is sleeved on the cylindrical end, the outer conductor spring (4) is sleeved on the cylindrical end, and two ends of the outer conductor spring (4) abut against the connection housing (6) and the contact housing (1), respectively.
3. A connector test probe according to claim 2, characterized in that the diameter of one end of the contact housing (1) is larger than the diameter of the other end, the larger diameter end of the contact housing (1) is arranged to fit around the cylindrical end, and the end surface of the smaller diameter end of the contact housing (1) is arranged to provide the housing plane (101).
4. Connector test probe according to claim 2, characterized in that a flange (9) is arranged at the connection housing (6) near the connection port (11), and a third insulator (8) is arranged between the flange (9) and the connection housing (6).
5. A connector test probe according to claim 4, characterised in that the flange (9) and the third insulator (8) are both fixedly sleeved at the cylindrical end.
6. A connector test probe according to claim 4, characterised in that a cylinder clamp is attached to the flange (9), the cylinder clamp being configured to drive the flange (9) into contact with the object to be tested.
7. A connector test probe according to claim 6, characterised in that the flange (9) is provided with a plurality of mounting holes (91) in the circumferential direction, and that fasteners are fixedly connected to the cylinder clamp through the mounting holes (91).
8. The connector testing probe according to claim 1, wherein an end of the needle tube (7) close to the needle shaft (2) is provided with an inner hole, an end of the needle shaft (2) close to the needle tube (7) is inserted into the inner hole, the inner conductor spring (5) is mounted in the inner hole, and two ends of the inner conductor spring (5) are respectively abutted against the needle shaft (2) and the needle tube (7).
9. The connector test probe as recited in claim 7, wherein the diameter of one end of the needle shaft (2) is larger than that of the other end, the large diameter end of the needle shaft (2) is inserted into the inner hole of the needle tube (7), and the small diameter end of the needle shaft (2) is provided with the needle shaft plane (201).
10. A connector test probe according to claim 1, characterized in that the connection port (11) is an SMA screw interface.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN202121279429.0U CN215575383U (en) | 2021-06-08 | 2021-06-08 | Connector test probe |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN202121279429.0U CN215575383U (en) | 2021-06-08 | 2021-06-08 | Connector test probe |
Publications (1)
Publication Number | Publication Date |
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CN215575383U true CN215575383U (en) | 2022-01-18 |
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ID=79867143
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
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CN202121279429.0U Active CN215575383U (en) | 2021-06-08 | 2021-06-08 | Connector test probe |
Country Status (1)
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CN (1) | CN215575383U (en) |
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2021
- 2021-06-08 CN CN202121279429.0U patent/CN215575383U/en active Active
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