CN215575329U - Current testing system - Google Patents
Current testing system Download PDFInfo
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- CN215575329U CN215575329U CN202120678855.5U CN202120678855U CN215575329U CN 215575329 U CN215575329 U CN 215575329U CN 202120678855 U CN202120678855 U CN 202120678855U CN 215575329 U CN215575329 U CN 215575329U
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Abstract
The application discloses a current testing system, which comprises an auxiliary testing device, wherein the output end of the auxiliary testing device is connected with the output end of a tested power supply and a grounding load, and the output voltage of the auxiliary testing device is higher than that of the tested power supply; and the result output device is connected with the auxiliary test device and used for obtaining and outputting the output current value of the power supply to be tested according to the output current value of the auxiliary test device. This application need not handle the relevant circuit of being surveyed the power when testing being surveyed power supply current, and application scope is wide, when being applied to high density circuit board, need not destroy original meticulous circuit on the high density circuit board and walk the line, improves efficiency of software testing and test reliability.
Description
Technical Field
The application relates to the field of current testing, in particular to a current testing system.
Background
Currently, there are two general schemes for testing dc current: the method is characterized in that firstly, a tested circuit is disconnected and connected into an ammeter in a series connection mode, hereinafter referred to as a series connection method, and secondly, a tested lead passes through an induction loop of a current probe and is converted into current according to the size of magnetic flux in the space around the lead, hereinafter referred to as an induction method. When a series connection method is adopted to test the direct current, a related circuit of a tested power supply needs to be disconnected firstly, then the tested power supply is connected into an ammeter in a series connection mode for testing, if the direct current is tested by an induction method, the related circuit of the tested power supply needs to be processed, and the related circuit is moved into an induction ring of a current probe or a breakpoint is processed firstly, a longer lead is added at two ends of the disconnection, and the lead passes through the induction ring of the current probe. Because the above two dc current testing schemes both require adjustment or processing of the related circuits of the power source to be tested, they are difficult to implement in high-density circuit boards with precise routing.
Therefore, how to provide a solution to the above technical problem is a problem that needs to be solved by those skilled in the art.
SUMMERY OF THE UTILITY MODEL
The purpose of this application is to provide a current test system, when testing the electric current of being surveyed the power, need not handle the relevant circuit of being surveyed the power, application scope is wide, when being applied to high density circuit board, need not destroy the original meticulous circuit on the high density circuit board and walk the line, improves efficiency of software testing and test reliability.
In order to solve the above technical problem, the present application provides a current testing system, including:
the auxiliary test device is connected with the output end of the tested power supply and a grounding load in a common ground mode, and the output voltage of the auxiliary test device is higher than that of the tested power supply;
and the result output device is connected with the auxiliary test device and used for obtaining and outputting the output current value of the power supply to be tested according to the output current value of the auxiliary test device.
Preferably, the current test system further comprises:
and the backflow prevention device is connected with the output end of the power supply to be detected.
Preferably, the backflow prevention device comprises a diode.
Preferably, the backflow prevention device is arranged between the output end of the power supply to be tested and the grounding load.
Preferably, the backflow prevention device is arranged inside the power supply to be tested.
Preferably, the backflow prevention device comprises a switching tube for being disconnected when a target voltage exists at the output end of the power supply to be tested, and the target voltage is greater than the output voltage of the power supply to be tested.
Preferably, the result output means includes:
the current detection device is used for detecting the output current value of the auxiliary test device;
and the prompting device is connected with the current detection device and is used for obtaining and outputting the output current value of the power supply to be detected according to the output current value of the auxiliary test device.
Preferably, the prompting device comprises an audio prompting device and/or a display device.
Preferably, the current test system further comprises:
and the voltmeter is connected with the power supply to be detected and used for detecting the output voltage of the power supply to be detected.
Preferably, the auxiliary testing device and the result output device are integrated on the same equipment.
The application provides a current test system, through auxiliary test device with by survey power supply common ground, the output end is connected altogether, and auxiliary test device's output voltage is higher than by survey power supply's output voltage to make by survey power supply's output suppressed, the ground load provides the current path for auxiliary test device, so that result output device obtains auxiliary test device's output current value, and obtain the output current value and the output of being surveyed power supply according to auxiliary test device's output current value. This application need not handle the relevant circuit of being surveyed the power when testing the electric current of being surveyed the power, and application scope is wide, when being applied to high density circuit board, need not destroy original meticulous circuit on the high density circuit board and walk the line, improves efficiency of software testing and test reliability.
Drawings
In order to more clearly illustrate the embodiments of the present application, the drawings needed for the embodiments will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the present application, and that other drawings can be obtained by those skilled in the art without inventive effort.
Fig. 1 is a schematic structural diagram of a current testing system provided in the present application;
FIG. 2 is a schematic diagram of another current testing system provided in the present application;
FIG. 3 is a schematic structural diagram of a power supply under test and its related circuits provided in the present application;
FIG. 4 is a schematic diagram of another current testing system provided in the present application;
fig. 5 is a schematic structural diagram of another current testing system provided in the present application.
Detailed Description
The core of this application is that a current test system is provided, when testing the electric current of being surveyed the power, need not handle the relevant circuit of being surveyed the power, and application scope is wide, when being applied to high density circuit board, need not destroy the original meticulous circuit on the high density circuit board and walk the line, improves efficiency of software testing and test reliability.
In order to make the objects, technical solutions and advantages of the embodiments of the present application clearer, the technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application, and it is obvious that the described embodiments are some embodiments of the present application, but not all embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.
Referring to fig. 1, fig. 1 is a schematic structural diagram of a current testing system provided in the present application, the current testing system including:
the auxiliary testing device 1 is connected with the output end of the tested power supply P and the grounding load RL in a common mode, and the output voltage of the auxiliary testing device 1 is higher than that of the tested power supply P;
and the result output device 2 is connected with the auxiliary test device 1 and used for obtaining and outputting the output current value of the power supply P to be tested according to the output current value of the auxiliary test device 1.
The output voltage of the auxiliary testing device 1 is adjustable, and the output voltage of the auxiliary testing device 1 can be adjusted according to the output voltage of the power supply P to be tested, so that the output voltage of the auxiliary testing device 1 is higher than the output voltage of the power supply P to be tested. After the auxiliary testing device 1 is connected with the output end of the tested power supply P in a common mode and in a common ground mode, the output voltage of the auxiliary testing device 1 is higher than the output voltage of the tested power supply P, so that the output of the tested power supply P is suppressed, and at the moment, the output current value of the auxiliary testing device 1 acquired by the result output device 2 has a certain corresponding relation with the output current value of the tested power supply P, and the corresponding relation can be determined according to the corresponding relation between the output voltage of the auxiliary testing device 1 and the output voltage of the tested power supply P. After the output current value of the auxiliary test device 1 is obtained, the output current value of the power supply P to be tested can be obtained and output according to the corresponding relationship.
As a preferred embodiment, the output voltage of the auxiliary testing device 1 may be adjusted to be slightly higher than the output voltage of the power supply P to be tested, for example, the output voltage of the auxiliary testing device 1 is adjusted to be higher than the output voltage of the power supply P to be tested by 0.1V or 0.01V, so that the output current value of the auxiliary testing device 1 is approximately equal to the output current value of the power supply P to be tested, and as a result, the output device 2 may directly output the output current value of the auxiliary testing device 1 as the output current value of the power supply P to be tested, which is highly accurate.
It can be understood that, in this embodiment, the process of calculating the output current value of the power supply to be tested according to the obtained output current value of the auxiliary test device 1 and a certain corresponding relationship belongs to the prior art, and the calculation process is not a protection focus of this application.
As a preferred embodiment, the current test system further comprises:
and the backflow prevention device 3 is connected with the output end of the power supply P to be detected.
Specifically, the backflow prevention device 3 may be disposed between the output end of the power supply P to be tested and the ground load RL, as shown with reference to fig. 2. The backflow prevention device 3 can also be arranged inside the power supply P to be tested. The backflow prevention device 3 is used for preventing the current of the auxiliary testing device 1 from flowing backwards to the inside of the tested power supply P, on one hand, the safety of the tested power supply P is guaranteed, and on the other hand, the situation that the testing result is large due to the backflow current is avoided.
As a preferred embodiment, the function of the backflow prevention device 3 may be implemented by a diode, and when the output voltage of the power supply P to be tested is smaller than the output voltage of the auxiliary test device 1, the diode is turned off, so as to cut off the current path of the power supply P to be tested, so that the power supply P to be tested does not output, and meanwhile, the output current of the auxiliary test device 1 does not flow back into the power supply P to be tested through the current path. Of course, the backflow prevention device 3 can be realized by using diodes and other components with the same function.
Furthermore, the power supply chips are internally provided with the backflow prevention device 3, so that the backflow prevention device 3 does not need to be independently arranged when the power supply chips are subjected to current testing, and the backflow prevention device 3 in the power supply chips is selected to realize the corresponding function, so that the cost and the volume of the current testing system are reduced. It can be understood that the function of the backflow prevention device 3 can be realized by a switch tube, specifically, when a controller in the power supply P to be tested detects that a target voltage higher than its own output voltage exists at the output end of the power supply P to be tested, the switch tube arranged on the internal current path is controlled to be disconnected, so that the purposes of cutting off the output of the power supply P to be tested and preventing backflow are realized. The switch tube can be selected from thyristor such as IGBT tube, MOS tube or triode.
It can be understood that, because the backflow prevention device 3 has the backflow prevention function, when performing the current test, the power supply P to be tested does not need to be turned off, and the input end of the backflow prevention device can be kept powered, so as to test other states of the load powered by the power supply P to be tested, such as a transmitting state, a receiving state, a standby state, a sleep state, and the like.
As a preferred embodiment, the result output device 2 includes:
a current detection means 21 for detecting an output current value of the auxiliary test apparatus 1;
and the prompting device 22 is connected with the current detection device 21 and used for obtaining and outputting the output current value of the power supply P to be tested according to the output current value of the auxiliary test device 1.
As a preferred embodiment, the prompting device 22 includes an audible prompting device and/or a display device.
Specifically, the current detection device 21 may be an ammeter, which is connected in series in the loop of the auxiliary test device 1 to measure the output current value of the auxiliary test device 1. The current detection device 21 is connected with the prompting device 22, and transmits the acquired output current value of the auxiliary test device 1 to the prompting device 22, so that the prompting device 22 performs subsequent processing. It can be understood that the ground load RL on the circuit where the power supply P to be tested is located provides a current path for the auxiliary testing device 1, the current flowing through the ground load RL is the output current of the auxiliary testing device 1, the ground load RL may have various expressions, and the resistor is illustrated as an example in fig. 3 and 4.
Referring to fig. 3, fig. 3 is a schematic diagram of a measured power supply and related circuits thereof, a VIN terminal of the measured power supply P is grounded through a first capacitor C1, a VOUT terminal (i.e., an output terminal) of the measured power supply P is grounded through a second capacitor C2 and a grounded load RL, wherein the first capacitor C1 and the second capacitor C2 are used for filtering, and a current I1 flowing through the grounded load RL is an output current of the measured power supply P. Referring to fig. 4, the backflow prevention device 3 in fig. 4 is not shown in the tested power supply P, and after the tested power supply P is connected to the current test system, the output voltage of the auxiliary test device 1 is slightly higher than the output voltage of the tested power supply P, so that the tested power supply P stops outputting. Assuming that the output voltage of the power supply P to be tested is 1.8V, the output voltage of the auxiliary testing device 1 can be set to 1.81V, I1 in fig. 4 becomes 0, and the current on the ground load RL is provided by the auxiliary testing device 1, i.e. I2, and the output current value of the auxiliary testing device 1 is read, i.e. the output current value of the power supply P to be tested can be obtained.
Specifically, the prompting device may include a sound prompting device and/or a display device, and the prompting device may include a controller for obtaining an output current value of the auxiliary testing device 1 and converting the output current value of the auxiliary testing device 1 into an output current value of the power supply P to be tested, and a function module connected to the controller and having a prompting function, for prompting information corresponding to the output current value of the power supply P to be tested, and of course, may also prompt information corresponding to the output voltage of the auxiliary testing device 1. Wherein, the functional module that has prompt facility can be voice broadcast device also can be the display screen, according to actual engineering needs selection can, this application does not do specific restriction here.
As a preferred embodiment, the current test system further comprises:
and the voltmeter is connected with the power supply P to be detected and used for detecting the output voltage of the power supply P to be detected.
Specifically, the output voltage of the power supply P to be measured can be directly measured through the voltmeter, and the measured output voltage is high in accuracy and reliability. In addition, as the voltmeter does not need to be connected in series with a related circuit of the tested power supply P, the test is only carried out on the filter capacitor at the output end of the tested power supply P. Therefore, when the measured power supply P in the high-density circuit board is measured, the fine routing in the high-density circuit board cannot be damaged.
In practical application, considering that some power chips, such as a conventional fixed voltage version of LDO or DCDC switching power supply, have corresponding fixed output voltages, the power supply P to be tested is usually output according to the fixed output voltages during operation, therefore, when performing current test on such power chips, in order to improve the test efficiency, the output voltage of the power supply P to be tested may not be measured by a voltmeter, the output voltage of the auxiliary test device 1 may be directly adjusted according to the known fixed output voltage, for example, a power chip may only output 3.3V, and then the output voltage of the auxiliary test device 1 may be adjusted to be slightly higher than 3.3V.
As a preferred embodiment, the auxiliary testing device 1 and the result output device 2 are integrated in the same apparatus.
Specifically, the auxiliary testing device 1 and the result output device 2 can be integrated into the same device, so that the size of the current testing system is reduced on one hand, and the management is convenient on the other hand. The functions of the auxiliary testing device 1 and the result output device 2 can also be realized by a voltage source with a prompting device, as shown in fig. 5, the positive pole of the voltage source DC power is connected with the output end of the power source P to be tested as the output end, and the negative pole of the voltage source DC power is grounded with the negative pole of the power source P to be tested.
Therefore, the auxiliary testing device is connected with the common-ground and common-output end of the tested power supply, the output voltage of the auxiliary testing device is higher than the output voltage of the tested power supply, so that the output of the tested power supply is suppressed, the grounding load provides a current path for the auxiliary testing device, and the output current value of the auxiliary testing device is obtained by the output device, and the output current value of the tested power supply is obtained and output according to the output current value of the auxiliary testing device. This application need not handle the relevant circuit of being surveyed the power when testing the electric current of being surveyed power P, and application scope is wide, when being applied to high density circuit board, need not destroy the original meticulous circuit on the high density circuit board and walk the line, improves efficiency of software testing and test reliability.
It is further noted that, in the present specification, relational terms such as first and second, and the like are used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Also, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, article, or apparatus. Without further limitation, an element defined by the phrase "comprising an … …" does not exclude the presence of other like elements in a process, article, or apparatus that comprises the element.
The previous description of the disclosed embodiments is provided to enable any person skilled in the art to make or use the present application. Various modifications to these embodiments will be readily apparent to those skilled in the art, and the generic principles defined herein may be applied to other embodiments without departing from the spirit or scope of the application. Thus, the present application is not intended to be limited to the embodiments shown herein but is to be accorded the widest scope consistent with the principles and novel features disclosed herein.
Claims (10)
1. A current testing system, comprising:
the auxiliary test device is connected with the output end of the tested power supply and a grounding load in a common ground mode, and the output voltage of the auxiliary test device is higher than that of the tested power supply;
and the result output device is connected with the auxiliary test device and used for obtaining and outputting the output current value of the power supply to be tested according to the output current value of the auxiliary test device.
2. The current testing system of claim 1, further comprising:
and the backflow prevention device is connected with the output end of the power supply to be detected.
3. The current testing system of claim 2, wherein the back-flow prevention device comprises a diode.
4. The current testing system of claim 2, wherein the anti-back-filling device is disposed between the output of the power supply under test and the grounded load.
5. The current testing system of claim 2, wherein the anti-back-filling device is disposed inside the power supply under test.
6. The current testing system according to claim 5, wherein the backflow prevention device comprises a switching tube for being turned off when a target voltage is present at the output terminal of the power supply under test, and the target voltage is greater than the output voltage of the power supply under test.
7. The current testing system of claim 1, wherein the result output device comprises:
the current detection device is used for detecting the output current value of the auxiliary test device;
and the prompting device is connected with the current detection device and is used for obtaining and outputting the output current value of the power supply to be detected according to the output current value of the auxiliary test device.
8. The current testing system according to claim 7, wherein the prompting device comprises an audible prompting device and/or a display device.
9. The current testing system of claim 1, further comprising:
and the voltmeter is connected with the power supply to be detected and used for detecting the output voltage of the power supply to be detected.
10. The current testing system according to any one of claims 1 to 9, wherein the auxiliary testing means and the result output means are integrated on the same device.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202120678855.5U CN215575329U (en) | 2021-04-02 | 2021-04-02 | Current testing system |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202120678855.5U CN215575329U (en) | 2021-04-02 | 2021-04-02 | Current testing system |
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| Publication Number | Publication Date |
|---|---|
| CN215575329U true CN215575329U (en) | 2022-01-18 |
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| CN202120678855.5U Active CN215575329U (en) | 2021-04-02 | 2021-04-02 | Current testing system |
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| CN (1) | CN215575329U (en) |
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- 2021-04-02 CN CN202120678855.5U patent/CN215575329U/en active Active
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