CN215449493U

CN215449493U - Cantilever type probe card for testing image processing chip

Info

Publication number: CN215449493U
Application number: CN202120571889.4U
Authority: CN
Inventors: 宋成龙; 吴声亮
Original assignee: Shenzhen Weilaixin Technology Co ltd
Current assignee: Shenzhen Weilaixin Technology Co ltd
Priority date: 2021-03-22
Filing date: 2021-03-22
Publication date: 2022-01-07
Anticipated expiration: 2031-03-22

Abstract

The utility model provides a cantilever type probe card for testing an image processing chip, which relates to the technical field of probe cards and comprises a workbench, wherein the top surface of the workbench is provided with a mounting groove, the mounting groove is a blind groove, a cylinder is arranged in the mounting groove and is fixed with a bolt in the mounting groove, a storage jig is arranged in the mounting groove and comprises a movable base, the top surface of the movable base is provided with a limiting plate, the limiting plate is fixed with the top surface of the movable base by a bolt, the side surface of the movable base is fixed with a pushing device, a lifting plate is arranged above the limiting plate, the bottom surface of the lifting plate is fixed with a spring, one end of the spring is provided with a connecting disc, the bottom surface of the connecting disc is connected with an adsorption device by a bolt, the adsorption device is positioned right above the limiting plate, the pushing device and the adsorption device are adopted, so that the equipment can be automatically recycled after the product is tested to reach the standard, and workers do not need to wait for the test result, and the product is recovered by oneself, so that the working efficiency is improved, and the labor force of workers is reduced.

Description

Cantilever type probe card for testing image processing chip

Technical Field

The utility model relates to the technical field of probe cards, in particular to a cantilever type probe card for testing an image processing chip.

Background

According to the patent No. CN201721629705.5, a cantilever probe card for testing GPU image processing chips comprises a probe card body, wherein the probe card body adopts a rhombic pin outlet mode and is manufactured in a jumping bag mode, the probe card body consists of a PCB and probes, a reinforcing plate is arranged at the top of the PCB, an opening is formed in the reinforcing plate, threaded holes are formed in positions corresponding to the PCB and the reinforcing plate, the PCB is fixedly connected with the reinforcing plate through locking bolts, a ceramic ring is arranged below the PCB, the bottom of the ceramic ring is fixedly connected with the probes, the top of the ceramic ring is fixedly connected with the PCB through fixing glue, the jumping bag design is adopted, the pin outlet mode is changed, the mutual interference among the bags is reduced, four bags can be realized on one cantilever probe card, the efficiency and the stability of testing the GPU image processing chips are improved, and the arrangement mode of the probes is optimized, the original rectangle is changed into the diamond shape, so that the problem of probe crossing is avoided.

Above-mentioned patent passes through equipment and tests the inspection to the product, and the staff need wait for the test result beside the equipment, and the staff need retrieve the product after reaching standard in person after the test result reaches standard, has increased the labour for the staff.

SUMMERY OF THE UTILITY MODEL

The present invention is directed to a cantilever probe card for testing image processing chips, which solves the problems of the prior art.

In order to achieve the purpose, the utility model adopts the following technical scheme: the utility model provides a test is with cantilever type probe card for testing image processing chip, includes the workstation, the workstation top surface is equipped with the mounting groove, and the mounting groove is blind groove, be equipped with the cylinder in the mounting groove, and cylinder and mounting inslot one side bolt fastening, be equipped with in the mounting groove and deposit the tool, it includes the removal base to deposit the tool, it is equipped with the limiting plate to remove the base top surface, and the limiting plate with remove base top surface bolt fastening, it is fixed with thrust unit to remove the base side, the limiting plate top is equipped with the lifter plate, the lifter plate bottom surface is fixed with the spring, spring one end is equipped with the connection disc, connection disc bottom surface bolted connection has adsorption equipment, and adsorption equipment is located directly over the limiting plate.

Preferably, the inner wall of the mounting groove is provided with a sliding groove, and the protrusions at the two ends of the movable base are embedded in the sliding groove.

Preferably, the working end of the cylinder is fixed with one side of the movable base through a bolt.

Preferably, thrust unit one end is arc chamfer, and thrust unit and mounting groove inner wall mutually support.

Preferably, the top surface of the workbench is connected with a connecting frame through bolts, a sliding screw rod is arranged in the connecting frame, and the lifting plate is sleeved with the surface of the sliding screw rod.

Preferably, a motor is arranged at one end of the sliding screw rod, and the motor is movably connected with the sliding screw rod in a key mode.

Preferably, the detector is arranged in the groove in the top surface of the lifting plate, the detector is fixed with the top surface of the lifting plate through bolts, and the detector is positioned right above the limiting plate.

Advantageous effects

In the utility model, a pushing device and an adsorption device are adopted, a product to be tested is placed on the top surface of a limiting plate, the product can be limited and clamped due to a groove arranged on the top surface of the limiting plate, a lifting plate is moved by rotating a motor, the spring is fixed on the bottom surface of the lifting plate, the spring is connected with the adsorption device by a connecting disc, the adsorption plate is positioned below a detector in the groove on the top surface of the lifting plate, the adsorption device is firstly contacted with the product when the lifting plate descends, the adsorption device extrudes the spring to limit and fix the product until the detector is contacted with the product to test the product, the adsorption device is automatically opened after the product reaches the standard, the lifting device ascends to adsorb and fix the product, meanwhile, a working end of an air cylinder is recovered to drive a moving base to move, bulges at two ends of the moving base slide in a sliding groove on the inner wall of a mounting groove, the product reaching the standard is placed in the mounting groove when the product reaches the set position, the cylinder work end outwards extends and promotes and removes the base, removes the product promotion after fixed thrust unit in base one side will be up to standard, and the cylinder stop work when removing the base and removing the normal position, can to next test product installation that awaits measuring, realized that the product can carry out recovery processing with equipment automatically after testing up to standard, need not the staff and wait for the test result to carry out the recovery operation with the product in person, improved work efficiency, reduced staff's labour.

Drawings

FIG. 1 is an isometric view of the present invention;

FIG. 2 is an enlarged view taken at the point of FIG. 1-A;

FIG. 3 is a cross-sectional view of the present invention;

fig. 4 is a top view of the present invention.

Illustration of the drawings:

1. a work table; 2. mounting grooves; 3. a cylinder; 4. storing the jig; 401. a sliding groove; 402. moving the base; 403. a limiting plate; 404. a pushing device; 5. a connecting frame; 6. a sliding screw rod; 7. a lifting plate; 8. a detector; 9. a spring; 10. connecting the disks; 11. an adsorption device; 12. an electric motor.

Detailed Description

In order to make the technical means, the original characteristics, the achieved purposes and the effects of the utility model easily understood, the utility model is further described below with reference to the specific embodiments and the attached drawings, but the following embodiments are only the preferred embodiments of the utility model, and not all embodiments. Based on the embodiments in the implementation, other embodiments obtained by those skilled in the art without any creative efforts belong to the protection scope of the present invention.

Specific embodiments of the present invention are described below with reference to the accompanying drawings.

The specific embodiment is as follows:

referring to fig. 1-4, a cantilever probe card for testing image processing chips, comprising a worktable 1, a mounting groove 2 is provided on the top surface of the worktable 1, the mounting groove 2 is a blind groove, a cylinder 3 is provided in the mounting groove 2, the cylinder 3 is fixed with a bolt in the mounting groove 2, a storage jig 4 is provided in the mounting groove 2, the storage jig 4 comprises a movable base 402, a limiting plate 403 is provided on the top surface of the movable base 402, the limiting plate 403 is fixed with the top surface of the movable base 402 by the bolt, a pushing device 404 is fixed on the side surface of the movable base 402, a lifting plate 7 is provided above the limiting plate 403, a spring 9 is fixed on the bottom surface of the lifting plate 7, a connecting disc 10 is provided at one end of the spring 9, an adsorption device 11 is connected to the bottom surface of the connecting disc 10 by the bolt, the adsorption device 11 is located right above the limiting plate 403, a connecting frame 5 is connected to the top surface of the worktable 1 by the bolt, a sliding screw 6 is provided in the connecting frame 5, the lifting plate 7 is sleeved with the surface of the sliding screw rod 6, one end of the sliding screw rod 6 is provided with a motor 12, the motor 12 is movably keyed with the sliding screw rod 6, a detector 8 is arranged in a groove on the top surface of the lifting plate 7, the detector 8 is fixed with the top surface of the lifting plate 7 through a bolt, the detector 8 is positioned right above the limit plate 403, a product to be tested is placed on the top surface of the limit plate 403, the product can be limited and clamped due to the groove arranged on the top surface of the limit plate 403, the lifting plate 7 is moved through the rotation of the motor 12, the spring 9 is connected with the adsorption device 11 through a spring 9 fixed on the bottom surface of the lifting plate 7 by using a connecting disc 10, the adsorption device 11 is positioned below the detector 8 in the groove on the top surface of the lifting plate 7, the motor 12 rotates to drive the sliding screw rod 6, the lifting plate 7 starts to carry out lifting adjustment, the adsorption device 11 is firstly contacted with the product when the lifting plate 7 descends, the adsorption device 11 extrudes the spring 9, carry out spacing fixed with the product, until detector 8 tests the product with the product contact, after the product is up to standard, 11 automatic openings of adsorption equipment, and lifter plate 7 rises to adsorb the product fixedly.

2 inner walls of mounting groove are equipped with sliding tray 401, remove protruding gomphosis in sliding tray 401 in base 402 both ends, 3 work ends of cylinder are fixed through the bolt with removing base 402 one side, thrust unit 404 one end is the arc chamfer,

thrust unit

404 and 2 inner walls of mounting groove are mutually supported, 3 work ends of cylinder are retrieved and are driven and remove base 402, it then slides in the sliding tray 401 of 2 inner walls of mounting groove to remove base 402 both ends arch, put into mounting groove 2 with the product after reaching standard when removing to setting up the position, 3 work ends of cylinder outwards extend and promote and remove base 402, remove the fixed thrust unit 404 in base 402 one side and promote the product after reaching standard, 3 stop work of cylinder when removing base 402 and removing the normal position, can to next trial product installation that awaits measuring.

The working principle of the utility model is as follows: the product to be tested is placed on the top surface of the limiting plate 403, the product can be limited and clamped due to the fact that the groove is formed in the top surface of the limiting plate 403, the lifting plate 7 is moved through rotation of the motor 12, the spring 9 fixed to the bottom surface of the lifting plate 7 is used, the spring 9 is connected with the adsorption device 11 through the connecting disc 10, the adsorption device 11 is located below the detector 8 in the groove in the top surface of the lifting plate 7, the sliding screw rod 6 is driven through rotation of the motor 12, the lifting plate 7 starts to lift and adjust, when the lifting plate 7 descends, the adsorption device 11 is firstly contacted with the product, the adsorption device 11 extrudes the spring 9 to limit and fix the product until the detector 8 is contacted with the product to test the product, when the product reaches the standard, the adsorption device 11 is automatically opened, the lifting plate 7 ascends to adsorb and fix the product, and meanwhile, the working end of the air cylinder 3 is recovered to drive the movable base 402 to move, remove protruding then of base 402 both ends and slide in the sliding tray 401 of mounting groove 2 inner wall, put into mounting groove 2 with the product after up to standard when removing to set up the position, 3 work ends of cylinder outwards extend and promote and remove base 402, remove the fixed thrust unit 404 in base 402 one side and promote the product after up to standard, cylinder 3 stop work when removing base 402 and removing the normal position, can to next product installation that awaits measuring.

In the present invention, unless otherwise expressly stated or limited, "above" or "below" a first feature means that the first and second features are in direct contact, or that the first and second features are not in direct contact but are in contact with each other via another feature therebetween. Also, the first feature being "on," "above" and "over" the second feature includes the first feature being directly on and obliquely above the second feature, or merely indicating that the first feature is at a higher level than the second feature. A first feature being "under," "below," and "beneath" a second feature includes the first feature being directly under and obliquely below the second feature, or simply meaning that the first feature is at a lesser elevation than the second feature.

The foregoing shows and describes the general principles, essential features, and advantages of the utility model. It will be understood by those skilled in the art that the present invention is not limited to the embodiments described above, and the preferred embodiments of the present invention are described in the above embodiments and the description, and are not intended to limit the present invention. The scope of the utility model is defined by the appended claims and equivalents thereof.

Claims

1. A cantilever probe card for testing an image processing chip, comprising a stage (1), characterized in that: the top surface of the workbench (1) is provided with an installation groove (2), the installation groove (2) is a blind groove, an air cylinder (3) is arranged in the installation groove (2), the cylinder (3) is fixed with one surface of the mounting groove (2) by bolts, a storage jig (4) is arranged in the mounting groove (2), the storage jig (4) comprises a movable base (402), a limiting plate (403) is arranged on the top surface of the movable base (402), the limiting plate (403) is fixed with the top surface of the movable base (402) through bolts, the side surface of the movable base (402) is fixed with a pushing device (404), a lifting plate (7) is arranged above the limit plate (403), a spring (9) is fixed on the bottom surface of the lifting plate (7), spring (9) one end is equipped with connection disc (10), connection disc (10) bottom surface bolted connection has adsorption equipment (11), and adsorption equipment (11) are located limiting plate (403) directly over.

2. The cantilever probe card for testing image processing chips of claim 1, wherein: the inner wall of the mounting groove (2) is provided with a sliding groove (401), and the two ends of the movable base (402) are convexly embedded in the sliding groove (401).

3. The cantilever probe card for testing image processing chips of claim 1, wherein: the working end of the cylinder (3) is fixed with one side of the movable base (402) through a bolt.

4. The cantilever probe card for testing image processing chips of claim 1, wherein: one end of the pushing device (404) is an arc-shaped chamfer, and the pushing device (404) is matched with the inner wall of the mounting groove (2).

5. The cantilever probe card for testing image processing chips of claim 1, wherein: the top surface of the workbench (1) is connected with a connecting frame (5) through bolts, a sliding screw rod (6) is arranged in the connecting frame (5), and the lifting plate (7) is sleeved with the surface of the sliding screw rod (6).

6. The cantilever probe card for testing image processing chips according to claim 5, wherein: and one end of the sliding screw rod (6) is provided with a motor (12), and the motor (12) is movably connected with the sliding screw rod (6) in a key mode.

7. The cantilever probe card for testing image processing chips of claim 1, wherein: be equipped with detector (8) in lifter plate (7) top surface recess, and detector (8) and lifter plate (7) top surface bolt fastening, and detector (8) are located limiting plate (403) directly over.