CN215375664U - Self-monitoring and remote-control burn-in-free integrated circuit aging test system - Google Patents
Self-monitoring and remote-control burn-in-free integrated circuit aging test system Download PDFInfo
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- CN215375664U CN215375664U CN202120328296.5U CN202120328296U CN215375664U CN 215375664 U CN215375664 U CN 215375664U CN 202120328296 U CN202120328296 U CN 202120328296U CN 215375664 U CN215375664 U CN 215375664U
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Abstract
The application provides a self-monitoring and remote-control burn-in test-free integrated circuit aging test system. The system comprises an information acquisition module, an adjustable power supply, an upper computer and a Web server, wherein the information acquisition module acquires information such as voltage and current of the integrated circuit to be tested, and the integrated circuit to be tested is subjected to an aging test in a high-temperature and low-temperature box; the adjustable power supply is used for supplying power to the integrated circuit to be tested; the upper computer is connected with the information acquisition module, receives the voltage, the current and the like of the integrated circuit to be tested, is connected with the adjustable power supply through a serial port, and performs state reading and power supply control; the Web server is communicated with the upper computer through the local area network, accesses data of the upper computer and controls the high-low temperature box and the adjustable power supply. The utility model monitors the aging test state of the integrated circuit in real time, saves the retest human resource and avoids the aging time waste; and the short-range communication interfaces such as a serial port and the like are converted into long-range communication interfaces through the Web server, so that the aging test can be controlled remotely.
Description
Technical Field
The application relates to the technical field of integrated circuit testing, in particular to a self-monitoring and remote-control burn-in-free integrated circuit aging test system.
Background
The existing aging mode of the integrated circuit is that the aging circuit board to be tested is usually put in a high-temperature and low-temperature environment to operate for a period of time, and the aging circuit board is taken out periodically to test whether the function is normal at normal temperature so as to judge whether the chip works normally.
In fact, the tested chip may have failed before the periodic inspection, and the voltage and current overload caused by the failure of a single module may affect the operation of other modules, even cause the damage of other modules, thereby causing inaccurate experimental results.
Or due to unexpected power failure, manual misoperation and the like, the aging box may enter an error or non-working state, so that the environment in the aging box does not meet the conditions required by the test, and the data of the aging test is not credible. And after unexpected events such as power failure, misoperation and the like occur, the direct current power supply, the aging box and the experimental equipment can possibly enter the non-operating state after reset, and if no one is on the spot in a laboratory, the test state is difficult to recover rapidly.
SUMMERY OF THE UTILITY MODEL
The embodiment of the application provides a self-monitoring and remote-control burn-in test system for a non-retesting integrated circuit, which comprises an information acquisition module, an adjustable power supply, an upper computer and a Web server, wherein the information acquisition module acquires voltage and current information, temperature and humidity information of the tested integrated circuit, and the tested integrated circuit is subjected to a burn-in test in a high-low temperature box; the adjustable power supply is used for supplying power to the integrated circuit to be tested; the upper computer is connected with the information acquisition module, receives voltage and current information and temperature and humidity information of the integrated circuit to be tested, is connected with the adjustable power supply through a serial port, and performs state reading and power supply control; the Web server is communicated with an upper computer through a local area network, accesses data of the upper computer, or/and controls the high-low temperature box or/and the adjustable power supply.
According to some embodiments, the information acquisition module comprises a first acquisition module, a second acquisition module and an electrical sampling device, wherein the first acquisition module is arranged in the high-low temperature box and used for acquiring a first temperature and a first humidity, and the first temperature and the first humidity are transmitted by connecting the upper computer through a serial port; the second acquisition module is arranged in the high-low temperature box and used for acquiring a second temperature and a second humidity and connecting the second temperature and the second humidity to the upper computer through a bus to transmit the second temperature and the second humidity; the electrical sampling equipment is connected with the integrated circuit to be tested, is used for collecting the voltage and current information of the integrated circuit to be tested, is electrically connected with the upper computer and transmits the voltage and current information.
According to some embodiments, the Web server comprises a human-machine interface for controlling the high-low temperature cabinet or/and the adjustable power supply.
According to some embodiments, the Web server further alarms when the operating status of the high and low temperature box or/and the adjustable power supply exceeds a set range.
According to some embodiments, the alerting comprises sending an alert message by WeChat.
According to some embodiments, the system further comprises a public network server, which communicates with the upper computer through a public network, so that a plurality of clients access data of the upper computer through the public network server.
According to some embodiments, the upper computer comprises a database for storing and recording the temperature, humidity, voltage and current information of the integrated circuit to be tested.
According to some embodiments, the integrated circuit under test comprises at least one module under test and a backplane, the at least one module under test being integrally mounted on the backplane; the bottom plate is connected with the adjustable power supply and the electrical sampling equipment, supplies power to the module to be tested, and collects the voltage and current information of the module to be tested through the electrical sampling equipment.
According to some embodiments, each of the modules under test has a unique identification address.
According to some embodiments, the upper computer detects that the voltage and current information of the module to be tested exceeds a threshold value, and sends out an alarm based on the unique identification address of the module to be tested.
According to the technical scheme provided by the embodiment of the application, the aging test state of the integrated circuit can be monitored in real time through the system, the human resources for retest are saved, and the aging time is prevented from being wasted; and the short-range communication interfaces such as a serial port and the like are converted into long-range communication interfaces through the Web server, so that the aging test of the integrated circuit to be tested can be remotely controlled.
Drawings
In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings needed to be used in the description of the embodiments are briefly introduced below, and it is obvious that the drawings in the following description are only some embodiments of the present application, and it is obvious for those skilled in the art to obtain other drawings based on these drawings without creative efforts.
Fig. 1 is a schematic diagram of a self-monitoring and remotely-controlled burn-in free integrated circuit burn-in test system according to an embodiment of the present disclosure.
FIG. 2 is a schematic diagram of another self-monitoring and remotely controlled burn-in free integrated circuit burn-in test system according to an embodiment of the present application.
Fig. 3 is a schematic diagram of an integrated circuit under test according to an embodiment of the present disclosure.
FIG. 4 is a schematic diagram of another self-monitoring and remotely controlled burn-in free integrated circuit burn-in test system according to an embodiment of the present application.
Detailed Description
The technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application, and it is obvious that the described embodiments are some, but not all, embodiments of the present application. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.
It will be understood that the terms "comprises" and/or "comprising," when used in this specification and claims, specify the presence of stated features, integers, steps, operations, elements, and/or components, but do not preclude the presence or addition of one or more other features, integers, steps, operations, elements, components, and/or groups thereof.
Fig. 1 is a self-monitoring and remote-control burn-in free integrated circuit aging test system according to an embodiment of the present disclosure, which includes an information acquisition module 10, an adjustable power supply 20, an upper computer 30, and a Web server 40.
The information acquisition module 10 acquires voltage and current information and temperature and humidity information of the integrated circuit 50 to be tested, and the integrated circuit 50 to be tested is subjected to an aging test in the high-low temperature box 60. The adjustable power supply 20 is used to power the integrated circuit under test 50. The upper computer 30 is connected with the information acquisition module 10, receives the voltage and current information and the temperature and humidity information of the integrated circuit 50 to be tested, and is connected with the adjustable power supply 20 through a serial port to read the state and control the power supply. The Web server 40 communicates with the upper computer 30 through a local area network, accesses data of the upper computer 30, and/or controls the high-low temperature box 60 and/or the adjustable power supply 20.
According to the technical scheme provided by the embodiment, the aging test state of the integrated circuit can be monitored in real time, the retest human resources are saved, and the aging time is prevented from being wasted; and the short-range communication interfaces such as a serial port and the like are converted into long-range communication interfaces through the Web server, so that the aging test of the integrated circuit to be tested can be remotely controlled.
According to some embodiments, the information acquisition module 10 comprises a first acquisition module 11, a second acquisition module 12 and an electrical acquisition module 13, as shown in fig. 2.
The first collecting module 11 is disposed inside the high-low temperature box 60, and is configured to collect a first temperature and a first humidity, and transmit the first temperature and the first humidity to the upper computer 30 through a serial port. The first collecting module 11 includes a first temperature sensor and a first humidity sensor, which are respectively used for collecting a first temperature and a first humidity.
The second collecting module 12 is disposed inside the high-low temperature chamber 60, and is configured to collect a second temperature and a second humidity, and transmit the second temperature and the second humidity to the upper computer 30 through a bus. The second collection module 12 includes a DHT11 temperature and humidity sensor as a backup of the first collection module 11, so as to prevent the sensor of the first collection module 11 from malfunctioning, and ensure that the aging test is normally performed. The two sets of sensor systems are used for simultaneously measuring the environmental parameters, which mutually guarantee that the measured data can be compared with each other for verification, thereby ensuring the accuracy of the measured data and the stability of the measuring system.
The electrical sampling device 13 is connected to the integrated circuit 50 to be tested, is used for collecting the voltage and current information of the integrated circuit 50 to be tested, is electrically connected to the upper computer 30, and transmits the voltage and current information.
The Web server 40 includes a human machine interface for controlling the high and low temperature cabinet or/and the adjustable power supply. Through the Web server 40, the user can control the experimental equipment in a Web mode at any time and any place, and when the experiment is stopped due to an accident, the user can remotely restart the operation of the whole set of system at any time and any place.
And the Web server gives an alarm when the running state of the high-low temperature box or/and the adjustable power supply exceeds a set range. The alarming comprises sending alarm information through WeChat. The user is informed of the monitoring information actively in the modes of WeChat and the like, the user is not required to view the information of the upper computer actively, and the human resources are saved.
Optionally, the integrated circuit under test 50 includes at least one module under test 51 and a backplane 52, as shown in FIG. 3. At least one tested module 51 is integrally installed on the bottom plate 52, the bottom plate 52 is connected with the adjustable power supply 20 and the electrical sampling device 13 to supply power to the tested module 51, and the voltage and current information of the tested module 51 is acquired through the electrical sampling device 13.
Each module under test 51 can work independently, and each module under test 51 has an independent and unique identification address. The upper computer 30 can be connected to a communication interface or an ADC sampling output interface of the integrated circuit under test 50 through the electrical sampling device 13, and detect the voltage and current information including but not limited to the module under test 51 in real time. Once the voltage and current information exceeds the threshold, the upper computer 30 will issue an alarm based on the unique identification address of the module 51 to be tested, and the alarm may include an alarm such as a mail to remind the experimenter whether to intervene.
The upper computer 30 also runs a power monitoring process to monitor the voltage and current of the adjustable power supply 20 in real time, when the voltage or current exceeds a set range, the upper computer 30 actively sends out alarm information in the modes of mails, WeChat and the like, and when serious overvoltage and overcurrent states occur, the adjustable power supply 20 is automatically powered off.
Optionally, the upper computer 30 includes a database 31 for storing and recording the temperature, humidity, voltage and current information of the integrated circuit 50 under test. Through recording the real-time parameter of each tested module 51, the influence of the aging test on the performance of the tested integrated circuit can be judged, and not only can the tested integrated circuit after aging be qualitatively judged whether damaged, but also the variation of the performance can be quantitatively analyzed.
Optionally, the system further comprises a public network server 70, as shown in fig. 4. The public network server 70 communicates with the upper computer 30 through a public network, so that a plurality of clients access data of the upper computer 30 through the public network server 70, and experimenters can conveniently access the data from the outside of a company.
The above embodiments are only for illustrating the technical idea of the present application, and the protection scope of the present application is not limited thereby, and any modifications made on the basis of the technical solution according to the technical idea presented in the present application fall within the protection scope of the present application.
Claims (10)
1. A self-monitoring and remotely controlled burn-in free integrated circuit burn-in test system, comprising:
the information acquisition module is used for acquiring voltage and current information and temperature and humidity information of the integrated circuit to be tested, and the integrated circuit to be tested is subjected to an aging test in a high-low temperature box;
the adjustable power supply is used for supplying power to the integrated circuit to be tested;
the upper computer is connected with the information acquisition module, receives voltage and current information and temperature and humidity information of the integrated circuit to be tested, is connected with the adjustable power supply through a serial port, and performs state reading and power supply control;
and the Web server is communicated with an upper computer through a local area network, accesses data of the upper computer, or/and controls the high-low temperature box or/and the adjustable power supply.
2. The system of claim 1, wherein the information collection module comprises:
the first acquisition module is arranged in the high-low temperature box and used for acquiring a first temperature and a first humidity and connecting the first temperature and the first humidity with the upper computer through a serial port;
the second acquisition module is configured inside the high-low temperature box and used for acquiring a second temperature and a second humidity and connecting the second temperature and the second humidity to the upper computer through a bus to transmit the second temperature and the second humidity;
and the electrical sampling equipment is connected with the integrated circuit to be tested, is used for acquiring the voltage and current information of the integrated circuit to be tested, is electrically connected with the upper computer and transmits the voltage and current information.
3. The system of claim 1, wherein the Web server comprises:
and the human-computer interaction interface is used for controlling the high-low temperature box or/and the adjustable power supply.
4. The system of claim 3, wherein the Web server further alerts when the operating conditions of the hot and cold boxes or/and the variable power supply are outside a set range.
5. The system of claim 4, wherein the alert comprises sending an alert message via a WeChat.
6. The system of claim 1, further comprising:
and the public network server is communicated with the upper computer through a public network, so that a plurality of clients access the data of the upper computer through the public network server.
7. The system of claim 1, wherein the upper computer comprises:
and the database is used for storing and recording the temperature, humidity, voltage and current information of the integrated circuit to be tested.
8. The system of claim 2, wherein the integrated circuit under test comprises:
at least one tested module, which is integrally installed on the bottom plate;
the bottom plate is connected with the adjustable power supply and the electrical sampling equipment, supplies power to the module to be tested, and collects the voltage and current information of the module to be tested through the electrical sampling equipment.
9. The system of claim 8, wherein each of the modules under test has a unique identification address.
10. The system of claim 9, wherein the upper computer detects that the voltage and current information of the module under test exceeds a threshold value, and based on the unique identification address of the module under test, an alarm is given.
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| CN202120328296.5U CN215375664U (en) | 2021-02-04 | 2021-02-04 | Self-monitoring and remote-control burn-in-free integrated circuit aging test system |
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| CN202120328296.5U CN215375664U (en) | 2021-02-04 | 2021-02-04 | Self-monitoring and remote-control burn-in-free integrated circuit aging test system |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN115128437A (en) * | 2022-08-29 | 2022-09-30 | 成都爱旗科技有限公司 | High-temperature aging test system and high-temperature aging test method |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN115128437A (en) * | 2022-08-29 | 2022-09-30 | 成都爱旗科技有限公司 | High-temperature aging test system and high-temperature aging test method |
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