CN215375525U - Semiconductor board test positioning tool - Google Patents
Semiconductor board test positioning tool Download PDFInfo
- Publication number
- CN215375525U CN215375525U CN202121773348.6U CN202121773348U CN215375525U CN 215375525 U CN215375525 U CN 215375525U CN 202121773348 U CN202121773348 U CN 202121773348U CN 215375525 U CN215375525 U CN 215375525U
- Authority
- CN
- China
- Prior art keywords
- assembly
- rotary
- disc
- rotary driven
- guide
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Images
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Abstract
The utility model relates to a semiconductor board card test positioning tool which is arranged on a machine table of test equipment with the model number of ST6730A and is matched with the test equipment to work, and the tool comprises a base, a rotary driven assembly and an upper rotary assembly which are sequentially stacked from bottom to top; the rotary driven assembly is used for placing the semiconductor board card and is matched with the base plug bush in a lifting way; the upper rotating assembly is in limited rotation fit with the base; an execution assembly for converting the rotation of the upper rotary assembly into the lifting of the rotary driven assembly is arranged between the rotary driven assembly and the upper rotary assembly; the positioning tool and the test equipment are matched to work, so that the performance test of the semiconductor board card is realized, and the board card is contacted with a probe in the test equipment based on the matching action of the base, the rotary driven assembly and the upper rotary assembly, so that the test is started; the positioning tool can realize positioning detection of the board card quickly and conveniently, can well ensure positioning precision, improves yield, and is energy-saving and emission-reducing.
Description
Technical Field
The utility model relates to the technical field of tool clamps for semiconductor testing, in particular to a semiconductor board test positioning tool.
Background
In the semiconductor test industry, board test is an important link, and the semiconductor board is contacted with a probe by adopting test equipment with the probe, so that a test function is started, and the board is contacted with the probe by adopting auxiliary equipment to be matched with the test equipment; in the prior art, the positioning precision and the yield of the board test are both required to be improved, and the difficulty of continuous breakthrough is also required, so that the semiconductor board test positioning tool is developed to solve the problems in the prior art, and the technical scheme which is the same as or similar to the technical scheme is not found through retrieval.
SUMMERY OF THE UTILITY MODEL
The utility model aims to: the utility model provides a semiconductor integrated circuit board test location frock to solve the problem that the positioning accuracy and the yields of integrated circuit board test are lower relatively among the prior art.
The technical scheme of the utility model is as follows: a semiconductor board card test positioning tool is arranged on test equipment and matched with the test equipment to work, and comprises a base, a rotary driven assembly and an upper rotary assembly which are sequentially stacked from bottom to top; the rotary driven assembly is used for placing the semiconductor board card and is matched with the base plug bush in a lifting way; the upper rotating assembly is in limited rotation fit with the base; an execution assembly for converting the rotation of the upper rotary assembly into the lifting of the rotary driven assembly is arranged between the rotary driven assembly and the upper rotary assembly.
Preferably, the base comprises an annular bottom plate, guide blocks and equal-height cushion blocks which are uniformly arranged on the bottom plate, and guide wheels which are arranged at equal-height positions on the inner side walls of the guide blocks; the rotary driven assembly is supported on the equal-height cushion block and comprises an annular rotary driven disc, a carrying platform fixed at the upper end of the rotary driven disc and a guide groove block fixed on the side edge of the rotary driven disc; the guide groove block body is matched with the guide block in a plug bush manner along the vertical direction; the upper rotating assembly is supported on the guide wheel and comprises an upper rotating disc and limiting plates which are fixed on the lower end surface of the upper rotating disc and correspond to the guide wheel one by one; the executing assembly comprises a cam fixed on the lower end face of the upper rotary disc and a guide rail fixed on the upper end face of the rotary driven disc; the thickness of the guide rail increases progressively along the rotating direction of the upper rotary disc, and the cam is always abutted against the end face of the guide rail.
Preferably, the limiting plates are of arc structures and are distributed annularly, one end of each limiting plate is fixedly connected with the corresponding end of each limiting plate, a notch for the guide wheel to enter is formed between the other end of each limiting plate and the adjacent limiting plate, and a limiting accommodating cavity communicated with the notch is formed between each limiting plate and the upper rotary disc.
Preferably, when the notch is aligned with the guide wheel, the cam is abutted against the side with the lower thickness of the guide rail.
Preferably, the upper rotary disc is also of an annular structure, a plurality of limiting wheels are uniformly arranged on the upper end face of the rotary driven disc, and the outer walls of the limiting wheels abut against the inner wall of the upper rotary disc.
Preferably, the side edge of the upper rotary disc is connected with an upper handle for pulling the upper rotary disc to rotate, and the side edge of the bottom plate is connected with a lower handle.
Compared with the prior art, the utility model has the advantages that:
the positioning tool and the test equipment are matched to work, so that the performance test of the semiconductor board card is realized, and the board card is contacted with a probe in the test equipment based on the matching action of the base, the rotary driven assembly and the upper rotary assembly, so that the test is started; the positioning tool can realize positioning detection of the board card quickly and conveniently, can well ensure positioning precision, improves yield, and is energy-saving and emission-reducing.
Drawings
The utility model is further described with reference to the following figures and examples:
fig. 1 is a schematic structural diagram of a semiconductor board test positioning tool according to the present invention;
fig. 2 is an exploded view of a semiconductor board test positioning tool according to the present invention;
FIG. 3 is a schematic structural view of the rotary driven assembly of the present invention;
fig. 4 is a schematic structural diagram of the upper rotating assembly according to the present invention.
Wherein: 1. a base;
11. the device comprises a bottom plate, 12, guide blocks, 13, equal-height cushion blocks, 14, guide wheels, 15 and a lower handle;
2. a rotary driven assembly;
21. the device comprises a rotary driven disc, 22, a carrying platform, 23, a guide groove block, 24 and a limiting wheel;
3. an upper swing assembly;
31. the upper rotating disc 32, the limiting plate 33, the gap 34, the limiting accommodating cavity 35 and the upper handle;
4. an execution component;
41. cam, 42, guide rail.
Detailed Description
The present invention will be further described in detail with reference to the following specific examples:
as shown in fig. 1 and 2, a semiconductor board test positioning tool is mounted on a machine platform of test equipment with a model ST6730A, and cooperates with the test equipment to realize contact between a probe inside the test equipment and a semiconductor board; the structure of the utility model comprises a base 1, a rotary driven component 2 and an upper rotary component 3 which are sequentially stacked from bottom to top; the rotary driven assembly 2 is used for placing a semiconductor board card and is matched with the base 1 in a lifting way through an inserting sleeve; the upper rotating component 3 is in limited rotation fit with the base 1; an executing component 4 for converting the rotation of the upper rotating component 3 into the lifting of the rotating driven component 2 is arranged between the rotating driven component 2 and the upper rotating component 3.
Specifically, as shown in fig. 2, the base 1 includes a bottom plate 11, guide blocks 12 and equal-height cushion blocks 13 uniformly installed on the bottom plate 11, and guide wheels 14 installed at equal-height positions on inner side walls of the guide blocks 12; the bottom plate 11 is of an annular structure, and the side edge of the bottom plate is fixedly connected with a lower handle 15 which is convenient for the whole structure to move; the equal-height cushion blocks 13 are arranged on the inner ring sides of the guide blocks 12 and can be pressed to descend.
As shown in fig. 3, the rotary driven assembly 2 is supported on the equal-height cushion block 13, and includes an annular rotary driven disc 21, a carrier 22 and a limiting wheel 24 fixed on the upper end of the rotary driven disc 21, and a guide groove block 23 fixed on the side of the rotary driven disc 21; the carrier 22 and the limiting wheel 24 are distributed annularly, the carrier 22 is used for placing a semiconductor board, and the central axis of the limiting wheel 24 is arranged along the vertical direction; the guide groove block 23 is in plug-in fit with the guide block 12 in the vertical direction, so that the guiding function in the lifting process of the rotary driven disc 21 is conveniently performed.
As shown in fig. 4, the upper rotating assembly 3 is supported on the guide wheel 14, and includes an upper rotating disk 31, and limit plates 32 fixed on the lower end surface of the upper rotating disk 31 and corresponding to the guide wheel 14 one by one; the side edge of the upper rotary disc 31 is connected with an upper handle 35 which is used for wrenching the upper rotary disc to rotate; the limiting plates 32 are in an arc-shaped structure and are distributed annularly, one end of each limiting plate is fixedly connected, a notch 33 for the guide wheel 14 to enter is formed between the other end of each limiting plate and the adjacent limiting plate 32, and a limiting accommodating cavity 34 communicated with the notch 33 is formed between each limiting plate 32 and the upper rotary disc 31; further, as shown in fig. 1, the upper rotating disc 31 is of an annular structure, and the outer walls of the plurality of limiting wheels 24 are abutted against the inner wall of the upper rotating disc 31, so that guiding and limiting in the rotating process of the upper rotating disc 31 are realized.
As shown in fig. 1, 3 and 4, the actuating assembly 4 includes a cam 41 fixed on the lower end surface of the upper rotary disk 31, and a guide rail 42 fixed on the upper end surface of the rotary driven disk 21; the thickness of the guide rail 42 is increased progressively along the rotating direction of the upper rotary disc 31, and the cam 41 is always abutted against the end face of the guide rail 42; when the notch 33 is aligned with the guide wheel 14, the cam 41 abuts against the side of the guide rail 42 having a smaller thickness.
It should be noted that, in the present invention, the base 1, the rotary driven component 2, and the upper rotary component 3 are all hollow structures, wherein the hollow structures of the base 1 and the rotary driven component 2 are for facilitating the semiconductor board placed on the stage 22 to be able to achieve contact with a probe in the test equipment, and the hollow structure of the upper rotary component 3 is for facilitating the cooperation with the limiting wheel 24 to achieve guiding and limiting in the rotation process.
The related technical parameters related to the utility model are as follows:
tooling material: AL6061/sus304
The surface treatment method comprises the following steps: blasting bright oxygen
Overall accuracy: 0.05mm
The working principle of the utility model is as follows:
the method comprises the following steps: before the tool is used, whether oil stains, abnormal abrasion and the like exist in a semiconductor board placing area is checked, whether the structural parts are loosened or not is checked, whether the rolling structures are jammed or not is checked, the whole appearance surface of the tool is checked to be free from missing and colliding, if the tool is abnormal, the tool needs to be timely processed, and the tool can be used after the abnormality is confirmed to be removed.
Step two: in an initial state, the upper rotary component 3 is not buckled above the rotary driven component 2, the rotary driven component 2 is installed on the base 1, the base 1 is placed on a machine table of the testing equipment, the semiconductor board card is placed on a carrying table 22 above the rotary driven component 2, a testing point position is well abutted, and the base 1 and the machine table are fixed;
step three: the upper rotary component 3 is arranged above the rotary driven component 2, each guide wheel 14 enters from the notch 33 and abuts against the lower end face of the upper rotary disk 31, at the moment, the limiting wheel 24 also abuts against the annular inner side wall of the upper rotary disk 31, and the cam 41 abuts against one side with the low thickness of the guide rail 42;
step four: the upper handle 35 is pulled to rotate the upper rotary disc 31 (the rotation direction is from the side with the low thickness of the guide rail 42 to the side with the high thickness), and at the moment, the guide wheel 14 enters the limiting accommodating cavity 34 to ensure that the upper rotary disc 31 always rotates at the same height; at this time, as the thickness of the guide rail 42 is increased progressively, the acting force of the cam 41 acting on the guide rail 42 enables the rotary driven component 2 to overcome the acting force of the equal-height cushion block 13 to descend, and further drives the semiconductor card board to descend;
step five: the semiconductor card board continuously descends and finally contacts with a probe in the test equipment, and the test function is started; and after the test is finished, the semiconductor card board is taken out by reverse action.
The above embodiments are merely illustrative of the technical ideas and features of the present invention, and the purpose of the embodiments is to enable those skilled in the art to understand the contents of the present invention and implement the present invention, and not to limit the protection scope of the present invention. It will be evident to those skilled in the art that the utility model is not limited to the details of the foregoing illustrative embodiments, and that the present invention may be embodied in other specific forms without departing from the spirit or essential attributes thereof, and it is therefore intended that the present embodiments be considered in all respects as illustrative and not restrictive, the scope of the utility model being indicated by the appended claims rather than by the foregoing description, and all changes which come within the meaning and range of equivalency of the claims are therefore intended to be embraced therein.
Claims (6)
1. The utility model provides a semiconductor integrated circuit board test location frock, installs on test equipment to with test equipment cooperation work, its characterized in that: comprises a base, a rotary driven component and an upper rotary component which are sequentially stacked from bottom to top; the rotary driven assembly is used for placing the semiconductor board card and is matched with the base plug bush in a lifting way; the upper rotating assembly is in limited rotation fit with the base; an execution assembly for converting the rotation of the upper rotary assembly into the lifting of the rotary driven assembly is arranged between the rotary driven assembly and the upper rotary assembly.
2. The semiconductor board test positioning tool of claim 1, characterized in that: the base comprises an annular bottom plate, guide blocks and equal-height cushion blocks which are uniformly arranged on the bottom plate, and guide wheels which are arranged at equal-height positions on the inner side walls of the guide blocks; the rotary driven assembly is supported on the equal-height cushion block and comprises an annular rotary driven disc, a carrying platform fixed at the upper end of the rotary driven disc and a guide groove block fixed on the side edge of the rotary driven disc; the guide groove block body is matched with the guide block in a plug bush manner along the vertical direction; the upper rotating assembly is supported on the guide wheel and comprises an upper rotating disc and limiting plates which are fixed on the lower end surface of the upper rotating disc and correspond to the guide wheel one by one; the executing assembly comprises a cam fixed on the lower end face of the upper rotary disc and a guide rail fixed on the upper end face of the rotary driven disc; the thickness of the guide rail increases progressively along the rotating direction of the upper rotary disc, and the cam is always abutted against the end face of the guide rail.
3. The semiconductor board card test positioning tool of claim 2, characterized in that: the limiting plates are of arc structures and are distributed annularly, one end of each limiting plate is fixedly connected, a notch for the guide wheel to enter is formed between the other end of each limiting plate and the adjacent limiting plate, and a limiting accommodating cavity communicated with the notch is formed between each limiting plate and the upper rotary disc.
4. The semiconductor board test positioning tool of claim 3, characterized in that: when the notch is aligned with the guide wheel, the cam is abutted to one side with low thickness of the guide rail.
5. The semiconductor board card test positioning tool of claim 2, characterized in that: the upper rotary disc is also of an annular structure, a plurality of limiting wheels are uniformly arranged on the upper end face of the rotary driven disc, and the outer walls of the limiting wheels are abutted to the inner wall of the upper rotary disc.
6. The semiconductor board card test positioning tool of claim 2, characterized in that: the side edge of the upper rotary disc is connected with an upper handle for pulling the upper rotary disc to rotate, and the side edge of the bottom plate is connected with a lower handle.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202121773348.6U CN215375525U (en) | 2021-07-30 | 2021-07-30 | Semiconductor board test positioning tool |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202121773348.6U CN215375525U (en) | 2021-07-30 | 2021-07-30 | Semiconductor board test positioning tool |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN215375525U true CN215375525U (en) | 2021-12-31 |
Family
ID=79613591
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202121773348.6U Active CN215375525U (en) | 2021-07-30 | 2021-07-30 | Semiconductor board test positioning tool |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN215375525U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN115092647A (en) * | 2022-07-26 | 2022-09-23 | 深圳市良机自动化设备有限公司 | High-voltage and low-voltage testing device and testing system |
-
2021
- 2021-07-30 CN CN202121773348.6U patent/CN215375525U/en active Active
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN115092647A (en) * | 2022-07-26 | 2022-09-23 | 深圳市良机自动化设备有限公司 | High-voltage and low-voltage testing device and testing system |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN215375525U (en) | Semiconductor board test positioning tool | |
| CN208427929U (en) | Pressing machine | |
| CN207753584U (en) | A kind of motor magnetic tile assembly system | |
| JP5746440B2 (en) | Work apparatus and control method | |
| JP2014193499A (en) | Assembly device and control method | |
| CN106787520B (en) | Motor coil assembling machine | |
| CN209407466U (en) | It is a kind of for producing the internal expanding fixture of motor housing | |
| CN211760899U (en) | Positioning device | |
| WO2023230773A1 (en) | Press-fitting positioning tool and press-fitting device | |
| JP2007330989A (en) | Pressing-die device and pressing method | |
| CN206353746U (en) | A kind of motor winding kludge | |
| CN206578516U (en) | A kind of T-shaped iron core press-in device of motor winding kludge | |
| CN106695307B (en) | A kind of T shape iron core press-in device of motor winding kludge | |
| CN212398498U (en) | Automobile sensor welding mechanism | |
| CN207104378U (en) | A kind of novel hole steel ball locator | |
| JPS6363537A (en) | Method and device for manufacturing pocket hole of ring | |
| CN206065997U (en) | U-shaped workpiece face fixture for processing | |
| CN213289529U (en) | Shaft type radial punching chamfering machine | |
| CN218445107U (en) | Probe station with groove type wafer detection sucker | |
| CN215985861U (en) | Tip protection device for full-automatic eddy current testing equipment of roller | |
| CN220427988U (en) | Surface grinding machine grinding positioning structure for large-diameter outer circle | |
| CN219151962U (en) | Welding tool for industrial robot manufacturing | |
| CN216829834U (en) | Cylinder type accurate moving type positioning device | |
| CN212517149U (en) | Quick worktable mechenism | |
| CN212887417U (en) | Front wheel bearing press-in jig |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant |