CN215340256U - Conduction testing device and detection equipment with same - Google Patents

Abstract

A conduction testing device and a detection device with the same are used for detecting a substrate and comprise: the positioning tool is used for accommodating and positioning the substrate to be detected; the test assembly comprises a first driving piece and a test head in transmission connection with the first driving piece, the test head corresponds to the connecting part of the substrate, and the first driving piece can drive the test head to contact or release the connecting part; the pressing assembly comprises a second driving piece and a pressing head in transmission connection with the second driving piece, the pressing head corresponds to the button of the substrate, and the second driving piece can drive the pressing head to press or release the button; and the pressing assembly comprises a third driving piece and a pressing head in transmission connection with the third driving piece, and the third driving piece can drive the pressing head to be close to or far away from the substrate so as to press or loosen the substrate on or off the positioning tool. According to the utility model, the test assembly, the pressing assembly and the compressing assembly are arranged, so that the substrate can be fastened and pressed automatically, and the short circuit and the open circuit of the substrate can be detected, thereby saving manpower, improving the automation level and improving the production efficiency.

Description

Conduction testing device and detection equipment with same

Technical Field

The utility model relates to the technical field of substrate electrical detection equipment, in particular to a conduction testing device and detection equipment with the same.

Background

After the key substrate is processed, OS (i.e., short circuit and open circuit) detection needs to be performed on a circuit of the key substrate to ensure that the product is qualified for delivery. The key substrate generally comprises a substrate body and a flexible board connected with the substrate body, wherein a plurality of electrically connected components are arranged on the substrate body to form a circuit structure, and the end part of the flexible board is a connecting part provided with a plurality of pins for being connected with a power supply structure so as to supply power to the substrate body.

In the prior art, a detection device is usually used to detect the key substrate, and the specific process is to manually electrically connect the pins of the flexible board to the test head of the detection device, and manually press the button on the key substrate to detect whether the circuit is short-circuited or open-circuited. The manual labor amount is large by adopting the mode, and the improvement of the production efficiency is not facilitated.

Accordingly, there is a need for improvements in the art that overcome the deficiencies in the prior art.

SUMMERY OF THE UTILITY MODEL

The utility model aims to provide a conduction testing device and a detection device with the same, which can automatically detect a substrate.

The purpose of the utility model is realized by the following technical scheme: a conduction testing apparatus for testing a substrate, comprising: the positioning tool is used for accommodating and positioning the substrate to be detected; the test assembly comprises a first driving piece and a test head in transmission connection with the first driving piece, the test head corresponds to the connecting part of the substrate, and the first driving piece can drive the test head to contact with or release the connecting part; the pressing assembly comprises a second driving piece and a pressing head in transmission connection with the second driving piece, the pressing head corresponds to the button of the substrate, and the second driving piece can drive the pressing head to press or release the button; and the pressing assembly comprises a third driving piece and a pressing head in transmission connection with the third driving piece, and the third driving piece can drive the pressing head to be close to or far away from the substrate so as to press or loosen the substrate on or off the positioning tool.

Furthermore, the test head comprises a needle die, a plurality of probes mounted on the needle die, and an adapter plate electrically connected with the probes, wherein the probes correspond to the connecting parts.

Further, a first floating block and an elastic piece are arranged on the needle die, two ends of the elastic piece are respectively connected with the first floating block and the needle die, and the first floating block is configured to buffer the probe when the probe contacts the connecting part.

Further, the pressing assembly comprises a pressure sensor for detecting the pressing value of the pressing head, and the pressure sensor is respectively connected with the pressing head and the second driving piece.

Further, the compressing head comprises a second mounting block fixedly mounted on the third driving member, and a supporting portion fixedly mounted on the second mounting block and supporting the substrate.

Further, the pressing head further comprises a second floating block arranged on the second mounting block in a floating mode, and the second floating block is configured to buffer the abutting portion when the abutting portion abuts against the substrate.

Further, the testing device also comprises a multi-axis adjusting assembly, and the testing assembly is mounted on the multi-axis adjusting assembly to adjust the position of the testing head.

In addition, the utility model also provides detection equipment which comprises the conduction testing device and a turntable capable of actively rotating, wherein a plurality of positioning tools are uniformly distributed on the turntable along the circumferential direction of the turntable, and the turntable drives the positioning tools to rotate to or away from the conduction testing device.

Further, the inspection apparatus includes a first camera assembly disposed upstream of the conduction testing device, the first camera assembly being configured to acquire an image of the substrate to be inspected and to adjust a relative position of the test head and the substrate.

Further, the detection apparatus includes a second camera component corresponding to the test head, the second camera component configured to acquire an image of the test head and adjust the positional accuracy of the test head.

Compared with the prior art, the utility model has the following beneficial effects: according to the utility model, the test assembly, the pressing assembly and the compressing assembly are arranged, so that the substrate can be fastened and pressed automatically, and the short circuit and the open circuit of the substrate can be detected, thereby saving manpower, improving the automation level and improving the production efficiency.

Drawings

Fig. 1 is a schematic diagram of the overall structure of the conduction testing apparatus of the present invention.

Fig. 2 is a schematic view of the installation of the positioning tool and the substrate in the present invention.

Fig. 3 is an exploded top view of the positioning tool and the substrate shown in fig. 2.

Fig. 4 is an exploded bottom view of the positioning tool and the substrate of fig. 2.

FIG. 5 is a schematic diagram of a test assembly according to the present invention.

Fig. 6 is a partial enlarged view of fig. 5 at a.

Figure 7 is a schematic partial cross-sectional view of a test head according to the present invention.

Fig. 8 is an exploded view of the test head of the present invention.

Fig. 9 is a schematic structural view of the pressing member of the present invention.

Fig. 10 is a schematic view of the construction of the compressing assembly of the present invention.

FIG. 11 is a schematic view of the structure of the detecting apparatus of the present invention.

Fig. 12 is a schematic structural diagram of the first camera assembly of fig. 11.

Fig. 13 is a schematic structural diagram of the second camera assembly of fig. 11.

Detailed Description

In order to make the aforementioned objects, features and advantages of the present application more comprehensible, embodiments accompanying the present application are described in detail below with reference to the accompanying drawings. It is to be understood that the specific embodiments described herein are merely illustrative of the application and are not limiting of the application. It should be further noted that, for the convenience of description, only some of the structures related to the present application are shown in the drawings, not all of the structures. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.

The terms "comprising" and "having," as well as any variations thereof, in this application are intended to cover non-exclusive inclusions. For example, a process, method, system, article, or apparatus that comprises a list of steps or elements is not limited to only those steps or elements listed, but may alternatively include other steps or elements not listed, or inherent to such process, method, article, or apparatus.

Reference herein to "an embodiment" means that a particular feature, structure, or characteristic described in connection with the embodiment can be included in at least one embodiment of the application. The appearances of the phrase in various places in the specification are not necessarily all referring to the same embodiment, nor are separate or alternative embodiments mutually exclusive of other embodiments. It is explicitly and implicitly understood by one skilled in the art that the embodiments described herein can be combined with other embodiments.

Referring to fig. 1 to 4, a conduction testing apparatus corresponding to a preferred embodiment of the utility model is used for testing a substrate 100. The substrate 100 includes a substrate body 11, a button 12 disposed on the substrate body 11, and a flexible board 13 connected to the substrate body 11, wherein a connecting portion 131 is disposed on an end surface of the flexible board 13 away from the substrate body 11, the connecting portion 131 and the button 12 are disposed in a back-to-back manner, and the connecting portion 131 has a plurality of pins.

The conduction testing device comprises: the positioning tool 200 is used for accommodating and positioning the substrate 100 to be detected; a test assembly 300 for inspecting the circuit of the substrate 100; a pressing assembly 400 for pressing the button 12 to detect short and open circuits of the circuit in cooperation with the testing assembly 300; and a pressing assembly 500 for pressing the substrate 100 on the positioning tool 200 to prevent the substrate 100 from moving when the pressing assembly 400 presses the button 12.

The positioning tool 200 includes a tool body 21, and a receiving groove 21a is formed in the tool body 21 along the Z-axis direction to receive the substrate body 11. A plurality of positioning blocks 22 are fixed in the containing groove 21a, the positioning blocks 22 abut against the edge of the substrate main body 11 to limit and position the substrate main body 11, and the flexible plate 13 is arranged on the end face of the tool main body 21. In the present embodiment, one surface of the substrate body 11 provided with the button 12 faces the bottom of the accommodating groove 21a, and the height of the button 12 is lower than the height of the end surface of the substrate body 11 facing the accommodating groove 21a, so as to prevent the button 12 from contacting the accommodating groove 21 a. The bottom of the receiving groove 21a is formed with a through hole 21b, and the through hole 21b corresponds to the button 12, so that the pressing assembly 400 can extend into the through hole 21b and press the button 12.

Preferably, a vacuum channel (not shown) is formed in the tool main body 21, one end of the vacuum channel is used for externally connecting the air pipe 23, the other end of the vacuum channel extends to the bottom of the accommodating groove 21a, a suction nozzle 24 communicated with the vacuum channel can be arranged at the bottom of the accommodating groove, and the suction nozzle 24 is in contact with the substrate 100. The suction nozzles 24 are connected to the air pipes 23 by vacuum equipment (not shown) to suck the substrate body 11, so as to fix the substrate body 11 in the accommodating groove 21a, thereby preventing the substrate 100 on the positioning tool 200 from being separated or displaced.

Further, the conduction testing device further comprises a first support 600, and the testing component 300 and the pressing component 500 are both mounted on the first support 600 and located above the positioning tool 200.

Referring to fig. 5 to 8, the testing assembly 300 includes a first driving member 31 and a testing head 32 drivingly connected thereto, the testing head 32 corresponds to the connecting portion 131 of the substrate 100, and the first driving member 31 can drive the testing head 32 to move along the Z-axis direction to contact or release the pins on the connecting portion 131. In the present embodiment, the first driving member 31 is embodied as a slide cylinder.

The test head 32 includes a pin mold mounting plate 321, a pin mold 322, a pin mold cover plate 323, an adapter plate 324, and a number of probes 325. The needle mold mounting plate 321 is fixed on the first driving member 31, the needle mold 322 is fixed on the needle mold mounting plate 321, the needle mold cover plate 323 is fixed on the upper end surface of the needle mold 322, the adapter plate 324 is fixed between the needle mold mounting plate 321 and the needle mold 322, the probe 325 is arranged in the needle mold 322 along the Z-axis direction in a penetrating manner, one end of the probe 325 penetrates through the upper end surface of the needle mold 322 and is fixed on the needle mold cover plate 323, and the other end penetrates through the lower end surface of the needle mold 322 and corresponds to the pins one by one. The probes 325 are electrically connected to the interposer 324 for connection to external test equipment (not shown).

The lower end of the pin mold 322 is provided with a recessed groove 322a facing inward, the test head 32 further includes a first slider 326 and an elastic member 327 accommodated in the recessed groove 322a, and two ends of the elastic member 327 are respectively connected to the first slider 326 and the pin mold 322. The lower end surface of the first slider 326 is projected by the elastic member 327 against the lower end surface of the pin die 322, and the elastic member 327 is compressed to move in a direction away from the flexible board 13 by an external force. The first slider 326 has a first avoiding hole 326a corresponding to the connecting portion 131 of the flexible board 13 to avoid the connecting portion 131 and the probe 325. In this embodiment, the elastic element 327 is specifically a spring, in other embodiments, the elastic element 327 may also adopt a spring sheet, an elastic column, an elastic sleeve or other suitable elastic structures, and one or more elastic elements 327 are provided as required.

When the test assembly 300 works, the first driving member 31 drives the test head 32 to move towards the connection portion 131 of the flexible board 13, at this time, the first slider 326 first contacts with the positioning tool 200 and gradually moves towards the pin mold 322 under the action of the elastic member 327, the probe 325 contacts with the pin of the connection portion 131 along with the compression of the elastic member 327, and the first slider 326 can effectively buffer the probe 325.

Further, referring to fig. 9, the pressing assembly 400 is disposed below the positioning tool 200, and includes a second driving element 41 and a pressing head 42 in transmission connection therewith, the pressing head 42 corresponds to the button 12 of the substrate 100, and the second driving element 41 can drive the pressing head 42 to move along the Z-axis direction to press or release the button 12. In this embodiment, the second driving member 41 is preferably a servo slide to improve the accuracy of the stroke.

The pressing head 42 is a column structure matched with the through hole 21b, and the second driving member 41 can drive the pressing head 42 to extend into the through hole 21b so as to press the button 12. Preferably, the pressing head 42 is provided with a pressure sensor 43, the pressure sensor 43 can sense the pressure of the pressing head 42 on the button 12, and when the set value is reached, the pressure sensor 43 sends a signal to drive the second driving member 41 to stop, so as to avoid the button 12 from being damaged by too much pressing force of the button 12 and the button 12 from being incompletely triggered by too little pressing force. Specifically, the pressing assembly 400 includes a second bracket 44, the second driving element 41 is mounted on the second bracket 44, a sliding portion (not shown) of the second driving element 41 is provided with a first mounting block 45, and the pressure sensor 43 is fixedly connected to the first mounting block 45 and the pressing head 42, respectively.

Further, referring to fig. 10, the pressing assembly 500 includes a third driving element 51 and a pressing head 52 in transmission connection therewith, and the third driving element 51 can drive the pressing head 52 to approach or separate from the substrate 100, so as to press or release the substrate 100 to the positioning tool 200. In the present embodiment, the third driving member 51 is embodied as a slide table cylinder.

The pressing head 52 includes a second mounting block 521 fixedly mounted on the third driving member 51 and an abutting portion 522 fixedly mounted on the second mounting block 521. The abutting portion 522 is a cylindrical structure, protrudes from the lower end surface of the second mounting block 521, and corresponds to the pressing head 42, and the abutting portion 522 abuts against a surface of the substrate 100 away from the button 12, so as to limit the movement of the substrate 100 when the pressing head 42 presses the button 12. Preferably, the pressing head 52 further includes a second floating block 523 arranged on the second mounting block 521 in a floating manner, a lower end surface of the second floating block 523 protrudes relative to a lower end surface of the second mounting block 521, and the specific structure and function of the second floating block 523 are similar to those of the first floating block 326, which is not described herein again. When the pressing assembly 500 works, the third driving element 51 drives the abutting portion 522 to move towards the substrate 100, the second floating block 523 contacts with the substrate 100 and gradually moves towards the second mounting block 521 to buffer the abutting portion 522, and the abutting portion 522 contacts with the upper end surface of the substrate 100 to press the substrate 100. Preferably, a high-strength adhesive is disposed at an end of the abutting portion 522 contacting the substrate 100 to further avoid damaging the substrate 100.

Further, referring to fig. 1, the test apparatus further includes a multi-axis adjustment assembly 700, the multi-axis adjustment assembly 700 being disposed on the first support 600, and the test assembly 300 being mounted on the multi-axis adjustment assembly 700 so as to adjust the position of the test assembly 300 to ensure that the test head 32 completely corresponds to the connection portion 131 of the substrate 100. In the present embodiment, the multi-axis adjustment assembly 700 is specifically an electric sliding table, which can translate in the X-axis and Y-axis directions and rotate around the Z-axis, and the electric sliding table is a common knowledge in the art and will not be described herein again.

In addition, referring to fig. 11 to 13, the present invention further provides a detection apparatus, which includes the above-mentioned conduction testing apparatus and a turntable 800 capable of actively rotating, wherein a plurality of positioning tools 200 are uniformly arranged on the turntable 800 along the circumferential direction of the turntable 800, and the turntable 800 can rotate the positioning tools 200 to or away from the conduction testing apparatus. The dial 800 may be driven using a cam divider to provide a consistent angle of rotation of the dial 800 each time.

Further, the inspection apparatus further includes a positioning device, the positioning device includes a first camera assembly 81, the first camera assembly 81 is disposed upstream of the conduction testing device, and includes a first camera 811 with a lens facing the upper end surface of the turntable 800 and a first light source 812 concentrically disposed below the first camera 811, the first camera 811 is used for shooting the substrate 100 to be inspected and acquiring an image thereof, and the inspection apparatus can perform corresponding adjustment on the multi-axis adjustment assembly 700 according to the position of the substrate 100 through calculation to ensure that the test head 32 completely corresponds to the substrate 100.

Since there may be a deviation in the positional accuracy of the multi-axis adjustment assembly 700 after multiple movements, it is preferred that the positioning apparatus further comprises a second camera assembly 82 for calibrating the multi-axis adjustment assembly 700. The second camera assembly 82 is disposed below the turntable 800, and includes a second camera 821 whose lens faces the test head 32 and a second light source 822 concentrically disposed above the second camera 821, the second camera 821 is used for capturing the test head 32 and obtaining an image thereof, and the detection apparatus can perform calculation to adjust the multi-axis adjustment assembly 700 accordingly according to the position of the test head 32. In order to ensure that the second camera 821 can successfully shoot the test head 32, the turntable 800 is provided with a second avoiding hole 801, the second avoiding hole 801 is located between two adjacent positioning tools 200, the number of the second avoiding holes 801 may be one or more, and the application is not limited herein.

The working process of the detection equipment is as follows: placing the substrate 100 to be tested on the positioning tool 200, rotating the turntable 800, driving the substrate 100 to a position right below the first camera 811, and acquiring an image of the substrate 100 by the first camera 811 to adjust the multi-axis adjusting assembly 700 according to the position deviation of the substrate 100 so as to ensure that the test head 32 corresponds to the substrate 100;

continuing to rotate the turntable 800, positioning the substrate 100 to be tested below the conduction testing device, driving the pressing head 42 to press against the substrate body 11 by the third driving member 51, driving the testing head 32 to contact with the connecting portion 131 of the flexible board 13 by the first driving member 31, and driving the pressing head 42 to press the button 12 by the second driving member 41, so as to cooperate with the testing head 32 to test the substrate 100; in addition, in the process of rotating the turntable 800, when the second avoidance hole 801 is located right below the second camera 821, the second camera 821 acquires an image of the test head 32, and adjusts the multi-axis adjusting assembly 700 through calculation to correct the position of the test head 32;

after the detection is completed, the test head 32, the pressing head 42 and the pressing head 52 are all reset, and the turntable 800 continues to rotate, so as to rotate the detected substrate 100 away from the conduction testing device and rotate the substrate 100 to be detected to the conduction testing device.

In conclusion, the testing assembly, the pressing assembly and the compressing assembly are arranged, so that the substrate can be fastened and pressed automatically, and the short circuit and the open circuit of the substrate can be detected, the labor is saved, the automation level is improved, and the production efficiency is improved;

the utility model is also provided with a multi-axis adjusting component which can adjust the position of the testing component so as to ensure that the testing component corresponds to the connecting part of the substrate;

the inspection equipment is provided with a turntable so as to input and output the substrate, and meanwhile, the inspection equipment is provided with a camera assembly which can shoot the substrate to be inspected and drive the test assembly to be adjusted to a position corresponding to the substrate according to the substrate deviation.

The above is only one embodiment of the present invention, and any other modifications based on the concept of the present invention are considered as the protection scope of the present invention.

Claims (10)

1. A conduction testing apparatus for inspecting a substrate (100), characterized in that: the method comprises the following steps:

the positioning tool (200) is used for accommodating and positioning the substrate (100) to be detected;

the testing assembly (300) comprises a first driving piece (31) and a testing head (32) in transmission connection with the first driving piece, the testing head (32) corresponds to the connecting part (131) of the substrate (100), and the first driving piece (31) can drive the testing head (32) to contact with or release the connecting part (131);

the pressing assembly (400) comprises a second driving piece (41) and a pressing head (42) in transmission connection with the second driving piece, the pressing head (42) corresponds to the button (12) of the substrate (100), and the second driving piece (41) can drive the pressing head (42) to press or release the button (12); and

the pressing assembly (500) comprises a third driving piece (51) and a pressing head (52) in transmission connection with the third driving piece, wherein the third driving piece (51) can drive the pressing head (52) to be close to or far away from the substrate (100) so as to press or release the substrate (100) to the positioning tool (200).

2. The conduction testing apparatus as claimed in claim 1, wherein: the test head (32) comprises a pin die (322), a plurality of probes (325) installed on the pin die (322) and an adapter plate (324) electrically connected with the probes (325), wherein the probes (325) correspond to the connecting parts (131).

3. The conduction testing apparatus as claimed in claim 2, wherein: the needle die (322) is provided with a first floating block (326) and an elastic piece (327), two ends of the elastic piece (327) are respectively connected with the first floating block (326) and the needle die (322), and the first floating block (326) is configured to buffer the probe (325) when the probe (325) contacts the connecting part (131).

4. The conduction testing apparatus as claimed in claim 1, wherein: the pressing assembly (400) comprises a pressure sensor (43) for detecting the pressing value of the pressing head (42), and the pressure sensor (43) is respectively connected with the pressing head (42) and the second driving piece (41).

5. The conduction testing apparatus as claimed in claim 1, wherein: the pressing head (52) comprises a second mounting block (521) fixedly mounted on the third driving piece (51) and an abutting part (522) fixedly mounted on the second mounting block (521) and abutting against the substrate (100).

6. The conduction testing apparatus as claimed in claim 5, wherein: the pressing head (52) further includes a second slider (523) provided on the second mounting block (521) in a floating manner, the second slider (523) being configured to buffer the abutting portion (522) when the abutting portion (522) abuts against the substrate (100).

7. The conduction testing apparatus as claimed in claim 1, wherein: the testing apparatus further includes a multi-axis adjustment assembly (700), the testing assembly (300) being mounted on the multi-axis adjustment assembly (700) to adjust the position of the test head (32).

8. A detection apparatus, characterized by: the conduction testing device comprises the conduction testing device according to any one of claims 1 to 7 and a rotary table (800) capable of actively rotating, wherein a plurality of positioning tools (200) are uniformly distributed on the rotary table (800) along the circumferential direction of the rotary table (800), and the rotary table (800) drives the positioning tools (200) to rotate to or away from the conduction testing device.

9. The detection device of claim 8, wherein: the inspection apparatus comprises a first camera assembly (81) arranged upstream of the conduction testing device, the first camera assembly (81) being configured to acquire an image of the substrate (100) to be inspected and to adjust the relative position of the test head (32) and the substrate (100).

10. The detection device of claim 9, wherein: the detection apparatus includes a second camera assembly (82) corresponding to the test head (32), the second camera assembly (82) configured to acquire an image of the test head (32) and adjust a positional accuracy of the test head (32).

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