CN215180378U

CN215180378U - Test fixture with lamp bead substrate

Info

Publication number: CN215180378U
Application number: CN202121246221.9U
Authority: CN
Inventors: 兰晶华; 文海建; 刘世明; 蔡振
Original assignee: Shenzhen Xinyexin Led Co ltd
Current assignee: Shenzhen Xinyexin Led Co ltd
Priority date: 2021-06-04
Filing date: 2021-06-04
Publication date: 2021-12-14
Anticipated expiration: 2031-06-04

Abstract

The utility model discloses a take test fixture of lamp pearl base plate, including a test platform, set up a base plate carrier on test platform and set up in a accredited testing organization of base plate carrier top, be formed with a base plate draw-in groove on this base plate carrier, be formed with at least a lamp pearl groove of stepping down on this base plate draw-in groove. The utility model provides a take test fixture of lamp pearl base plate can carry out effective location to taking lamp pearl base plate, prevents to take lamp pearl base plate to shift to do benefit to and aim at the test point and test, improve the test accuracy; meanwhile, the lamp beads can be prevented from being scraped, so that the quality of the substrate with the lamp beads is ensured. Moreover, the test is convenient and quick, the time consumption is short, and the efficiency is high.

Description

Test fixture with lamp bead substrate

Technical Field

The utility model relates to a test fixture especially relates to a test fixture of tape light pearl base plate.

Background

After the production and processing of the substrate with the lamp beads are finished, the electrification performance of the lamp beads on the substrate needs to be tested to prevent the short circuit and the open circuit. The existing testing method is that a test is directly carried out by a test pencil manually. The problem of efficiency of software testing is low in this mode, especially when having a plurality of lamp pearls on the base plate, it is just more troublesome to test, and is consuming time long, inefficiency.

Meanwhile, in the testing process, the substrate is easy to move, the test point is not beneficial to the contact of the test pencil, great inconvenience is brought to the test, and the test precision is influenced.

SUMMERY OF THE UTILITY MODEL

In view of the above disadvantages, an object of the present invention is to provide a testing fixture with a lamp bead substrate, which can effectively position the lamp bead substrate and prevent the lamp bead substrate from shifting, thereby facilitating the alignment of the testing points for testing and improving the testing precision; meanwhile, the lamp beads can be prevented from being scraped, so that the quality of the substrate with the lamp beads is ensured. Moreover, the test is convenient and quick, the time consumption is short, and the efficiency is high.

The utility model discloses a reach the technical scheme that above-mentioned purpose adopted and be:

a test fixture with a lamp bead substrate comprises a test platform, a substrate carrier arranged on the test platform and a test mechanism arranged above the substrate carrier.

As a further improvement of the utility model, the two opposite side edges of the base plate clamping groove on the base plate carrier are respectively provided with a grabbing and abdicating groove.

As a further improvement of the utility model, the last locating component that is provided with of test platform, this locating component include set up two location rectangular pieces on test platform relatively and set up on test platform and be located a location dog between two location rectangular pieces one end, are formed with an at least bar mounting hole on this location rectangular piece and location dog respectively, and this location rectangular piece is installed on test platform through at least a screw and bar mounting hole cooperation with the location dog.

As a further improvement, the testing mechanism includes a mounting bracket erected on the testing platform, a lifting operation assembly arranged on the mounting bracket, and a testing needle plate arranged above the substrate carrier and connected to the lifting operation assembly.

As a further improvement, the lift operation assembly includes a fixed connecting piece, a movable lifter that runs through the connecting piece lower part that set up on the installing support, rotates and connects in a turning handle on connecting piece upper portion and rotate and connect in a turning handle and connect in a connecting ear structure on lifter upper portion, wherein, this lifter sub-unit connection is in the test faller.

As a further improvement of the utility model, a sleeve for the lifting rod to movably penetrate is formed at the lower part of the connecting piece.

As a further improvement, the engaging lug structure mainly comprises two engaging lugs which are arranged relatively, the upper end of the engaging lug is connected with the rotating handle side edge in a rotating way, and the lower end of the engaging lug is connected with the lifting rod side edge.

As a further improvement of the utility model, the pin joints are respectively arranged between the connecting lug and the rotating handle, between the connecting lug and the lifting rod and between the rotating handle and the connecting piece.

As a further improvement, the utility model is provided with two piece at least lift location guide pillars between installing support and the test platform, be provided with the movable sleeve on this test faller and locate two at least lift location guide pin bushing of lift location guide pillar outlying.

As a further improvement, the test needle plate is provided with a plurality of test needles which run through to the lower end of the test needle plate and face the substrate carrier, and the plurality of test needles are connected with the positive electrode and the negative electrode of the power supply through wires.

The utility model has the advantages that:

(1) through the special structural design of the substrate clamping groove and the lamp bead abdicating groove on the substrate carrier, the substrate with the lamp beads is effectively positioned, and the substrate with the lamp beads is prevented from shifting, so that the test points can be favorably aligned for testing, and the test precision is improved; meanwhile, the lamp bead abdicating groove abdicating the lamp beads prevents the lamp beads from being scraped, thereby ensuring the quality of the substrate with the lamp beads.

(2) By the setting of locating component on the test platform, specifically by two location bars and location dog combination together, carry out trilateral location to the base plate carrier, prevent that the base plate carrier from appearing the aversion phenomenon, do benefit to test mechanism and can aim at the test point on the base plate of taking lamp pearl on the base plate carrier and test, improve the measuring accuracy.

(3) The test needle plate with the plurality of test needles is adopted to test the plurality of lamp beads on the lamp bead substrate, a plurality of lamp beads can be tested at the same time, the test is convenient and fast, the time consumption is short, and the efficiency is high.

The above is an overview of the technical solution of the present invention, and the present invention is further explained with reference to the accompanying drawings and the detailed description.

Drawings

Fig. 1 is a schematic view of the overall structure of the present invention;

fig. 2 is a schematic view of the structure of the combination of the substrate carrier and the testing platform of the present invention.

Detailed Description

To further illustrate the technical means and effects of the present invention adopted to achieve the intended purpose, the following detailed description of the embodiments of the present invention is provided in conjunction with the accompanying drawings and preferred embodiments.

Referring to fig. 1 and 2, an embodiment of the present invention provides a testing fixture with a lamp bead substrate, including a testing platform 1, a substrate carrier 2 disposed on the testing platform 1, and a testing mechanism 3 disposed above the substrate carrier 2, a substrate slot 21 is formed on the substrate carrier 2, and at least one lamp bead abdicating slot 22 is formed on the substrate slot 21. The substrate carrier 2 is used for carrying a substrate with lamp beads, and when in testing, the substrate with the lamp beads is clamped on the substrate clamping groove 21 of the substrate carrier 2, so that the substrate with the lamp beads is prevented from shifting, and the substrate with the lamp beads is effectively positioned, thereby being beneficial to testing by aligning with a testing point and improving the testing precision; meanwhile, the lamp beads on the lamp bead substrate correspond to the lamp bead yielding grooves 22, the lamp bead yielding grooves 22 are used for yielding the lamp beads, and the lamp beads are prevented from being scraped, so that the quality of the lamp bead substrate is guaranteed.

Specifically, to the quantity and the position of the lamp pearl groove of stepping down 22, can set for according to lamp pearl position on the base plate of taking the lamp pearl, and shared region size, as long as will take the lamp pearl base plate card to the base plate draw-in groove 21 on the base plate carrier 2 after, the lamp pearl can aim at the lamp pearl groove of stepping down 22, by the lamp pearl groove of stepping down 22 for the lamp pearl step down can.

In order to place the substrate with the lamp beads into the substrate slot 21 of the substrate carrier 2 and take the substrate with the lamp beads out of the substrate slot 21, a capturing and abdicating slot 23 is formed on the substrate carrier 2 and on two opposite sides of the substrate slot 21, as shown in fig. 2. By the setting of snatching the groove of stepping down 23, be convenient for directly snatch and take the lamp pearl base plate to put into base plate draw-in groove 21, also be convenient for take out from base plate draw-in groove 21 with the lamp pearl base plate, bring very big facility for the operation.

In this embodiment, a positioning assembly 4 is disposed on the testing platform 1, and the positioning assembly 4 includes two positioning bars 41 disposed on the testing platform 1, and a positioning block 42 disposed on the testing platform 1 and located between one ends of the two positioning bars 41. By two location strip pieces 41 and location dog 42 combine together, carry out trilateral location to base plate carrier 2, prevent that base plate carrier 2 from appearing the aversion phenomenon, do benefit to that accredited testing organization 3 can aim at the test point on the base plate of taking lamp pearl base plate on the base plate carrier 2 and test, improve the measuring accuracy.

Meanwhile, at least one strip-shaped mounting hole (410,420) is respectively formed on the positioning strip block 41 and the positioning block 42, and the positioning strip block 41 and the positioning block 42 are mounted on the test platform 1 through at least one screw (411,421) matched with the strip-shaped mounting hole (410, 420). Through the screw 411 on the wrench movement bar mounting hole 410, can adjust the position of location stick 41 on test platform 1, and in the same way, through the screw 421 on the wrench movement bar mounting hole 420, can adjust the position of location dog 42 on test platform 1, then location stick 41 combines together with location dog 42 and can fix a position not the base plate carrier 2 of equidimension, when needs bear the test to not unidimensional lamp pearl base plate, can change the size of a dimension of base plate carrier 2, thereby the application range has been enlarged.

In the present embodiment, as shown in fig. 1, the testing mechanism 3 includes a mounting bracket 31 mounted on the testing platform 1, a lift operation assembly 32 mounted on the mounting bracket 31, and a testing needle plate 33 disposed above the substrate carrier 2 and connected to the lift operation assembly 32. The lifting operation component 32 can control the test needle plate 33 to do lifting action, thereby being convenient for testing the substrate with the lamp beads on the substrate carrier 2.

Specifically, the lifting operation assembly 32 includes a connecting member 321 fixedly disposed on the mounting bracket 31, a lifting rod 322 movably penetrating through the lower portion of the connecting member 321, a rotating handle 323 rotatably connected to the upper portion of the connecting member 321, and a connecting lug structure 324 rotatably connected to the rotating handle 323 and connected to the upper portion of the lifting rod 322, wherein the lower portion of the lifting rod 322 is connected to the test needle plate 33.

Specifically, a sleeve 3211 through which the lifting rod 322 movably penetrates is formed at a lower portion of the connecting member 321. That is, the lifting rod 322 can move up and down in the sleeve 3211.

Specifically, the engaging lug structure 324 is mainly composed of two opposing engaging lugs 3241, the upper end of the engaging lug 3241 is rotatably connected to the side of the rotating handle 323, and the lower end is connected to the side of the lifting rod 322.

As for the connection mode between the structures, specifically, the connection lug 3241 and the rotating handle 323, the connection lug 3241 and the lifting rod 322, and the rotating handle 323 and the connecting member 321 are respectively connected by a pin 320. The connection mode of the pin 320 is adopted to respectively realize the rotary connection between the connecting lug 3241 and the rotating handle 323 and the rotary handle 323 and the connecting piece 321, and realize the connection between the connecting lug 3241 and the lifting rod 322.

As shown in fig. 1, the elevation operation assembly 32 drives the test needle plate 33 to rise to the highest point, when the height of the test needle plate 33 needs to be lowered, since the rotating handle 323 and the connecting member 321, and the rotating handle 323 and the connecting lug structure 324 are rotatably connected, and the connecting member 321 is fixedly connected to the mounting bracket 31, when the rotating handle 323 is swung toward one side of the test needle plate 33 by hand, the rotating handle 323 and the connecting lug structure 324 are forced to move downward with the connecting member 321 as a fixed fulcrum, so as to drive the elevating rod 322 to move downward, and finally, the test needle plate 33 is driven downward, so that the height of the test needle plate 33 is lowered, and the test needle plate 33 is favorable for testing the substrate with lamp beads on the substrate carrier 2. On the contrary, when the test is completed and the height of the test needle plate 33 needs to be raised, the rotating handle 323 swings backwards by hand, so that the rotating handle 323 and the connecting lug structure 324 move upwards by taking the connecting piece 321 as a fixed fulcrum, and the lifting rod 322 is driven to move upwards, and finally the test needle plate 33 is driven upwards, so that the height of the test needle plate 33 is raised, and the tested substrate with the lamp beads can be taken away from the substrate carrier 2 conveniently.

When the lifting operation assembly 32 drives the test needle plate 33 to perform lifting operation, in order to improve the stability of the test needle plate 33 during lifting, at least two lifting positioning guide pillars 5 are disposed between the mounting bracket 31 and the test platform 1, and at least two lifting positioning guide sleeves 330 movably sleeved on the periphery of the lifting positioning guide pillars 5 are disposed on the test needle plate 33. When the lifting operation component 32 drives the test needle plate 33 to do lifting action, the lifting positioning guide sleeve 330 does vertical lifting motion along the lifting positioning guide pillar 5, and the stability is high.

In the present embodiment, the test probe plate 33 is provided with a plurality of test probes 331 penetrating to the lower end of the test probe plate 33 and facing the substrate carrier 2, and the plurality of test probes 331 are connected to the positive and negative electrodes of the power source through wires. Specifically, have the several lamp pearl on taking lamp pearl base plate, and every lamp pearl all has two test points. When the two testing needles 331 contact two testing points of the same lamp bead, namely the two testing needles 331 contact the two testing points one by one, because the two testing needles 331 are connected with the positive electrode and the negative electrode of the power supply through the conducting wires, if the lamp bead is lightened, the electrifying performance of the lamp bead is qualified, and if the lamp bead is not lightened, the electrifying performance of the lamp bead is unqualified.

From this, adopt the test faller 33 who takes several test needles 331 to test the several lamp pearl on taking the lamp pearl base plate, can test a plurality of lamp pearls at the same time, test convenient and fast, weak point consuming time, it is efficient.

Of course, different types of substrates with the lamp beads can be replaced by different test needle plates 33, so that the application range is wide, and the practicability is high.

The above description is only a preferred embodiment of the present invention, and is not intended to limit the technical scope of the present invention, so that other structures obtained by adopting the same or similar technical features as the above embodiments of the present invention are all within the protection scope of the present invention.

Claims

1. A test fixture with a lamp bead substrate comprises a test platform, a substrate carrier arranged on the test platform and a test mechanism arranged above the substrate carrier.

2. The testing fixture for substrates with beads according to claim 1, wherein a capturing and avoiding groove is formed on each of two opposite sides of the substrate clamping groove on the substrate carrier.

3. The testing fixture of claim 1, wherein the testing platform is provided with a positioning assembly, the positioning assembly comprises two positioning bars oppositely arranged on the testing platform, and a positioning block arranged on the testing platform and located between one ends of the two positioning bars, at least one strip-shaped mounting hole is formed in each of the positioning bars and the positioning block, and the positioning bars and the positioning block are mounted on the testing platform through at least one screw in cooperation with the strip-shaped mounting holes.

4. The testing fixture for the substrate with the lamp beads as claimed in any one of claims 1 to 3, wherein the testing mechanism comprises a mounting frame mounted on the testing platform, a lifting operation assembly disposed on the mounting frame, and a testing pin plate disposed above the substrate carrier and connected to the lifting operation assembly.

5. The testing fixture of claim 4, wherein the lifting assembly comprises a connecting member fixedly disposed on the mounting bracket, a lifting rod movably penetrating through a lower portion of the connecting member, a rotating handle rotatably connected to an upper portion of the connecting member, and a connecting lug structure rotatably connected to the rotating handle and connected to an upper portion of the lifting rod, wherein a lower portion of the lifting rod is connected to the testing needle plate.

6. The testing fixture with the substrate having the lamp beads as set forth in claim 5, wherein a sleeve for the lift rod to movably pass through is formed at a lower portion of the connecting member.

7. The testing fixture with the lamp bead substrate as claimed in claim 5, wherein the engaging lug structure is mainly composed of two engaging lugs oppositely arranged, the upper ends of the engaging lugs are rotatably connected with the side edge of the rotating handle, and the lower ends of the engaging lugs are connected with the side edge of the lifting rod.

8. The testing fixture of claim 7, wherein the engaging lug is connected to the rotating handle, the engaging lug is connected to the lifting rod, and the rotating handle is connected to the connecting member by a pin.

9. The testing fixture of claim 4, wherein at least two lifting and positioning guide posts are disposed between the mounting frame and the testing platform, and at least two lifting and positioning guide sleeves are disposed on the testing needle plate and movably sleeved on the outer periphery of the lifting and positioning guide posts.

10. The testing fixture of claim 4, wherein the testing pin plate is provided with a plurality of testing pins extending through the testing pin plate to a lower end thereof and facing the substrate carrier, and the testing pins are connected to the positive and negative electrodes of the power source through wires.