CN215179543U - Flip type two-section downward pressing puncture needle testing mechanism - Google Patents
Flip type two-section downward pressing puncture needle testing mechanism Download PDFInfo
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- CN215179543U CN215179543U CN202120976793.6U CN202120976793U CN215179543U CN 215179543 U CN215179543 U CN 215179543U CN 202120976793 U CN202120976793 U CN 202120976793U CN 215179543 U CN215179543 U CN 215179543U
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- base
- upper cover
- probe
- buckle
- carrying disc
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Abstract
The utility model discloses a flip formula two sections are pressed down and are pricked needle accredited testing organization, include: the needle inserting mechanism and the probes are arranged on the carrying disc and comprise an upper cover, a base and a buckle, the upper cover is rotatably connected with the base, the upper cover can be tightly attached to the base, the base is movably connected with the carrying disc and slides linearly relative to the breadth of the carrying disc, the buckle is located near the base, the buckle is movably connected with the carrying disc, and the movable route of the buckle faces the base; the probe install in cover on, the probe is located the upper cover with the one side that the base can overturn the laminating, the probe orientation with the base for it is parallel to carry the removal route of dish, the utility model discloses well probe no longer causes the loss because of the yawing force, reduces the human cost of probe loss cost and change probe.
Description
Technical Field
The utility model relates to a microelectronics is made and test field, especially relates to two sections of pressing of flip formula and is pricked needle accredited testing organization.
Background
In LCD, OLED, on-vehicle display screen, among the testing arrangement of panel correlation industry such as FPC, the multigrade is in the theory of semi-automatization, the getting of circuit board is accomplished by the operating personnel is artifical, the testing process is the automatic control process, in the testing process of circuit board, it is to each check point on the circuit board to need the probe to be connected to, current flip prick needle mechanism is getting the in-process at the manual work, utilize the upper cover to overturn the pressfitting with an axle center, upper cover and determinand have an contained angle before the complete pressfitting, because the probe is installed in the upper cover, when the determinand just touch, the probe is not perpendicular with the determinand this moment, make the probe receive a yawing force, the yawing force leads to the probe very easily to break down, just cause the probe to need often to change yet, equipment cost and human cost increase.
At present, no acupuncture testing mechanism which can realize the vertical movement of the probe and keep the simplicity of the original flip mechanism exists.
Disclosure of Invention
The utility model overcomes prior art's is not enough, provides flip formula two sections and pushes down acupuncture testing mechanism.
In order to achieve the above purpose, the utility model adopts the technical scheme that: two sections push down acupuncture accredited testing organization of flip formula includes: the needle inserting mechanism and the probes are arranged on the carrying disc and comprise an upper cover, a base and a buckle, the upper cover is rotatably connected with the base, the upper cover can be tightly attached to the base, the base is movably connected with the carrying disc and slides linearly relative to the breadth of the carrying disc, the buckle is located near the base, the buckle is movably connected with the carrying disc, and the movable route of the buckle faces the base; the probe is arranged on the upper cover, the probe is positioned on one surface of the upper cover, which can be overturned and attached to the base, and the orientation of the probe is parallel to the moving route of the base relative to the carrying disc.
In a preferred embodiment of the present invention, a torsion spring is installed between the upper cover and the base.
In a preferred embodiment of the present invention, the upper cover and the base are turned over with the torsion spring as an axis.
In a preferred embodiment of the present invention, the base is connected to the carrying plate by a positioning guide bolt.
In a preferred embodiment of the present invention, the positioning guide bolt and the carrying plate form a vertical movement therebetween.
In a preferred embodiment of the present invention, a vertical spring is further disposed inside the base, and the vertical spring expansion path is perpendicular to the carrier plate breadth.
In a preferred embodiment of the present invention, the two sides of the base are respectively provided with the buckle.
In a preferred embodiment of the present invention, a horizontal spring is disposed in the buckle, and the horizontal spring is in a flexible path parallel to the breadth of the carrying tray.
In a preferred embodiment of the present invention, the probe is located at an end of the upper cover away from the torsion spring.
In a preferred embodiment of the present invention, a handle is disposed at an end of the buckle away from the base.
The utility model provides a defect that exists among the background art, the utility model discloses possess following beneficial effect:
(1) the utility model discloses a probe is for the two-period form motion of carrying the dish, separates into upset motion and pushing down the motion with the upset motion to make the probe can be close to by the test panel with vertical gesture, thereby reduced because of the wearing and tearing that cause with the side direction collision of panel in the probe motion process even fracture, thereby reduce accredited testing organization's probe loss cost, and the manpower time cost of changing the probe.
(2) Specifically, the utility model discloses well probe installation is covered on, and the upper cover uses torque spring to overturn with the base as the axle center and is connected for the upper cover can be close to the panel smoothly at first stage upset in-process, and finishes at the test and loosen the buckle after, can overturn automatically and keep away from the base, thereby makes that the operator can be convenient change the test panel, practices thrift the operation flow.
(3) The utility model discloses in, base and year are connected with location guide bolt between the dish, and location guide bolt with carry the dish and form vertical motion, ensure that the probe can be after upper cover and base upset laminating, can do down vertical motion according to location guide bolt's direction route, through second stage's pushing down for the probe does not receive the side force influence, improves probe life, has reduced probe loss cost.
(4) The utility model relates to an in the preferred embodiment, the base both sides are equipped with respectively the buckle to ensure that the buckle on both sides can provide a stable overdraft, avoid the base because of the uneven one side perk that leads to of atress, improve test stability, the buckle is kept away from simultaneously the one end of base is provided with the handle, makes that the operator can be convenient pulls open the buckle through pulling the handle, thereby releases base and upper cover, and is concrete, when withdrawing from the prick needle, both hands pull the handle, and outwards pull the buckle, the base pops out up because of the spring force, and the upper cover is because of torsion spring is automatic to be opened, ensures accredited testing organization's expansion coherence, practices thrift manual operation time, reduces the cost of labor.
Drawings
The present invention will be further explained with reference to the drawings and examples;
FIG. 1 is a perspective view of the preferred embodiment of the present invention in an expanded state;
FIG. 2 is a perspective view of the preferred embodiment of the present invention after the upper cover is turned over;
FIG. 3 is a perspective view of the closed test mode of the preferred embodiment of the present invention;
in the figure: 1. a carrying tray; 2. a base; 3. an upper cover; 4. a probe; 5. a torsion spring; 6. positioning a guide bolt; 7. and (5) buckling.
Detailed Description
The invention will now be described in further detail with reference to the accompanying drawings, which are simplified schematic drawings and illustrate, by way of illustration only, the basic structure of the invention, and which therefore show only the constituents relevant to the invention.
The flip type two-section downward-pressing puncture needle testing mechanism shown in fig. 1 comprises: the probe 4 and the needle inserting mechanism connected with the probe 4 are arranged on the carrying disc 1, the needle inserting mechanism comprises an upper cover 3, a base 2 and a buckle 7, the upper cover 3 is rotatably connected with the base 2, the upper cover 3 can be tightly attached to the base 2, the base 2 is movably connected with the carrying disc 1, the base 2 slides linearly relative to the breadth of the carrying disc 1, the buckle 7 is located near the base 2, the buckle 7 is movably connected with the carrying disc 1, and the movable route of the buckle 7 faces the base 2; the probe 4 is arranged on the upper cover 3, the probe 4 is positioned on one surface of the upper cover 3 which can be overturned and attached to the base 2, and the direction of the probe 4 is parallel to the moving route of the base 2 relative to the carrying disc 1.
As shown in figure 1, two sections of needle accredited testing organization that push down of flip formula installs torque spring 5 between upper cover 3 and the base 2, upper cover 3 with base 2 with torque spring 5 overturns for the axle center, the utility model discloses well probe 4 is installed on upper cover 3, and upper cover 3 and base 2 use torque spring 5 to overturn as the axle center and be connected for upper cover 3 can be in first stage upset in-process, is close to the panel smoothly, and finishes at the test and unclamps behind buckle 7, can overturn automatically and keep away from base 2, thereby makes that the operator can be convenient change the test panel, practices thrift the operation flow.
Preferably, the probe 4 is located at an end of the upper cover 3 far away from the torsion spring 5, so as to avoid the probe 4 interfering with the base 2 during the overturning process.
According to the flip type two-section downward-pressing puncture needle testing mechanism shown in the figure 1, a base 2 is connected with a carrying disc 1 through a positioning guide bolt 6, the positioning guide bolt 6 is connected with the carrying disc 1 to form vertical motion, a vertical spring is further arranged inside the base 2, a telescopic path of the vertical spring is perpendicular to a breadth of the carrying disc 1, the base 2 is connected with the carrying disc 1 through the positioning guide bolt 6, the positioning guide bolt 6 and the carrying disc 1 form vertical motion, it is ensured that a probe 4 can be pressed down to move vertically according to a guide path of the positioning guide bolt 6 after an upper cover 3 and the base 2 are overturned and attached, and the probe 4 is not affected by lateral force through pressing at the second stage, so that the service life of the probe 4 is prolonged, and the loss cost of the probe 4 is reduced.
As shown in fig. 2, the two sections of flip-type downward-pressing pricking testing mechanisms are characterized in that the two sides of the base 2 are respectively provided with the buckles 7, the buckles 7 are internally provided with the horizontal springs, the telescopic paths of the horizontal springs are parallel to the breadth of the carrying disc 1, one ends of the buckles 7 far away from the base 2 are provided with the handles, the two sides of the base 2 are respectively provided with the buckles 7, so that the buckles 7 at the two sides can provide stable downward pressure, one side tilting of the base 2 caused by uneven stress is avoided, the testing stability is improved, meanwhile, one ends of the buckles 7 far away from the base 2 are provided with the handles, an operator can conveniently pull the buckles 7 open by pulling the handles, the base 2 and the upper cover 3 are released, specifically, when the pricking needle is withdrawn, the handle is pulled by both hands, the buckles 7 are pulled outwards, the base 2 is popped upwards due to the spring force, and the upper cover 3 is automatically opened due to the torsion spring 5, the unfolding consistency of the testing mechanism is ensured, the manual operation time is saved, and the labor cost is reduced.
The utility model discloses a probe 4 is for carrying the two-stage type motion of dish 1, separates into upset motion and pushing down the motion with the upset motion to make probe 4 can be close to by the test panel with vertical gesture, thereby reduced 4 motion processes of probe because of the wearing and tearing that cause with the side direction collision of panel fracture even, thereby reduced 4 loss cost of probe of accredited testing organization, and the manpower time cost of changing probe 4.
The utility model discloses during the use:
when the needle is pricked, the upper cover 3 is pushed by hand, when the upper cover 3 is turned to be horizontal and is tightly sealed with the base 2, the upper cover 3 is just attached to the buckle 7, downward force is applied, the upper cover 3 and the base 2 integrally move vertically and downwards, the buckle 7 slides outwards, and when the upper cover 3 is in place, the buckle 7 slides inwards to buckle the upper cover 3, so that the needle pricking effect is achieved;
when the needle is withdrawn, as shown in fig. 3, the buckle 7 is pulled outward by both hands, the base 2 is ejected upward by the force of the vertical spring, and the upper cover 3 is automatically opened by the torsion spring 5.
In light of the foregoing, it is to be understood that various changes and modifications may be made by those skilled in the art without departing from the spirit and scope of the invention. The technical scope of the present invention is not limited to the content of the specification, and must be determined according to the scope of the claims.
Claims (10)
1. Two sections push down acupuncture accredited testing organization of flip formula includes: probe and with the mechanism of pricking of probe connection, its characterized in that:
the needle inserting mechanism and the probes are arranged on the carrying disc, the needle inserting mechanism comprises an upper cover, a base and a buckle, the upper cover is rotatably connected with the base, the upper cover can be tightly attached to the base, the base is movably connected with the carrying disc, the base slides linearly relative to the breadth of the carrying disc, the buckle is located near the base, the buckle is movably connected with the carrying disc, and the movable route of the buckle faces the base;
the probe is arranged on the upper cover, the probe is positioned on one surface of the upper cover, which can be overturned and attached to the base, and the orientation of the probe is parallel to the moving route of the base relative to the carrying disc.
2. The flip type two-section push-down acupuncture testing mechanism according to claim 1, characterized in that: and a torsion spring is arranged between the upper cover and the base.
3. The flip type two-section push-down acupuncture testing mechanism according to claim 2, characterized in that: the upper cover and the base are turned over by taking the torsion spring as an axis.
4. The flip type two-section push-down acupuncture testing mechanism according to claim 1, characterized in that: the base is connected with the carrying disc through a positioning guide bolt.
5. The flip type two-segment push-down acupuncture testing mechanism according to claim 4, characterized in that: and vertical movement is formed between the positioning guide bolt and the carrying disc.
6. The flip type two-segment push-down acupuncture testing mechanism according to claim 5, characterized in that: the base is internally provided with a vertical spring, and the telescopic path of the vertical spring is perpendicular to the breadth of the carrying disc.
7. The flip type two-section push-down acupuncture testing mechanism according to claim 1, characterized in that: the buckles are respectively arranged on two sides of the base.
8. The flip type two-section push-down acupuncture testing mechanism according to claim 1, characterized in that: a horizontal spring is arranged in the buckle, and the telescopic path of the horizontal spring is parallel to the breadth of the carrying disc.
9. The flip type two-section push-down acupuncture testing mechanism according to claim 2, characterized in that: the probe is positioned at one end of the upper cover far away from the torsion spring.
10. The flip type two-section push-down acupuncture testing mechanism according to claim 1, characterized in that: the buckle is kept away from the one end of base is provided with the handle.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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CN202120976793.6U CN215179543U (en) | 2021-05-10 | 2021-05-10 | Flip type two-section downward pressing puncture needle testing mechanism |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
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CN202120976793.6U CN215179543U (en) | 2021-05-10 | 2021-05-10 | Flip type two-section downward pressing puncture needle testing mechanism |
Publications (1)
Publication Number | Publication Date |
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CN215179543U true CN215179543U (en) | 2021-12-14 |
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CN202120976793.6U Active CN215179543U (en) | 2021-05-10 | 2021-05-10 | Flip type two-section downward pressing puncture needle testing mechanism |
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CN (1) | CN215179543U (en) |
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2021
- 2021-05-10 CN CN202120976793.6U patent/CN215179543U/en active Active
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