CN214953837U - Electromagnet temperature rise testing device - Google Patents
Electromagnet temperature rise testing device Download PDFInfo
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- CN214953837U CN214953837U CN202120891503.8U CN202120891503U CN214953837U CN 214953837 U CN214953837 U CN 214953837U CN 202120891503 U CN202120891503 U CN 202120891503U CN 214953837 U CN214953837 U CN 214953837U
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Abstract
The utility model discloses an electromagnet temperature rise testing device, which comprises a low resistance tester, a digital power supply, a main control circuit and a display screen; the main control circuit comprises a singlechip, a switching circuit and a switch circuit, wherein the switching circuit and the switch circuit are connected with the singlechip; the single chip microcomputer is electrically connected with the low resistance tester, the digital power supply and the display screen; the digital power supply, the switching circuit, the tested electromagnet and the switch circuit are connected to form a first test loop; the low-resistance tester, the switching circuit and the tested electromagnet are connected to form a second test loop; the switching circuit is controlled by a single chip microcomputer and automatically switches the tested electromagnet to be connected into a first test loop or a second test loop; the switch circuit is controlled by a single chip microcomputer to switch on or off the first test loop. The utility model discloses can accomplish electro-magnet temperature rise test's automation test accurately, high-efficiently, use manpower sparingly, avoid the data that the artificial mistake leads to inaccurate.
Description
Technical Field
The utility model relates to an electro-magnet test equipment technical field especially relates to an electro-magnet temperature rise testing arrangement.
Background
Therefore, when the electromagnet is purchased or used, how the electromagnet generates heat in the using process is an extremely important parameter. If the temperature of the coil is too high in the using process of the electromagnet, the coil of the electromagnet can be burnt, the coil is short-circuited, a circuit board can be burnt, and even an electrical fire and other serious disastrous results can be caused. Therefore, the 'temperature rise' test is firstly required to be carried out on each type of electromagnet before the electromagnet is delivered from a factory.
In the prior art, the traditional manual measurement method is adopted in the temperature rise test of the electromagnet. The initial resistance of the electromagnet needs to be measured firstly, then the electromagnet is put into a test, the test is interrupted after a period of time, the electromagnet is taken out to measure the resistance value of the electromagnet, then the resistance value is recorded on paper, the measured electromagnet is put into the test again, and finally the temperature rise of the electromagnet coil is calculated according to a temperature rise calculation formula of the coil material.
Temperature rise formula: θ ═ R2-R1/R1 (235+ t1) + t1-t2 (K).
In the formula:
r2 — winding resistance at the end of the test, Ω;
r1 — winding resistance at the beginning of the test, Ω;
t 1-winding temperature at the beginning of the test (typically room temperature),. degree.C.;
t 2-Cooling Medium temperature at the end of the test (generally referred to as room temperature),. degree.C;
235 is a copper wire coil and 225 is an aluminum wire coil.
The method for manually testing the temperature rise of the electromagnet has the following defects:
1. need artifical regularly to take out the electro-magnet and measure resistance, unusual trouble and extravagant manual work, efficiency is also very low simultaneously.
2. The temperature rise of the electromagnet needs to be calculated manually through a temperature rise formula, data are recorded manually, and manual errors cannot be avoided when the efficiency is low.
3. In the on-off type test, a 'timed' interruption test is required, which breaks the continuity of the test, and thus the test result is inaccurate.
4. After the electromagnet is taken out, the temperature of the electromagnet actually drops, and the test result is lower.
Therefore, the prior art has yet to be improved.
SUMMERY OF THE UTILITY MODEL
In view of the deficiencies of the prior art, the utility model aims at providing an electro-magnet temperature rise testing arrangement aims at can accurately, accomplish the automatic test of electro-magnet temperature rise test high-efficiently, uses manpower sparingly, avoids the data that artificial mistake leads to inaccurate.
In order to achieve the purpose, the utility model adopts the following technical proposal:
the utility model provides an electro-magnet temperature rise testing arrangement for insert and carry out the temperature rise test behind the electro-magnet that is surveyed, wherein, include:
the device comprises a low-resistance tester, a digital power supply, a main control circuit and a display screen;
the main control circuit comprises a singlechip, a switching circuit and a switch circuit, wherein the switching circuit and the switch circuit are connected with the singlechip;
the single chip microcomputer is electrically connected with the low resistance tester, the digital power supply and the display screen;
the digital power supply, the switching circuit, the tested electromagnet and the switch circuit are connected to form a first test loop;
the low-resistance tester, the switching circuit and the tested electromagnet are connected to form a second test loop;
the switching circuit is controlled by a single chip microcomputer and automatically switches the tested electromagnet to be connected into a first test loop or a second test loop;
the switch circuit is controlled by a single chip microcomputer to switch on or off the first test loop.
The single chip microcomputer is STM32F103 in model.
The switching circuit comprises a switching triode Q6, a double-pole relay coil, a double-pole relay contact mechanically connected with the double-pole relay coil, a first loop contact connected to a first test loop and a second loop contact connected to a second test loop;
the collector of the Q6 is connected with the singlechip, the emitter is connected with the double-pole relay coil, the base is grounded, the singlechip controls the on-off of the Q6 so as to control the power on and off of the double-pole relay coil, and the contact of the double-pole relay is connected with a detected electromagnet;
and the double-pole relay coil enables the double-pole relay contact to be connected with the first loop contact or the second loop contact under the power-on or power-off state, so that the tested electromagnet is connected into the first test loop or the second test loop.
And a backflow prevention diode D12 is also connected between the emitter of the Q6 and the double-pole relay coil.
The switching circuit comprises a MOS transistor Q8, a voltage division resistor R37 and a voltage division resistor R39;
the digital power supply is provided with a power supply anode and a power supply cathode which are connected into the first test loop;
one end of the R37 receives a control signal from the singlechip, the other end of the R37 is connected with the grids of the R39 and the Q8, and the other end of the R39 is connected with the source of the Q8 and is grounded;
the drain electrode of the Q8 is connected with the positive electrode of the power supply of the digital power supply through the detected electromagnet, and the source electrode of the Q8 is connected with the negative electrode of the power supply of the digital power supply.
The master control circuit further comprises an optocoupler U3 and a switch tube Q3, the input end of the optocoupler U3 is connected with the single chip microcomputer, the output end of the optocoupler U3 is connected with the collector of the Q3, and the base of the Q3 is connected with the R37 of the switch circuit to control the on and off of the Q8.
The master control circuit also comprises a first serial port communication circuit, a second serial port communication circuit, a third serial port communication circuit and a fourth serial port communication circuit which are connected with the single chip microcomputer respectively;
the first serial port communication circuit comprises a first communication chip connected with the single chip microcomputer and a first serial port connected with the first communication chip, and the first serial port is connected with a digital power supply;
the second serial port communication circuit comprises a second communication chip connected with the single chip microcomputer and a second serial port connected with the second communication chip, and the second serial port is connected with the low-resistance tester;
the third serial port communication circuit comprises a third communication chip connected with the single chip microcomputer and a third serial port connected with the third communication chip, and the third serial port is connected with the display screen;
the fourth serial port communication circuit comprises a fourth communication chip connected with the single chip microcomputer and a fourth serial port connected with the fourth communication chip, and the fourth serial port is connected with the computer.
The first communication chip, the second communication chip and the fourth communication chip are MAX3232 in model, and the third communication chip is MAX485 in model.
The main control circuit further comprises a data storage circuit connected with the single chip microcomputer.
The main control circuit further comprises a power supply circuit for providing stable voltage.
The utility model discloses an electro-magnet temperature rise testing arrangement, through with digital power supply, switching circuit, by survey electromagnet, switch circuit connects into first test loop, with the low resistance tester, switching circuit, by survey electromagnet connect into second test loop, switching circuit will be surveyed electromagnet automatic switch-over and insert first test loop or second test loop, and switch circuit switches on first test loop or turn-offs, is carrying out the electro-magnet temperature rise test like this, the utility model discloses a testing arrangement can use first test loop to carry out on-off control, and it is after first test loop disconnection, can automatic switch to second test loop and carry out the measurement of resistance, need not artifical the switching, need not artifical the measurement, and measured data can be by the singlechip automatic calculation in the testing arrangement, has guaranteed the accuracy of result calculation. The utility model discloses a testing arrangement can automize and accomplish the temperature rise test of electro-magnet, uses manpower sparingly, has improved efficiency of software testing.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings needed to be used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to the structures shown in the drawings without creative efforts.
Fig. 1 is a schematic circuit diagram of a first embodiment of the temperature rise testing device of the electromagnet of the present invention;
FIG. 2 is a schematic diagram of the circuit connection of the single chip microcomputer of the present invention;
fig. 3 is a schematic circuit connection diagram of the first test loop and the second test loop of the present invention;
fig. 4 is a schematic diagram of the circuit connection of the optocoupler of the present invention;
fig. 5 is a schematic diagram of a first serial port communication circuit connection according to the present invention;
fig. 6 is a schematic diagram of a second serial port communication circuit connection according to the present invention;
fig. 7 is a schematic diagram of the third serial port communication circuit connection of the present invention;
fig. 8 is a schematic diagram of a fourth serial port communication circuit connection according to the present invention;
FIG. 9 is a schematic diagram of the data storage circuit connection according to the present invention;
fig. 10 is a schematic diagram of a first power circuit connection according to the present invention;
fig. 11 is a schematic diagram of a second power circuit connection according to the present invention.
Description of reference numerals:
100-testing device, 10-low resistance tester, 20-digital power supply, 30-main control circuit, 31-single chip, 32-switching circuit, 321-double pole relay coil, 322-double pole relay contact, 323-first loop contact, 324-second loop contact, 33-switching circuit, 34-first serial port communication circuit, 341-first communication chip, 342-first serial port, 35-second serial port communication circuit, 351-second communication chip, 352-second serial port, 36-third serial port communication circuit, 361-third communication chip, 362-third serial port, 37-fourth serial port communication circuit, 371-fourth communication chip, 372-fourth serial port, 38-data storage circuit, 39-power supply circuit, 39 a-a first power supply circuit, 39 b-a second power supply circuit, 40-a display screen, 50-a computer, 200-a measured electromagnet.
Detailed Description
The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative efforts belong to the protection scope of the present invention.
It should be noted that all the directional indicators (such as upper, lower, left, right, front and rear … …) in the embodiment of the present invention are only used to explain the relative position relationship between the components, the motion situation, etc. in a specific posture (as shown in the drawings), and if the specific posture is changed, the directional indicator is changed accordingly.
In the present application, unless expressly stated or limited otherwise, the terms "connected" and "fixed" are to be construed broadly, e.g., "connected" may be a fixed connection or a removable connection, or may be integral therewith; can be mechanically or electrically connected; they may be directly connected or indirectly connected through intervening media, or they may be connected internally or in any other suitable relationship, unless expressly stated otherwise. The specific meaning of the above terms in the present invention can be understood according to specific situations by those skilled in the art.
In addition, descriptions in the present application as to "first", "second", and the like are for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicit to the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include at least one such feature.
Referring to fig. 1, the present invention provides an electromagnet temperature rise testing apparatus 100 for performing electromagnet temperature rise test after accessing a tested electromagnet 200, the apparatus 100 includes:
A digital power supply 20 provides power to the electromagnets. Meanwhile, when the electromagnet is used for a continuous temperature rise test, the electromagnet does not need to be powered off and the resistance of the electromagnet is not temporarily removed in the test process. The digital power supply 20 provides the current voltage value and the actual current value at a certain moment to the single chip microcomputer through the serial port, and then the single chip microcomputer can calculate the resistance value of the electromagnet through the ohm law. And then the single chip microcomputer can calculate the temperature rise value of the electromagnet coil through a temperature rise formula. It is not necessary to interrupt the power supply in order to obtain a resistance value at an intermediate point in time as in the prior art. That is the utility model discloses digital power supply 20's setting makes the utility model discloses just no longer need in the experiment in the continuous circular telegram temperature rise test process, for the resistance of test electro-magnet and many times the interrupt test, avoided causing the influence to the result of experiment because of the interrupt power supply, guaranteed experimental accuracy.
The utility model discloses a display screen 40 can adopt the touch-control display screen, can understand, if the utility model discloses a display screen 40 is ordinary display screen, then the utility model discloses a testing arrangement 100 still needs to dispose input device like keyboard, mouse etc.
The display screen 40 is used for displaying various parameters such as voltage, current and temperature rise test results.
The utility model discloses a master control circuit 30 includes singlechip 31, switching circuit 32 and switch circuit 33 who is connected with singlechip 31.
The single chip microcomputer 31 is electrically connected with the low resistance tester 10, the digital power supply 20 and the display screen 40 for data transmission.
As shown in fig. 1, the digital power supply 20, the switching circuit 32, the measured electromagnet 200, and the switching circuit 33 of the present invention are connected to form a first test loop. The low resistance tester 10, the switching circuit 32 and the tested electromagnet 200 are connected to form a second test loop.
Different test requirements can be completed when the tested electromagnet 200 is connected to the first test loop or the second test loop, the first test loop can supply power to the tested electromagnet 200 due to the digital power supply 20, the output voltage and the current of the digital power supply 200 can be obtained at any time point in the power-on process, the resistance value of the tested electromagnet 200 can be obtained, the resistance value of the electromagnet can be measured under the condition of no power failure, and the requirement of a continuous power-on test can be met. The second test loop is provided with the low resistance tester 10, so that the second test loop can be used for measuring the resistance of the tested electromagnet 200 immediately after the electromagnet 200 is powered off during the on-off test.
The switching circuit 32 is controlled by the singlechip 31 and automatically switches the tested electromagnet 200 into a first test loop or a second test loop; the switch circuit 33 is controlled by the single chip 31 to switch on or off the first test loop.
The utility model discloses the switching of first test loop or second test loop is realized by singlechip 31 control switching circuit 32 is automatic, and switch circuit 33 then realizes the on-off control of first test loop in order to satisfy the experimental demand of break-make.
The utility model discloses testing arrangement 100's singlechip 31 accomplishes following function:
1. and reading the resistance signal of the magnet 200 to be tested sent by the low resistance tester 10.
2. The voltage value and the current value transmitted by the digital power supply 20 are read.
3. Controls the turning on and off of the power supply output of the digital power supply 20, and the setting operation of the voltage and current of the digital power supply 20.
4. And when the electromagnet needs to be electrified, the electromagnet is switched to the first test loop to be electrified.
5. The test data can be sent to the upper computer program through the serial port, and the data and the commands sent by the upper computer program are received and processed.
6. And sending the tested data and the calculated result to the display screen 40 for display, and receiving user input data and commands transmitted by the touch screen when the display screen is the touch screen.
7. And storing the parameters set this time for restoring the previous set data when starting up the computer next time.
The utility model discloses an electro-magnet temperature rise testing arrangement 100 can automize and accomplish the temperature rise test of electro-magnet, uses manpower sparingly, has improved efficiency of software testing, need not artifical the switching, need not artifical the measurement, and measured data can be by the singlechip 21 automatic calculation in the testing arrangement, has guaranteed the accuracy that the result calculated.
Preferably, as shown in fig. 2, the single chip microcomputer 31 of the present invention is model STM32F 103.
Because the control is more complicated and the number of serial ports needs to be more, the embodiment of the utility model selects a 32-bit advanced single chip microcomputer STM32F103 as a main processor. The device is provided with five serial ports, and can meet the requirement of multiple serial ports. The peripheral circuit of the STM32F103 comprises a standard 8M crystal oscillator, a standard JTAG program programming interface and the like, and is used as a minimum system circuit of a single chip microcomputer.
Specifically, as shown in fig. 3, the switching circuit 32 of the present invention comprises a switching transistor Q6, a double-pole relay coil 321, a double-pole relay contact 322 mechanically connected to the double-pole relay coil 321, a first loop contact 323 connected to the first test loop, and a second loop contact 324 connected to the second test loop.
Collector C of Q6 connects singlechip 31, and projecting pole E connects the double pole relay coil, and base B ground connection, thereby the singlechip 31 control Q6's break-make control double pole relay coil 321 gains the electricity and loses the electricity, and double pole relay contact 322 is connected with surveyed electromagnet 200.
The double pole relay coil 321 makes the double pole relay contact 322 connect with the first loop contact 323 or connect with the second loop contact 324 in the power-on or power-off state, so as to connect the measured electromagnet 200 into the first test loop or the second test loop.
The embodiment of the utility model provides an in, Q6's collecting electrode C is connected to singlechip 31's Pb8 pin through current-limiting resistor R6, and singlechip 31 controls the break-make that Q6 was controlled to Pb 8's output level, and when Q6 switched on, double pole relay coil 321 got electric, then action takes place for double pole relay contact 322, and when Q6 broke off, double pole relay coil 321 lost electricity, then action takes place for double pole relay contact 322. It can be understood that, as a mode, when the double-pole relay coil 321 of the present invention is powered on, the double-pole relay contact 322 is connected with the first loop contact 323 to connect the measured electromagnet 200 into the first test loop; when the double pole relay coil 321 loses power, the double pole relay contact 322 is connected with the second loop contact 324 to connect the measured electromagnet 200 into the second test loop.
Furthermore, the anti-backflow diode D12 is connected between the emitter E of the Q6 and the double-pole relay coil 321. The anti-reflux diode D12 prevents the double pole relay coil 321 from flowing backward into the Q6 and damaging the Q6.
As shown in fig. 3, the switching circuit 33 of the present invention includes a MOS transistor Q8, and voltage dividing resistors R37 and R39.
The digital power supply 20 is provided with a power supply anode and a power supply cathode which are connected to the first test loop.
One end of the R37 receives a control signal from the singlechip 21, the other end is connected with the grids of the R39 and the Q8, the other end of the R39 is connected with the source of the Q8 and is grounded, the drain of the Q8 is connected with the positive electrode of the power supply of the digital power supply 20 through the detected electromagnet 200, and the source of the Q8 is connected with the negative electrode of the power supply of the digital power supply 20.
The utility model discloses regard as a switch tube with MOS pipe Q8, can adapt to the switch break-make of high frequency experimental, if say an circular telegram millisecond, then a circular telegram millisecond, the relay contact can not reach this function, and the MOS pipe then can satisfy the demand.
As a specific embodiment:
when the double-pole relay coil 321 is electrified, the double-pole relay contact 322 is driven to act and then is connected with the first loop contact 323, the tested electromagnet 200 is connected to the first test loop, at the moment, current flows out from the positive electrode of the power supply of the digital power supply 20, flows into the tested electromagnet 200 and then flows into the D electrode of the Q8, the G electrode of the Q8 is conducted after a conducting signal sent by the single chip microcomputer from the P2x is obtained, and the current flows out from the S electrode of the Q8 and enters the negative electrode of the power supply of the digital power supply 20 to complete the current flow of the whole first test loop;
when the double-pole relay coil 321 loses power, the double-pole relay contact 322 is driven to act and then is connected with the second loop contact 324, the tested electromagnet 200 is connected to the second test loop, at the moment, the current flows out of the positive pole of the low-resistance tester 10, flows into the tested electromagnet 200 and then flows back to the negative pole of the low-resistance tester 10, and the current flowing of the whole second test loop is completed.
Preferably, as shown in fig. 4, the main control circuit 30 of the present invention further includes an optocoupler U3 and a switch tube Q3, the input end of the optocoupler U3 is connected to the single chip microcomputer 31, the output end is connected to the collector C of Q3, and the base B of Q3 is connected to the R37 of the switch circuit 33 to control the on and off of Q8. In the figure, an emitter E of a Q3 is connected with a power supply, and Q1 and Q5 are standby switch tubes and can simultaneously control the on-off of 3 paths of driving signals. The optocoupler U3 adopts TLP521-4, which plays a role in isolating the singlechip 31 from the MOS tube Q8 and the measured electromagnet 200, so as to protect the singlechip 31.
Please continue to refer to fig. 1, the main control circuit 30 of the present invention further includes a first serial communication circuit 34, a second serial communication circuit 35, a third serial communication circuit 36 and a fourth serial communication circuit 37 connected to the single chip microcomputer 31, respectively.
Specifically, as shown in fig. 5, the first serial port communication circuit 34 includes a first communication chip 341 connected to the single chip microcomputer 31 and a first serial port 342 connected to the first communication chip 341, and the first serial port 342 is connected to the digital power supply 20.
The first communication chip 341 adopts a MAX3232 chip, and since the control interface of the digital power supply 20 is an RS232 communication interface, the MAX3232 chip is required to convert an RS232 signal into a TTL signal of the single chip microcomputer STM 32.
As shown in fig. 6, the second serial port communication circuit 35 includes a second communication chip 351 connected to the single chip microcomputer 31 and a second serial port 352 connected to the second communication chip 351, and the second serial port 352 is connected to the low resistance tester 10.
As shown in fig. 7, the third serial port communication circuit 36 of the present invention includes a third communication chip 361 connected to the single chip 31 and a third serial port 362 connected to the third communication chip 361, wherein the third serial port 362 is connected to the display screen 40.
The embodiment of the utility model provides a RS485 interface touch-sensitive screen has been chooseed for use, so third communication chip 361 uses the MAX485 chip to carry out the conversion of level.
The data obtained by the test of the single chip 31 of the utility model, such as the number of times of action, the current resistance, the current temperature rise, etc., can be displayed on the touch screen.
As shown in fig. 8, the fourth serial port communication circuit 37 of the present invention includes a fourth communication chip 371 connected to the single chip 31 and a fourth serial port 372 connected to the fourth communication chip 371, wherein the fourth serial port 372 is connected to the computer 50. The fourth communication chip 371 also employs a MAX3232 chip.
The utility model discloses a testing arrangement 100 connects computer 50's effect is, and computer 50 is responsible for opening "temperature rise test program", then receives the various data that singlechip 31 serial port sent and come through the computer serial port, and every received a data, the computer program all can show it on the screen of computer to in the file name according to the user setting saves corresponding file to test data. At any moment, if the operator needs the tested data, the operator only needs to open the file, and manual timing intervention is not needed. Thus requiring little operator intervention throughout the test. The work efficiency is improved and the labor force is liberated.
Further, as shown in fig. 9, the main control circuit 30 of the testing device 100 of the present invention further includes a data storage circuit 38 connected to the single chip 31. In the embodiment of the present invention, the data storage circuit 38 employs the chip 24C 02.
In the embodiment, the IIC chip 24C02 is used for storing some parameter data in the setting process of the single chip microcomputer 31, so that the loss of the setting parameters is prevented, the previously set parameters can be called quickly after the single chip microcomputer is started, repeated operation is avoided, and the efficiency is improved.
Preferably, the main control circuit 30 of the testing device 100 of the present invention further includes a power circuit 39 for providing a stable voltage. Specifically, as described in fig. 10 and 11, the power supply circuit 39 includes a first power supply circuit 39a and a second power supply circuit 39 b.
The first power circuit 39a provides positive and negative 16V and positive and negative 12V regulated power for various interfaces after rectification and filtering.
The second power circuit 39b should perform voltage reduction processing and finally provide a 3.3V regulated power supply to supply power to the chips such as the single chip 31.
The electromagnet temperature rise testing device 100 provided by the embodiment of the utility model connects the digital power supply 20, the switching circuit 32, the tested electromagnet 200 and the switch circuit 33 into a first testing loop, connects the low resistance tester 10, the switching circuit 32 and the tested electromagnet 200 into a second testing loop, the switching circuit 32 automatically switches the tested electromagnet 200 into the first testing loop or the second testing loop, the switch circuit 33 switches on or off the first testing loop, thus, when the temperature rise test of the electromagnet is carried out, the testing device 100 of the utility model can use the first testing loop to carry out on-off control, after the first test loop is disconnected, the resistance can be automatically switched to the second test loop to measure the resistance without manual switching or manual measurement, and the measured data can be automatically calculated by the singlechip 31 in the testing device 100, so that the accuracy of result calculation is ensured. The utility model discloses a testing arrangement 100 can automize and accomplish the temperature rise test of electro-magnet, uses manpower sparingly, has improved efficiency of software testing.
The above only for the purpose of clearly illustrating the examples of the present invention, not limiting the scope of the present invention, can't be exhausted to all the embodiments, all the concepts of the present invention, utilize the equivalent structure transformation of the content of the technical solution of the present invention, or directly/indirectly use in other related technical fields and are all included in the protection scope of the present invention.
Claims (10)
1. The utility model provides an electro-magnet temperature rise testing arrangement for insert and carry out the temperature rise test behind the electro-magnet that is surveyed, its characterized in that includes:
the device comprises a low-resistance tester, a digital power supply, a main control circuit and a display screen;
the main control circuit comprises a singlechip, a switching circuit and a switch circuit, wherein the switching circuit and the switch circuit are connected with the singlechip;
the single chip microcomputer is electrically connected with the low resistance tester, the digital power supply and the display screen;
the digital power supply, the switching circuit, the tested electromagnet and the switch circuit are connected to form a first test loop;
the low-resistance tester, the switching circuit and the tested electromagnet are connected to form a second test loop;
the switching circuit is controlled by a single chip microcomputer and automatically switches the tested electromagnet to be connected into a first test loop or a second test loop;
the switch circuit is controlled by a single chip microcomputer to switch on or off the first test loop.
2. The electromagnet temperature rise test device of claim 1, wherein the single chip microcomputer is STM32F 103.
3. The electromagnet temperature rise test device according to claim 1, wherein the switching circuit comprises a switching transistor Q6, a double pole relay coil, a double pole relay contact mechanically connected to the double pole relay coil, a first loop contact connected to a first test loop, a second loop contact connected to a second test loop;
the collector of the Q6 is connected with the singlechip, the emitter is connected with the double-pole relay coil, the base is grounded, the singlechip controls the on-off of the Q6 so as to control the power on and off of the double-pole relay coil, and the contact of the double-pole relay is connected with a detected electromagnet;
and the double-pole relay coil enables the double-pole relay contact to be connected with the first loop contact or the second loop contact under the power-on or power-off state, so that the tested electromagnet is connected into the first test loop or the second test loop.
4. The electromagnet temperature rise test device according to claim 3, wherein a backflow prevention diode D12 is further connected between the emitting electrode of the Q6 and the double-pole relay coil.
5. The electromagnet temperature rise test device according to claim 1, wherein the switch circuit comprises a MOS transistor Q8, a voltage dividing resistor R37 and R39;
the digital power supply is provided with a power supply anode and a power supply cathode which are connected into the first test loop;
one end of the R37 receives a control signal from the singlechip, the other end of the R37 is connected with the grids of the R39 and the Q8, and the other end of the R39 is connected with the source of the Q8 and is grounded;
the drain electrode of the Q8 is connected with the positive electrode of the power supply of the digital power supply through the detected electromagnet, and the source electrode of the Q8 is connected with the negative electrode of the power supply of the digital power supply.
6. The electromagnet temperature rise testing device of claim 5, wherein the master control circuit further comprises an optocoupler U3 and a switch tube Q3, an input end of the optocoupler U3 is connected with the single chip microcomputer, an output end of the optocoupler U3 is connected with a collector of the Q3, and a base of the Q3 is connected with the R37 of the switch circuit to control on and off of the Q8.
7. The electromagnet temperature rise testing device according to claim 1, wherein the master control circuit further comprises a first serial port communication circuit, a second serial port communication circuit, a third serial port communication circuit and a fourth serial port communication circuit which are connected with the single chip microcomputer respectively;
the first serial port communication circuit comprises a first communication chip connected with the single chip microcomputer and a first serial port connected with the first communication chip, and the first serial port is connected with a digital power supply;
the second serial port communication circuit comprises a second communication chip connected with the single chip microcomputer and a second serial port connected with the second communication chip, and the second serial port is connected with the low-resistance tester;
the third serial port communication circuit comprises a third communication chip connected with the single chip microcomputer and a third serial port connected with the third communication chip, and the third serial port is connected with the display screen;
the fourth serial port communication circuit comprises a fourth communication chip connected with the single chip microcomputer and a fourth serial port connected with the fourth communication chip, and the fourth serial port is connected with the computer.
8. The electromagnet temperature rise test device of claim 7, wherein the type of the first communication chip, the type of the second communication chip and the type of the fourth communication chip are MAX3232, and the type of the third communication chip is MAX 485.
9. The electromagnet temperature rise testing device of claim 1, wherein the master control circuit further comprises a data storage circuit connected with the single chip microcomputer.
10. The electromagnet temperature rise test device of claim 1, wherein the master control circuit further comprises a power circuit for providing a regulated voltage.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
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