CN214794923U

CN214794923U - Backlight full-detection low-current testing device

Info

Publication number: CN214794923U
Application number: CN202121140734.1U
Authority: CN
Inventors: 金程; 潘连兴
Original assignee: Wanzai Antarctic Optoelectronics Technology Co ltd
Current assignee: Wanzai Antarctic Optoelectronics Technology Co ltd
Priority date: 2021-05-26
Filing date: 2021-05-26
Publication date: 2021-11-19
Anticipated expiration: 2031-05-26

Abstract

The utility model relates to a backlight technical field just discloses a low current testing arrangement is examined entirely to backlight, including the base, the top of base is provided with the connecting block, the standing groove has been seted up at the top of base, and the inside shifting chute of two intercommunication standing grooves has been seted up to the inside of base, and the shifting chute is horizontal Contraband font, and the inside of two shifting chutes is provided with the same structure, and the inside rotation groove of intercommunication shifting chute has been seted up to the inside of base. This low current testing arrangement is examined entirely to backlight, through the spring reset make two support frames drive two clamp plates and carry out the removal of being close to relatively to press from both sides tight fixedly to the backlight, make that the staff can be more convenient test multiple size backlight, prevent simultaneously to a certain extent that the staff from touching the backlight carelessly when testing the backlight after golden finger is fixed, make the backlight remove, and then the golden finger of messenger's backlight appears the condition of damage.

Description

Backlight full-detection low-current testing device

Technical Field

The utility model relates to a backlight technical field specifically is a low current testing arrangement is examined entirely to backlight.

Background

In a conventional backlight source, both the front and the back of the FPC golden finger can be conductive, during backlight test, voltage and current in a power supply in the jig can flow from the jig to the backlight source to light the backlight source, and in some special backlight sources, the front of the golden finger can be conductive, the back of the golden finger is insulated, and a common backlight test jig cannot light the backlight source during test, so that the jig capable of lighting the backlight source with the front conductive and the back insulated golden finger needs to be provided.

According to the above problems, the patent publication: CN210072250U, opened a test fixture in a poor light, including the base and can with the cope match-plate pattern of base pressfitting, the base includes the working face that is used for placing the piece that awaits measuring, has solved golden finger front electrically conductive, the back is insulating and can't lighten the problem of backlight, but this scheme still can appear following problem at the in-process that uses: some staff are when testing the backlight of unidimensional not, need carry out certain fixed by the light source, and then make the golden finger can be more convenient insert the connecting piece in, but because the surface that the backlight source was received is comparatively smooth, when staff tests the backlight after the golden finger is fixed, or when fixing the golden finger, if touch the backlight carelessly, make the backlight appear removing, and then the condition of damage appears in the golden finger and the backlight board that easily make the backlight, and then make the staff be difficult for testing the backlight of unidimensional not.

SUMMERY OF THE UTILITY MODEL

Technical problem to be solved

The utility model provides a be not enough to prior art, the utility model provides a low current testing arrangement is examined entirely to backlight possesses that the staff can make things convenient for advantage such as test not unidimensional backlight more, has solved the difficult problem of testing not unidimensional backlight of staff.

(II) technical scheme

In order to achieve the above object, the utility model provides a following technical scheme: a backlight full-detection low-current testing device comprises a base, a connecting block is arranged at the top of the base, the standing groove has been seted up at the top of base, the inside shifting chute of two intercommunication standing grooves has been seted up to the inside of base, the shifting chute is horizontal Contraband font, the inside of two shifting chutes is provided with the same structure, the inside rotation groove of intercommunication shifting chute has been seted up to the inside of base, the inside sliding connection of shifting chute rear side transverse groove has the support frame, the support frame is horizontal T font, first spacing groove with support frame longitudinal plate surface sliding connection has all been seted up to both sides around the inside of shifting chute rear side transverse groove, the inner wall fixedly connected with spring of first spacing groove, the right-hand member of spring and the left side fixed connection of support frame longitudinal plate, the right-hand member fixedly connected with of support frame transverse plate and the inside sliding connection's of standing groove clamp plate, be provided with power frame clamping mechanism on the base.

Preferably, the bottom of the transverse plate of the support frame is provided with a rolling ball movably connected with the inside of the moving groove.

Preferably, the right side of the clamping plate is fixedly connected with a rubber layer, and the right side of the rubber layer is provided with a small bump.

Preferably, power frame clamping mechanism is including rotating the post, rotates the surface of post and is connected with the inside rotation of base, rotates the bottom of post and runs through the inside of base and extend to the inside of rotating the groove, rotates the bottom fixedly connected with of post and rotates the collection post that inslot wall rotates to be connected, collects the surface of post and has seted up the second spacing groove, two wire rope of inner wall fixedly connected with of second spacing groove, the left side fixed connection of the one end of second spacing groove and the vertical board of support frame is kept away from to steel wire rope.

Preferably, the wire ropes are located on the same position of the inner wall of the second limiting groove, and the two steel wire ropes are respectively arranged in the two moving grooves.

Preferably, the inner part of the longitudinal groove of the moving groove is rotatably connected with two mirror-image driving wheels, and the surfaces of the driving wheels are provided with driving grooves in transmission connection with the surfaces of the steel wire ropes.

(III) advantageous effects

Compared with the prior art, the utility model provides a low current testing arrangement is examined entirely to backlight possesses following beneficial effect:

1. this low current testing arrangement is examined entirely to backlight, through the spring reset make two support frames drive two clamp plates and carry out the removal of being close to relatively to press from both sides tight fixedly to the backlight, make that the staff can be more convenient test multiple size backlight, prevent simultaneously to a certain extent that the staff from touching the backlight carelessly when testing the backlight after golden finger is fixed, make the backlight remove, and then the golden finger of messenger's backlight appears the condition of damage.

2. This low current testing arrangement is examined entirely to backlight through the cooperation of drive wheel with the driving groove, makes the inside at the shifting chute that wire rope can be more smooth move, makes wire rope's shift position receive the restriction simultaneously through the driving groove, makes wire rope drive support frame that can be more smooth move, reduces wire rope and the skew appears when carrying out the transmission to a certain extent, makes the dead condition of card appear in the device.

3. This low current testing arrangement is examined entirely to backlight can protect the frame of backlight through the rubber layer, prevents to a certain extent that the clamp plate from pressing from both sides when pressing from both sides the frame of backlight, makes the frame of backlight the condition of damage appear, simultaneously through the little lug that the rubber layer right side set up, makes the frictional force between rubber layer and the backlight frame obtain increasing, makes the clamp plate can be more stable press from both sides tightly fixedly to the frame of backlight, makes the backlight can be more smooth test.

Drawings

Fig. 1 is a schematic structural view of a backlight full-inspection low-current testing device of the present invention;

FIG. 2 is a schematic cross-sectional view of the base of the present invention;

fig. 3 is a schematic view of the front plan structure of the support frame of the present invention.

In the figure: the device comprises a base 1, a connecting block 2, a placing groove 3, a supporting frame 4, a clamping plate 5, a rubber layer 6, a rotating column 7, a spring 8, a first limiting groove 9, a moving groove 10, a driving wheel 11, a transmission groove 12, a steel wire rope 13, a rotating groove 14, a second limiting groove 15, a collecting column 16 and a rolling ball 17.

Detailed Description

The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative work belong to the protection scope of the present invention.

Referring to fig. 1-3, the present invention provides a technical solution: a backlight full-inspection low-current testing device comprises a base 1, wherein a connecting block 2 is arranged at the top of the base 1, the connecting block 2 is an existing structure and is not described in detail herein, a placing groove 3 is formed at the top of the base 1, two moving grooves 10 communicated with the inside of the placing groove 3 are formed in the base 1, the moving grooves 10 are in a transverse Contraband shape, the same structure is arranged in the two moving grooves 10, a rotating groove 14 communicated with the inside of the moving groove 10 is formed in the base 1, a supporting frame 4 is connected to the inside of the transverse groove at the rear side of the moving groove 10 in a sliding manner, the supporting frame 4 is in a transverse T shape, a first limiting groove 9 connected with the surface of a longitudinal plate of the supporting frame 4 in a sliding manner is formed in each of the front side and the rear side of the transverse groove at the rear side of the moving groove 10, a spring 8 is fixedly connected to the inner wall of the first limiting groove 9, and the right end of the spring 8 is fixedly connected with the left side of the longitudinal plate of the supporting frame 4, the spring 8 can be compressed and reset by moving the support frame 4 left and right, the rolling ball 17 movably connected with the inside of the moving groove 10 is arranged at the bottom of the transverse plate of the support frame 4, the rolling ball 17 can roll between the support frame 4 and the moving groove 10, the right end of the transverse plate of the support frame 4 is fixedly connected with the clamping plate 5 in sliding connection with the inside of the placing groove 3, the right side of the clamping plate 5 is fixedly connected with the rubber layer 6, the right side of the rubber layer 6 is provided with the small lug, the frame of the backlight source can be clamped and fixed by the two clamping plates 5, and can be protected by the rubber layer 6, so that the frame of the backlight source is prevented from being damaged to a certain extent when the clamping plate 5 clamps the frame of the backlight source, and meanwhile, the friction between the rubber layer 6 and the frame of the backlight source is increased by the small lug arranged at the right side of the rubber layer 6, the clamping plate 5 can clamp and fix the frame of the backlight source more stably, so that the backlight source can be tested more smoothly, and the base 1 is provided with a power frame clamping mechanism;

the power frame clamping mechanism comprises a rotating column 7, the surface of the rotating column 7 is rotatably connected with the inside of a base 1, the bottom end of the rotating column 7 penetrates through the inside of the base 1 and extends to the inside of a rotating groove 14, the bottom end of the rotating column 7 is fixedly connected with a collecting column 16 rotatably connected with the inner wall of the rotating groove 14, a second limiting groove 15 is formed in the surface of the collecting column 16, two steel wire ropes 13 are fixedly connected with the inner wall of the second limiting groove 15, the steel wire ropes 13 are positioned at the same position of the inner wall of the second limiting groove 15, the two steel wire ropes 13 are respectively arranged inside two moving grooves 10, one end, far away from the second limiting groove 15, of each steel wire rope 13 is fixedly connected with the left side of a longitudinal plate of a support frame 4, two mirror-image driving wheels 11 are rotatably connected inside the longitudinal grooves 10, and a transmission groove 12 in transmission connection with the surface of each steel wire rope 13 is formed in the surface of each driving wheel 11;

the rotating column 7 is rotated clockwise, the collecting column 16 drives the two steel wire ropes 13 to rotate clockwise, the steel wire ropes are wound inside the second limiting groove 15 and drive the two support frames 4 to move away from each other, the springs 8 are compressed, the two clamping plates 5 are further moved away from each other, meanwhile, the steel wire ropes 13 can move more smoothly inside the moving groove 10 through the matching of the driving wheels 11 and the transmission grooves 12, meanwhile, the moving positions of the steel wire ropes 13 are limited through the transmission grooves 12, the steel wire ropes 13 can drive the support frames 4 to move more smoothly, the deviation of the steel wire ropes 13 during transmission is reduced to a certain extent, and the device is blocked;

the moving position of the support frame 4 is limited through the first limiting groove 9, so that the support frame 4 can transmit more smoothly, meanwhile, the friction force between the support frame 4 and the moving groove 10 is reduced through the rolling ball 17, the support frame 4 can move more smoothly in the moving groove 10, and the situation that the support frame 4 is offset and clamped during moving is prevented to a certain extent;

place the backlight between two clamp plates 5, loosen and rotate post 7, spring 8 resets and makes two support frames 4 drive two clamp plates 5 and carry out the relative approach and remove, and press from both sides tight fixedly to the backlight, make that the staff can be more convenient test multiple size backlight, prevent simultaneously to a certain extent that the staff is when testing not unidimensional backlight, because the gliding condition appears at the top of base 1 in the backlight, make the staff be difficult for inserting the inside condition of testing of carrying out of connecting block 2 with the golden finger of backlight appear, prevent simultaneously to a certain extent that the staff from testing the backlight after the golden finger is fixed, touch the backlight carelessly, make the backlight appear removing, and then the golden finger of messenger's backlight appears the condition of damage.

The working principle is as follows:

this low current testing arrangement is examined entirely to backlight is when using, rotate post 7 through making and carry out clockwise rotation, and then make collection post 16 drive two wire rope 13 and carry out clockwise rotation, the winding is in the inside of second spacing groove 15, and drive two support frames 4 and keep away from the removal relatively, spring 8 compresses, and then make two clamp plate 5 keep away from the removal relatively, simultaneously through the cooperation of drive wheel 11 with transmission groove 12, make wire rope 13 can move in the inside of shifting chute 10 more smoothly, place the backlight between two clamp plate 5, loosen and rotate post 7, spring 8 resets and makes two support frames 4 drive two clamp plate 5 and carry out the removal of being close to relatively, and press from both sides tightly fixedly to the backlight.

Although embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that changes, modifications, substitutions and alterations can be made in these embodiments without departing from the principles and spirit of the invention, the scope of which is defined in the appended claims and their equivalents.

Claims

1. The utility model provides a low current testing arrangement is examined entirely to backlight, includes base (1), and the top of base (1) is provided with connecting block (2), its characterized in that: the top of the base (1) is provided with a placing groove (3), the inside of the base (1) is provided with two moving grooves (10) communicated with the inside of the placing groove (3), the moving grooves (10) are in a transverse Contraband shape, the insides of the two moving grooves (10) are provided with the same structure, the inside of the base (1) is provided with a rotating groove (14) communicated with the inside of the moving groove (10), the inside of the rear side transverse groove of the moving groove (10) is slidably connected with a support frame (4), the support frame (4) is in a transverse T shape, the front side and the rear side of the inside of the rear side transverse groove of the moving groove (10) are both provided with first limit grooves (9) slidably connected with the surface of a longitudinal plate of the support frame (4), the inner wall of the first limit grooves (9) is fixedly connected with springs (8), the right ends of the springs (8) are fixedly connected with the left side of the longitudinal plate of the support frame (4), the right ends of the transverse plate of the support frame (4) are fixedly connected with clamping plates (5) slidably connected with the inside of the placing groove (3), the base (1) is provided with a power frame clamping mechanism.

2. The backlight full-detection low-current testing device according to claim 1, wherein: the bottom of the transverse plate of the support frame (4) is provided with a rolling ball (17) movably connected with the inside of the moving groove (10).

3. The backlight full-detection low-current testing device according to claim 1, wherein: the right side of the clamping plate (5) is fixedly connected with a rubber layer (6), and the right side of the rubber layer (6) is provided with a small bump.

4. The backlight full-detection low-current testing device according to claim 1, wherein: power frame clamping mechanism is including rotating post (7), the surface that rotates post (7) is connected with the inside rotation of base (1), the bottom of rotating post (7) runs through the inside of base (1) and extends to the inside of rotating groove (14), the bottom fixedly connected with that rotates post (7) rotates collection post (16) of being connected with rotation groove (14) inner wall, second spacing groove (15) have been seted up on the surface of collection post (16), two wire rope (13) of inner wall fixedly connected with of second spacing groove (15), wire rope (13) are kept away from the one end of second spacing groove (15) and the left side fixed connection of the vertical board of support frame (4).

5. The device for testing full-detection low current of backlight source according to claim 4, wherein: the steel wire ropes (13) are positioned at the same position of the inner wall of the second limiting groove (15), and the two steel wire ropes (13) are respectively arranged in the two moving grooves (10).

6. The backlight full-detection low-current testing device according to claim 1, wherein: the inner part of the longitudinal groove of the moving groove (10) is rotatably connected with two mirror-image transmission wheels (11), and the surface of each transmission wheel (11) is provided with a transmission groove (12) in transmission connection with the surface of the steel wire rope (13).