CN214793093U

CN214793093U - Flatness measuring device

Info

Publication number: CN214793093U
Application number: CN202120328344.0U
Authority: CN
Inventors: 吴瑞彬; 裴国祥
Original assignee: Guangzhou Shiyuan Electronics Thecnology Co Ltd; Qstech Co Ltd
Current assignee: Qstech Co Ltd
Priority date: 2021-02-03
Filing date: 2021-02-03
Publication date: 2021-11-19
Anticipated expiration: 2031-02-03

Abstract

The utility model discloses a roughness measuring device, this roughness measuring device includes: the measuring mechanism comprises a mounting table, an inductor and a plurality of probes; the mounting table is provided with a plurality of mounting holes, the probe is detachably mounted in the mounting holes, two ends of the probe are respectively provided with a top probe for contacting the inductor and a bottom probe for contacting the object to be tested, and the bottom probe extends out of the mounting holes; the sensor is arranged above the mounting table, and the probe has freedom degree of moving towards the sensor; and the driving mechanism is used for driving the measuring mechanism to move so as to drive the bottom probe to contact the object to be measured. This roughness measuring device can once realize the multiple spot and measure to obtain the roughness information and/or the profile information on the object surface that awaits measuring fast, improved detection efficiency, the cost is reduced still can adjust probe position and quantity in a flexible way, and application scope is wider, and simple structure, the operation of being convenient for.

Description

Flatness measuring device

Technical Field

The utility model relates to a measuring instrument field especially relates to a roughness measuring device.

Background

The three-dimensional measuring device is an instrument for measuring by three-dimensional point taking, is used for measuring the geometric dimension, shape and position of a measured object, and is widely applied to the fields of measurement of precision mechanical parts, electronic components, plastic and rubber finished products, semiconductor components and the like. The existing three-dimensional equipment generally adopts a single-probe multi-point measurement mode, and has the problems of slow point taking and low test efficiency.

In many industries, such as the LED display screen industry, it is necessary to measure the flatness of the surface of a product to meet the design requirements of the product. However, the existing three-dimensional measuring device is adopted to measure the product, the flatness of the product cannot be rapidly measured, the position of the unevenness of the surface of the product cannot be rapidly positioned, the measuring efficiency is low, and the cost is high.

SUMMERY OF THE UTILITY MODEL

The embodiment of the utility model provides an aim at: the flatness measuring device is high in measuring efficiency, low in cost and more flexible to use.

In order to achieve the purpose, the utility model adopts the following technical proposal:

a flatness measuring apparatus comprising:

the measuring mechanism comprises a mounting table, an inductor and a plurality of probes; the mounting table is provided with a plurality of mounting holes, the probe is detachably mounted in the mounting holes, two ends of the probe are respectively provided with a top probe for contacting the inductor and a bottom probe for contacting an object to be tested, and the bottom probe extends out of the mounting holes; the sensor is arranged above the mounting table, and the probe has a degree of freedom of moving towards the sensor;

and the driving mechanism is used for driving the measuring mechanism to move downwards so as to drive the bottom probe to contact the object to be measured.

Preferably, the driving mechanism is used for driving the measuring mechanism to move according to a set speed.

Preferably, the device further comprises a processing module, wherein the processing module is in communication connection with the inductor;

the sensor is used for measuring plane position information of the probe and time information of contact with the probe when the sensor is in contact with the top probe; the processing module is used for acquiring and processing the plane position information and the time information to obtain surface flatness information and/or surface contour information of the object to be detected.

Preferably, the number of the mounting holes is greater than the number of the probes.

Preferably, the mounting holes are arranged in an array.

Preferably, the mounting hole is a guide through hole; a first limiting surface is arranged inside the mounting hole, and the probe is provided with a second limiting surface; when the probe is installed in the installation hole, the second limiting surface is abutted to the first limiting surface, and the first limiting surface is used for limiting the degree of freedom of downward movement of the probe.

Preferably, a first supporting platform which protrudes inwards relative to the hole wall along the radial direction is arranged in the mounting hole, and the top surface of the first supporting platform is a first limiting surface;

the probe also comprises a body and a second supporting platform which protrudes outwards relative to the body along the radial direction, and the bottom surface of the second supporting platform is the second limiting surface; the top probe and the bottom probe are respectively arranged at two opposite ends of the body.

Preferably, the probe comprises a body, the bottom probe being fixed to one end of the body; the top probe is connected with the body through an elastic piece, or the top probe is fixed at the other end of the body and is an elastic probe.

Preferably, the inductor is a touch control induction plate, the touch control induction plate is close to one side of mount table is equipped with the response membrane, the response membrane be used for with the contact of top probe.

Preferably, in the vertical direction, a projection of the mounting hole is located in the inductor.

The utility model has the advantages that: the flatness measuring device can realize the contact between a plurality of probes and the surface of an object to be measured when the mounting table is moved once, and can realize multi-point measurement once, so that the flatness information and/or the profile information of the surface of the object to be measured can be quickly obtained, the measuring efficiency is improved, and the measuring cost is reduced; in addition, the installation position and the number of the probes can be adjusted according to the surface detection points of different objects to be detected, so that the application is more flexible and the application range is wide; meanwhile, the flatness measuring device is simple in structure and convenient to operate.

Drawings

The present invention will be described in further detail with reference to the accompanying drawings and examples.

Fig. 1 is a schematic structural diagram of a flatness measuring apparatus according to an embodiment of the present invention;

FIG. 2 is an enlarged view of portion A of FIG. 1;

fig. 3 is a schematic structural diagram of a probe of the flatness measuring apparatus according to an embodiment of the present invention;

fig. 4 is a schematic view of an application of the flatness measuring apparatus according to an embodiment of the present invention;

FIG. 5 is an enlarged view of the portion B of FIG. 4;

fig. 6 is a flowchart of a measuring method of the flatness measuring apparatus according to the embodiment of the present invention;

in the figure: 10. an installation table; 11. mounting holes; 111. a first limiting surface; 20. an inductor; 21. an induction film; 30. a probe; 31. a body; 32. a top probe; 33. a bottom probe; 34. a second support table; 341. a second limiting surface; 35. an elastic member; 90. an object to be measured.

Detailed Description

In order to make the technical problems, technical solutions and technical effects achieved by the present invention more clear, the embodiments of the present invention will be described in further detail with reference to the accompanying drawings, and obviously, the described embodiments are only some embodiments, not all embodiments of the present invention. Based on the embodiments in the present invention, all other embodiments obtained by those skilled in the art without creative efforts belong to the protection scope of the present invention.

In the description of the present invention, unless otherwise explicitly specified or limited, the terms "connected" and "fixed" are to be understood broadly, e.g. as a fixed connection, a detachable connection or an integral part; can be mechanically or electrically connected; either directly or indirectly through intervening media, either internally or in any other relationship. The specific meaning of the above terms in the present invention can be understood in specific cases to those skilled in the art.

In the present disclosure, unless expressly stated or limited otherwise, the first feature "on" or "under" the second feature may comprise direct contact between the first and second features, or may comprise contact between the first and second features not directly. Also, the first feature being "on," "above" and "over" the second feature includes the first feature being directly on and obliquely above the second feature, or merely indicating that the first feature is at a higher level than the second feature. A first feature being "under," "below," and "beneath" a second feature includes the first feature being directly under and obliquely below the second feature, or simply meaning that the first feature is at a lesser elevation than the second feature.

The utility model provides a roughness measuring device has improved measuring speed, and measurement of efficiency is high, and measurement cost reduces to improve product production efficiency, reduced product manufacturing cost.

As shown in fig. 1 to 6, in an embodiment of the flatness measuring apparatus of the present invention, the flatness measuring apparatus includes:

a measuring mechanism comprising a mounting table 10, a sensor 20 and a plurality of probes 30; the mounting table 10 is provided with a plurality of mounting holes 11, and the probe 30 is detachably mounted in the mounting holes 11; a top probe 32 and a bottom probe 33 are respectively arranged at two ends of the probe 30, the top probe 32 is used for contacting the inductor 20, the bottom probe 33 is used for contacting the object to be detected 90, and the top probe 32 and the bottom probe 33 respectively extend out of the mounting hole 11; the sensor 20 is provided above the mounting table 10, and the probe 30 has a degree of freedom of movement toward the sensor 20;

the driving mechanism is used for driving the measuring mechanism to move towards the object to be measured 90 positioned below the measuring mechanism so as to drive the bottom probe 33 to move towards the direction close to the object to be measured 90; the bottom probe 33 is brought into contact with the object to be measured 90 by the driving mechanism so that the probe 30 is moved upward by the reaction force of the object to be measured 90, and the top probe 32 is brought into contact with the sensor 20.

Preferably, the drive mechanism is a linear drive mechanism. The drive mechanism may be, but is not limited to, an electric motor.

Wherein, the mounting table 10 and the inductor 20 are configured to move synchronously, so that the probe 30 and the inductor 20 move synchronously.

The utility model discloses roughness measuring device is applicable to once and detects the multiple measuring station, and the testing process is as follows:

selecting a proper number of probes 30 according to the concave-convex characteristics of the surface of the object to be measured 90 and actual measurement requirements, reasonably setting the positions of the probes 30, inserting each probe 30 into one mounting hole 11, and extending a plurality of bottom probes 33 from the bottom surface of the mounting table 10;

moving the measuring mechanism at a specific speed to make the bottom probes 33 of the probes 30 contact the surface of the object to be measured 90 simultaneously or sequentially, and after the probes 30 contact the object to be measured 90, because the measuring mechanism keeps moving in a direction approaching the object to be measured 90, the probes 30 will move upward (i.e. in a direction approaching the inductor 20) under the reaction force of the object to be measured 90 until the top probes 32 of the probes 30 contact the inductor 20;

the top probes 32 of the probes 30 contact the sensor 20, the sensor 20 detects and collects sensing information of the probes 30, and the sensing information is processed to obtain detection information of detection points corresponding to the probes 30, wherein the detection information comprises plane position information and height information; the surface flatness and/or surface profile of the object to be measured 90 can be obtained by processing the detection information of the detection points.

In this embodiment, the plane position information of each probe 30 is an x coordinate and a y coordinate of a detection point corresponding to the probe 30; the height information of each probe 30 is height difference information, that is, the height difference information between the detection points corresponding to the plurality of probes 30 can be calculated and processed according to the time information detected by the sensor 20 and the moving speed of the measuring mechanism; the flatness information and the contour information of the surface of the object to be measured 90 can be obtained by processing the plane position information and the height information.

The flatness measuring device of the utility model can realize the contact between a plurality of probes 30 and the surface of the object to be measured 90 when the mounting table 10 is moved once, and can realize multi-point measurement simultaneously, thereby being capable of quickly obtaining the flatness information and/or the outline information of the surface of the object to be measured 90, improving the detection efficiency and reducing the detection cost; moreover, the installation position of the probes 30 and the number of the probes 30 can be adjusted according to the surface detection points of different objects to be detected 90, so that the application is more flexible and the application range is wide; meanwhile, the flatness measuring device is simple in structure and convenient to operate.

The utility model discloses a roughness measuring device is applicable to LED display screen industry, measures the roughness of the lamp plate installation face of LED box as needs to guarantee the effect that the display screen leveled the demonstration. Adopt this roughness measuring device, can measure fast to the lamp plate installation face to fix a position unsmooth unevenness's position fast can greatly improve production efficiency, reduction in production cost, provide specific guiding position for processing and design.

In another embodiment of the present invention, in order to obtain the surface flatness information and the surface profile information more quickly, the driving mechanism is configured to: the measuring mechanism is driven to move according to the set speed, and therefore the probe is driven to move according to the set speed.

Among them, the set speed is preferably a constant speed.

Preferably, the flatness measuring apparatus further includes a processing module, and the processing module is in communication connection with the sensor 20 in a wired or wireless connection manner, so that the processing module can acquire sensing information of the sensor 20;

the sensor 20 is used for measuring plane position information of the probe 30 and time information of contact with the probe 30 when the sensor is in contact with the top probe head 32 of the probe 30; the processing module is used for acquiring and processing the time information to obtain height information; the processing module is configured to obtain the plane position information, and process the plane position information and the height information to obtain surface flatness information and/or surface contour information of the object to be measured 90.

In this embodiment, the time information of each probe 30 is the time when the probe 30 contacts the sensor 20; firstly, the sensor 20 senses time information of different probes 30, the processing module acquires time information of all the probes 30, one probe 30 is used as a reference probe 30, the time of the reference probe 30 contacting with the sensor 20 is used as reference time, the time difference between the time of the other probes 30 contacting with the sensor 20 and the reference time is calculated, and the height difference (namely height information) between other measuring points (object surface measuring points corresponding to the other probes 30) and a reference measuring point (object surface measuring points corresponding to the reference probe 30) is calculated through the time difference and a set speed (moving speed of a measuring mechanism); secondly, the processing module can process the surface flatness and the surface contour of the object according to the plane position information and the height difference of each probe 30.

The utility model discloses a roughness measuring device moves according to setting for speed through actuating mechanism drive measuring mechanism, and a plurality of probes 30 contact inductor 20, both the plane position of a plurality of measurement stations of detectable, still can handle the difference in height that obtains between a plurality of measurement stations through a plurality of probes 30 contact inductor 20's time difference to can realize the calculation and the formation of the surface smoothness and the profile curve (or curved surface) of the object 90 that awaits measuring fast. The contour curve (or curved surface) is a concave-convex deformation curve (or curved surface) of the surface of the object to be measured 90.

In another embodiment of the present invention, in order to enlarge the application range, the number of the mounting holes 11 needs to be greater than the number of the probes 30, and the density of the mounting holes 11 is increased by setting more mounting holes 11, so as to adjust the positions and the number of the probes 30 more flexibly and improve the measurement accuracy.

Preferably, in order to conveniently and reasonably select the positions of the measuring points, the mounting holes 11 are arranged in an array, that is, the mounting table 10 is provided with a plurality of rows of mounting holes 11.

In this embodiment, the mounting holes 11 are arranged in a row.

In another embodiment of the present invention, in order to detachably mount the probe 30 on the mounting table 10, the mounting hole 11 is a mounting through hole, the first limiting surface 111 facing upward is disposed inside the mounting hole 11, the second limiting surface 341 facing downward is disposed on the probe 30, when the probe 30 is mounted, the probe 30 is inserted into the mounting hole 11 from the top of the mounting hole 11, and the second limiting surface 341 abuts against the first limiting surface 111; the first limiting surface 111 is used for limiting the degree of freedom of downward movement of the probe 30 so as to ensure that the probe 30 is inserted into the mounting hole 11.

Preferably, in order to ensure the measurement accuracy, the mounting hole 11 is a guiding through hole, and the mounting hole 11 is configured to have a guiding effect on the vertical displacement of the probe 30, so that when the bottom probe 33 abuts against the object to be measured 90, the probe 30 moves vertically upward in the guiding of the guiding through hole.

In this embodiment, set up the external diameter of probe 30 to match with the internal diameter of mounting hole 11 to inner wall through mounting hole 11 carries out radial spacing to probe 30, thereby realizes that probe 30 can be at vertical upward movement under the direction of mounting hole 11, reduces the error of the plane position information of probe 30 that inductor 20 surveyed, thereby improves and measures the precision.

In other embodiments, a guide groove or a guide convex strip may be disposed on an outer wall of the probe 30, a guide convex strip or a guide groove may be disposed on an inner wall of the mounting hole 11, and a guide effect of the mounting hole 11 on the vertical movement of the probe 30 may be achieved through cooperation between the guide convex strip and the guide groove.

In this embodiment, the first and second position-limiting

surfaces

111 and 341 are arranged as follows:

a first supporting platform which is inwards protruded along the radial direction relative to the hole wall is arranged in the mounting hole 11, and the top surface of the first supporting platform is a first limiting surface 111;

the probe 30 further includes a body 31, and a second supporting platform 34 protruding outward relative to the body 31 in the radial direction, and a bottom surface of the second supporting platform 34 is a second limiting surface 341; a top probe 32 and a bottom probe 33 are provided at opposite ends of the body 31, respectively. So set up, the inner wall of mounting hole 11 also has radial limiting displacement to second supporting bench 34 to improve the stability of probe 30 installation.

In this embodiment, the bottom probe 33 is integrally formed with the body 31.

In other embodiments, the first support table may not be provided in the mounting hole 11; the second support base 34 is directly provided on the probe 30, the bottom surface of the second support base 34 is a second limit surface 341, and after the probe 30 is mounted in the mounting hole 11, the second limit surface 341 abuts against the top surface of the mounting table 10, and the top surface of the mounting table 10 is used as the first limit surface 111.

In another embodiment of the present invention, because when the surface unevenness of the object 90 to be measured, after a part of the probes 30 contact the object 90 to be measured, the measuring mechanism needs to continue moving in the direction of the object 90 to be measured, so that all the probes 30 all contact the object 90 to be measured, and the validity of each probe 30 measurement is ensured, so it is possible to cause the probe 30 or the inductor 20 to be damaged due to the excessive squeezing between the top probe 32 of the probe 30 and the inductor 20, in order to protect the probe 30 and the inductor 20, the probe 30 includes an elastic structure, and the elastic activity after the top probe 32 contacts the inductor 20 is provided through the elastic structure.

Specifically, the probe 30 includes a body 31, a bottom probe 33 fixed to one end of the body 31; the top probe 32 is connected to the body 31 by an elastic member 35, or the top probe 32 is fixed to the other end of the body 31 and the top probe 32 is an elastic probe.

Preferably, the top probe 32 is connected to the body 31 by the elastic member 35.

In another embodiment of the present invention, the sensor 20 is a touch sensing board, one side of the touch sensing board close to the mounting platform 10 is provided with a sensing film 21, and the sensing film 21 is used for detecting the plane position information and the time information of the top probe 32 when contacting the top probe 32.

In another embodiment of the present invention, in order to ensure the effectiveness of measurement, in the vertical direction, the projection of the mounting hole 11 is located in the sensor 20, so as to ensure that the sensor 20 can effectively contact each probe 30, thereby ensuring the accuracy of the measurement result.

In the description herein, it is to be understood that the terms "upper", "lower", "left", "right", and the like are used in a descriptive sense and with reference to the illustrated orientation or positional relationship, and are used for convenience in description and simplicity in operation, and do not indicate or imply that the referenced device or element must have a particular orientation, be constructed and operated in a particular orientation, and thus should not be construed as limiting the present invention. Furthermore, the terms "first" and "second" are used merely for descriptive purposes and are not intended to have any special meaning.

In the description herein, references to the description of "an embodiment," "an example" or the like are intended to mean that a particular feature, structure, material, or characteristic described in connection with the embodiment or example is included in at least one embodiment or example of the invention. In this specification, the schematic representations of the terms used above do not necessarily refer to the same embodiment or example.

Furthermore, it should be understood that although the present description refers to embodiments, not every embodiment may contain only a single embodiment, and such description is for clarity only, and those skilled in the art should integrate the description, and the embodiments may be appropriately combined to form other embodiments as will be appreciated by those skilled in the art.

The technical principle of the present invention is described above with reference to specific embodiments. The description is made for the purpose of illustrating the principles of the invention and should not be construed in any way as limiting the scope of the invention. Based on the explanations herein, those skilled in the art will be able to conceive of other embodiments of the present invention without any inventive effort, which would fall within the scope of the present invention.

Claims

1. A flatness measuring apparatus, comprising:

a measuring mechanism comprising a mounting table (10), a sensor (20) and a number of probes (30); the mounting table (10) is provided with a plurality of mounting holes (11), the probe (30) is detachably mounted in the mounting holes (11), two ends of the probe (30) are respectively a top probe (32) used for contacting the inductor (20) and a bottom probe (33) used for contacting an object to be tested (90), and the bottom probe (33) extends out of the mounting holes (11); the inductor (20) is arranged above the mounting table (10), and the probe (30) has a degree of freedom of moving towards the inductor (20);

and the driving mechanism is used for driving the measuring mechanism to move downwards so as to drive the bottom probe (33) to contact the object (90) to be measured.

2. A flatness measuring device according to claim 1, wherein the drive mechanism is adapted to drive the measuring mechanism to move at a set speed.

3. The flatness measuring device according to claim 2, further comprising a processing module communicatively connected to the inductor (20);

the sensor (20) is used for measuring plane position information of the probe (30) and time information of contact with the probe (30) when the sensor is in contact with the top probe (32); the processing module is used for acquiring and processing the plane position information and the time information to obtain surface flatness information and/or surface contour information of the object (90) to be measured.

4. Flatness measuring device according to any of claims 1-3, characterized in that the number of mounting holes (11) is larger than the number of probes (30).

5. Flatness measuring device according to claim 4, characterized in that several of said mounting holes (11) are arranged in an array.

6. Flatness measuring device according to any of claims 1-3, characterized in that said mounting holes (11) are guiding through holes; a first limit surface (111) is arranged inside the mounting hole (11), and a second limit surface (341) is arranged on the probe (30); when the probe (30) is mounted in the mounting hole (11), the second limit surface (341) is abutted against the first limit surface (111), and the first limit surface (111) is used for limiting the degree of freedom of downward movement of the probe (30).

7. The flatness measuring device according to claim 6, wherein a first supporting platform which protrudes inwards along the radial direction relative to the hole wall is arranged in the mounting hole (11), and the top surface of the first supporting platform is a first limiting surface (111);

the probe (30) further comprises a body (31) and a second supporting platform (34) which protrudes outwards relative to the body (31) along the radial direction, and the bottom surface of the second supporting platform (34) is the second limiting surface (341); the top probe (32) and the bottom probe (33) are respectively arranged at two opposite ends of the body (31).

8. Flatness measuring device according to any of claims 1-3, characterized in that the probe (30) comprises a body (31), the bottom probe (33) being fixed to one end of the body (31); the top probe (32) is connected with the body (31) through an elastic piece (35), or the top probe (32) is fixed at the other end of the body (31) and the top probe (32) is an elastic probe.

9. Flatness measuring device according to any of claims 1-3, characterized in that the sensor (20) is a touch sensitive pad, which is provided with a sensing film (21) on the side close to the mounting table (10), the sensing film (21) being adapted to contact the top probe (32).

10. Flatness measuring device according to any of claims 1-3, characterized in that the projection of the mounting hole (11) is located in the inductor (20) in a vertical direction.