CN214703689U - Direct insertion type power semiconductor module test fixture - Google Patents
Direct insertion type power semiconductor module test fixture Download PDFInfo
- Publication number
- CN214703689U CN214703689U CN202023061272.2U CN202023061272U CN214703689U CN 214703689 U CN214703689 U CN 214703689U CN 202023061272 U CN202023061272 U CN 202023061272U CN 214703689 U CN214703689 U CN 214703689U
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- wall
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- 239000004065 semiconductor Substances 0.000 title claims abstract description 43
- 238000012360 testing method Methods 0.000 title claims abstract description 22
- 238000003780 insertion Methods 0.000 title claims description 10
- 230000037431 insertion Effects 0.000 title description 3
- 239000007787 solid Substances 0.000 claims description 3
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
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Abstract
The utility model relates to the technical field of anchor clamps, and a formula power semiconductor module test fixture cut straightly is disclosed, including the screw thread horizontal pole, the pole wall movable sleeve of screw thread horizontal pole is equipped with the montant, the slide opening has been seted up to the pole wall of montant, the screw thread horizontal pole runs through the montant through the slide opening, the pole wall symmetry screw thread cover of screw thread horizontal pole is equipped with two spacing barrels, the montant is located between two spacing barrels, two push rods of the outer wall symmetry fixedly connected with of spacing barrel, the upper end of montant is rotated and is connected with the rotor plate. The utility model discloses can carry out the regulation in position and position fast, the effectual convenience that improves anchor clamps and use.
Description
Technical Field
The utility model relates to an anchor clamps technical field especially relates to a formula power semiconductor module test fixture cut straightly.
Background
The direct-insert type power semiconductor module is a combination body according to a certain function and mode, and the power semiconductor module is formed by combining and encapsulating high-power electronic power devices into a whole according to a certain function. The direct-insertion type power semiconductor module needs to be subjected to performance testing after production is completed, and a clamp needs to be used for clamping the direct-insertion type power semiconductor module during testing.
The position and the orientation of the clamp for the conventional direct-insert type power semiconductor module test cannot be quickly adjusted according to actual test requirements, so that the use convenience of the clamp is reduced.
SUMMERY OF THE UTILITY MODEL
The utility model aims at solving the problem that the position and the position of the test fixture for the direct-insert power semiconductor module can not be quickly adjusted in the prior art, and the provided test fixture for the direct-insert power semiconductor module.
In order to achieve the above purpose, the utility model adopts the following technical scheme:
a direct-insertion type power semiconductor module test fixture comprises a threaded cross rod, wherein a vertical rod is movably sleeved on the rod wall of the threaded cross rod, a sliding hole is formed in the rod wall of the vertical rod, the threaded cross rod penetrates through the vertical rod through the sliding hole, two limit screw cylinders are symmetrically and threadedly sleeved on the rod wall of the threaded cross rod, the vertical rod is positioned between the two limit screw cylinders, two push rods are symmetrically and fixedly connected to the outer wall of each limit screw cylinder, a rotating plate is rotatably connected to the upper end of the vertical rod, a rotating groove is formed in the side wall of the lower side of the rotating plate, the rod wall of the vertical rod is rotatably connected with the groove wall of the rotating groove through a bearing, a fixing plate is fixedly connected to the side wall of the lower side of the rotating plate, a screw hole is formed in the side wall of the left side of the fixing plate, a locking screw rod is sleeved in the screw hole, screw holes extend out of two ends of the locking screw rod, a frosted sleeve corresponding to the locking screw rod is fixedly sleeved on the rod wall of the vertical rod, the utility model discloses a quick-witted, including rotor plate, lateral wall fixedly connected with solid fixed splint of rotor plate upside, the lateral wall fixedly connected with riser of rotor plate upside, the left lateral wall of riser set up threaded hole, the screw rod has been cup jointed to the screw hole internal thread, the left end of screw rod rotates through ball bearing and is connected with movable clamp plate, the lateral wall fixedly connected with gag lever post on movable clamp plate right side, spacing hole has been seted up to the left lateral wall of riser, the right-hand member of gag lever post runs through the riser through spacing hole.
Preferably, the rod wall of the threaded cross rod is fixedly connected with a U-shaped guide rod, the rod wall of the vertical rod is provided with a guide hole corresponding to the U-shaped guide rod, and the U-shaped guide rod penetrates through the vertical rod through the guide hole.
Preferably, the equal fixedly connected with mounting panel in both ends about the screw thread horizontal pole, the mounting hole has been seted up to the left lateral wall of mounting panel.
Preferably, the side wall of one side opposite to the fixed clamping plate and the movable clamping plate is fixedly connected with a rubber plate.
Preferably, the rod wall of the vertical rod is symmetrically provided with two clamping grooves corresponding to the limiting screw cylinders.
Preferably, two operating rods are symmetrically and fixedly connected to the rod wall of the locking screw rod.
Compared with the prior art, the utility model provides a formula power semiconductor module test fixture cut straightly possesses following beneficial effect:
the direct-insertion type power semiconductor module test fixture comprises a threaded cross rod, a vertical rod, a sliding hole, a limiting screw cylinder, a push rod, a rotating plate, a rotating groove, a fixing plate, a screw hole, a locking screw rod, a frosted sleeve, a fixing splint, a vertical plate, a threaded hole, a screw rod, a movable splint, a limiting rod and a limiting hole, wherein the semiconductor is placed between the fixing splint and the movable splint when the direct-insertion type power semiconductor module test fixture is used; when the position of the semiconductor is required to be adjusted, the locking screw rod is screwed, the frosted sleeve is kept away from the locking screw rod through the thread fit between the locking screw rod and the screw hole, the limitation of the locking screw rod on the rotating plate is removed, the rotating plate is pushed to enable the semiconductor to rotate, therefore, the position of the semiconductor can be adjusted, the position and the position of the clamp can be adjusted quickly, and the use convenience of the clamp is effectively improved.
The part that does not relate to in the device all is the same with prior art or can adopt prior art to realize, the utility model discloses can carry out the regulation in position and position fast, the effectual convenience that improves anchor clamps and use.
Drawings
Fig. 1 is a schematic structural view of a direct-insertion power semiconductor module test fixture provided by the present invention;
FIG. 2 is a schematic structural view of portion A of FIG. 1;
FIG. 3 is a schematic structural diagram of portion B of FIG. 1;
fig. 4 is a schematic structural view of a portion C in fig. 1.
In the figure: 1 threaded cross rod, 2 montants, 3 sliding hole, 4 spacing screw barrels, 5 push rods, 6 rotating plates, 7 rotating grooves, 8 fixed plates, 9 screw holes, 10 locking screw rods, 11 frosted sleeves, 12 fixed clamping plates, 13 vertical plates, 14 threaded holes, 15 screw rods, 16 movable clamping plates, 17 limiting rods, 18 limiting holes, 19U-shaped guide rods, 20 guide holes, 21 mounting plates, 22 mounting holes, 23 rubber plates, 24 clamping grooves and 25 operating rods.
Detailed Description
The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments.
In the description of the present invention, it is to be understood that the terms "upper", "lower", "front", "rear", "left", "right", "top", "bottom", "inner", "outer", and the like indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings, and are only for convenience of description and simplicity of description, and do not indicate or imply that the device or element being referred to must have a particular orientation, be constructed and operated in a particular orientation, and therefore, should not be construed as limiting the present invention.
Referring to fig. 1-4, a direct insertion type power semiconductor module testing fixture comprises a threaded cross rod 1, a vertical rod 2 is movably sleeved on the rod wall of the threaded cross rod 1, a sliding hole 3 is formed in the rod wall of the vertical rod 2, the threaded cross rod 1 penetrates through the vertical rod 2 through the sliding hole 3, two limiting screw cylinders 4 are symmetrically and threadedly sleeved on the rod wall of the threaded cross rod 1, the vertical rod 2 is positioned between the two limiting screw cylinders 4, two push rods 5 are symmetrically and fixedly connected to the outer wall of each limiting screw cylinder 4, a rotating plate 6 is rotatably connected to the upper end of the vertical rod 2, a rotating groove 7 is formed in the side wall of the lower side of the rotating plate 6, the rod wall of the vertical rod 2 is rotatably connected with the groove wall of the rotating groove 7 through a bearing, a fixing plate 8 is fixedly connected to the side wall of the lower side of the rotating plate 6, a screw hole 9 is formed in the side wall of the left side of the fixing plate 8, a locking screw rod 10 is sleeved in a thread, and the screw hole 9 extends out of the two ends of the locking screw rod 10, the pole wall of the vertical pole 2 is fixedly sleeved with a grinding sleeve 11 corresponding to the locking screw 10, the side wall of the upper side of the rotating plate 6 is fixedly connected with a fixed clamping plate 12, the side wall of the upper side of the rotating plate 6 is fixedly connected with a vertical plate 13, the side wall of the left side of the vertical plate 13 is provided with a threaded hole 14, a screw 15 is sleeved in the threaded hole 14, the left end of the screw 15 is rotatably connected with a movable clamping plate 16 through a ball bearing, the side wall of the right side of the movable clamping plate 16 is fixedly connected with a limiting rod 17, the side wall of the left side of the vertical plate 13 is provided with a limiting hole 18, the right end of the limiting rod 17 penetrates through the vertical plate 13 through the limiting hole 18, when the semiconductor clamping device is used, a semiconductor is placed between the fixed clamping plate 12 and the movable clamping plate 16, the screw 15 is rotated to move leftwards, the screw 15 drives the movable clamping plate 16 to move leftwards, so that the semiconductor can be clamped, when the position of the semiconductor needs to be adjusted, the push rod 5 is pushed, the push rod 5 drives the limiting screw barrel 4 to rotate, so that the limiting screw barrel 4 is far away from the vertical rod 2, the vertical rod 2 is pushed, the vertical rod 2 slides on the threaded cross rod 1, the position of the semiconductor in the horizontal direction can be adjusted, and after the adjustment is finished, the limiting screw barrel 4 is reused for locking and fixing the vertical rod 2; when the position of the semiconductor is required to be adjusted, the locking screw rod 10 is screwed, the sanding sleeve 11 is far away from the locking screw rod 10 through the thread fit between the locking screw rod 10 and the screw hole 9, the limitation of the locking screw rod 10 on the rotating plate 6 is removed, the rotating plate 6 is pushed to rotate the semiconductor, and therefore the position of the semiconductor can be adjusted, the position and the position of the clamp can be adjusted quickly, and the use convenience of the clamp is effectively improved.
The pole wall fixedly connected with U type guide bar 19 of screw thread horizontal pole 1, the pole wall of montant 2 set up with the corresponding guiding hole 20 of U type guide bar 19, U type guide bar 19 runs through montant 2 through guiding hole 20, can carry on spacingly to montant 2, avoids montant 2 to rotate, has improved montant 2's stability.
The equal fixedly connected with mounting panel 21 in both ends about screw thread horizontal pole 1, mounting hole 22 has been seted up to the left lateral wall of mounting panel 21, is convenient for carry out fixed mounting to anchor clamps.
The side wall of the opposite side of the fixed clamping plate 12 and the movable clamping plate 16 is fixedly connected with a rubber plate 23, and the rubber plate 23 can prevent the semiconductor from being scratched.
Two clamping grooves 24 corresponding to the limiting screw cylinder 4 are symmetrically formed in the rod wall of the vertical rod 2, and the clamping grooves 24 can improve the matching effect between the limiting screw cylinder 4 and the vertical rod 2.
The two operating rods 25 are symmetrically and fixedly connected to the rod wall of the locking screw 10, so that the locking screw 10 can be conveniently rotated, and the use convenience is improved.
In the utility model, during the use, place the semiconductor between solid fixed splint 12 and movable splint 16, rotate screw rod 15, make screw rod 15 move left, screw rod 15 drives movable splint 16 and moves left, thereby can press from both sides the semiconductor tightly, when needing to adjust the position of semiconductor, promote push rod 5, push rod 5 drives spacing barrel 4 and rotates, make spacing barrel 4 keep away from montant 2, promote montant 2, make montant 2 slide on screw thread horizontal pole 1, thereby can adjust the position of semiconductor horizontal direction, after the adjustment is accomplished, reuse spacing barrel 4 to lock the montant 2 fixedly; when the position of the semiconductor is required to be adjusted, the locking screw rod 10 is screwed, the sanding sleeve 11 is far away from the locking screw rod 10 through the thread fit between the locking screw rod 10 and the screw hole 9, the limitation of the locking screw rod 10 on the rotating plate 6 is removed, the rotating plate 6 is pushed to rotate the semiconductor, and therefore the position of the semiconductor can be adjusted, the position and the position of the clamp can be adjusted quickly, and the use convenience of the clamp is effectively improved.
The above, only be the concrete implementation of the preferred embodiment of the present invention, but the protection scope of the present invention is not limited thereto, and any person skilled in the art is in the technical scope of the present invention, according to the technical solution of the present invention and the utility model, the concept of which is equivalent to replace or change, should be covered within the protection scope of the present invention.
Claims (6)
1. The direct-insertion type power semiconductor module test fixture comprises a threaded cross rod (1) and is characterized in that a vertical rod (2) is movably sleeved on the rod wall of the threaded cross rod (1), a sliding hole (3) is formed in the rod wall of the vertical rod (2), the threaded cross rod (1) penetrates through the vertical rod (2) through the sliding hole (3), two limiting screw cylinders (4) are symmetrically and threadedly sleeved on the rod wall of the threaded cross rod (1), the vertical rod (2) is located between the two limiting screw cylinders (4), two push rods (5) are symmetrically and fixedly connected with the outer wall of each limiting screw cylinder (4), a rotating plate (6) is rotatably connected to the upper end of the vertical rod (2), a rotating groove (7) is formed in the side wall of the rotating plate (6) and is rotatably connected with the groove wall of the rotating groove (7) through a bearing, a fixing plate (8) is fixedly connected to the side wall of the rotating plate (6) on the lower side, screw hole (9) has been seted up to the left lateral wall of fixed plate (8), screw hole (9) internal thread has cup jointed locking screw (10), screw hole (9) all stretches out at the both ends of locking screw (10), the pole wall fixed cover of montant (2) is equipped with dull polish sleeve (11) corresponding with locking screw (10), the lateral wall fixedly connected with solid fixed splint (12) of rotor plate (6) upside, the lateral wall fixedly connected with riser (13) of rotor plate (6) upside, threaded hole (14) has been seted up to the left lateral wall of riser (13), screw rod (15) have been cup jointed to screw hole (14) internal thread, the left end of screw rod (15) rotates through ball bearing and is connected with movable clamp plate (16), the lateral wall fixedly connected with gag lever post (17) on movable clamp plate (16) right side, spacing hole (18) has been seted up to the left lateral wall of riser (13), the right end of the limiting rod (17) penetrates through the vertical plate (13) through a limiting hole (18).
2. An in-line power semiconductor module test fixture as claimed in claim 1, wherein a U-shaped guide rod (19) is fixedly connected to a rod wall of the threaded cross rod (1), a guide hole (20) corresponding to the U-shaped guide rod (19) is formed in a rod wall of the vertical rod (2), and the U-shaped guide rod (19) penetrates through the vertical rod (2) through the guide hole (20).
3. An in-line power semiconductor module test fixture according to claim 1, wherein the left and right ends of the threaded cross bar (1) are fixedly connected with mounting plates (21), and mounting holes (22) are formed in the side walls of the left sides of the mounting plates (21).
4. An in-line power semiconductor module test fixture as claimed in claim 1, wherein a rubber plate (23) is fixedly attached to each of the side walls of the fixed clamp plate (12) opposite to the movable clamp plate (16).
5. An in-line power semiconductor module test fixture as claimed in claim 1, wherein the wall of the vertical rod (2) is symmetrically provided with two slots (24) corresponding to the limit screw cylinders (4).
6. An in-line power semiconductor module test fixture as claimed in claim 1, wherein two operating rods (25) are symmetrically and fixedly connected to the rod wall of the locking screw (10).
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN202023061272.2U CN214703689U (en) | 2020-12-18 | 2020-12-18 | Direct insertion type power semiconductor module test fixture |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN202023061272.2U CN214703689U (en) | 2020-12-18 | 2020-12-18 | Direct insertion type power semiconductor module test fixture |
Publications (1)
Publication Number | Publication Date |
---|---|
CN214703689U true CN214703689U (en) | 2021-11-12 |
Family
ID=78558486
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN202023061272.2U Expired - Fee Related CN214703689U (en) | 2020-12-18 | 2020-12-18 | Direct insertion type power semiconductor module test fixture |
Country Status (1)
Country | Link |
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CN (1) | CN214703689U (en) |
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2020
- 2020-12-18 CN CN202023061272.2U patent/CN214703689U/en not_active Expired - Fee Related
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Legal Events
Date | Code | Title | Description |
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GR01 | Patent grant | ||
GR01 | Patent grant | ||
CF01 | Termination of patent right due to non-payment of annual fee | ||
CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20211112 |