CN214585863U - Chip testing machine capable of automatically marking dead spots - Google Patents

Chip testing machine capable of automatically marking dead spots Download PDF

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Publication number
CN214585863U
CN214585863U CN202120599270.4U CN202120599270U CN214585863U CN 214585863 U CN214585863 U CN 214585863U CN 202120599270 U CN202120599270 U CN 202120599270U CN 214585863 U CN214585863 U CN 214585863U
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motor
screw rod
spiral shell
fixed mounting
chip
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CN202120599270.4U
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Chinese (zh)
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李娜
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Shenzhen Beichen Electronics Co ltd
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Shenzhen Beichen Electronics Co ltd
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Abstract

The utility model discloses an automatic chip test machine of mark dead pixel, including the test box, the bottom fixed mounting of test box inner chamber has first motor, the output transmission of first motor is connected with first screw rod, the surface screw thread of first screw rod is connected with first spiral shell piece, there is the pick-up plate at the top of first spiral shell piece through support fixed mounting, the detection groove has been seted up at the top of pick-up plate, and there is first electric putter in the left side of test box inner chamber through support fixed mounting. The utility model discloses set up test box, first motor, first spiral shell piece, first screw rod, pick-up plate, detection groove, negative pole probe, first electric putter, pilot lamp, second screw rod, second spiral shell piece, second motor, second electric putter, stable frame, positive pole probe, third motor, third spiral shell piece, third screw rod, third electric putter and china ink needle, it is not good to have solved traditional chip test machine result of use, is not convenient for carry out the problem marked to the chip dead pixel.

Description

Chip testing machine capable of automatically marking dead spots
Technical Field
The utility model relates to a chip test machine technical field specifically is an automatic mark chip test machine of dead pixel.
Background
The chip is an integrated circuit which is miniaturized and then fixed on the surface of a semiconductor wafer, a chip testing machine is mainly used for testing the chip in the aspect of the integrated circuit, the chip testing machine is required to be used for detecting the chip after the production of the chip is finished, whether the chip has dead spots or not is detected, and the quality of the chip is guaranteed.
SUMMERY OF THE UTILITY MODEL
An object of the utility model is to provide an automatic chip test machine of mark dead pixel possesses excellent in use effect, is convenient for carry out the advantage of mark to the chip dead pixel, and it is not good to have solved traditional chip test machine result of use, is not convenient for carry out the problem of mark to the chip dead pixel.
In order to achieve the above object, the utility model provides a following technical scheme: a chip testing machine capable of automatically marking dead spots comprises a testing box, wherein a first motor is fixedly installed at the bottom of an inner cavity of the testing box, a first screw rod is connected to the output end of the first motor in a transmission manner, a first screw block is connected to the surface of the first screw rod in a threaded manner, a detection plate is fixedly installed at the top of the first screw block through a support, a detection groove is formed in the top of the detection plate, a first electric push rod is fixedly installed on the left side of the inner cavity of the testing box through the support, a negative probe is fixedly installed at the output end of the first electric push rod through the support, a second motor is fixedly installed on the right side of the inner cavity of the testing box through an installation plate, a second screw rod is connected to the output end of the second motor in a transmission manner, a second screw block is connected to the surface of the second screw rod in a threaded manner, a second electric push rod is fixedly installed at the bottom of the second screw block, and a stabilizing frame is fixedly installed at the output end of the second electric push rod, the back of stabilizing the frame has the third motor through mount pad fixed mounting, the output transmission of third motor is connected with the third screw rod, the surface thread connection of third screw rod has the third spiral shell piece, the bottom fixed mounting of third spiral shell piece has anodal probe, the inner chamber fixed mounting of anodal probe has third electric putter, third electric putter's output fixed mounting has the china ink needle, the left top of test box is provided with the pilot lamp.
Preferably, the bottom of the first screw block is fixedly provided with a first sliding block through a support, and the bottom of the inner cavity of the test box is provided with a first sliding groove.
Preferably, a second sliding block is fixedly mounted at the top of the second screw block through a support, and a second sliding groove is formed in the top of the inner cavity of the test box.
Preferably, a third sliding block is fixedly mounted at the top of the third screw block through a support, and a third sliding groove is formed in the top of the inner cavity of the stabilizing frame.
Preferably, a control panel is arranged on the left side of the test box, and a protective film is arranged on the surface of the control panel.
Preferably, a battery box is fixedly mounted at the bottom of the right side of the test box, and a storage battery is arranged in an inner cavity of the battery box.
Compared with the prior art, the beneficial effects of the utility model are as follows:
1. the utility model discloses turn on the first motor, the first motor drives the first screw rod and rotates, the first screw rod drives the first screw block and moves left, the first screw block drives the detecting plate and moves left, make the detecting plate stretch out the test box, put the chip in the detecting groove at the top of the detecting plate, reverse the first motor, make the detecting plate return to the original position, turn on the first electric push rod, the first electric push rod pushes the negative probe and touches on the chip, turn on the second motor, the second motor drives the second screw block and moves left, the second screw block drives the second electric push rod and moves left, the second electric push rod drives the stabilizing frame and moves left, thereby can change the lateral position of the positive probe, turn on the third motor, the third motor drives the third screw rod and rotates, the third screw rod drives the third screw block and moves forward, the third screw block drives the positive probe and moves forward, thereby can change the longitudinal position of the positive probe, open second electric putter, second electric putter promotes and stabilizes frame downstream, thereby can drive the anodal probe and contact the chip, be convenient for detect each point of chip, utilize negative pole probe and anodal probe can detect the circuit of chip, when the circuit is normal, the pilot lamp is green lamp, when the circuit is abnormal, the pilot lamp is the red lamp, people can open third electric putter, third electric putter promotes the china ink needle and moves down, mark the chip, it is not good to have solved traditional chip test machine result of use, be not convenient for carry out the problem marked to the chip dead pixel.
2. The utility model discloses it is firm when third slider and third spout make third spiral shell piece remove, and it is firm when second spout and second slider make second spiral shell piece remove, and control panel is used for controlling the switch of each electrical apparatus, and the battery in the battery box provides the electric energy for the device, and is firm when first slider and first spout make first spiral shell piece remove.
Drawings
FIG. 1 is a schematic structural view of the present invention;
FIG. 2 is a left-view enlarged structural diagram of the stabilizing frame of the present invention;
fig. 3 is an enlarged schematic view of a portion a in fig. 2 according to the present invention.
In the figure: 1. a test box; 2. a first motor; 3. a first slider; 4. a first screw block; 5. a first screw; 6. detecting a plate; 7. a detection tank; 8. a first chute; 9. a negative probe; 10. a first electric push rod; 11. a control panel; 12. an indicator light; 13. a second screw; 14. a second chute; 15. a second slider; 16. a second screw block; 17. a second motor; 18. a second electric push rod; 19. a stabilizing frame; 20. a positive electrode probe; 21. a third slider; 22. a third motor; 23. a third screw block; 24. a third screw; 25. a third chute; 26. a third electric push rod; 27. an ink needle; 28. a battery box.
Detailed Description
The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative work belong to the protection scope of the present invention.
In the description of the present invention, it should be noted that the terms "upper", "lower", "inner", "outer", "front end", "rear end", "both ends", "one end", "the other end", and the like indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings, and are only for convenience of description and simplification of description, but do not indicate or imply that the device or element to be referred must have a specific orientation, be constructed in a specific orientation, and be operated, and thus, should not be construed as limiting the present invention. Furthermore, the terms "first" and "second" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance.
In the description of the present invention, it is to be noted that, unless otherwise explicitly specified or limited, the terms "mounted", "provided", "connected", and the like are to be construed broadly, such as "connected", which may be fixedly connected, detachably connected, or integrally connected; can be mechanically or electrically connected; they may be connected directly or indirectly through intervening media, or they may be interconnected between two elements. The specific meaning of the above terms in the present invention can be understood in specific cases to those skilled in the art.
The utility model discloses a test box 1, first motor 2, first slider 3, first spiral shell piece 4, first screw rod 5, pick-up plate 6, detect groove 7, first spout 8, negative pole probe 9, first electric putter 10, control panel 11, pilot lamp 12, second screw rod 13, second spout 14, second slider 15, second spiral shell piece 16, second motor 17, second electric putter 18, stabilizing frame 19, positive pole probe 20, third slider 21, third motor 22, third spiral shell piece 23, third screw rod 24, third spout 25, third electric putter 26, ink needle 27 and battery box 28 part are the parts that general standard or technical staff know, its structure and principle all can learn through the technical manual or learn through conventional experimental method for this technical staff.
Referring to fig. 1-3, a chip testing machine for automatically marking dead spots comprises a testing box 1, a control panel 11 is arranged on the left side of the testing box 1, a protective film is arranged on the surface of the control panel 11, the control panel 11 is used for controlling switches of various electric appliances, a battery box 28 is fixedly arranged at the bottom of the right side of the testing box 1, a storage battery is arranged in the inner cavity of the battery box 28, the storage battery in the battery box 28 provides electric energy for the device, a first motor 2 is fixedly arranged at the bottom of the inner cavity of the testing box 1, the output end of the first motor 2 is connected with a first screw 5 in a transmission manner, a first screw block 4 is connected with the surface of the first screw 5 in a threaded manner, a first slide block 3 is fixedly arranged at the bottom of the first screw block 4 through a bracket, a first slide groove 8 is arranged at the bottom of the inner cavity of the testing box 1, the first slide block 3 and the first slide groove 8 stabilize the first screw block 4 when moving, a detection plate 6 is fixedly arranged at the top of the first screw block 4 through the bracket, the top of the detection plate 6 is provided with a detection groove 7, the left side of the inner cavity of the test box 1 is fixedly provided with a first electric push rod 10 through a bracket, the output end of the first electric push rod 10 is fixedly provided with a cathode probe 9 through a bracket, the right side of the inner cavity of the test box 1 is fixedly provided with a second motor 17 through a mounting plate, the output end of the second motor 17 is connected with a second screw 13 in a transmission way, the surface of the second screw 13 is in threaded connection with a second screw block 16, the top of the second screw block 16 is fixedly provided with a second slide block 15 through a bracket, the top of the inner cavity of the test box 1 is provided with a second slide groove 14, the second slide groove 14 and the second slide block 15 ensure that the second screw block 16 is stable when moving, the bottom of the second screw block 16 is fixedly provided with a second electric push rod 18, the output end of the second electric push rod 18 is fixedly provided with a stabilizing frame 19, the back of the stabilizing frame 19 is fixedly provided with a third motor 22 through a mounting seat, the output end of a third motor 22 is connected with a third screw 24 in a transmission manner, the surface of the third screw 24 is in threaded connection with a third screw block 23, the top of the third screw block 23 is fixedly provided with a third slide block 21 through a bracket, the top of the inner cavity of the stabilizing frame 19 is provided with a third slide groove 25, the third slide block 21 and the third slide groove 25 enable the third screw block 23 to be stable when moving, the bottom of the third screw block 23 is fixedly provided with an anode probe 20, the inner cavity of the anode probe 20 is fixedly provided with a third electric push rod 26, the output end of the third electric push rod 26 is fixedly provided with an ink needle 27, the top of the left side of the test box 1 is provided with an indicator lamp 12, the first motor 2 is turned on, the first motor 2 drives the first screw 5 to rotate, the first screw 5 drives the first screw block 4 to move leftwards, the first screw block 4 drives the test board 6 to move leftwards, so that the test board 6 extends out of the test box 1, and the chip is placed in a test groove 7 at the top of the test box 6, the first motor 2 is reversed to return the detection plate 6 to the original position, the first electric push rod 10 is opened, the first electric push rod 10 pushes the cathode probe 9 to touch the chip, the second motor 17 is opened, the second motor 17 drives the second screw block 16 to move leftwards, the second screw block 16 drives the second electric push rod 18 to move leftwards, the second electric push rod 18 drives the stabilizing frame 19 to move leftwards, so that the transverse position of the anode probe 20 can be changed, the third motor 22 is opened, the third motor 22 drives the third screw rod 24 to rotate, the third screw rod 24 drives the third screw block 23 to move forwards, the third screw block 23 drives the anode probe 20 to move forwards, so that the longitudinal position of the anode probe 20 can be changed, the second electric push rod 18 is opened, the second electric push rod 18 pushes the stabilizing frame 19 to move downwards, so that the anode probe 20 can be driven to contact the chip, and each point of the chip can be detected conveniently, utilize negative pole probe 9 and positive pole probe 20 can detect the circuit of chip, when the circuit is normal, pilot lamp 12 is green light, when the circuit is abnormal, pilot lamp 12 is the red light, people can open third electric putter 26, and third electric putter 26 promotes ink needle 27 and moves down, marks the chip, and it is not good to have solved traditional chip test machine result of use, is not convenient for carry out the problem marked to the chip dead pixel.
When the test box is used, the first motor 2 is turned on, the first motor 2 drives the first screw rod 5 to rotate, the first screw rod 5 drives the first screw block 4 to move leftwards, the first screw block 4 drives the detection plate 6 to move leftwards, the detection plate 6 extends out of the test box 1, the chip is placed in the detection groove 7 at the top of the detection plate 6, the first motor 2 is reversed, the detection plate 6 returns to the original position, the first electric push rod 10 is turned on, the first electric push rod 10 pushes the negative probe 9 to touch the chip, the second motor 17 is turned on, the second motor 17 drives the second screw block 16 to move leftwards, the second screw block 16 drives the second electric push rod 18 to move leftwards, the second electric push rod 18 drives the stabilizing frame 19 to move leftwards, so that the transverse position of the positive probe 20 can be changed, the third motor 22 is turned on, the third motor 22 drives the third screw rod 24 to rotate, the third screw block 24 drives the third screw block 23 to move forwards, third spiral shell piece 23 drives anodal probe 20 and moves forward, thereby can change anodal probe 20's longitudinal position, open second electric putter 18, second electric putter 18 promotes stable frame 19 and moves down, thereby can drive anodal probe 20 and contact the chip, be convenient for detect each point of chip, utilize negative pole probe 9 and anodal probe 20 to detect the circuit of chip, when the circuit is normal, pilot lamp 12 is the green light, when the circuit is abnormal, pilot lamp 12 is the red light, people can open third electric putter 26, third electric putter 26 promotes ink needle 27 and moves down, mark the chip, it is not good to have solved traditional chip test machine result of use, be not convenient for carry out the problem marked to the chip dead pixel.
Although embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that changes, modifications, substitutions and alterations can be made in these embodiments without departing from the principles and spirit of the invention, the scope of which is defined in the appended claims and their equivalents.

Claims (6)

1. The utility model provides an automatic mark chip test machine of dead pixel, includes test box (1), its characterized in that: the testing device is characterized in that a first motor (2) is fixedly mounted at the bottom of an inner cavity of the testing box (1), an output end of the first motor (2) is connected with a first screw rod (5) in a transmission manner, a surface thread of the first screw rod (5) is connected with a first screw block (4), the top of the first screw block (4) is fixedly mounted with a detection plate (6) through a support, the top of the detection plate (6) is provided with a detection groove (7), the left side of the inner cavity of the testing box (1) is fixedly mounted with a first electric push rod (10) through the support, an output end of the first electric push rod (10) is fixedly mounted with a negative probe (9) through the support, the right side of the inner cavity of the testing box (1) is fixedly mounted with a second motor (17) through a mounting plate, an output end of the second motor (17) is connected with a second screw rod (13) in a transmission manner, a surface thread of the second screw rod (13) is connected with a second screw block (16), the utility model discloses a test box, including first spiral shell piece (16), the bottom fixed mounting of second spiral shell piece (16) has second electric putter (18), the output fixed mounting of second electric putter (18) has stable frame (19), the back of stable frame (19) has third motor (22) through mount pad fixed mounting, the output transmission of third motor (22) is connected with third screw rod (24), the surface thread of third screw rod (24) is connected with third spiral shell piece (23), the bottom fixed mounting of third spiral shell piece (23) has positive probe (20), the inner chamber fixed mounting of positive probe (20) has third electric putter (26), the output fixed mounting of third electric putter (26) has ink needle (27), the left top of test box (1) is provided with pilot lamp (12).
2. The chip tester for automatically marking dead spots as claimed in claim 1, wherein: the bottom of first spiral shell piece (4) is passed through support fixed mounting and is had first slider (3), first spout (8) have been seted up to the bottom of test box (1) inner chamber.
3. The chip tester for automatically marking dead spots as claimed in claim 1, wherein: the top of the second screw block (16) is fixedly provided with a second sliding block (15) through a support, and the top of the inner cavity of the test box (1) is provided with a second sliding groove (14).
4. The chip tester for automatically marking dead spots as claimed in claim 1, wherein: the top of the third screw block (23) is fixedly provided with a third sliding block (21) through a support, and the top of the inner cavity of the stabilizing frame (19) is provided with a third sliding groove (25).
5. The chip tester for automatically marking dead spots as claimed in claim 1, wherein: the left side of test box (1) is provided with control panel (11), and the surface of control panel (11) is provided with the protecting film.
6. The chip tester for automatically marking dead spots as claimed in claim 1, wherein: the bottom on the right side of the test box (1) is fixedly provided with a battery box (28), and an inner cavity of the battery box (28) is provided with a storage battery.
CN202120599270.4U 2021-03-24 2021-03-24 Chip testing machine capable of automatically marking dead spots Active CN214585863U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202120599270.4U CN214585863U (en) 2021-03-24 2021-03-24 Chip testing machine capable of automatically marking dead spots

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202120599270.4U CN214585863U (en) 2021-03-24 2021-03-24 Chip testing machine capable of automatically marking dead spots

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CN214585863U true CN214585863U (en) 2021-11-02

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CN202120599270.4U Active CN214585863U (en) 2021-03-24 2021-03-24 Chip testing machine capable of automatically marking dead spots

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN114295730A (en) * 2022-03-08 2022-04-08 神州龙芯智能科技有限公司 Chip testing device and testing method capable of automatically marking dead pixels
CN116930568A (en) * 2023-09-14 2023-10-24 成都圣芯集成电路有限公司 Millimeter wave chip test platform

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN114295730A (en) * 2022-03-08 2022-04-08 神州龙芯智能科技有限公司 Chip testing device and testing method capable of automatically marking dead pixels
CN114295730B (en) * 2022-03-08 2022-05-27 神州龙芯智能科技有限公司 Chip testing device and method capable of automatically marking dead pixel
CN116930568A (en) * 2023-09-14 2023-10-24 成都圣芯集成电路有限公司 Millimeter wave chip test platform
CN116930568B (en) * 2023-09-14 2023-12-19 成都圣芯集成电路有限公司 Millimeter wave chip test platform

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