CN214585853U - Embedded chip test seat - Google Patents
Embedded chip test seat Download PDFInfo
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- CN214585853U CN214585853U CN202120258080.6U CN202120258080U CN214585853U CN 214585853 U CN214585853 U CN 214585853U CN 202120258080 U CN202120258080 U CN 202120258080U CN 214585853 U CN214585853 U CN 214585853U
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- chip
- test socket
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Abstract
The utility model discloses an embedded chip test seat, including chip deflector, assembly curb plate, test socket main part and probe holding plate, the both ends of test socket main part all are fixed with the assembly curb plate, and evenly are provided with the screw thread pilot hole on the assembly curb plate. The utility model discloses an install the chip deflector, test socket main part, positioning fixture block and positioning slot, make the device optimize the structure of self, during the use, the user can utilize the block location structure that positioning fixture block and positioning slot constitute, fix a position the installation with connection piece and chip deflector and test socket main part, the accuracy of position when having promoted the chip deflector and having assembled with test socket main part, and utilize the locking fixed action of first locking bolt, it is fixed to lock the chip deflector after assembling with test socket main part, the holistic firm performance of device has been promoted, be convenient for carry out the chip test.
Description
Technical Field
The utility model belongs to the technical field of the chip test, concretely relates to embedded chip test seat.
Background
With the development of semiconductor technology, chips are used in more and more products, chip testing is one of the more important processes in the chip manufacturing process, and the embedded chip test socket is a frequent tool for chip testing operation, but the existing embedded chip test socket has some disadvantages.
The prior art has the following problems: 1. the existing embedded chip test socket often has the defects of difficult positioning and assembly and no assembly structure, which leads to low practicability of the device; 2. the existing embedded chip test socket also has the defect that the probe retaining plate is not easy to disassemble, assemble and maintain, which is not beneficial to the long-term popularization of the device; 3. the existing embedded chip test socket also generally has the problems of difficulty in fixing the chip and poor convenience, which causes poor using effect of the device.
SUMMERY OF THE UTILITY MODEL
To solve the problems set forth in the background art described above. The utility model provides an embedded chip test seat has the location equipment of being convenient for and fixed mounting, probe retaining plate dismantled and assembled change and be convenient for operation and the characteristics of the fixed chip of being convenient for.
In order to achieve the above object, the utility model provides a following technical scheme: the utility model provides an embedded chip test seat, includes chip deflector, assembly curb plate, test socket main part and probe retaining plate, the both ends of test socket main part all are fixed with the assembly curb plate, and evenly are provided with the screw thread pilot hole on the assembly curb plate, the inside of test socket main part is provided with the embedded groove, and the internally mounted of embedded groove has the probe retaining plate to evenly be provided with test probe on the probe retaining plate, install the chip deflector on the embedded groove of probe retaining plate one side, and four corners that the chip deflector is close to embedded groove one side all are provided with the reservation groove to the internally mounted of reservation groove has the double faced adhesive tape stationary blade, and one side that the embedded groove was kept away from to the chip deflector is fixed with operating handle.
Preferably, the inside wall of embedded groove and the lateral wall of chip deflector all are provided with rubber insulation layer, and embedded groove, chip deflector and test socket main part three's horizontal central line is on same straight line, makes it promote the insulating protective effect of device.
Preferably, the connecting pieces are welded at the two ends of one side of the chip guide plate and are provided with 4 connecting pieces, so that the structure of the device is optimized, and the assembly is facilitated.
Preferably, a positioning fixture block is welded on one side, close to the test socket main body, of the connecting sheet, a positioning fixture groove matched with the positioning fixture block is uniformly formed in the test socket main body, and a first locking bolt connected with the test socket main body is arranged on the connecting sheet, so that a user can conveniently position and assemble the chip guide plate and the test socket main body.
Preferably, the edge of probe keeper plate is fixed with the aluminum alloy and consolidates the frame, and the even welding has the reservation inserted block on the probe keeper plate, and the inside of embedded groove evenly is provided with and reserves the insertion block assorted and reserves the slot, and is provided with second locking bolt between reservation inserted block and the reservation slot, makes its convenient to use person maintain or change the probe keeper plate.
Preferably, constitute the bonding between double faced adhesive tape stationary blade and the reservation groove, one side that the reservation groove was kept away from to the double faced adhesive tape stationary blade is provided with from type paper, makes it promote the accuracy of chip position.
Compared with the prior art, the beneficial effects of the utility model are that:
1. the utility model is provided with a chip guide plate, an assembly side plate, a test socket main body, a positioning fixture block and a positioning clamping groove, the device optimizes the structure, when in use, on one hand, a user can utilize the clamping and positioning structure formed by the positioning clamping block and the positioning clamping groove to position and install the connecting sheet, the chip guide plate and the test socket main body, thereby improving the position accuracy when the chip guide plate and the test socket main body are assembled, and the assembled chip guide plate and the test socket main body can be locked and fixed by using the locking and fixing action of the first locking bolt, the integral firmness of the device is improved, the chip test is convenient, on the other hand, a user can use the action of the assembly side plate and the threaded assembly hole, the test socket main body is fixedly installed at a proper operation position through screws, so that the stability of the device is enhanced;
2. the utility model discloses an install probe retaining plate, the embedded groove, reserve the inserted block and reserve the slot, make the device optimize self performance, during the use, the user can utilize the insertion that reserves the inserted block and reserve the slot and constitute and close connection structure, cooperate the locking fixed action of second locking bolt, fix or dismantle probe retaining plate inside the embedded groove, and then convenient to use person maintains or changes probe retaining plate, be favorable to prolonging the holistic life of device, and through being fixed with aluminum alloy reinforcement frame at the edge of probe retaining plate, the structural strength of probe retaining plate has been promoted, make its non-deformable break;
3. the utility model discloses an install the double faced adhesive tape stationary blade, the probe retaining plate, chip deflector and test socket main part, when making the device specifically use, the user can tear off from the type paper on four double faced adhesive tape stationary blades, and correspond the bonding with four turnings of its chip that awaits measuring, realize the fixing to the chip, then assemble chip deflector and test socket main part, make the chip sink into the embedded groove inside and contact with the probe retaining plate, and make the test probe in close contact with that corresponds on welding ball on the chip and the probe retaining plate, be convenient for test, and utilize this chip fixed knot to construct, the accuracy of chip position has been promoted, can be after accomplishing a test, direct inside more renewed double faced adhesive tape stationary blade in four preformed grooves can, the convenience of device has been strengthened.
Drawings
Fig. 1 is a schematic front view of the present invention;
FIG. 2 is a schematic view of the front view cross section of the present invention;
FIG. 3 is a rear view of the chip guide plate of the present invention;
fig. 4 is an enlarged schematic structural view of a point a in fig. 2 according to the present invention;
in the figure: 1. connecting sheets; 2. a groove is embedded; 3. an operating handle; 4. a chip guide plate; 5. assembling the side plates; 6. testing the socket main body; 7. a threaded assembly hole; 8. a first locking bolt; 9. positioning a fixture block; 10. a probe holding plate; 11. testing the probe; 12. positioning the clamping groove; 13. reserving a groove; 14. a double-sided adhesive tape fixing piece; 15. reserving an insert block; 16. a second locking bolt; 17. and reserving the slot.
Detailed Description
The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative work belong to the protection scope of the present invention.
Referring to fig. 1-4, the present invention provides the following technical solutions: an embedded chip test socket comprises a chip guide plate 4, an assembly side plate 5, a test socket main body 6 and a probe retaining plate 10, wherein the assembly side plate 5 is fixed at both ends of the test socket main body 6, threaded assembly holes 7 are uniformly formed in the assembly side plate 5, an embedded groove 2 is formed in the test socket main body 6, the probe retaining plate 10 is arranged in the embedded groove 2, test probes 11 are uniformly arranged on the probe retaining plate 10, a chip guide plate 4 is arranged on the embedded groove 2 at one side of the probe retaining plate 10, reserved grooves 13 are formed in four corners of the chip guide plate 4 close to one side of the embedded groove 2, double-faced adhesive fixing pieces 14 are arranged in the reserved grooves 13, an operating handle 3 is fixed at one side of the chip guide plate 4 far away from the embedded groove 2, and rubber insulating layers are arranged on the inner side wall of the embedded groove 2 and the outer side wall of the chip guide plate 4, the horizontal central lines of the embedded groove 2, the chip guide plate 4 and the test socket main body 6 are on the same straight line;
when the device is used, the rubber insulating layers are arranged on the inner side wall of the embedded groove 2 and the outer side wall of the chip guide plate 4, so that the insulating and protecting effect of the device is improved;
connecting sheets 1 are welded at two ends of one side of the chip guide plate 4, and 4 connecting sheets 1 are arranged;
the structure of the device is optimized, and the assembly is convenient;
a positioning fixture block 9 is welded on one side, close to the test socket main body 6, of the connecting sheet 1, positioning fixture grooves 12 matched with the positioning fixture block 9 are uniformly arranged on the test socket main body 6, and a first locking bolt 8 connected with the test socket main body 6 is arranged on the connecting sheet 1;
when the device is used, a user can utilize a clamping and positioning structure formed by the positioning clamping block 9 and the positioning clamping groove 12 to position and install the connecting sheet 1, the chip guide plate 4 and the test socket main body 6, so that the position accuracy of the chip guide plate 4 and the test socket main body 6 during assembly is improved, and the assembled chip guide plate 4 and the test socket main body 6 can be locked and fixed by utilizing the locking and fixing action of the first locking bolt 8, so that the firmness of the whole device is improved, and chip testing is facilitated;
an aluminum alloy reinforcing frame is fixed at the edge of the probe retaining plate 10, reserved insertion blocks 15 are uniformly welded on the probe retaining plate 10, reserved insertion slots 17 matched with the reserved insertion blocks 15 are uniformly arranged in the embedded slots 2, and second locking bolts 16 are arranged between the reserved insertion blocks 15 and the reserved insertion slots 17;
when the probe retaining plate is used, a user can fix or detach the probe retaining plate 10 in the embedded groove 2 by utilizing an inserting connection structure formed by the reserved inserting block 15 and the reserved inserting groove 17 and matching with the locking and fixing action of the second locking bolt 16, so that the user can conveniently maintain or replace the probe retaining plate 10, the service life of the whole device is prolonged, and the aluminum alloy reinforcing frame is fixed at the edge of the probe retaining plate 10, so that the structural strength of the probe retaining plate 10 is improved, and the probe retaining plate is not easy to deform and break;
the double-sided adhesive fixing sheet 14 is bonded with the preformed groove 13, and release paper is arranged on one side of the double-sided adhesive fixing sheet 14, which is far away from the preformed groove 13;
during the use, the user can tear off from the type paper on four double faced adhesive tape stationary blade 14, and correspond the bonding with four turnings of its chip that awaits measuring, the realization is fixed to the chip, then assemble chip deflector 4 and test socket main part 6, make the chip sink into 2 inside embedded groove and with probe holding board 10 contact, and make the welding ball on the chip and the probe holding board 10 on the test probe 11 in close contact with that corresponds, be convenient for test, and utilize this chip fixed knot to construct, the accuracy of chip position has been promoted, can be after accomplishing a test, direct inside more renewed double faced adhesive tape stationary blade 14 in four preformed groove 13 can, the convenience of device has been strengthened.
The test probe 11 of the present invention is a known technique that has been widely used in the field of the present invention.
The utility model discloses a theory of operation and use flow: when the utility model is used, a user can firstly tear off the release paper on the four double-sided adhesive fixing sheets 14 and correspondingly bond the release paper with four corners of a chip to be tested to fix the chip, then assemble the chip guide plate 4 and the test socket main body 6 to ensure that the chip is sunk into the embedded groove 2 and is contacted with the probe retaining plate 10, and ensure that the welding balls on the chip are closely contacted with the corresponding test probes 11 on the probe retaining plate 10 for convenient test, and the chip fixing structure is utilized to improve the accuracy of the position of the chip, after one-time test is completed, the new double-sided adhesive fixing sheets 14 can be directly replaced in the four reserved grooves 13, thereby enhancing the convenience of the device, then seizing the operating handle 3, utilizing the block positioning structure consisting of the positioning clamping block 9 and the positioning clamping groove 12 to position and install the connecting sheet 1 and the chip guide plate 4 with the test socket main body 6, the accuracy of the position of the assembled chip guide plate 4 and the test socket main body 6 is improved, the assembled chip guide plate 4 and the test socket main body 6 can be locked and fixed by using the locking and fixing action of the first locking bolt 8, the integral firmness of the device is improved, the power-on test of a chip is convenient to carry out, in addition, when the device is used specifically, a user can utilize the inserting and connecting structure formed by the reserved insertion block 15 and the reserved insertion slot 17 to match with the locking and fixing action of the second locking bolt 16 to fix or disassemble the probe retaining plate 10 in the insertion slot 2, so that the user can maintain or replace the probe retaining plate 10 conveniently, the service life of the integral device is prolonged, and the aluminum alloy reinforcing frame is fixed at the edge of the probe retaining plate 10, the structural strength of the probe retaining plate 10 is improved, and the probe retaining plate is not easy to deform and break, meanwhile, a user can fixedly install the test socket main body 6 at a proper operation position through screws by utilizing the action of the assembly side plate 5 and the threaded assembly hole 7, and the stability of the device is enhanced.
Although embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that changes, modifications, substitutions and alterations can be made in these embodiments without departing from the principles and spirit of the invention, the scope of which is defined in the appended claims and their equivalents.
Claims (6)
1. The utility model provides an embedded chip test seat, includes chip deflector (4), assembly curb plate (5), test socket main part (6) and probe holding plate (10), its characterized in that: the both ends of test socket main part (6) all are fixed with assembly curb plate (5), and evenly are provided with screw thread pilot hole (7) on assembly curb plate (5), the inside of test socket main part (6) is provided with embedded groove (2), and the internally mounted of embedded groove (2) has probe retaining plate (10) to evenly be provided with test probe (11) on probe retaining plate (10), install chip deflector (4) on embedded groove (2) of probe retaining plate (10) one side, and four corners that chip deflector (4) are close to embedded groove (2) one side all are provided with reserve groove (13), and the internally mounted of reserve groove (13) has double faced adhesive tape stationary blade (14), and one side that embedded groove (2) were kept away from to chip deflector (4) is fixed with operating handle (3).
2. The embedded chip testing socket according to claim 1, wherein: the inner side wall of the embedded groove (2) and the outer side wall of the chip guide plate (4) are provided with rubber insulation layers, and the horizontal center lines of the embedded groove (2), the chip guide plate (4) and the test socket main body (6) are on the same straight line.
3. The embedded chip testing socket according to claim 1, wherein: connecting pieces (1) are welded at two ends of one side of the chip guide plate (4), and 4 connecting pieces (1) are arranged.
4. The embedded chip test socket according to claim 3, wherein: one side of the connecting piece (1) close to the test socket main body (6) is welded with a positioning fixture block (9), the test socket main body (6) is evenly provided with a positioning fixture groove (12) matched with the positioning fixture block (9), and the connecting piece (1) is provided with a first locking bolt (8) connected with the test socket main body (6).
5. The embedded chip testing socket according to claim 1, wherein: the edge of probe keeper board (10) is fixed with the aluminum alloy and consolidates the frame, and probe keeper board (10) go up even welding have reserve inserted block (15), the inside of embedded groove (2) evenly be provided with reserve inserted block (15) assorted reserve slot (17), and reserve inserted block (15) and reserve and be provided with second locking bolt (16) between slot (17).
6. The embedded chip testing socket according to claim 1, wherein: constitute between double faced adhesive tape stationary blade (14) and reserve groove (13) and bond, one side that reserve groove (13) was kept away from in double faced adhesive tape stationary blade (14) is provided with from type paper.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202120258080.6U CN214585853U (en) | 2021-01-29 | 2021-01-29 | Embedded chip test seat |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202120258080.6U CN214585853U (en) | 2021-01-29 | 2021-01-29 | Embedded chip test seat |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN214585853U true CN214585853U (en) | 2021-11-02 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202120258080.6U Active CN214585853U (en) | 2021-01-29 | 2021-01-29 | Embedded chip test seat |
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| Country | Link |
|---|---|
| CN (1) | CN214585853U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN115598384A (en) * | 2022-10-18 | 2023-01-13 | 上海燧原科技有限公司（Cn） | Link electromigration test fixture and preparation method thereof |
-
2021
- 2021-01-29 CN CN202120258080.6U patent/CN214585853U/en active Active
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN115598384A (en) * | 2022-10-18 | 2023-01-13 | 上海燧原科技有限公司（Cn） | Link electromigration test fixture and preparation method thereof |
| CN115598384B (en) * | 2022-10-18 | 2023-08-08 | 上海燧原科技有限公司 | Link electromigration test fixture and preparation method thereof |
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