CN214585850U - Chip dynamic testing device - Google Patents
Chip dynamic testing device Download PDFInfo
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- CN214585850U CN214585850U CN202120084869.4U CN202120084869U CN214585850U CN 214585850 U CN214585850 U CN 214585850U CN 202120084869 U CN202120084869 U CN 202120084869U CN 214585850 U CN214585850 U CN 214585850U
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Abstract
The utility model relates to a chip testing arrangement technical field just discloses a chip dynamic testing arrangement, the camera includes a supporting plate, four spacing holes have been seted up at the top of backup pad, the internal surface swing joint in spacing hole has the gag lever post, the bottom of gag lever post is connected with the fixed block, the bottom of fixed block is provided with removes the wheel, the top of fixed block is connected with damping spring, damping spring's top and backup pad are connected, damping spring's internal surface is connected with the gag lever post, the top of gag lever post is connected with the limiting plate, the top of backup pad is connected with cabinet body. This chip dynamic testing device, through backup pad, spacing hole, gag lever post, fixed block, the structure of removing wheel and limiting plate, can be convenient for to the removal of cabinet body, through damping spring's structure, can play absorbing effect to the cabinet body in the removal, the protection cabinet body does not receive the damage.
Description
Technical Field
The utility model relates to a chip testing arrangement technical field specifically is a chip dynamic testing arrangement.
Background
In recent years, the rapid development of electronic technology has enabled the application field of integrated circuits to be wider and wider, and some important fields such as military industry, aviation, aerospace and the like are applied to integrated circuits in large quantities, meanwhile, the working frequency of the integrated circuits is continuously improved, the complexity is continuously increased, the reliability of the integrated circuits is also more and more concerned by people, and in the reliability test of the integrated circuits, the high-temperature dynamic aging test is the most important one. The aging equipment of the domestic third generation/fourth generation integrated circuit adopts the technology of testing the function of the integrated circuit while aging.
Some chip dynamic test devices on the market currently:
(1) in the moving process of the chip testing device, no damping effect is exerted on the chip testing device, and internal parts of the chip dynamic testing device can be damaged due to the bumpy road surface in the moving process, so that the service life of the device is shortened;
(2) in the process of the chip testing device, the chip needs to be placed in the heating box, but the current heating box is positioned in the device, so that the chip is inconvenient to use and inconvenient to use in the process of placing and taking the chip.
We have therefore proposed a dynamic chip test apparatus in order to solve the problems set forth above.
SUMMERY OF THE UTILITY MODEL
Technical problem to be solved
To the not enough of prior art in the above-mentioned background art, the utility model aims to provide a chip dynamic testing device to solve some chip dynamic testing devices on the existing market that propose in the above-mentioned background art, the in-process extremely inconvenient problem of placing and taking to chip testing device's cushioning effect and to the chip exists.
(II) technical scheme
In order to achieve the above purpose, the utility model discloses a following technical scheme realizes:
a chip dynamic testing device comprises a supporting plate, wherein four limiting holes are formed in the top of the supporting plate, limiting rods are movably connected to the inner surfaces of the limiting holes, a fixed block is connected to the bottom end of each limiting rod, moving wheels are arranged at the bottom of each fixed block, a damping spring is connected to the top of each fixed block, the top end of each damping spring is connected with the supporting plate, the inner surface of each damping spring is connected with the corresponding limiting rod, a limiting plate is connected to the top end of each limiting rod, a cabinet body is connected to the top of the supporting plate, a display screen is connected to the right end of the front side of the cabinet body, a plurality of placing grooves are formed in the front side of the cabinet body, a temperature controller is connected to the inner wall of the left side of each placing groove, the bottom of each temperature controller is connected with the placing grooves, a connecting block is connected to the right side of each temperature controller, and the bottom of each connecting block is connected with the placing grooves, the top of the connecting block is connected with an aging plate, the right side of the connecting block is connected with the placing groove, the top of the aging plate is connected with a heating box, and the front side of the connecting block is connected with a handle;
two spouts have been seted up to the inner diapire of standing groove, the internal connection of spout has the slider, the top and the connecting block of slider are connected, the inner chamber has been seted up to the cabinet body, the internal connection of inner chamber has the fly leaf, the left side of fly leaf is connected with the dead lever, the right side of fly leaf is connected with powerful spring, the spacing groove has been seted up on the right side of slider, the internal surface and the dead lever in spacing groove are connected, the front side of fly leaf is connected with the slide, the front side of inner chamber is seted up and is equipped with the slide opening, the inside and the slide connection of slide opening.
Preferably, the outer surface of the limiting rod is movably connected with the inner surface of the limiting hole, the top of the fixed block is fixed with the bottom of the limiting rod, the bottom of the fixed block is movably connected with a moving wheel through a pin shaft, the bottom of the damping spring is fixed with the top of the fixed block, the top of the damping spring is fixed with the bottom of the supporting plate, the inner surface of the damping spring is movably connected with the outer surface of the limiting rod, the bottom of the limiting plate is fixed with the top of the limiting rod, the top of the supporting plate is fixed with the bottom of the cabinet body, the rear side of the display screen is fixed with the right end of the front side of the cabinet body, the left side of the temperature controller is fixed with the inner wall of the left side of the placing groove, the bottom of the temperature controller is fixed with the inner bottom wall of the placing groove, the left side of the connecting block is movably connected with the lower portion of the right side of the temperature controller, and the bottom of the inner bottom of the placing groove is movably connected with the inner wall of the placing groove, the right side of the connecting block is movably connected with the lower portion of the inner wall of the right side of the placing groove, the bottom of the aging plate is fixed with the top of the connecting block, and the bottom of the heating box is fixed with the top of the aging plate.
Preferably, the rear portion of handle is fixed with the front side of connecting block, the surface of slider and the internal surface swing joint of spout, the top of slider is fixed with the bottom of connecting block, the top and the bottom of fly leaf respectively with the interior roof and the interior diapire swing joint of inner chamber, the right-hand member of dead lever is fixed with the left side of fly leaf, the left end of powerful spring is fixed with the right side of fly leaf, the right-hand member of powerful spring is fixed with the right side inner wall of inner chamber, the internal surface of spacing groove and the surface swing joint of dead lever, the rear side of slide is fixed with the front side of fly leaf, the middle part of slide and the inside swing joint of slide opening.
Preferably, the outer surface of the limiting rod is in sliding connection with the inner surface of the limiting hole, the inner surface of the damping spring is in sliding connection with the outer surface of the limiting rod, the left side of the connecting block is in sliding connection with the lower portion of the right side of the temperature controller, the bottom of the connecting block is in sliding connection with the inner bottom wall of the placing groove, and the right side of the connecting block is movably connected with the lower portion of the inner wall of the right side of the placing groove.
Furthermore, the outer surface of the sliding block is in sliding connection with the inner surface of the sliding groove, the top and the bottom of the movable plate are in sliding connection with the inner top wall and the inner bottom wall of the inner cavity respectively, the inner surface of the limiting groove is in sliding connection with the outer surface of the fixed rod, and the middle of the sliding plate is in sliding connection with the inside of the sliding hole.
Furthermore, the four limiting holes are arranged in a rectangular shape and the like, and the front part of the sliding plate is positioned outside the sliding hole.
Further, the limiting plate is located above the supporting plate, and the heating box is located inside the placing groove.
(III) advantageous effects
Compared with the prior art, the beneficial effects of the utility model are that: this chip dynamic test device:
(1) through the structure of backup pad, spacing hole, gag lever post, fixed block, removal wheel and limiting plate, can be convenient for to the removal of cabinet body, through damping spring's structure, can play absorbing effect to the cabinet body in the removal, the protection cabinet body does not receive the damage.
(2) Through the structure that is provided with standing groove, handle, spout and slider on the cabinet body, can be convenient for pull out the connecting block from the standing groove, through the structure that is provided with inner chamber, fly leaf, dead lever, powerful spring, spacing groove, slide and slide opening on the cabinet body, can be convenient for fix the slider, prevent the autonomous movement of slider.
Drawings
Fig. 1 is a schematic front view of the dynamic chip testing device of the present invention;
fig. 2 is a schematic perspective view of a limiting plate of the dynamic chip testing device of the present invention;
fig. 3 is a schematic front view of the placement groove of the dynamic chip testing device of the present invention;
fig. 4 is a schematic perspective view of a connecting block of the dynamic chip testing device of the present invention;
fig. 5 is an enlarged schematic view of the structure at a in fig. 3 of the dynamic chip testing device of the present invention;
FIG. 6 is a schematic diagram of a side view of an inner cavity of the dynamic chip testing device according to the present invention;
fig. 7 is a schematic perspective view of the movable plate structure of the dynamic chip testing device of the present invention.
In the figure: 1. a support plate; 2. a limiting hole; 3. a limiting rod; 4. a fixed block; 5. a moving wheel; 6. a damping spring; 7. a limiting plate; 8. a cabinet body; 9. a display screen; 10. a placement groove; 11. a temperature controller; 12. Connecting blocks; 13. aging the board; 14. a heating cartridge; 15. a handle; 16. a chute; 17. a slider; 18. An inner cavity; 19. a movable plate; 20. fixing the rod; 21. a strong spring; 22. a limiting groove; 23. a slide plate; 24. and (4) a slide hole.
Detailed Description
The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative work belong to the protection scope of the present invention.
Referring to fig. 1-7, the present invention provides a dynamic chip testing apparatus; the cabinet body damping device comprises a supporting plate 1, four limiting holes 2 are formed in the top of the supporting plate 1, limiting rods 3 are movably connected to the inner surfaces of the limiting holes 2, fixed blocks 4 are connected to the bottom ends of the limiting rods 3, moving wheels 5 are arranged at the bottoms of the fixed blocks 4, damping springs 6 are connected to the tops of the fixed blocks 4, the top ends of the damping springs 6 are connected with the supporting plate 1, the inner surfaces of the damping springs 6 are connected with the limiting rods 3, limiting plates 7 are connected to the top ends of the limiting rods 3, a cabinet body 8 is connected to the top of the supporting plate 1, the moving wheels 5 and the limiting plates 7 can be moved conveniently through the supporting plate 1, the limiting holes 2, the limiting rods 3, the fixed blocks 4, the moving wheels 5 and the limiting plates 7, a damping effect can be achieved on the moving cabinet body 8 through the structures of the damping springs 6, the cabinet body 8 can be protected from being damaged, and a display screen 9 is connected to the right end of the front side of the cabinet body 8, a plurality of placing grooves 10 are formed in the front side of the cabinet body 8, a temperature controller 11 is connected to the inner wall of the left side of each placing groove 10, the bottom of each temperature controller 11 is connected with the corresponding placing groove 10, a connecting block 12 is connected to the right side of each temperature controller 11, the bottom of each connecting block 12 is connected with the corresponding placing groove 10, an aging plate 13 is connected to the top of each connecting block 12, the right side of each connecting block 12 is connected with the corresponding placing groove 10, a heating box 14 is connected to the top of each aging plate 13, and a handle 15 is connected to the front side of each connecting block 12;
two sliding grooves 16 are formed in the inner bottom wall of the placing groove 10, a sliding block 17 is connected to the inside of each sliding groove 16, the top of each sliding block 17 is connected with a connecting block 12, an inner cavity 18 is formed in the cabinet body 8, a movable plate 19 is connected to the inside of each inner cavity 18, a fixed rod 20 is connected to the left side of each movable plate 19, a strong spring 21 is connected to the right side of each movable plate 19, a limiting groove 22 is formed in the right side of each sliding block 17, the inner surface of each limiting groove 22 is connected with the corresponding fixed rod 20, a sliding plate 23 is connected to the front side of each movable plate 19, a sliding hole 24 is formed in the front side of each inner cavity 18, the inside of each sliding hole 24 is connected with the corresponding sliding plate 23, the connecting block 12 can be conveniently pulled out of the placing groove 10 through the structure that the placing groove 10, the handles 15, the sliding grooves 16 and the sliding blocks 17 are arranged on the cabinet body 8, and the inner cavities 18, the movable plates 19, the fixed rods 20, the strong springs 21 and the limiting grooves 22 are arranged on the cabinet body 8, The structure of the sliding plate 23 and the sliding hole 24 can facilitate the fixation of the sliding block 17 and prevent the self-movement of the sliding block 17;
as an optimal technical solution of the utility model: the outer surface of the limiting rod 3 is movably connected with the inner surface of the limiting hole 2, the top of the fixing block 4 is fixed with the bottom end of the limiting rod 3, the bottom of the fixing block 4 is movably connected with a moving wheel 5 through a pin shaft, the bottom end of a damping spring 6 is fixed with the top of the fixing block 4, the top of the damping spring 6 is fixed with the bottom of the supporting plate 1, the inner surface of the damping spring 6 is movably connected with the outer surface of the limiting rod 3, the bottom of the limiting plate 7 is fixed with the top of the limiting rod 3, the top of the supporting plate 1 is fixed with the bottom of the cabinet body 8, the rear side of the display screen 9 is fixed with the right end of the front side of the cabinet body 8, the left side of the temperature controller 11 is fixed with the inner wall of the left side of the placing groove 10, the bottom of the temperature controller 11 is fixed with the inner bottom wall of the placing groove 10, the left side of the connecting block 12 is movably connected with the lower portion of the right side of the temperature controller 11, the bottom of the connecting block 12 is movably connected with the inner bottom wall of the placing groove 10, the right side of the connecting block 12 is movably connected with the lower part of the inner wall of the right side of the placing groove 10, the bottom of the aging plate 13 is fixed with the top of the connecting block 12, and the bottom of the heating box 14 is fixed with the top of the aging plate 13;
as an optimal technical solution of the utility model: the rear part of the handle 15 is fixed with the front side of the connecting block 12, the outer surface of the sliding block 17 is movably connected with the inner surface of the sliding groove 16, the top of the sliding block 17 is fixed with the bottom of the connecting block 12, the top and the bottom of the movable plate 19 are respectively movably connected with the inner top wall and the inner bottom wall of the inner cavity 18, the right end of the fixed rod 20 is fixed with the left side of the movable plate 19, the left end of the strong spring 21 is fixed with the right side of the movable plate 19, the right end of the strong spring 21 is fixed with the right inner wall of the inner cavity 18, the inner surface of the limiting groove 22 is movably connected with the outer surface of the fixed rod 20, the rear side of the sliding plate 23 is fixed with the front side of the movable plate 19, and the middle part of the sliding plate 23 is movably connected with the inside of the sliding hole 24;
as an optimal technical solution of the utility model: the outer surface of the limiting rod 3 is connected with the inner surface of the limiting hole 2 in a sliding mode, the inner surface of the damping spring 6 is connected with the outer surface of the limiting rod 3 in a sliding mode, the left side of the connecting block 12 is connected with the lower portion of the right side of the temperature controller 11 in a sliding mode, the bottom of the connecting block 12 is connected with the inner bottom wall of the placing groove 10 in a sliding mode, the right side of the connecting block 12 is movably connected with the lower portion of the inner wall of the right side of the placing groove 10, and the connecting block 12 can slide back and forth conveniently;
as an optimal technical solution of the utility model: the outer surface of the sliding block 17 is connected with the inner surface of the sliding chute 16 in a sliding way, the top and the bottom of the movable plate 19 are respectively connected with the inner top wall and the inner bottom wall of the inner cavity 18 in a sliding way, the inner surface of the limiting groove 22 is connected with the outer surface of the fixed rod 20 in a sliding way, and the middle part of the sliding plate 23 is connected with the inside of the sliding hole 24 in a sliding way, so that the fixed rod 20 can move conveniently;
as an optimal technical solution of the utility model: the four limiting holes 2 are arranged in a rectangular shape and the like, and the front part of the sliding plate 23 is positioned outside the sliding hole 24, so that the sliding plate 23 can be conveniently moved in the sliding hole 24;
as an optimal technical solution of the utility model: the limit plate 7 is positioned above the support plate 1, and the heating box 14 is positioned inside the placing groove 10, so that the heating box 14 can be conveniently pulled out.
The working principle of the embodiment is as follows: when the chip dynamic testing device is used, as shown in fig. 1-7, the device integrally comprises a supporting plate 1, a limiting rod 3, a fixing block 4, a moving wheel 5, a cabinet body 8 and a display screen 9, when the device needs to move, the device is pushed to start moving, and in the moving process, a damping spring 6 can play a role in damping the cabinet body 8;
as shown in fig. 2-7, when the device needs to pull out the heating box 14, the sliding plate 23 is pulled to the right, the sliding plate 23 drives the movable plate 19 to move to the right, the movable plate 19 drives the fixed rod 20 to move out of the limiting groove 22, then the handle 15 is pulled, the handle 15 drives the connecting block 12 to move forwards, the connecting block 12 and the heating box 14 on the connecting block 12 are pulled out, the chip is taken out and then the connection block 12 is returned to the original position, at which time a leftward elastic force is applied to the movable plate 19 by the strong spring 21, then the movable plate 19 drives the fixed rod 20 to move leftwards until the left end of the fixed rod 20 is positioned in the limiting groove 22, the sliding block 17 can be fixed to prevent the connecting block 12 from moving autonomously, which is the working process of the whole device, and those not described in detail in this specification are well within the skill of those in the art.
Although the present invention has been described in detail with reference to the foregoing embodiments, it should be noted that, in the present invention, unless otherwise explicitly specified or limited, the terms "set", "mounted", "connected", "fixed", and the like are to be interpreted broadly, and may be, for example, either fixedly connected or detachably connected; or indirectly through an intermediary. The specific meaning of the above terms in the present invention can be understood according to specific situations by those skilled in the art; it will be appreciated by those skilled in the art that modifications may be made to the above-described embodiments, or equivalents may be substituted for elements thereof, and any modifications, equivalents, improvements and the like which fall within the spirit and scope of the present invention may be resorted to.
Claims (7)
1. The chip dynamic testing device comprises a supporting plate (1) and is characterized in that four limiting holes (2) are formed in the top of the supporting plate (1), limiting rods (3) are movably connected to the inner surfaces of the limiting holes (2), fixed blocks (4) are connected to the bottom ends of the limiting rods (3), moving wheels (5) are arranged at the bottoms of the fixed blocks (4), damping springs (6) are connected to the tops of the fixed blocks (4), the top ends of the damping springs (6) are connected with the supporting plate (1), the inner surfaces of the damping springs (6) are connected with the limiting rods (3), limiting plates (7) are connected to the top ends of the limiting rods (3), a cabinet body (8) is connected to the top of the supporting plate (1), a display screen (9) is connected to the right end of the front side of the cabinet body (8), and a plurality of placing grooves (10) are formed in the front side of the cabinet body (8), the temperature controller (11) is connected to the inner wall of the left side of the placing groove (10), the bottom of the temperature controller (11) is connected with the placing groove (10), the right side of the temperature controller (11) is connected with the connecting block (12), the bottom of the connecting block (12) is connected with the placing groove (10), the top of the connecting block (12) is connected with the aging plate (13), the right side of the connecting block (12) is connected with the placing groove (10), the top of the aging plate (13) is connected with the heating box (14), and the front side of the connecting block (12) is connected with the handle (15);
two chutes (16) are opened to the inner bottom wall of the placing groove (10), the internal connection of the chutes (16) is provided with a slider (17), the top of the slider (17) is connected with the connecting block (12), the cabinet body (8) is provided with an inner cavity (18), the internal connection of the inner cavity (18) is provided with a movable plate (19), the left side of the movable plate (19) is connected with a fixing rod (20), the right side of the movable plate (19) is connected with a strong spring (21), the right side of the slider (17) is provided with a limiting groove (22), the inner surface of the limiting groove (22) is connected with the fixing rod (20), the front side of the movable plate (19) is connected with a sliding plate (23), the front side of the inner cavity (18) is provided with a sliding hole (24), and the inside of the sliding hole (24) is connected with the sliding plate (23).
2. The dynamic chip testing device according to claim 1, wherein the outer surface of the limiting rod (3) is movably connected with the inner surface of the limiting hole (2), the top of the fixing block (4) is fixed with the bottom end of the limiting rod (3), the bottom of the fixing block (4) is movably connected with a moving wheel (5) through a pin shaft, the bottom end of the damping spring (6) is fixed with the top of the fixing block (4), the top of the damping spring (6) is fixed with the bottom of the supporting plate (1), the inner surface of the damping spring (6) is movably connected with the outer surface of the limiting rod (3), the bottom of the limiting plate (7) is fixed with the top of the limiting rod (3), the top of the supporting plate (1) is fixed with the bottom of the cabinet body (8), the rear side of the display screen (9) is fixed with the right end of the front side of the cabinet body (8), the left side of temperature controller (11) is fixed with the left side inner wall of standing groove (10), the bottom of temperature controller (11) is fixed with the interior diapire of standing groove (10), the left side of connecting block (12) and the right side lower part swing joint of temperature controller (11), the bottom of connecting block (12) and the interior diapire swing joint of standing groove (10), the right side of connecting block (12) and the right side inner wall lower part swing joint of standing groove (10), the bottom of ageing board (13) is fixed with the top of connecting block (12), the bottom of heating box (14) is fixed with the top of ageing board (13).
3. The dynamic chip testing device as claimed in claim 1, wherein the rear portion of the handle (15) is fixed to the front side of the connecting block (12), the outer surface of the slider (17) is movably connected to the inner surface of the sliding slot (16), the top portion of the slider (17) is fixed to the bottom portion of the connecting block (12), the top portion and the bottom portion of the movable plate (19) are respectively movably connected to the inner top wall and the inner bottom wall of the cavity (18), the right end of the fixing rod (20) is fixed to the left side of the movable plate (19), the left end of the strong spring (21) is fixed to the right side of the movable plate (19), the right end of the strong spring (21) is fixed to the right inner wall of the cavity (18), the inner surface of the limiting slot (22) is movably connected to the outer surface of the fixing rod (20), the rear side of the sliding plate (23) is fixed to the front side of the movable plate (19), the middle part of the sliding plate (23) is movably connected with the inside of the sliding hole (24).
4. The dynamic chip testing device according to claim 2, wherein the outer surface of the limiting rod (3) is slidably connected with the inner surface of the limiting hole (2), the inner surface of the damping spring (6) is slidably connected with the outer surface of the limiting rod (3), the left side of the connecting block (12) is slidably connected with the lower portion of the right side of the temperature controller (11), the bottom of the connecting block (12) is slidably connected with the inner bottom wall of the placing groove (10), and the right side of the connecting block (12) is movably connected with the lower portion of the inner right side wall of the placing groove (10).
5. The dynamic chip testing device according to claim 3, wherein the outer surface of the sliding block (17) is slidably connected with the inner surface of the sliding groove (16), the top and bottom of the movable plate (19) are slidably connected with the inner top wall and the inner bottom wall of the inner cavity (18), respectively, the inner surface of the limiting groove (22) is slidably connected with the outer surface of the fixed rod (20), and the middle of the sliding plate (23) is slidably connected with the inside of the sliding hole (24).
6. The dynamic chip testing device according to claim 1, wherein the four limiting holes (2) are arranged in a rectangular shape, and the front part of the sliding plate (23) is located outside the sliding hole (24).
7. The dynamic chip testing device according to claim 1, wherein the limiting plate (7) is located above the supporting plate (1), and the heating box (14) is located inside the placing groove (10).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202120084869.4U CN214585850U (en) | 2021-01-13 | 2021-01-13 | Chip dynamic testing device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202120084869.4U CN214585850U (en) | 2021-01-13 | 2021-01-13 | Chip dynamic testing device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN214585850U true CN214585850U (en) | 2021-11-02 |
Family
ID=78368526
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202120084869.4U Active CN214585850U (en) | 2021-01-13 | 2021-01-13 | Chip dynamic testing device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN214585850U (en) |
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2021
- 2021-01-13 CN CN202120084869.4U patent/CN214585850U/en active Active
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Address after: No. 101.102, Building 12, No. 88 Keyuan South Road, High tech Zone, Chengdu, Sichuan, 610041 Patentee after: Chengdu Hantong Integrated Technology Co.,Ltd. Address before: 610000 No. 101 and 102, building 12, No. 88, Keyuan South Road, high tech Zone, Chengdu, Sichuan Patentee before: CHENGDU CHINAR INTEGRATED TECHNOLOGY CO.,LTD. |