CN214585563U - Test fixture suitable for multiple circuit boards - Google Patents
Test fixture suitable for multiple circuit boards Download PDFInfo
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- CN214585563U CN214585563U CN202023330264.3U CN202023330264U CN214585563U CN 214585563 U CN214585563 U CN 214585563U CN 202023330264 U CN202023330264 U CN 202023330264U CN 214585563 U CN214585563 U CN 214585563U
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Abstract
The utility model relates to a circuit board test fixture field discloses a test fixture suitable for multiple circuit board. The method comprises the following steps: the test pedestal, slidingtype assembly is in the first slide rail board and the second slide rail board of test pedestal, locates first support plate and second support plate on first slide rail board and the second slide rail board respectively, offers first support plate and second support plate, is used for placing the recess that detects the product, covers in the apron of second support plate in the pressure, locates the detection device on the test pedestal, and detection device includes: the probe comprises a pressing plate, a vertical guide rod, a driving assembly, a probe body, a first detection needle and a second detection needle. Through the arrangement of the first sliding rail plate, the second sliding rail plate, the first carrier plate, the second carrier plate, the cover plate and the detection device, test products of different types can be placed on the jig, detection points are concentrated together for one-time testing, quick testing and detection are convenient to realize, and the application range of the testing efficiency and the jig is improved.
Description
Technical Field
The utility model relates to a circuit board test fixture field, in particular to test fixture suitable for multiple circuit board.
Background
In the prior art, for a circuit board produced in small batches, generally, a universal meter is directly used for testing the voltage and the current between two measuring points on the circuit board, and then whether the circuit board is qualified is judged, however, the testing method needs to manually contact the testing probes with the testing points of the circuit board one by one, so that the defect of low testing working efficiency exists, and meanwhile, most of the testing jigs can only detect one corresponding product structure, and can not detect products of different types, so that the application range of the jig is reduced.
SUMMERY OF THE UTILITY MODEL
For solving the technical problem, the utility model provides a test fixture suitable for multiple circuit board through first slide rail board, second slide rail board, first support plate, second support plate, apron and detection device's setting, makes the test product that can place the different grade type on this tool to concentrate the check point together, be used for disposable test, be convenient for realize quick test and detection, improved the application scope of efficiency of software testing and tool.
In order to achieve the above purpose, the technical scheme of the utility model is as follows:
a test fixture suitable for multiple circuit boards, comprising:
a test pedestal;
the test bench comprises a first slide rail plate and a second slide rail plate which are assembled on the test bench in a sliding manner, a first carrier plate and a second carrier plate which are respectively arranged on the first slide rail plate and the second slide rail plate, grooves which are arranged on the first carrier plate and the second carrier plate and used for placing a detection product, a cover plate which is pressed on the second carrier plate, and an electromagnetic suction seat which is arranged on the test bench and used for limiting the second slide rail plate and the second carrier plate;
locate detection device on the test pedestal, detection device includes: locate the test pedestal is located the clamp plate of first support plate and second support plate top corresponding position, locate the test pedestal with clamp plate complex vertical guide arm, locating the test pedestal is used for the drive the clamp plate carries out oscilaltion motion's drive assembly, locates the clamp plate is used for detecting the probe body and the first detection needle of product on the first support plate and locate the clamp plate is used for detecting the second detection needle of product on the second support plate.
The technical scheme is realized, firstly, a product to be tested is placed in grooves of a first carrier plate and a second carrier plate, then the first slide rail plate, the second slide rail plate, the first carrier plate, the second carrier plate and a cover plate are assembled, the first slide rail plate is pushed to drive the second slide rail plate, the first carrier plate, the second carrier plate and the cover plate to synchronously move, the second slide rail plate and the second carrier plate are abutted against an electromagnetic suction seat, at the moment, the electromagnetic suction seat is connected with a power supply, then, a driving assembly is started, a pressing plate moves downwards, a probe body is firstly contacted with a test product on the first carrier plate, the detection is realized, and a first detection needle and a second detection needle respectively detect the test product on the first carrier plate and the second carrier plate.
As an optimized scheme of the utility model, be provided with the slide rail seat on the test pedestal, be provided with the slider on the slide rail seat, the slider with first slide rail board and second slide rail board are connected.
As an optimized scheme of the utility model, still be provided with on the test pedestal with the gyro wheel seat that first slide rail board and second slide rail board contacted mutually.
According to the technical scheme, the slide blocks are matched with the slide rail seats, and the roller seats are arranged, so that the motion stability and the smoothness of the first slide rail plate and the second slide rail plate are improved.
As an optimized scheme of the utility model, the second support plate press cover in on the first support plate.
By the technical scheme, the first carrier plate is guaranteed to be stable during detection, and the first carrier plate and the second carrier plate are linked.
As an optimized scheme of the utility model, the clamp plate with the cooperation department of vertical guide arm is provided with the flange bearing.
By adopting the technical scheme, the friction between the pressing plate and the vertical guide rod is reduced, and the detection precision is improved.
As a preferred aspect of the present invention, the driving assembly includes: locate test pedestal, orientation the first cylinder of clamp plate, the output of first cylinder be provided with the telescopic link that the clamp plate bottom is connected.
According to the technical scheme, the telescopic rod is driven to move up and down by starting the first air cylinder, and the pressing plate is driven to move up and down.
As an optimized scheme of the utility model, the probe body passes through the probe seat to be installed on the clamp plate.
By adopting the technical scheme, the probe body is more firm in detection.
As an optimized scheme of the utility model, first detection needle and second detection needle are all in through setting up second cylinder on the clamp plate carries out the up-and-down motion.
As an optimized scheme of the utility model, the confession has been seted up on the second support plate the second detects the needle and passes through and detect the logical groove of test product.
To sum up, the utility model discloses following beneficial effect has: firstly, placing a product to be tested in the grooves on the first carrier plate and the second carrier plate, then assembling the first slide rail plate, the second slide rail plate, the first carrier plate, the second carrier plate and the cover plate, pushing the first slide rail plate to drive the second slide rail plate, the first carrier plate, the second carrier plate and the cover plate to synchronously move, enabling the second slide rail plate and the second carrier plate to be abutted against the electromagnetic suction seat, at the moment, the electromagnetic suction seat is connected with a power supply, and then the pressing plate moves downwards by starting the driving assembly, so that the probe body is firstly contacted with a test product on the first carrier plate to realize detection, the first detection pin and the second detection pin respectively detect the test products on the first carrier plate and the second carrier plate, so that different types of test products can be placed on the jig, and the detection points are integrated together for one-time test, so that rapid test and detection are conveniently realized, and the test efficiency and the application range of the jig are improved.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to these drawings without creative efforts.
Fig. 1 is a schematic view of the overall structure of the present invention.
Fig. 2 is a schematic diagram of the plate separating structure of the present invention.
Fig. 3 is a schematic structural diagram of the testing pedestal of the present invention.
The corresponding part names indicated by the numbers and letters in the drawings:
1. a test pedestal; 2. a groove; 3. a first carrier plate; 4. a first slide rail plate; 5. a second slide rail plate; 6. a second carrier plate; 7. a cover plate; 8. a slider; 9. a first cylinder; 10. a vertical guide rod; 11. an electromagnetic suction seat; 12. a second cylinder; 13. a first detection pin; 14. a probe base; 15. a probe body; 16. pressing a plate; 17. a flange bearing; 18. a through groove; 19. a roller seat; 20. a slide rail seat; 21. and a second detection pin.
Detailed Description
The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative efforts belong to the protection scope of the present invention.
Examples
As shown in fig. 1 to 3, the utility model relates to a test fixture suitable for multiple circuit board, include: the test bench comprises a test bench 1, a first slide rail plate 4 and a second slide rail plate 5 which are assembled on the test bench 1 in a sliding mode, a first carrier plate 3 and a second carrier plate 6 which are respectively arranged on the first slide rail plate 4 and the second slide rail plate 5, a groove 2 which is arranged on the first carrier plate 3 and the second carrier plate 6 and used for placing a detection product, a cover plate 7 which is pressed on the second carrier plate 6, and an electromagnetic suction seat 11 which is arranged on the test bench 1 and used for limiting the second slide rail plate 5 and the second carrier plate 6.
Wherein, be provided with slide rail seat 20 on the test pedestal 1, be provided with slider 8 on the slide rail seat 20, slider 8 is connected with first slide rail board 4 and second slide rail board 5. The test pedestal 1 is also provided with a roller seat 19 which is contacted with the first slide rail plate 4 and the second slide rail plate 5, and the movement stability and the fluency of the first slide rail plate 4 and the second slide rail plate 5 are improved through the matching of the slide block 8 and the slide rail seat 20 and the arrangement of the roller seat 19.
The second carrier 6 is pressed on the first carrier 3, so that the stability of the first carrier 3 during detection is ensured, and the first carrier 3 and the second carrier 6 have linkage.
Further, a detection device provided on the test stand 1 includes: the test device comprises a pressing plate 16, a vertical guide rod 10, a driving assembly, a probe body 15, a first detection needle 13 and a second detection needle 21, wherein the pressing plate 16 is arranged on the test pedestal 1 and is located at a corresponding position above the first carrier plate 3 and the second carrier plate 6, the vertical guide rod 10 is arranged on the test pedestal 1 and is matched with the pressing plate 16, the driving assembly is arranged on the test pedestal 1 and is used for driving the pressing plate 16 to move up and down, the probe body 15 and the first detection needle 13 are arranged on the pressing plate 16 and are used for detecting products on the first carrier plate 3, and the second detection needle 21 is arranged on the pressing plate 16 and is used for detecting products on the second carrier plate 6.
The flange bearing 17 is arranged at the matching position of the pressure plate 16 and the vertical guide rod 10, so that the friction between the pressure plate 16 and the vertical guide rod 10 is reduced, and the detection precision is improved.
The drive assembly includes: locate test pedestal 1, towards the first cylinder 9 of clamp plate 16, the output of first cylinder 9 is provided with the telescopic link of being connected with clamp plate 16 bottom, through starting first cylinder 9, makes the telescopic link carry out the oscilaltion motion, drives clamp plate 16 and carries out the oscilaltion motion.
The probe body 15 is mounted on the pressure plate 16 through the probe seat 14, so that the probe body 15 is more firm during detection.
The first sensing pin 13 and the second sensing pin 21 are moved up and down by a second cylinder 12 provided on the pressing plate 16.
The second carrier 6 is provided with a through slot 18 for the second detection pin 21 to pass through and detect the test product.
In this embodiment, the product to be tested is placed in the groove 2 on the first carrier plate 3 and the second carrier plate 6, then the first sliding rail plate 4, the second sliding rail plate 5, the first carrier plate 3, the second carrier plate 6 and the cover plate 7 are assembled, the first sliding rail plate 4 is pushed to drive the second sliding rail plate 5, the first carrier plate 3, the second carrier plate 6 and the cover plate 7 to move synchronously, so that the second sliding rail plate 5 and the second carrier plate 6 are abutted against the electromagnetic suction seat 11, at this time, the electromagnetic suction seat 11 is powered on, and the pressing plate 16 is moved downwards by starting the driving assembly, so that the probe body 15 is firstly contacted with the test product on the first carrier plate 3 to realize the detection, and the first detection pin 13 and the second detection pin 21 are respectively used for detecting the test products on the first carrier plate 3 and the second carrier plate 6, so that the test products of different types can be placed on the jig, and the detection points will be gathered together, the test fixture is used for one-time test, is convenient for realizing quick test and detection, and improves the test efficiency and the application range of the fixture.
The previous description of the disclosed embodiments is provided to enable any person skilled in the art to make or use the present invention. Various modifications to these embodiments will be readily apparent to those skilled in the art, and the generic principles defined herein may be applied to other embodiments without departing from the spirit or scope of the invention. Thus, the present invention is not intended to be limited to the embodiments shown herein but is to be accorded the widest scope consistent with the principles and novel features disclosed herein.
Claims (9)
1. The utility model provides a test fixture suitable for multiple circuit board which characterized in that includes:
a test pedestal;
the test bench comprises a first slide rail plate and a second slide rail plate which are assembled on the test bench in a sliding manner, a first carrier plate and a second carrier plate which are respectively arranged on the first slide rail plate and the second slide rail plate, grooves which are arranged on the first carrier plate and the second carrier plate and used for placing a detection product, a cover plate which is pressed on the second carrier plate, and an electromagnetic suction seat which is arranged on the test bench and used for limiting the second slide rail plate and the second carrier plate;
locate detection device on the test pedestal, detection device includes: locate the test pedestal is located the clamp plate of first support plate and second support plate top corresponding position, locate the test pedestal with clamp plate complex vertical guide arm, locating the test pedestal is used for the drive the clamp plate carries out oscilaltion motion's drive assembly, locates the clamp plate is used for detecting the probe body and the first detection needle of product on the first support plate and locate the clamp plate is used for detecting the second detection needle of product on the second support plate.
2. The testing fixture applicable to various circuit boards as claimed in claim 1, wherein the testing pedestal is provided with a slide rail seat, the slide rail seat is provided with a slide block, and the slide block is connected to the first slide rail plate and the second slide rail plate.
3. The testing fixture for various circuit boards as claimed in claim 2, wherein the testing platform further comprises a roller seat contacting the first and second sliding rail plates.
4. The test fixture for multiple circuit boards of claim 1, wherein the second carrier is pressed on the first carrier.
5. The test fixture applicable to various circuit boards as claimed in claim 1, wherein a flange bearing is disposed at a fitting position of the pressure plate and the vertical guide rod.
6. The testing fixture for various circuit boards according to claim 1, wherein the driving assembly comprises: locate test pedestal, orientation the first cylinder of clamp plate, the output of first cylinder be provided with the telescopic link that the clamp plate bottom is connected.
7. The test fixture for multiple circuit boards of claim 1, wherein the probe body is mounted on the pressure plate by a probe seat.
8. The testing fixture for various circuit boards as claimed in claim 1, wherein the first and second testing pins are moved up and down by a second cylinder disposed on the pressing plate.
9. The test fixture for multiple circuit boards as claimed in claim 1, wherein the second carrier has a through slot for the second testing pin to pass through and testing the testing product.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202023330264.3U CN214585563U (en) | 2020-12-30 | 2020-12-30 | Test fixture suitable for multiple circuit boards |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202023330264.3U CN214585563U (en) | 2020-12-30 | 2020-12-30 | Test fixture suitable for multiple circuit boards |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN214585563U true CN214585563U (en) | 2021-11-02 |
Family
ID=78344805
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202023330264.3U Active CN214585563U (en) | 2020-12-30 | 2020-12-30 | Test fixture suitable for multiple circuit boards |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN214585563U (en) |
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2020
- 2020-12-30 CN CN202023330264.3U patent/CN214585563U/en active Active
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