CN214473772U

CN214473772U - High-voltage testing device for chip detection

Info

Publication number: CN214473772U
Application number: CN202120534169.0U
Authority: CN
Inventors: 陈益群; 季学敏; 蔡毅
Original assignee: Shenzhen Qunxin Microelectronics Co ltd
Current assignee: Shenzhen Qunxin Microelectronics Co ltd
Priority date: 2021-03-15
Filing date: 2021-03-15
Publication date: 2021-10-22
Anticipated expiration: 2031-03-15

Abstract

The utility model discloses a high-pressure testing device for chip detection, which comprises a base, vertical plates and a conveyer belt, wherein the top parts of the two base are respectively fixed with the vertical plates, the conveyer belt is arranged between the two vertical plates, the top parts of the two vertical plates are respectively fixed with a fixing frame, a pushing mechanism which vertically moves is arranged at the top of the fixing frame, a high-pressure testing device is arranged at the bottom of the pushing mechanism, a driving mechanism which provides power is arranged between the two vertical plates and positioned in the conveying belt, and the top of the driving mechanism is in transmission connection with a connecting rod mechanism, under the action of the pushing mechanism, the high-voltage testing device is close to and away from the chip on the conveying belt, the conveying belt is convenient to convey the chip and the high-voltage testing device is convenient to detect the chip, under actuating mechanism and link mechanism's mating reaction, realized extruding the chip on the surface, prevent that it from taking place to slide when examining, it is better for prior art high efficiency and the limiting displacement of testing process to the chip.

Description

High-voltage testing device for chip detection

Technical Field

The utility model relates to a chip detects technical field, specifically is a chip detects uses high-pressure testing arrangement.

Background

With the continuous progress of the high-tech industry, the functions of electronic and electrical products are continuously expanded and increased, which results in more and more functional requirements and wider application range for the scientific and technical products of modern people, and in order to meet the demands of consumers, manufacturers also increasingly enhance the application functions of electronic and electrical products to achieve diversified use effects, so that IC chips, which are important components in the electronic and electrical products and have functions of executing programs, calculating, operating, and the like, must also have stronger execution functions, and thus various chips applied to the electronic and electrical products have a very important status.

In the prior art, high-voltage testing is generally required after the chip is produced, the chip is placed on a detection table in a handheld mode in a conventional mode, the efficiency is low, the fixing effect on the chip is poor when the chip is detected in a conveyor belt mode, and the chip is easy to slide.

SUMMERY OF THE UTILITY MODEL

An object of the utility model is to provide a high efficiency pipelined detects and fixed stable difficult gliding chip detects uses high pressure test device to solve the problem that proposes among the above-mentioned background art.

In order to achieve the above object, the utility model provides a following technical scheme: the utility model provides a chip detects uses high-pressure testing arrangement, includes base, riser and conveyer belt, two the base top all is fixed with the riser, two install the conveyer belt between the riser, two the riser top is fixed with the mount, and the mount top is equipped with vertical movement's pushing mechanism, the pushing mechanism bottom is equipped with high-pressure testing arrangement, two lie in the inside actuating mechanism who provides power that is equipped with of conveyer belt between the riser, and actuating mechanism top transmission is connected with link mechanism.

Preferably, pushing mechanism includes electric putter, telescopic link, spring and connecting plate, the mount top is fixed with electric putter, and electric putter's extension end passes mount and high-pressure testing arrangement fixed connection, high-pressure testing arrangement both sides are fixed with the connecting plate, and the connecting plate top is fixed with the telescopic link, the one end and the mount fixed connection of connecting plate are kept away from to the telescopic link, the spring has been cup jointed to the telescopic link outer lane, the spring both ends respectively with connecting plate and mount fixed connection.

Preferably, actuating mechanism includes bottom plate, motor, driving gear, driven gear, threaded rod, movable block and fixed station, be equipped with the bottom plate between two tracks of conveyer belt, and bottom plate both ends and riser fixed connection, bottom plate top fixed mounting has the motor, and the motor output is fixed with the driving gear, the bottom plate is located driving gear one side and rotates on the surface and install driven gear, and the driving gear is connected with the driven gear meshing, driving gear and driven gear all are fixed with the threaded rod, and the threaded rod keeps away from the one end of bottom plate and rotate and be connected with the fixed station, fixed station bottom and bottom plate fixed connection, two the threaded rod all meshes the cover on the surface and has connect the movable block.

Preferably, the link mechanism comprises a first connecting rod, a second connecting rod, a third connecting rod and a sliding sleeve, the outer side surfaces of the moving blocks are connected with the first connecting rod in a rotating mode, one ends, far away from the moving blocks, of the first connecting rod are connected with the third connecting rod in a rotating mode through rotating shafts, the top of the fixed platform is connected with the two second connecting rods in a rotating mode, the ends, far away from the fixed platform, of the second connecting rods are connected with the sliding sleeve in a rotating mode through rotating shafts, and the sliding sleeve is in sliding sleeve connection with the third connecting rod on the surface.

Preferably, a pressing head is fixed to one end of the third connecting rod, which is far away from the first connecting rod, and the pressing head is made of soft rubber.

Preferably, the surface of the track of the conveying belt is fixed with partition plates at equal intervals.

Compared with the prior art, the beneficial effects of the utility model are that:

the utility model discloses

Under the action of the pushing mechanism, the extension end of the electric push rod drives the high-voltage testing device to move towards the surface of the conveying belt, and meanwhile, under the drive of the connecting plate, the telescopic rod extends and stretches the spring to assist the accuracy of the moving route of the high-voltage testing device, so that the high-voltage testing device is close to and far away from a chip on the conveying belt, and the conveying belt is convenient for conveying the chip and the high-voltage testing device is convenient for detecting the chip;

under actuating mechanism and link mechanism's mating reaction, the motor drives the driving gear and rotates, the driving gear meshes with driven gear, make two threaded rods rotate simultaneously, meshing rotation is done along threaded rod pivoted direction to two movable blocks, when the movable block removed along the threaded rod, first connecting rod drove the third connecting rod and is vertical ascending removal of side, receive the limiting displacement of the sliding sleeve of third connecting rod simultaneously under, realized extruding the chip on the surface, prevent that it from taking place to slide when examining, more high-efficient and the limiting displacement of testing process to the chip is better for prior art.

Drawings

FIG. 1 is a schematic view of the overall structure of the present invention;

FIG. 2 is a schematic view of the pushing mechanism of the present invention;

fig. 3 is a schematic structural view of the link mechanism and the driving mechanism of the present invention;

fig. 4 is a schematic view of the connection relationship between the link mechanism and the driving mechanism of the present invention.

In the figure: 1. a base; 2. a vertical plate; 3. a conveyor belt; 31. a partition plate; 4. a fixed mount; 5. a pushing mechanism; 51. an electric push rod; 52. a telescopic rod; 53. a spring; 54. a connecting plate; 6. a high voltage testing device; 7. a link mechanism; 71. a first link; 72. a second link; 73. a third link; 731. a pressing head; 74. a sliding sleeve; 8. a drive mechanism; 81. a base plate; 82. a motor; 83. a driving gear; 84. a driven gear; 85. a threaded rod; 86. a moving block; 87. and a fixed platform.

Detailed Description

The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative work belong to the protection scope of the present invention.

Referring to fig. 1, a high voltage testing apparatus 6 for chip testing in the figure includes bases 1, vertical plates 2 and conveyer belts 3, the vertical plates 2 are fixed on the tops of the two bases 1, the conveyer belt 3 is installed between the two vertical plates 2, and the conveyer belts 3 have the same structure as a conveyer belt composed of existing rollers and belts, and are controlled to be opened by an electric device.

Referring to fig. 1 and 4, a fixing frame 4 is fixed at the top of each of the two vertical plates 2, a pushing mechanism 5 which moves vertically is arranged at the top of the fixing frame 4, a high-voltage testing device 6 is arranged at the bottom of the pushing mechanism 5, a driving mechanism 8 which provides power is arranged between the two vertical plates 2 and inside the conveying belt 3, and a link mechanism 7 is connected to the top of the driving mechanism 8 in a transmission manner, the high-voltage testing device 6 has the same structure as that of an existing chip contact type high-voltage detector, and under the action of the pushing mechanism 5, the high-voltage testing device 6 is close to and away from a chip on the conveying belt 3, so that the conveying belt 3 can transport the chip and the high-voltage testing device 6 can detect the chip conveniently, and under the cooperation of the driving mechanism 8 and the link mechanism 7, the chip can be extruded on the surface to prevent the chip from sliding during detection.

Referring to fig. 2, the pushing mechanism 5 includes an electric push rod 51, an expansion link 52, a spring 53 and a connecting plate 54, the electric push rod 51 is fixed on the top of the fixing frame 4, the extending end of the electric push rod 51 passes through the fixed frame 4 to be fixedly connected with the high-voltage testing device 6, the two sides of the high-voltage testing device 6 are fixedly provided with connecting plates 54, and the top of the connecting plate 54 is fixed with an expansion link 52, one end of the expansion link 52 far away from the connecting plate 54 is fixedly connected with the fixed frame 4, a spring 53 is sleeved on the outer ring of the telescopic rod 52, two ends of the spring 53 are respectively and fixedly connected with the connecting plate 54 and the fixed frame 4, the electric push rod 51 is started, the extending end of the electric push rod 51 drives the high-voltage testing device 6 to move towards the surface of the conveying belt 3, meanwhile, under the driving of the connecting plate 54, the telescopic rod 52 extends and stretches the spring 53, so as to assist the accuracy of the moving route of the high-voltage testing device 6.

Referring to fig. 3 and 4, the driving mechanism 8 includes a bottom plate 81, a motor 82, a driving gear 83, a driven gear 84, a threaded rod 85, a moving block 86 and a fixed table 87, the bottom plate 81 is disposed between two tracks of the conveyor belt 3, two ends of the bottom plate 81 are fixedly connected to the vertical plate 2, the motor 82 is fixedly mounted at the top of the bottom plate 81, the driving gear 83 is fixed at the output end of the motor 82, the driven gear 84 is rotatably mounted on a surface of one side of the bottom plate 81, the driving gear 83 is engaged with the driven gear 84, the driving gear 83 and the driven gear 84 are both fixed with the threaded rod 85, one end of the threaded rod 85 away from the bottom plate 81 is rotatably connected to the fixed table 87, the bottom of the fixed table 87 is fixedly connected to the bottom plate 81, the moving block 86 is engaged and sleeved on the surface of the two threaded rods 85, threads of the threaded rod 85 at the axes of the driving gear 83 and the driven gear 84 are in opposite directions, thereby realize that two movable blocks 86 move in the same direction, open motor 82, motor 82 drives the driving gear 83 and rotates, and driving gear 83 and driven gear 84 mesh for two threaded rod 85 rotate simultaneously, and two movable blocks 86 are the meshing rotation along the rotatory direction of threaded rod 85.

Referring to fig. 3 and 4, the link mechanism 7 includes a first link 71, a second link 72, a third link 73 and a sliding sleeve 74, the first link 71 is rotatably connected to the outer side surfaces of the two moving blocks 86, one end of the first link 71 away from the moving blocks 86 is rotatably connected to the third link 73 through a rotating shaft, the two second links 72 are symmetrically rotatably connected to the top of the fixed table 87, one end of the second link 72 away from the fixed table 87 is rotatably connected to the sliding sleeve 74 through a rotating shaft, the sliding sleeve 74 is slidably sleeved on the surface of the third link 73, when the moving blocks 86 move along the threaded rods 85, the first link 71 drives the third link 73 to move in the vertical direction, and simultaneously, under the limiting action of the sliding sleeve 74 of the third link 73, the third link 73 forms a movement process of extruding and moving away the core on the surface of the conveyor belt 3.

Referring to fig. 3, a pressing head 731 is fixed to an end of the third link 73 away from the first link 71, and the pressing head 731 is made of a soft rubber material, which does not damage the surface of the chip and has a large friction force.

Referring to fig. 1, the surface of the track of the conveyor belt 3 is equidistantly fixed with partition plates 31, and the partition plates 31 serve as the separation and the limit between the chips.

In the scheme, when the device is used, a chip is placed between the partition plates 31 on the conveying belt 3, the conveying belt 3 is opened, the motor 82 is started, the motor 82 drives the driving gear 83 to rotate, the driving gear 83 is meshed with the driven gear 84, so that the two threaded rods 85 rotate simultaneously, the two moving blocks 86 are meshed and rotate along the rotating direction of the threaded rods 85, when the moving blocks 86 move along the threaded rods 85, the first connecting rod 71 drives the third connecting rod 73 to move in the vertical direction, and simultaneously, under the limiting action of the sliding sleeve 74 of the third connecting rod 73, the pressing head 731 on the third connecting rod 73 forms a motion process of extruding and separating the chip on the surface of the conveying belt 3, the electric push rod 51 is opened, the extension end of the electric push rod 51 drives the high-pressure testing device 6 to move towards the surface of the conveying belt 3, and simultaneously, under the drive of the connecting plate 54, the expansion rod 52 extends and stretches the spring 53, the accuracy of the moving route of the high-voltage testing device 6 is assisted, and the original operation is repeated after the test is completed.

It is noted that, herein, relational terms such as first and second, and the like may be used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Also, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus.

Although embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that changes, modifications, substitutions and alterations can be made in these embodiments without departing from the principles and spirit of the invention, the scope of which is defined in the appended claims and their equivalents.

Claims

1. The utility model provides a chip detects uses high-pressure testing arrangement, includes base (1), riser (2) and conveyer belt (3), two base (1) top all is fixed with riser (2), two install conveyer belt (3), its characterized in that between riser (2): two riser (2) top is fixed with mount (4), and mount (4) top is equipped with vertical movement's pushing mechanism (5), pushing mechanism (5) bottom is equipped with high pressure test device (6), two lie in conveyer belt (3) inside between riser (2) and be equipped with actuating mechanism (8) that provide power, and actuating mechanism (8) top transmission is connected with link mechanism (7).

2. The high voltage testing device for chip detection according to claim 1, wherein: pushing mechanism (5) include electric putter (51), telescopic link (52), spring (53) and connecting plate (54), mount (4) top is fixed with electric putter (51), and the extension end of electric putter (51) passes mount (4) and high-pressure testing arrangement (6) fixed connection, high-pressure testing arrangement (6) both sides are fixed with connecting plate (54), and connecting plate (54) top is fixed with telescopic link (52), the one end and mount (4) fixed connection of connecting plate (54) are kept away from in telescopic link (52), spring (53) have been cup jointed to telescopic link (52) outer lane, spring (53) both ends respectively with connecting plate (54) and mount (4) fixed connection.

3. The high voltage testing device for chip detection according to claim 1, wherein: the driving mechanism (8) comprises a bottom plate (81), a motor (82), a driving gear (83), a driven gear (84), a threaded rod (85), a moving block (86) and a fixed table (87), the bottom plate (81) is arranged between the two tracks of the conveying belt (3), the two ends of the bottom plate (81) are fixedly connected with a vertical plate (2), the motor (82) is fixedly installed at the top of the bottom plate (81), the driving gear (83) is fixed at the output end of the motor (82), the driven gear (84) is rotatably installed on the surface of one side, located on the driving gear (83), of the bottom plate (81), the driving gear (83) is meshed with the driven gear (84), the threaded rod (85) is fixed on each of the driving gear (83) and the driven gear (84), the fixed table (87) is rotatably connected to one end, far away from the bottom plate (81), of the threaded rod (85), the bottom of the fixed table (87) is fixedly connected with the bottom plate (81), and moving blocks (86) are respectively meshed and sleeved on the surfaces of the two threaded rods (85).

4. The high voltage testing device for chip detection according to claim 3, wherein: link mechanism (7) include first connecting rod (71), second connecting rod (72), third connecting rod (73) and sliding sleeve (74), two all rotate on the movable block (86) outside surface and be connected with first connecting rod (71), and first connecting rod (71) keep away from the one end of movable block (86) and rotate through the pivot and be connected with third connecting rod (73), fixed station (87) top symmetry rotates and is connected with two second connecting rods (72), and second connecting rod (72) keep away from the one end of fixed station (87) and rotate through the pivot and be connected with sliding sleeve (74), sliding sleeve (74) slip cup joint third connecting rod (73) on the surface.

5. The high voltage testing device for chip detection according to claim 4, wherein: a pressing head (731) is fixed at one end of the third connecting rod (73) far away from the first connecting rod (71), and the pressing head (731) is made of soft rubber materials.

6. The high voltage testing device for chip detection according to claim 1, wherein: and partition plates (31) are fixed on the surface of the crawler belt of the conveying belt (3) at equal intervals.