CN214473763U - Test board for testing performance of circuit board - Google Patents

Test board for testing performance of circuit board Download PDF

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Publication number
CN214473763U
CN214473763U CN202120349938.XU CN202120349938U CN214473763U CN 214473763 U CN214473763 U CN 214473763U CN 202120349938 U CN202120349938 U CN 202120349938U CN 214473763 U CN214473763 U CN 214473763U
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China
Prior art keywords
fixing plate
test
circuit board
tested
plate
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CN202120349938.XU
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Chinese (zh)
Inventor
张晓燕
黄庆跃
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Kunshanqiu Titanium Photoelectric Technology Co Ltd
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Kunshanqiu Titanium Photoelectric Technology Co Ltd
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Abstract

The utility model relates to a capability test board technical field especially relates to a survey test panel to the capability test of circuit board, include: the circuit board testing device comprises a first fixing plate, a second fixing plate and a testing device, wherein the first fixing plate is provided with a magnetic part for fixing the magnetic part, the second fixing plate is used for fixing a circuit board to be tested, and the circuit board to be tested comprises: the coil assembly is matched with the magnetic component for use, and the connector is connected with the coil assembly; when the first fixing plate is buckled with the second fixing plate, the magnetic part is opposite to the coil assembly, the testing port is electrically connected with the connector, and the testing plate is adopted to test whether the circuit board to be tested has assembly faults or not, so that the adverse conditions are intercepted before finished products, and the yield is improved.

Description

Test board for testing performance of circuit board
Technical Field
The utility model relates to a capability test board technical field especially relates to a survey test panel to the capability test of circuit board.
Background
The circuit board comprises two types, one type is FPC board, the other type is PCB board, wherein, T-FPC in the FPC board is the combination of partial devices of the system which forms a motor closed loop, and the T-FPC board mainly comprises a coil, a Hall sensor, an FPC board, a drive IC and the like.
Because the devices are assembled, if the devices are not damaged in the assembling process, the devices can normally work after the assembling process is finished, and if the devices are damaged in the assembling process, the devices cannot normally work.
Therefore, how to intercept the bad situation in the assembly process before the finished product is a technical problem to be solved urgently.
SUMMERY OF THE UTILITY MODEL
In view of the above, the present invention has been made in order to provide a test board for performance test of a circuit board that overcomes or at least partially solves the above problems.
The utility model provides a survey test panel to performance test of circuit board, a serial communication port, include:
the test device comprises a first fixing plate, a second fixing plate and a testing device, wherein the first fixing plate is provided with a magnetic component and a testing port;
the second fixing plate is rotatably connected with the first fixing plate and used for fixing a circuit board to be tested;
when the first fixing plate and the second fixing plate are rotationally buckled, the magnetic part is opposite to the circuit board to be tested, and the test port is electrically connected with the circuit board to be tested.
Furthermore, the first fixing plate is further provided with a supporting block, the supporting block is arranged around the magnetic component, and the supporting block is a plastic magnetic insulating block.
Further, when the first fixing plate and the second fixing plate are rotationally buckled, the magnetic part is over against the circuit board to be tested, and the test port is electrically connected to an upper computer through a transfer plate.
Furthermore, a rotating mechanism is arranged between the first fixing plate and the second fixing plate, and the first fixing plate and the second fixing plate are rotatably connected through the rotating mechanism.
Further, the rotating mechanism is a rotating shaft.
Furthermore, a locking connection mechanism is arranged between the first fixing plate and the second fixing plate, and the first fixing plate and the second fixing plate are locked through the connection mechanism after being buckled.
Further, the locking connection mechanism is specifically a snap structure or a bolt locking structure.
Further, the magnetic member is attached to the first fixing plate.
Further, the magnetic component is a magnet.
Furthermore, the second fixing plate is provided with an accommodating groove, and the circuit board to be tested is correspondingly arranged in the accommodating groove.
Further, the circuit board to be tested comprises a coil assembly, the coil assembly is arranged corresponding to the magnetic component, and the size of the magnetic component is slightly larger than that of the coil assembly, so that the magnetic component is located above the coil assembly.
Further, the coil component is embodied as a coil winding.
Further, the circuit board to be tested comprises a connector which is electrically connected with the test port.
The embodiment of the utility model provides an in one or more technical scheme, following technological effect or advantage have at least:
the utility model provides a survey test panel to the capability test of circuit board, include: a first fixing plate for fixing the magnetic member and the test port; the second fixing plate is rotatably connected with the first fixing plate and used for fixing the circuit board to be tested; when the first fixing plate and the second fixing plate are rotationally buckled, the magnetic part is opposite to the circuit board to be tested, the testing port is electrically connected with the circuit board to be tested, whether the circuit board to be tested has assembly faults or not is tested by adopting the magnetic part on the testing plate, and the adverse conditions are intercepted before finished products, so that the yield is improved.
Drawings
Various other advantages and benefits will become apparent to those of ordinary skill in the art upon reading the following detailed description of the preferred embodiments. The drawings are only for purposes of illustrating the preferred embodiments and are not to be construed as limiting the invention. Also, like reference numerals are used to refer to like parts throughout the drawings. In the drawings:
fig. 1 shows a schematic structural diagram of a test board for testing the performance of a circuit board to be tested in an embodiment of the present invention;
fig. 2 shows a schematic diagram of the embodiment of the present invention when the coil assembly is aligned with the circuit board to be tested.
Detailed Description
Exemplary embodiments of the present disclosure will be described in more detail below with reference to the accompanying drawings. While exemplary embodiments of the present disclosure are shown in the drawings, it should be understood that the present disclosure may be embodied in various forms and should not be limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete, and will fully convey the scope of the disclosure to those skilled in the art.
Example one
The utility model provides a survey test panel to the capability test of awaiting measuring test circuit board, as shown in figure 1, include: a first stationary plate 101, the first stationary plate 101 being provided with a magnetic means 103 and a test port 102.
In this embodiment, the magnetic component 103 is specifically a magnet or an electromagnet, but not limited thereto, and the number of the magnetic components may be two or more, specifically, the number is set according to the condition of the circuit board to be tested.
In this embodiment, the magnetic component 103 is adhered to the first fixing plate 101, specifically, the adhesion is achieved by glue, and in addition, the magnetic component 103 includes an N pole and an S pole, and a connection direction of the N pole and the S pole of the magnetic component 103 is parallel to the first fixing plate 101, as specifically shown in fig. 2.
In this embodiment, the test port 102 is used to connect a communication interface of a circuit board to be tested to an external device, where the external device is specifically a computer or an upper computer, and the test port 102 is connected to the upper computer or the computer through an adapter board 401, and specifically, the test port 102 is electrically connected to the adapter board 401 and then is communicatively connected to the upper computer or the computer after being electrically connected.
In this embodiment, the first fixing plate 101 is further provided with a supporting block 104, and the supporting block 104 is disposed around the magnetic component 103. The supporting block 104 is specifically a magnetic isolation block, and the supporting block 104 made of a magnetic isolation material can avoid affecting the magnetic field, in this embodiment, the supporting block 104 mainly plays a role of supporting so as to avoid being squeezed when the magnetic component 103 abuts against the coil assembly 204.
In this embodiment, the test board for testing the performance of the circuit board further includes a second fixing plate 201, the second fixing plate 201 is rotatably connected to the first fixing plate 101, and the second fixing plate 201 is used to fix the circuit board to be tested, in this embodiment, the circuit board to be tested includes: the testing device comprises a coil assembly 204 used with the magnetic component 103, and a communication interface 205 connected with the coil assembly 204, wherein a connector is connected to the communication interface 205 and is used for realizing communication connection between the testing port 102 and a circuit board to be tested through the communication interface 205.
In this embodiment, the circuit board to be tested is specifically a T-FPC board, and specifically, the T-FPC board further includes: an FPC board 202, a magnetic flux inducing element 203, i.e., a hall sensor, on the FPC board 202. Wherein the coil assembly 204 is located on the element 203 inducing magnetic flux and the communication interface 205 is also located on the FPC board 202. The communication interface 205 is electrically connected to the coil block 204 and the magnetic flux inducing element 203 through the FPC board 202, respectively. As shown in fig. 1, the coil assemblies and the magnetic members are in a one-to-one correspondence relationship, that is, when there are two coil assemblies 204, there are also two corresponding magnetic members 103, but of course, there may be two or more, and the present invention is not limited thereto.
In this embodiment, the first end portion a of the first fixing plate 101 is connected to the second end portion B of the second fixing plate 201 through a rotating mechanism 301, so that the first fixing plate 101 rotates around the rotating mechanism 301, and the first fixing plate 101 and the second fixing plate 201 form a predetermined angle, in this embodiment, the rotating mechanism 301 is specifically a rotating shaft and the like.
In the present embodiment, when the first fixing plate 101 and the second fixing plate 201 are in the unfolded state, that is, when a preset angle is present between the first fixing plate 101 and the second fixing plate 201, that is, any angle greater than 0 °, the circuit board to be tested is placed on the second fixing plate 201.
In this embodiment, when the first fixing plate 101 rotates around the second fixing plate 201 and is engaged with the second fixing plate 201, the magnetic component 103 is opposite to the coil assembly 204, and the test port 102 is electrically connected to the communication interface 205.
Specifically, a probe is disposed at the test port 102, a connector is disposed at the communication interface 205, and the test port 102 is electrically connected to the communication interface 205, specifically, the probe is inserted into the connector to achieve electrical connection.
Specifically, a locking connection mechanism is arranged between the first fixing plate 101 and the second fixing plate 201, when the first fixing plate 101 and the second fixing plate 201 are rotationally buckled, i.e., the angle between the first fixing plate 101 and the second fixing plate 201 is 0 deg., the third end C of the first fixing plate 101 is opposite to the fourth end D of the second fixing plate 201, and the third end C of the first fixing plate 101 is connected to the fourth end D of the second fixing plate 201 by the locking connection mechanism, the locking connection mechanism may be a buckle structure, a bolt connection structure, or the like, and is not limited herein, in this embodiment, the third end C of the first fixing plate 101 is preferably the end opposite to the first end a of the first fixing plate 101, and the fourth end D of the second fixing plate 201 is preferably an end opposite to the third end B of the second fixing plate 201.
In this embodiment, when the first fixing plate and the second fixing plate are rotationally locked, the magnetic component 103 faces the circuit board to be tested. Specifically, the size of the magnetic component 103 is slightly larger than the size of the coil assembly 204, so that when the first fixing plate 101 is fastened to the second fixing plate 201, the magnetic component 103 is located above the coil assembly 204, wherein the coil assembly 204 is specifically a coil winding, and the coil winding includes a hollow portion, and only when the magnetic component 103 is larger than the size of the coil assembly 204, the magnetic component 103 does not fall into the hollow portion of the coil assembly 204, so that the magnetic component 103 is located above the coil assembly 204.
Then, after the first fixing plate 101 and the second fixing plate 201 are connected and locked, the step of testing the circuit board to be tested is executed, which is specifically as follows:
taking the T-FPC board as an example, a control signal is applied to the communication interface 205 through an upper computer or a computer, so that different currents are applied to the two coil assemblies 204, magnetic flux is generated under the action of the currents and the magnetic component 103, the magnetic flux inducing element 203 located below the coil assemblies 204 can induce the magnetic flux, and the magnetic flux is transmitted to the upper computer or the computer through the communication interface 205 and the test port 102.
The upper computer or the computer judges the received magnetic flux, and compares the two magnetic fluxes induced by the two magnetic flux inducing elements 203 because the magnetic fluxes of the two magnetic flux inducing elements 203 are received, and if the difference between the two magnetic fluxes is larger, the upper computer or the computer shows that the magnetic flux inducing elements 203 are normal and the assembly damage does not occur; if the two magnetic flux values are not very different, i.e., difficult to distinguish, the component 203 that induces the magnetic flux is welded or damaged in assembly.
The test board can also test whether the coil component 204 is damaged, and by recording the introduced current value and receiving the actual current value by the upper computer, when the actual current value is halved relative to the introduced current value, the coil component 204 is determined to have a fault in the assembling process.
By the testing mode, whether each device is damaged or not is tested before the T-FPC board is assembled, so that bad conditions can be intercepted before finished products, and the yield is further improved. Of course, the test board can also test other types of circuit boards, and will not be described in detail herein.
And after the test is finished, replacing another circuit board to be tested to carry out a test step of another circuit board to be tested.
The embodiment of the utility model provides an in one or more technical scheme, following technological effect or advantage have at least:
the utility model provides a survey test panel to the capability test of circuit board, include: a first fixing plate for fixing the magnetic member and the test port; the second fixing plate is rotatably connected with the first fixing plate and used for fixing the circuit board to be tested; when the first fixing plate and the second fixing plate are rotationally buckled, the magnetic part is opposite to the circuit board to be tested, the testing port is electrically connected with the circuit board to be tested, whether the circuit board to be tested has assembly faults or not is tested by adopting the magnetic part on the testing plate, and then the adverse conditions are intercepted before finished products, so that the yield is improved.
While the preferred embodiments of the present invention have been described, additional variations and modifications in those embodiments may occur to those skilled in the art once they learn of the basic inventive concepts. It is therefore intended that the appended claims be interpreted as including the preferred embodiment and all such alterations and modifications as fall within the scope of the invention.
It will be apparent to those skilled in the art that various changes and modifications may be made without departing from the spirit and scope of the invention. Thus, if such modifications and variations of the present invention fall within the scope of the claims and their equivalents, the present invention is also intended to include such modifications and variations.

Claims (10)

1. A test board for testing the performance of a circuit board, comprising:
the test device comprises a first fixing plate, a second fixing plate and a testing device, wherein the first fixing plate is provided with a magnetic component and a testing port;
the second fixing plate is rotatably connected with the first fixing plate and used for fixing a circuit board to be tested;
the first fixing plate and the second fixing plate are rotationally buckled, the magnetic part is opposite to the circuit board to be tested, and the test port is electrically connected with the circuit board to be tested.
2. The test plate of claim 1, wherein a support block is further disposed on the first fixing plate, the support block being disposed around the magnetic member, the support block being a plastic magnetic isolation block.
3. The test board of claim 1, wherein the magnetic member faces the circuit board to be tested when the first fixing plate is rotatably engaged with the second fixing plate, and the test port is electrically connected to the upper computer through a transfer plate.
4. The test plate according to claim 1, wherein a rotating mechanism is disposed between the first fixing plate and the second fixing plate, and the first fixing plate and the second fixing plate are rotatably connected through the rotating mechanism.
5. The test plate of claim 4, wherein the rotation mechanism is a spindle.
6. The test plate of claim 1, wherein a locking connection is provided between the first and second fixing plates, the first and second fixing plates being locked by the locking connection after being snapped together.
7. The test plate of claim 6, wherein the locking connection is embodied as a snap-fit structure or a bolt-lock structure.
8. The test plate of claim 1, wherein the magnetic component is a magnet.
9. The test board according to claim 1, wherein the second fixing plate is provided with a receiving groove, and the circuit board to be tested is correspondingly placed in the receiving groove.
10. The test board of claim 1, wherein the circuit board to be tested comprises a coil assembly disposed corresponding to the magnetic component, and the magnetic component has a size slightly larger than that of the coil assembly, such that the magnetic component is located above the coil assembly, wherein the coil assembly is a coil winding, and the circuit board to be tested further comprises a connector electrically connected to the test port.
CN202120349938.XU 2021-02-05 2021-02-05 Test board for testing performance of circuit board Active CN214473763U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202120349938.XU CN214473763U (en) 2021-02-05 2021-02-05 Test board for testing performance of circuit board

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202120349938.XU CN214473763U (en) 2021-02-05 2021-02-05 Test board for testing performance of circuit board

Publications (1)

Publication Number Publication Date
CN214473763U true CN214473763U (en) 2021-10-22

Family

ID=78118507

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202120349938.XU Active CN214473763U (en) 2021-02-05 2021-02-05 Test board for testing performance of circuit board

Country Status (1)

Country Link
CN (1) CN214473763U (en)

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