CN214473724U - Adjustable instrument probe - Google Patents
Adjustable instrument probe Download PDFInfo
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- CN214473724U CN214473724U CN202120263138.6U CN202120263138U CN214473724U CN 214473724 U CN214473724 U CN 214473724U CN 202120263138 U CN202120263138 U CN 202120263138U CN 214473724 U CN214473724 U CN 214473724U
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Abstract
The utility model belongs to the technical field of instrument and meter, concretely relates to adjustable instrument and meter probe. An adjustable instrument probe, characterized in that: comprises a fixing piece and an adjusting piece; the fixed part is used for connecting the instrument and the meter and the adjusting part, and the adjusting part is used for fixing the probe; the fixed piece and the adjusting piece are rotatably connected. The application provides an adjustable instrument probe through adoption rotatable coupling's mounting and regulating part, can carry out good adaptation to the work piece that awaits measuring that the binding post has different structures and configuration, has avoided the dismouting of relapseing of probe, has technical effect such as efficiency and precision height and strong adaptability.
Description
Technical Field
The utility model belongs to the technical field of instrument and meter, concretely relates to adjustable instrument and meter probe.
Background
This is often encountered when a safety instrumented (e.g., high pressure) is used to perform a pressure resistance test on a workpiece: because the wiring terminals or the positive and negative electrodes of the workpiece have different structures and configurations, the installation position of the probe needs to be adjusted repeatedly when the workpiece is replaced, so that the working efficiency is influenced, and the testing precision is also influenced due to the repeated adjustment of the probe.
SUMMERY OF THE UTILITY MODEL
In view of this, the utility model provides an adjustable instrument probe to solve the technical problem who exists among the prior art.
The utility model discloses a solve its technical problem and the solution that adopts does:
an adjustable instrument probe, characterized in that: comprises a fixing piece and an adjusting piece; the fixed part is used for connecting the instrument and the meter and the adjusting part, and the adjusting part is used for fixing the probe; the fixed piece and the adjusting piece are rotatably connected.
Preferably, the fixed part comprises an equipment connecting part and a hinge structure, the equipment connecting part is used for connecting the instrument, and the hinge structure is used for rotatably connecting the adjusting part; the adjusting part comprises a probe fixing part and an articulated matching structure, the probe fixing part is used for fixedly connecting the probe, and the articulated matching structure is used for matching the articulated structure to realize rotatable connection between the fixing part and the adjusting part.
Preferably, the hinge structure comprises a mounting cavity and at least one wave ball screw arranged at the side part of the mounting cavity; the hinge fit structure comprises an assembly part and a wave bead embedding hole arranged on the assembly part; the assembly part is arranged in the assembly cavity, and the wave bead screw is used for being matched with the wave bead embedding hole to adjust and fix the direction of the probe.
Preferably, the hinge structure further comprises at least one screw hole arranged at the side of the assembly cavity, and the wave ball screw is arranged in the screw hole; the hinge fit structure also comprises an annular groove body, and the wave bead embedding hole is arranged in the annular groove body.
Preferably, the wave ball screws are uniformly arranged on the side part of the assembling cavity; the bead fitting holes are uniformly arranged on the outer periphery of the fitting portion.
Preferably, the number of the bead screws and bead fitting holes is 2 or 4.
Preferably, the hinge structure comprises a fitting hole, and an internal thread is arranged in the fitting hole; the hinge fit structure comprises an assembling head, and an external thread is arranged on the assembling head; the internal thread and the external thread are matched in shape and position, and the rotatable connection between the fixing piece and the adjusting piece can be established through threaded connection.
Preferably, the device connecting part is fixedly connected with the instrument by adopting a threaded connection and/or a snap connection.
Preferably, the probe fixing part is used for installing and fixing the probe by adopting a threaded connection and/or a buckling connection mode.
The beneficial technical effects are as follows:
the application provides an adjustable instrument probe through adopting rotatable coupling's mounting and regulating part, can have the workpiece that awaits measuring of isostructure and configuration to the binding post and carry out good adaptation, when needs change the work piece, just can realize the butt joint between probe and the work piece binding post through rotating the regulating part, has avoided dismantling repeatedly of probe, has technical effect such as efficiency and precision height and strong adaptability.
The technical solutions and technical effects of the present application will be described in detail below with reference to the drawings and the detailed description of the present application.
Drawings
FIG. 1: the first preferred embodiment is a perspective front view;
FIG. 2: the first preferred embodiment structure is a perspective top view;
FIG. 3: the hinge fitting structure in the first preferred embodiment is partially sectional;
FIG. 4: the structure of the second preferred embodiment is perspective front view;
FIG. 5: perspective top view of the structure of the second preferred embodiment;
and (3) identification and explanation:
1/10-fastener, 2/20-adjuster;
11/110-device connection, 12/120-hinge structure;
21/210-Probe Mount, 22/220-hinge fitting structure;
121-assembly hole, 122-internal thread;
221-fitting head, 222-external thread;
1210-assembly cavity, 1220-threaded hole, 1230-ball screw;
2210-assembly, 2220-annular groove, 2230-bead interfitting hole.
Detailed Description
The application provides an adjustable instrument probe, including being used for connecting the mounting of ann's rule instrument for example high-pressure machine and being used for the regulating part of fixed high-pressure machine probe, be rotatable coupling between mounting and the regulating part.
The fixed part comprises an equipment connecting part and a hinge structure, wherein the equipment connecting part is used for connecting instruments and meters, and the hinge structure is used for rotatably connecting the adjusting part. The adjusting part comprises a probe fixing part and an articulated matching structure, the probe fixing part is used for fixedly connecting the probe, and the articulated matching structure is used for matching the articulated structure to realize rotatable connection between the fixing part and the adjusting part.
The equipment connecting part is fixedly connected with the instrument by adopting a threaded connection and/or a buckle connection mode in the prior art. The probe fixing part adopts a threaded connection and/or a buckling connection mode in the prior art to install and fix the probe.
The rotatable connection between the fixed member and the adjustment member may be in the following two preferred embodiments, or in other ways known in the art as a hinge.
First preferred embodiment
Referring to fig. 1 to 3, the adjustable instrumentation probe according to the preferred embodiment includes a fixed member 10 and an adjusting member 20; the fixed part 10 is used for connecting the instrument and the meter and the adjusting part 20, and the adjusting part 20 is used for fixing the probe; the fixed member 10 and the adjusting member 20 are rotatably connected.
The fixed member 10 includes an equipment connecting portion 110 and a hinge structure 120, the equipment connecting portion 110 is used for connecting an instrument, and the hinge structure 120 is used for rotatably connecting the adjusting member 20; the hinge structure 120 includes a fitting chamber 1210, at least one screw hole 1220 disposed at a side of the fitting chamber 1210, and a ball screw 1230 disposed in the screw hole 1220; the number of the wave ball screws 1230 is 4, and the 4 wave ball screws 1230 are uniformly arranged at the side of the assembly chamber 1210.
The adjusting member 20 comprises a probe fixing portion 210 and an articulated coupling structure 220, wherein the probe fixing portion 210 is used for fixedly connecting the probe, and the articulated coupling structure 220 is used for coupling the articulated structure 120 to realize the rotatable connection between the fixing member 10 and the adjusting member 20. The hinge fitting structure 220 includes a fitting portion 2210, an annular groove 2220 provided on the fitting portion 2210, and a bead fitting hole 2230 provided in the annular groove 2220; the number and the form and size of the bead-fitting holes 2230 correspond to those of the bead screws 1230.
The assembly relation is as follows: the mounting portion 2210 is disposed in the mounting cavity 1210, and the wave-bead screw 1230 is fitted in the wave-bead fitting hole 2230. When the orientation of the probe needs to be adjusted, the adjusting piece 20 is rotated, the bead screw 1230 can be withdrawn from the bead embedding hole 2230 and rotate in the annular groove 2220, and after the adjusting piece is rotated to another orientation, the adjusting piece is re-embedded in the bead embedding hole 2230 in another orientation, so that the orientation of the probe is adjusted.
The device connecting portion 110 may be fixed to the instrument by using a screw connection and/or a snap connection, and the probe fixing portion 210 may be used to mount and fix the probe by using a screw connection and/or a snap connection. For example, the probe can be fixed in the hole of the probe fixing portion 210 by screwing, wiring holes can be formed in the fixing member 10 and the adjusting member 20, and the like.
Second preferred embodiment
Referring to fig. 4 and 5, the preferred embodiment discloses an adjustable instrumentation probe using another rotatable connection, which includes a fixed member 1 and an adjusting member 2, similar to the first preferred embodiment; the fixed part 1 is used for connecting an instrument and a meter and the adjusting part 2, and the adjusting part 2 is used for fixing the probe; the fixed member 1 and the adjusting member 2 are rotatably connected. The fixed part 1 comprises an equipment connecting part 11 and a hinge structure 12, wherein the equipment connecting part 11 is used for connecting instruments and meters, and the hinge structure 12 is used for rotatably connecting the adjusting part 2; the adjusting part 2 comprises a probe fixing part 21 and an articulated matching structure 22, the probe fixing part 21 is used for fixedly connecting a probe, and the articulated matching structure 22 is used for matching the articulated structure 12 to realize the rotatable connection between the fixing part 1 and the adjusting part 2.
The hinge structure 12 includes a fitting hole 121, and an internal thread 122 is provided in the fitting hole 121; the hinge fitting structure 22 comprises a fitting head 221, and an external thread 222 is arranged on the fitting head 221; the internal thread 122 and the external thread 222 are configured and dimensioned to be engaged with each other, enabling a rotatable connection between the fixing member 1 and the adjusting member 2 to be established by means of a threaded connection.
The device connecting part 11 can be fixed to the instrument by using a screw connection and/or a snap connection, and the probe fixing part 21 can mount and fix the probe by using a screw connection and/or a snap connection. For example, the probe can be fixed in the hole on the probe fixing part 21 by screw connection, and wiring holes can be formed in the fixing part 1 and the adjusting part 2.
The assembly relation is as follows: the fitting head 221 is disposed within the fitting hole 121, and the internal thread 122 and the external thread 222 establish a rotatable connection therebetween through a thread fit. When the position of the probe needs to be adjusted, the adjusting piece 2 is rotated, and the position of the probe can be adjusted by screwing in and out the assembling head 221.
Description of the principle: the following explains the mechanism of the present application by taking a workpiece to be measured in which two sets of positive and negative terminals are respectively configured in the X axis and the Y axis, where the X axis is perpendicular to the Y axis. The probe is fixed to the adjuster 2/20 by the probe fixing portion 21/210, and the fixture 1/10 is attached to the instrument by the equipment connecting portion 11/110. When the workpiece configured in the X axis needs to be tested, the anode and the cathode of the probe are rotated to be parallel to the X axis through the rotatable connection between the adjusting piece 2/20 and the fixing piece 1/10; after the workpiece with the wiring terminal configured for the X axis is detected, the anode and the cathode of the probe are rotated to be parallel to the Y axis through the rotatable connection between the adjusting piece 2/20 and the fixing piece 1/10, and then the workpiece with the wiring terminal configured for the Y axis can be detected.
Similar to the X-axis and Y-axis configurations of the terminals, respectively, the present application is also applicable to applications with other different angled terminal configurations, and with the second preferred embodiment, the probe can be adapted to the terminal by relative rotation between the internal threads 122 and the external threads 222 regardless of the configuration and configuration of the workpiece terminal. In a modified embodiment of the first preferred embodiment, the expansion of the adjustment range can also be achieved by increasing the number of the wave-bead screws and the wave-bead fitting holes.
Therefore, the application provides an adjustable instrument probe, through adopting rotatable coupling's mounting and regulating part, can have the workpiece that awaits measuring of isostructure and configuration to the binding post and carry out good adaptation, when needs change the work piece, just can realize the butt joint between probe and the work piece binding post through rotating the regulating part, has avoided dismantling repeatedly of probe, has technical effect such as efficiency and precision height and strong adaptability.
While the technical solutions and effects of the present invention have been described in detail with reference to the drawings and the specific embodiments of the present invention, it should be noted that the specific embodiments disclosed in the specification are only preferred embodiments of the present invention, and those skilled in the art can develop other embodiments based on the embodiments; any simple modification and equivalent replacement without departing from the innovative concepts of the present invention is covered by the present invention and is within the scope of the present patent.
Claims (9)
1. An adjustable instrument probe, characterized in that:
comprises a fixed part (1; 10) and an adjusting part (2; 20);
the fixing part (1; 10) is used for connecting an instrument and a meter with the adjusting part (2; 20), and the adjusting part (2; 20) is used for fixing a probe;
the fixing part (1; 10) and the adjusting part (2; 20) are rotatably connected.
2. The adjustable instrument probe of claim 1, wherein:
the fixing part (1; 10) comprises an equipment connecting part (11; 110) and a hinge structure (12; 120), wherein the equipment connecting part (11; 110) is used for connecting instruments, and the hinge structure (12; 120) is used for rotatably connecting the adjusting part (2; 20);
the adjusting piece (2; 20) comprises a probe fixing part (21; 210) and a hinge matching structure (22; 220), wherein the probe fixing part (21; 210) is used for fixedly connecting a probe, and the hinge matching structure (22; 220) is used for matching with the hinge structure (12; 120) to realize rotatable connection between the fixing piece (1; 10) and the adjusting piece (2; 20).
3. The adjustable instrument probe of claim 2, wherein:
the hinge structure (120) comprises a mounting cavity (1210) and at least one ball screw (1230) arranged at the side of the mounting cavity (1210);
the hinge fitting structure (220) includes a fitting portion (2210) and a bead fitting hole (2230) provided on the fitting portion (2210);
the assembly part (2210) is arranged in the assembly cavity (1210), and the bead screw (1230) is used for matching with the bead embedding hole (2230) to adjust and fix the probe direction.
4. The adjustable instrument probe of claim 3, wherein:
the hinge structure (120) further comprises at least one screw hole (1220) disposed at a side of the assembly cavity (1210), and the ball screw (1230) is disposed in the screw hole (1220);
the hinge fit structure (220) further comprises an annular groove body (2220), and the wave bead embedding hole (2230) is formed in the annular groove body (2220).
5. The adjustable instrument probe of claim 3, wherein:
the bead screws (1230) are uniformly arranged at the side part of the assembling cavity (1210);
the bead fitting holes (2230) are uniformly arranged on the outer periphery of the fitting portion (2210).
6. The adjustable instrument probe of claim 3, wherein:
the number of the bead screws (1230) and the bead embedding holes (2230) is 2 or 4.
7. The adjustable instrument probe of claim 2, wherein:
the hinge structure (12) comprises a mounting hole (121), and an internal thread (122) is arranged in the mounting hole (121);
the hinge fit structure (22) comprises an assembling head (221), and an external thread (222) is arranged on the assembling head (221);
the internal thread (122) and the external thread (222) are matched in shape and position, and the rotatable connection between the fixing piece (1) and the adjusting piece (2) can be established through threaded connection.
8. An adjustable instrument probe according to any one of claims 2 to 6, wherein:
the equipment connecting part (11; 110) is fixedly connected with the instrument by adopting a threaded connection and/or a buckling connection mode.
9. An adjustable instrument probe according to any one of claims 2 to 6, wherein:
the probe fixing part (21; 210) adopts a threaded connection and/or a buckling connection mode to install and fix the probe.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202120263138.6U CN214473724U (en) | 2021-01-30 | 2021-01-30 | Adjustable instrument probe |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202120263138.6U CN214473724U (en) | 2021-01-30 | 2021-01-30 | Adjustable instrument probe |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN214473724U true CN214473724U (en) | 2021-10-22 |
Family
ID=78141989
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202120263138.6U Active CN214473724U (en) | 2021-01-30 | 2021-01-30 | Adjustable instrument probe |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN214473724U (en) |
-
2021
- 2021-01-30 CN CN202120263138.6U patent/CN214473724U/en active Active
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