CN214441032U - Chip testing device - Google Patents
Chip testing device Download PDFInfo
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- CN214441032U CN214441032U CN202023322417.XU CN202023322417U CN214441032U CN 214441032 U CN214441032 U CN 214441032U CN 202023322417 U CN202023322417 U CN 202023322417U CN 214441032 U CN214441032 U CN 214441032U
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Abstract
The utility model provides a chip testing device, include the base and all install the test module on the base, the test module includes test channel, feeding stop mechanism, the support, gold finger presss from both sides survey mechanism, test stop mechanism, lower correlation response mechanism and ejection of compact stop mechanism, feeding stop mechanism installs the side at test channel entrance point, the gold finger presss from both sides survey mechanism and test stop mechanism and installs respectively in the upside and the downside of support and all be located the place ahead of test channel, the ejection of compact stop mechanism all installs the side at the test channel exit end. The utility model discloses can keep in the chip, efficiency of software testing is higher.
Description
Technical Field
The utility model relates to a chip sorter field specifically is a chip testing arrangement.
Background
The chip testing device has the function of automatically testing chips in the chip sorting machine, an upper distributing shuttle and a lower distributing shuttle are respectively provided with one group, at least two groups of chip testing devices are provided, the upper distributing shuttle carries out material receiving and discharging work above the at least two groups of chip testing devices, and the lower distributing shuttle carries out material receiving and discharging work below the at least two groups of chip testing devices; 2. the chip testing device can not temporarily store the tested chip, the chip testing device can release the tested chip when the lower distributing shuttle receives the material, and the testing position can not be emptied in time so as to continue to test the next chip, so that the testing efficiency is low.
Disclosure of Invention
An object of the utility model is to provide a chip testing device to solve the problem that proposes among the above-mentioned background art.
In order to achieve the above object, the utility model provides a following technical scheme:
the utility model provides a chip testing device, includes the base and all installs test module on the base, test module includes test channel, feeding stop mechanism, goes up correlation response mechanism, support, golden finger clamp survey mechanism, test stop mechanism, correlation response mechanism and ejection of compact stop mechanism down, feeding stop mechanism installs the side at test channel entrance point, the golden finger presss from both sides survey mechanism and test stop mechanism and installs respectively in the upside and the downside of support and all be located the place ahead of test channel, the ejection of compact stops the side that the mechanism all installed at the test channel exit end.
Furthermore, the device also comprises an upper correlation induction mechanism, wherein the upper correlation induction mechanism is arranged at the side of the feeding end of the testing channel.
Further, still include lower correlation response mechanism, lower correlation response mechanism installs the side at the test passageway discharge end.
Furthermore, the feeding blocking mechanism comprises a first driving assembly and a first blocking piece, the first blocking piece is installed on the first driving assembly, a first avoidance hole for avoiding the first blocking piece is formed in the feeding end of the testing channel, and the first driving blocking piece penetrates through the first avoidance hole to enter and exit the inside of the feeding end of the testing channel.
Further, golden finger presss from both sides survey mechanism includes the test golden finger and opens and closes actuating mechanism, the test golden finger bilateral symmetry sets up in the both sides of test passageway and all installs on the base, the notch of dodging that is used for dodging the chip pin is offered for the position department of test golden finger respectively in the left side and the right side of test passageway, open and close the test golden finger that actuating device drive bilateral symmetry set up and do the opposite motion.
Further, the test blocking mechanism comprises a driving assembly II and a blocking assembly, the blocking assembly comprises a concave connecting rod, a bar-shaped connecting rod and a blocking piece, the lower end of the bar-shaped connecting rod is installed on the driving assembly II through the concave connecting rod, the blocking piece is installed at the upper end of the bar-shaped connecting rod, a avoidance hole II for avoiding the blocking piece is formed in the test channel, and the driving assembly II drives the concave connecting rod to drive the blocking piece to penetrate through the bar-shaped connecting rod to enter and exit the test channel through the avoidance hole II.
Further, ejection of compact barrier mechanism includes drive assembly three and blocks piece two, block piece two and install on drive assembly three, offer on test channel's the feed end and be used for dodging the hole of dodging that blocks piece two and dodging hole three, drive assembly three drive blocks piece two and passes the inside of dodging hole three business turn over test channel discharge end.
The utility model has the advantages that:
during testing, the feeding blocking mechanism blocks the chip sliding to the testing position of the testing channel, the golden finger clamping and testing mechanism performs combined motion to test the chip, and at the moment, the upper distributing shuttle drives one chip to move and release the chip to the feeding end of the testing channel to be blocked by the feeding blocking mechanism, so that the chip before testing is temporarily stored;
after the test is accomplished, gold finger presss from both sides the test mechanism and is open the motion, feeding blocking mechanism releases this chip and makes its gliding to be blockked by ejection of compact blocking mechanism in the discharge end of test channel, the realization is kept in the chip after the test, feeding blocking mechanism need not to wait for down to divide the material shuttle to come to connect the material just can release the chip after the test, efficiency of software testing has been improved, then feeding blocking mechanism resets, feeding blocking mechanism releases the chip and makes its testing position that in time slided to test channel test, efficiency of software testing has been improved.
Drawings
FIG. 1: a schematic top view of a chip testing apparatus.
FIG. 2: a first three-dimensional schematic diagram of a chip testing device is provided.
FIG. 3: a second schematic perspective view of a chip testing device.
FIG. 4: a block assembly of a chip testing device is provided.
Detailed Description
The invention is further explained below with reference to the drawings:
please refer to fig. 1 to 3, a chip testing device, including base 1 and all install the test module 2 on base 1, test module 2 sets up along the left and right sides direction mirror image, test module 2 includes test channel 21, feeding stop mechanism 22, support 23, gold finger presss from both sides survey mechanism 24, test stop mechanism 25 and ejection of compact stop mechanism 26, feeding stop mechanism 22 installs the side at test channel 21 entrance point, gold finger presss from both sides survey mechanism 24 and test stop mechanism 25 and installs respectively at the upside and the downside of support 23 and all is located the place ahead of test channel 21, ejection of compact stop mechanism 26 all installs the side at test channel 21 exit end.
Referring to fig. 1 to 3, the testing device further includes an upper correlation sensing mechanism 27, the upper correlation sensing mechanism 27 is installed beside the feeding end of the testing channel 21, a first sensing line avoiding hole penetrating in the left-right direction is formed at the feeding end of the testing channel 21, and a sensing line of the upper correlation sensing mechanism 27 passes through the first sensing line avoiding hole.
Referring to fig. 1 to 3, the testing device further includes a lower correlation sensing mechanism 28, the lower correlation sensing mechanism 28 is installed beside the discharge end of the testing channel 21, a second sensing line avoiding hole penetrating in the left-right direction is formed in the discharge end of the testing channel 21, and the sensing line of the lower correlation sensing mechanism 28 passes through the second sensing line avoiding hole.
When the chip enters the feed end of the test channel 21 and is blocked by the feed blocking mechanism 22, the chip blocks the induction line of the upper correlation induction mechanism 27, at this time, the upper correlation induction mechanism 27 detects that there is material, the upper material-separating shuttle does not need to discharge material, the lower correlation induction mechanism 28 has the same detection principle as the upper correlation induction mechanism 27, and the description is omitted here.
The feeding blocking mechanism 22 comprises a first driving assembly and a first blocking part, the first blocking part is used for blocking the chip in the feeding end of the testing channel 21, the first blocking part is installed on the first driving assembly, a first avoidance hole used for avoiding the first blocking part is formed in the feeding end of the testing channel 21, and the first driving assembly drives the first blocking part to penetrate through the first avoidance hole to enter or exit the interior of the feeding end of the testing channel 21.
Golden finger presss from both sides survey mechanism 24 and includes the test golden finger and opens and close actuating mechanism, the test golden finger is connected with the test instrument electricity, the bilateral symmetry setting of test golden finger is just all installed on base 1 in the both sides of test channel 21, the notch of dodging that is used for dodging the chip pin is offered respectively for the position department of test golden finger in the left side and the right side of test channel 21, open and close actuating mechanism and install the upside at support 23, open and close the test golden finger that actuating device drive bilateral symmetry set up and do the relative motion and make both realize the test with the pin contact of chip both sides respectively.
Referring to fig. 4, the test blocking mechanism 25 includes a second driving element 251 and a blocking element, the blocking element includes a second concave link 2521, a second bar link 2522 and a blocking tab 2523, the second driving element 251 is mounted on the lower side of the base, the lower end of the second bar link 2522 is mounted under the second driving element 251 through the second concave link 2521, the blocking tab 2523 is used to block the chip in the test position of the test channel 21, so that the golden finger clamping mechanism 24 can smoothly test the chip, the blocking tab 2523 is mounted on the upper end of the second bar link 2522, a second avoiding hole for avoiding the blocking tab 2523 is formed in the test channel 21, and the second driving element 251 drives the second concave link 2521 to drive the blocking tab 2523 to pass through the second avoiding hole to enter or exit the interior of the test channel 21 through the second avoiding hole 2522.
The discharge blocking mechanism 26 comprises a driving assembly III and a blocking piece II, the blocking piece II is installed on the driving assembly III, an avoiding hole III used for avoiding the blocking piece II is formed in the feeding end of the testing channel 21, the blocking piece II is used for blocking a tested chip in the discharging end of the testing channel 21, and the driving assembly III drives the blocking piece II to penetrate through the avoiding hole III to enter or exit the inside of the discharging end of the testing channel 21.
The utility model discloses a theory of operation:
during testing, the feeding blocking mechanism 22 blocks the chip sliding to the testing position of the testing channel 21, the golden finger clamping mechanism 24 performs combined motion to test the chip, and at the moment, the upper distributing shuttle drives one chip to move and release the chip to the feeding end of the testing channel 21 to be blocked by the feeding blocking mechanism 22, so that the chip before testing is temporarily stored;
after the test is accomplished, gold finger presss from both sides survey mechanism 24 and is open the motion, feeding stop gear 22 releases this chip and makes its gliding stop by ejection of compact stop gear 26 in the discharge end of test channel 21, the realization is kept in the chip after the test, feeding stop gear 22 need not to wait for down to divide the material shuttle to come to connect the material and just can release the chip after the test, efficiency of software testing is improved, at this moment feeding stop gear 22 resets, feeding stop gear 22 releases the chip and makes its test position that in time slided to test channel 21 test, efficiency of software testing is improved.
The above is not intended to limit the technical scope of the present invention, and any modifications, equivalent changes and modifications made to the above embodiments according to the technical spirit of the present invention are all within the scope of the technical solution of the present invention.
Claims (7)
1. A chip testing device is characterized in that: include the base and all install test module on the base, test module includes test channel, feeding barrier mechanism, support, gold finger clamp survey mechanism, test barrier mechanism, lower correlation response mechanism and ejection of compact barrier mechanism, the side at the test channel entrance point is installed to feeding barrier mechanism, the gold finger clamp survey mechanism and test barrier mechanism install respectively in the upside and the downside of support and all are located the place ahead of test channel, the side at the test channel exit end is all installed to ejection of compact barrier mechanism.
2. The chip testing device according to claim 1, wherein: the testing device further comprises an upper correlation sensing mechanism, and the upper correlation sensing mechanism is installed beside the feeding end of the testing channel.
3. The chip testing device according to claim 1, wherein: the device also comprises a lower correlation induction mechanism, and the lower correlation induction mechanism is arranged at the side of the discharge end of the test channel.
4. The chip testing device according to claim 1, wherein: the feeding blocking mechanism comprises a first driving assembly and a first blocking piece, the first blocking piece is installed on the first driving assembly, a first avoiding hole for avoiding the first blocking piece is formed in the feeding end of the testing channel, and the first driving blocking piece penetrates through the first avoiding hole to enter and exit the feeding end of the testing channel.
5. The chip testing device according to claim 1, wherein: golden finger presss from both sides survey mechanism and includes the test golden finger and opens and close actuating mechanism, the test golden finger bilateral symmetry sets up in the both sides of test passageway and all installs on the base, the notch of dodging that is used for dodging the chip pin is offered for the position department of test golden finger respectively in the left side and the right side of test passageway, open and close the test golden finger that actuating device drive bilateral symmetry set up and do the opposite motion.
6. The chip testing device according to claim 1, wherein: the test blocking mechanism comprises a second driving assembly and a blocking assembly, the blocking assembly comprises a concave connecting rod, a bar-shaped connecting rod and a blocking piece, the lower end of the bar-shaped connecting rod is installed on the second driving assembly through the concave connecting rod, the blocking piece is installed at the upper end of the bar-shaped connecting rod, a second avoiding hole for avoiding the blocking piece is formed in the test channel, and the second driving concave connecting rod of the driving assembly drives the blocking piece to penetrate through the bar-shaped connecting rod to pass through the second avoiding hole and enter and exit the test channel.
7. The chip testing device according to claim 1, wherein: the discharge blocking mechanism comprises a driving assembly III and a blocking piece II, the blocking piece II is installed on the driving assembly III, a third avoiding hole used for avoiding the blocking piece II is formed in the feeding end of the test channel, and the driving assembly III drives the blocking piece II to penetrate through the third avoiding hole to enter the discharge end of the test channel.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202023322417.XU CN214441032U (en) | 2020-12-31 | 2020-12-31 | Chip testing device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202023322417.XU CN214441032U (en) | 2020-12-31 | 2020-12-31 | Chip testing device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN214441032U true CN214441032U (en) | 2021-10-22 |
Family
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202023322417.XU Active CN214441032U (en) | 2020-12-31 | 2020-12-31 | Chip testing device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN214441032U (en) |
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2020
- 2020-12-31 CN CN202023322417.XU patent/CN214441032U/en active Active
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