CN214409235U - Full parameter one-key testing device of module power supply - Google Patents
Full parameter one-key testing device of module power supply Download PDFInfo
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- CN214409235U CN214409235U CN202022296002.3U CN202022296002U CN214409235U CN 214409235 U CN214409235 U CN 214409235U CN 202022296002 U CN202022296002 U CN 202022296002U CN 214409235 U CN214409235 U CN 214409235U
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Abstract
The utility model provides a full parameter key testing arrangement of module power to the module power that functional parameter is complicated, design preparation test circuit, with multiple test circuit integration and through test system control, realize the full parameter's of module power a key test. The device has solved manual seizure waveform inefficiency to the unable problem that fuses with the test report of graphic data, test circuit design combines together with test system's software and hardware, has promoted the efficiency of module power test greatly, has increased the utility model discloses a commonality.
Description
Technical Field
The utility model relates to a test technical field especially relates to a full parameter key testing arrangement of module power.
Background
With the development of the technology, the functions of the module power supply are more and more complex, the parameters are more and more, and the performance test of each parameter of the module power supply is more and more complex. In the prior art, the test of the module power supply is completed by using a module power supply test system, one operation is required when a certain parameter needs to be tested, multiple groups of parameters cannot be measured simultaneously, and simultaneously, when parameters such as output voltage, voltage regulation rate, current regulation rate and efficiency are acquired, the test of parameters such as undervoltage locking, load step, input limit and load limit and waveform capture cannot be realized.
SUMMERY OF THE UTILITY MODEL
In view of this, the utility model aims at providing a full parameter one key testing arrangement of module power to the operation is complicated when solving among the prior art a plurality of parameter measurement, manual inefficiency problem.
Based on the above-mentioned purpose, the utility model provides a full parameter key testing arrangement of module power, include:
the device comprises an input performance test circuit, an enabling end control test circuit, an output performance test circuit, a test system and a module power supply placing groove; wherein:
the module power supply placing groove is respectively connected with the input performance testing circuit, the enabling end control testing circuit and the output performance testing circuit, and the module power supply placing groove is used for placing a tested module power supply.
The test system is respectively connected with the input performance test circuit, the enabling end control test circuit and the output performance test circuit and is used for measuring parameters of the module power supply.
The input performance test circuit comprises: a capacitor Cin, a port VinS +, a port VinF +, a port VinS-, a port VinF-, a port Vin1, a port of the module under test power supply + Vin, and a port of the module under test power supply-Vin, the test system comprising: the device comprises a direct current voltage source, a digital measurement unit, a direct current voltage source and a digital measurement unit.
Wherein, one end of the capacitor Cin is respectively connected with the port VinS +, the port VinF + and the port + Vin of the tested module power supply, the other end of the capacitor Cin is respectively connected with the port VinS-, the port VinF-and the port-Vin of the tested module power supply, the port + Vin of the power supply of the module to be tested is respectively connected with the port VinS + and the port VinF +, the port Vin of the module power supply to be tested is respectively connected with a port VinS-port VinF-, a port VinS + is respectively connected with a port Vin and a port positive Sense of the direct-current voltage source of the test system, a port VinF + is connected with a port positive Force of the direct-current voltage source of the test system, a port VinS-is respectively connected with a port Vin1 and a port negative Sense of the direct-current voltage source of the test system, a port VinF-is connected with a port negative Force of the direct-current voltage source of the test system, and a port Vin1 is connected with a digital measurement unit of the test system.
The enable terminal control test circuit includes: the device comprises a switch K1, a switch K2, a port Vin2, a relay J1, a relay J2, a port C1G1, a port C2G1, +12V voltage port, a port Vcc, a resistor Ren, a ground wire interface Vins-and a port Enable of the power supply of the tested module;
the port Enable of the power supply of the module to be tested is respectively connected with a switch K1, a switch K2 and a port Vin2, the switch K1 is connected with VinS-, the switch K1 is controlled by a relay J1, two ends of a relay J1 are respectively connected with a +12V voltage port and a port C1G1, the switch K2 is connected with a resistor Ren, a switch K2 is controlled by a relay J2, two ends of a relay J2 are respectively connected with a +12V voltage port and a port C2G1, the resistor Ren is connected with a port Vcc, a port VinS 2 is connected with the port VinS-and a digital measuring unit of the test system, and the +12V voltage port, the port C1G1, the port C2G1 and the port Vcc are respectively connected with the ports of the test system in a one-to one correspondence.
The output performance test circuit comprises: the testing system comprises a capacitor Co, a port + S, a port Vo +, a port-S, a port Vo-, a port Vo, a port Trim, a single-pole double-throw switch K3, a single-pole double-throw switch K4, a relay J3, a relay J4, a port C3G1, a port C4G1, a +12V voltage port, an adjustable resistor Rset, a port Vo-, a port-S, a port Vo + and a port + S of a tested module power supply, and comprises: the device comprises a direct current voltage source, a digital measurement unit, a direct current voltage source and a digital measurement unit, wherein the direct current voltage source comprises a positive port Sense of a direct current voltage source, a positive port Force of the direct current voltage source, a negative port Sense of the direct current voltage source, a negative port Force of the direct current voltage source and the digital measurement unit;
wherein, one end of the capacitor Co is respectively connected with a port + S, a port Vo + of the tested module power supply and the port + S of the tested module power supply, the other end of the capacitor Co is respectively connected with a port-S, a port Vo-of the tested module power supply and a port-S of the tested module power supply, the port Vo + of the tested module power supply is connected with the port + S, the port + S of the tested module power supply is connected with the port Vo +, the port Vo-of the tested module power supply is connected with the port-S, the port-S of the tested module power supply is connected with the port Vo-, the port + S and the port-S are respectively connected with the port Vo, the port Vo is connected with a digital measuring unit of the testing system, the port + S is connected with a positive Sense end of a direct current electronic load of the testing system, the port Vo + is connected with the positive Force end of the direct current electronic load of the test system, the port-S is connected with the negative Sense end of the direct current electronic load of the test system, the port Vo-is connected with the negative Force end of the direct current electronic load of the test system, the port Trim of the power supply of the module to be tested is connected with a single-pole double-throw switch K3, the single-pole double-throw switch K3 is controlled by a relay J3, two ends of the relay J3 are respectively connected with a +12V voltage port and a port C3G1, the single-pole double-throw switch K3 is connected with an adjustable resistor Rset, the adjustable resistor Rset is connected with a single-pole double-throw switch K4, the single-pole double-throw switch K4 is controlled by a relay J4, two ends of the relay J4 are respectively connected with a +12V voltage port and a port C4G1, the single-pole double-throw switch K4 is connected with a port-S and a port + S, and the +12V voltage port, the port C3G1 and the port C4G1 are respectively connected with ports of the test system in a one-to-one corresponding mode.
The adjustable resistance Rest of the output performance test circuit is a program-controlled adjustable resistance box, the resistance range of the adjustable resistance box is 1K to 100M ohms, the single-pole double-throw switch K3 is controlled through the relay J3, the output performance test circuit is enabled to be in a normal output state or an adjustment output state, and when the output performance test circuit is in the adjustment output state, the single-pole double-throw switch K4 is controlled through the relay J4, so that the output performance test circuit is enabled to be in an upper adjustment output state or a lower adjustment output state.
The input source of the test system is provided with specified voltage, the electronic load of the test system is provided with specified current, and the electronic load and the measurement function of the input source are utilized to test the output voltage precision, the voltage regulation rate, the current regulation rate and the efficiency of the module power supply;
the input source of the test system is provided with specified voltage, the electronic load of the test system is provided with specified current, the relay J1 and the relay J2 are controlled, the enabling end of the module power supply is in a suspended state, a grounding state or a high-voltage state, and the enabling control test is completed by utilizing the input source and the input and output parameters of the electronic load measuring device;
the input source of the test system is provided with specified voltage, the electronic load of the test system is provided with specified current, the relay J3 and the relay J4 are controlled, the output adjusting end of the module power supply is connected to the output positive or output negative through an adjustable resistor Rset, the module power supply is in an adjusting working state, and the output voltage adjusting test is completed by utilizing the input source and the input and output parameters of the electronic load measuring device;
the input source of the test system is provided with specified voltage, the electronic load of the test system is provided with specified current, the digital measurement unit of the test system is utilized to measure the parameters of output response when the input of the module power supply is stepped, output response when the load is stepped, ripple voltage and recovery time, and the waveform of each parameter is dynamically displayed;
and the test system generates a test report comprising a data result and test waveform information according to the completed test.
And the ports VinS +, VinS-, VinF + and VinF-are correspondingly connected with the control system through connectors.
The port +12V, the port C1G1, the port C2G1, the port C3G1, the port C4G1 and the port Vcc are correspondingly connected with an interface of a control system through connectors.
And the port + S, the port-S, the port Vo + and the port Vo-are connected with corresponding interfaces of the control system through connectors.
The test system is a NHR5700 power module test system.
From the above, can see that the utility model provides a pair of full parameter one-key testing arrangement of module power to the module power that functional parameter is complicated, design preparation test circuit realizes the one-key test of the full parameter of module power. The device has solved manual seizure waveform inefficiency to the unable problem that fuses with the test report of graphic data, test circuit design combines together with test system's software and hardware, has promoted the efficiency of module power test greatly, has increased the utility model discloses a commonality.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to these drawings without creative efforts.
FIG. 1 is a schematic diagram of the input performance test circuit of the present invention;
FIG. 2 is a schematic diagram of the connection of the control test circuit of the enable terminal of the present invention;
FIG. 3 is a schematic diagram of the output performance testing circuit of the present invention;
fig. 4 is a schematic diagram of the circuit port of the present invention connecting the test system through the connector.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention more apparent, the present invention will be described in detail with reference to the accompanying drawings.
It should be noted that unless otherwise defined, technical or scientific terms used in the embodiments of the present invention should have the ordinary meaning as understood by those having ordinary skill in the art to which the present disclosure belongs. The use of "first," "second," and similar terms in this disclosure is not intended to indicate any order, quantity, or importance, but rather is used to distinguish one element from another. The word "comprising" or "comprises", and the like, means that the element or item listed before the word covers the element or item listed after the word and its equivalents, but does not exclude other elements or items. The terms "connected" or "coupled" and the like are not restricted to physical or mechanical connections, but may include electrical connections, whether direct or indirect. "upper", "lower", "left", "right", and the like are used merely to indicate relative positional relationships, and when the absolute position of the object being described is changed, the relative positional relationships may also be changed accordingly.
A full-parameter one-key testing device of a module power supply comprises an input performance testing circuit, an enabling end control testing circuit, an output performance testing circuit, a testing system and a module power supply placing groove, wherein the module power supply placing groove is respectively connected with the input performance testing circuit, the enabling end control testing circuit and the output performance testing circuit, and is used for placing a tested module power supply; the test system is respectively connected with the input performance test circuit, the enabling end control test circuit and the output performance test circuit and is used for measuring parameters of the module power supply.
As shown in fig. 1, for the input performance test circuit connection diagram according to an embodiment of the present invention, the input performance test circuit includes: a capacitor Cin, a port VinS +, a port VinF +, a port VinS-, a port VinF-, a port Vin1, a port of the module under test power supply + Vin, and a port of the module under test power supply-Vin, the test system comprising: the device comprises a direct current voltage source, a digital measurement unit, a direct current voltage source and a digital measurement unit.
One end of a capacitor Cin is respectively connected with a port VinS +, a port VinF + and a port + Vin of a tested module power supply, the other end of the capacitor Cin is respectively connected with a port VinS-, a port Vinf-and a port-Vin of the tested module power supply, the port + Vin of the tested module power supply is respectively connected with a port VinS +, a port Vinf +, a port VinF-of the tested module power supply is respectively connected with a port VinS-, a port Vinf-, a port VinF + is respectively connected with a port 1 and a port positive Sense of a direct-current voltage source of a test system, a port VinF + is connected with a port positive Force of the direct-current voltage source of the test system, a port VinS-is respectively connected with a port Vin1 and a port negative Sense of the direct-current voltage source of the test system, and a port VinF-is connected with a port negative Force of the direct-current voltage source of the test system. The port Vin1 is connected with a digital measurement unit of the test system through an SMA connector and is used for capturing data and waveforms of input ripple voltage and input ripple current. The method comprises the steps of selecting an input voltage source required by a test device and setting input voltage source parameters through software of a test system, and programming an input voltage program, wherein the input voltage program can be input transition signals or harmonic signals and provides input conditions for module power supply test.
As shown in fig. 2, for the utility model discloses an enable end control test circuit connection schematic diagram of an embodiment, enable end control test circuit includes: the device comprises a switch K1, a switch K2, a port Vin2, a relay J1, a relay J2, a port C1G1, a port C2G1, +12V voltage port, a port Vcc, a resistor Ren, a ground wire interface Vins-and a port Enable of the power supply of the tested module. The port Enable of the power supply of the module to be tested is respectively connected with a switch K1, a switch K2 and a port Vin2, the switch K1 is controlled by a relay J1, two ends of the relay J1 are respectively connected with a +12V voltage port and a port C1G1, a switch K2 is connected with a resistor Ren, the switch K2 is controlled by a relay J2, two ends of the relay J2 are respectively connected with a +12V voltage port and a port C2G1, the resistor Ren is connected with a port Vcc, the port Vin2 is connected with a digital measuring unit of the test system through an SMA joint to realize an enabling voltage and current test, and the +12V voltage port, the port C1G1, the port C2G1 and the port Vcc are respectively connected with the ports of the test system in a one-to-one correspondence manner. The opening and closing of the relay J1 and the relay J2 are controlled through software of a test system, when the switch K1 and the switch K2 are opened, the port Enable is suspended, when the switch K1 is closed, the port Enable is grounded, when the switch K2 is closed, the port Enable is connected with a required high level through a resistor Ren, the high level type is provided through an input voltage source of the test system, and the K1 and the K2 are not closed at the same time.
As shown in fig. 3, for the utility model discloses an output performance test circuit connection schematic diagram of an embodiment, output performance test circuit includes: the testing system comprises a capacitor Co, a port + S, a port Vo +, a port-S, a port Vo-, a port Vo, a port Trim, a single-pole double-throw switch K3, a single-pole double-throw switch K4, a relay J3, a relay J4, a port C3G1, a port C4G1, a +12V voltage port, an adjustable resistor Rset, a port Vo-, a port-S, a port Vo + and a port + S of a tested module power supply, and comprises: the device comprises a direct current voltage source, a digital measurement unit, a direct current voltage source and a digital measurement unit. One end of a capacitor Co is respectively connected with a port + S, a port Vo + of the tested module power supply and the port + S of the tested module power supply, the other end of the capacitor Co is respectively connected with a port-S, a port Vo-of the tested module power supply and the port-S of the tested module power supply, the port Vo + of the tested module power supply is connected with the port + S, the port + S of the tested module power supply is connected with the port Vo +, the port Vo-of the tested module power supply is connected with the port-S, the port-S of the tested module power supply is connected with the port Vo-, the port + S and the port-S are respectively connected with the port Vo, and the port Vo is connected with a digital measuring unit of the test system through an SMA female head and used for capturing output voltage, output power and output voltage, The testing system comprises a port S, a port Vo and a port-S, wherein the port S is connected with a positive sensor end of a direct current electronic load of the testing system, the port Vo + is connected with a positive Force end of the direct current electronic load of the testing system, the port-S is connected with a negative sensor end of the direct current electronic load of the testing system, and the port Vo-S is connected with a negative Force end of the direct current electronic load of the testing system, so that an output load is provided for testing a module power supply, and the testing of output voltage and current is realized. Through test system software, the electronic load required by the power supply of the test module is selected and the parameters of the load are set, wherein the parameters can be current jump signals, and load conditions are provided for device testing.
When an output voltage adjustment function test is carried out, a port Trim of a module power supply to be tested is connected with a single-pole double-throw switch K3, the single-pole double-throw switch K3 is controlled by a relay J3, two ends of the relay J3 are respectively connected with a +12V voltage port and a port C3G1, the single-pole double-throw switch K3 is connected with an adjustable resistor Rset, the adjustable resistor Rset is connected with a single-pole double-throw switch K4, the single-pole double-throw switch K4 is controlled by the relay J4, two ends of the relay J4 are respectively connected with the +12V voltage port and a port C4G1, the single-pole double-throw switch K4 is connected with the port-S and the port + S, and the +12V voltage port, the port C3G1 and the port C4G1 are respectively connected with ports of the test system in a one-to-one correspondence manner. The module power supply is adjusted to be normally output or adjusted to be output by controlling the switch K3 through the relay J3, when the relay J3 does not act, the module power supply is in a normal working state, when the relay J3 acts, the module power supply is in an output voltage adjusting state, when the relay J4 does not act, the switch K4 is connected with a negative output end of the testing system, the output voltage of the module power supply is adjusted upwards, when the relay J4 acts, the switch K4 is connected with a positive output end of the testing system, the output voltage of the module power supply is adjusted downwards, and therefore the module power supply output voltage is not adjusted, and the up-adjustment and the down-adjustment of three states are switched.
Optionally, the adjustable resistor Rset is a program-controlled adjustable resistor box, the resistance range of the adjustable resistor Rset is 1k to 100M ohms, the resistance value can be adjusted through test system software, switching among a plurality of resistors is not needed, and the resistance value is more accurate.
In addition, the utility model can be used for measuring other parameters, the input source of the test system is provided with specified voltage, the electronic load of the test system is provided with specified current, and the output voltage precision, the voltage regulation rate, the current regulation rate and the efficiency of the module power supply are tested by utilizing the measurement functions of the electronic load and the input source; the method comprises the steps that a specified voltage is set for an input source of the test system, a specified current is set for an electronic load of the test system, parameters of output response when the input of a module power supply is stepped, output response when the load is stepped, ripple voltage and recovery time are measured by a digital measurement unit of the test system, and the waveform of each parameter is dynamically displayed on test system software;
and the test system generates a test report comprising a data result and test waveform information according to the completed test.
Fig. 4 is a general schematic diagram of a circuit system according to an embodiment of the present invention.
Optionally, the utility model discloses a port VinS +, port VinS-, port VinF +, port VinF-, port +12V, port C1G1, port C2G1, port C3G1, port C4G1, port Vcc, port + S, port-S, port Vo +, port Vo-pass through the connector and correspond interface connection with control system, connect test system' S various port resources, including 12V voltage, relay control bit, input voltage source Sense line, electronic load Sense line.
Optionally, the utility model discloses a test system is NHR5700 power module test system.
From the above, can see that the utility model provides a pair of full parameter one-key testing arrangement of module power to the module power that functional parameter is complicated, design preparation test circuit realizes the one-key test of the full parameter of module power. The device has solved manual seizure waveform inefficiency to the unable problem that fuses with the test report of graphic data, test circuit design combines together with test system's software and hardware, has promoted the efficiency of module power test greatly, has increased the utility model discloses a commonality.
Those of ordinary skill in the art will understand that: the discussion of any embodiment above is meant to be exemplary only, and is not intended to intimate that the scope of the disclosure, including the claims, is limited to these examples; within the idea of the invention, also technical features in the above embodiments or in different embodiments can be combined, steps can be implemented in any order, and there are many other variations of the different aspects of the invention as described above, which are not provided in detail for the sake of brevity.
The present embodiments are intended to embrace all such alternatives, modifications and variances which fall within the broad scope of the appended claims. Therefore, any omission, modification, equivalent replacement, or improvement made within the spirit and principle of the present invention should be included within the protection scope of the present invention.
Claims (10)
1. A full parameter one-touch testing device for a modular power supply, comprising:
the device comprises an input performance test circuit, an enabling end control test circuit, an output performance test circuit, a test system and a module power supply placing groove; wherein:
the module power supply placing groove is respectively connected with the input performance testing circuit, the enabling end control testing circuit and the output performance testing circuit, and the module power supply placing groove is used for placing a module power supply to be tested;
the test system is respectively connected with the input performance test circuit, the enabling end control test circuit and the output performance test circuit and is used for measuring parameters of the module power supply.
2. The full parameter one-touch test apparatus for a modular power supply of claim 1, wherein the input performance test circuit comprises: a capacitor Cin, a port VinS +, a port VinF +, a port VinS-, a port VinF-, a port Vin1, a port of the module under test power supply + Vin, and a port of the module under test power supply-Vin, the test system comprising: the device comprises a direct current voltage source, a digital measurement unit, a direct current voltage source and a digital measurement unit, wherein the direct current voltage source comprises a positive port Sense of a direct current voltage source, a positive port Force of the direct current voltage source, a negative port Sense of the direct current voltage source, a negative port Force of the direct current voltage source and the digital measurement unit;
wherein, one end of the capacitor Cin is respectively connected with the port VinS +, the port VinF + and the port + Vin of the tested module power supply, the other end of the capacitor Cin is respectively connected with the port VinS-, the port VinF-and the port-Vin of the tested module power supply, the port + Vin of the power supply of the module to be tested is respectively connected with the port VinS + and the port VinF +, the port Vin of the module power supply to be tested is respectively connected with a port VinS-port VinF-, a port VinS + is respectively connected with a port Vin and a port positive Sense of the direct-current voltage source of the test system, a port VinF + is connected with a port positive Force of the direct-current voltage source of the test system, a port VinS-is respectively connected with a port Vin1 and a port negative Sense of the direct-current voltage source of the test system, a port VinF-is connected with a port negative Force of the direct-current voltage source of the test system, and a port Vin1 is connected with a digital measurement unit of the test system.
3. The full parameter one-touch test apparatus for module power of claim 1, wherein the enable control test circuit comprises: the device comprises a switch K1, a switch K2, a port Vin2, a relay J1, a relay J2, a port C1G1, a port C2G1, +12V voltage port, a port Vcc, a resistor Ren, a ground wire interface Vins-and a port Enable of the power supply of the tested module;
the port Enable of the power supply of the module to be tested is respectively connected with a switch K1, a switch K2 and a port Vin2, the switch K1 is connected with VinS-, the switch K1 is controlled by a relay J1, two ends of a relay J1 are respectively connected with a +12V voltage port and a port C1G1, the switch K2 is connected with a resistor Ren, a switch K2 is controlled by a relay J2, two ends of a relay J2 are respectively connected with a +12V voltage port and a port C2G1, the resistor Ren is connected with a port Vcc, a port VinS 2 is connected with the port VinS-and a digital measuring unit of the test system, and the +12V voltage port, the port C1G1, the port C2G1 and the port Vcc are respectively connected with the ports of the test system in a one-to one correspondence.
4. The full parameter one-touch test apparatus for module power of claim 1, wherein the output performance test circuit comprises: the testing system comprises a capacitor Co, a port + S, a port Vo +, a port-S, a port Vo-, a port Vo, a port Trim, a single-pole double-throw switch K3, a single-pole double-throw switch K4, a relay J3, a relay J4, a port C3G1, a port C4G1, a +12V voltage port, an adjustable resistor Rset, a port Vo-, a port-S, a port Vo + and a port + S of a tested module power supply, and comprises: the device comprises a direct current voltage source, a digital measurement unit, a direct current voltage source and a digital measurement unit, wherein the direct current voltage source comprises a positive port Sense of a direct current voltage source, a positive port Force of the direct current voltage source, a negative port Sense of the direct current voltage source, a negative port Force of the direct current voltage source and the digital measurement unit;
wherein, one end of the capacitor Co is respectively connected with a port + S, a port Vo + of the tested module power supply and the port + S of the tested module power supply, the other end of the capacitor Co is respectively connected with a port-S, a port Vo-of the tested module power supply and a port-S of the tested module power supply, the port Vo + of the tested module power supply is connected with the port + S, the port + S of the tested module power supply is connected with the port Vo +, the port Vo-of the tested module power supply is connected with the port-S, the port-S of the tested module power supply is connected with the port Vo-, the port + S and the port-S are respectively connected with the port Vo, the port Vo is connected with a digital measuring unit of the testing system, the port + S is connected with a positive Sense end of a direct current electronic load of the testing system, the port Vo + is connected with the positive Force end of the direct current electronic load of the test system, the port-S is connected with the negative Sense end of the direct current electronic load of the test system, the port Vo-is connected with the negative Force end of the direct current electronic load of the test system, the port Trim of the power supply of the module to be tested is connected with a single-pole double-throw switch K3, the single-pole double-throw switch K3 is controlled by a relay J3, two ends of the relay J3 are respectively connected with a +12V voltage port and a port C3G1, the single-pole double-throw switch K3 is connected with an adjustable resistor Rset, the adjustable resistor Rset is connected with a single-pole double-throw switch K4, the single-pole double-throw switch K4 is controlled by a relay J4, two ends of the relay J4 are respectively connected with a +12V voltage port and a port C4G1, the single-pole double-throw switch K4 is connected with a port-S and a port + S, and the +12V voltage port, the port C3G1 and the port C4G1 are respectively connected with ports of the test system in a one-to-one corresponding mode.
5. The full-parameter one-key testing device of the module power supply as claimed in claim 4, wherein the adjustable resistor Rest of the output performance testing circuit is a programmable adjustable resistor box with a resistance range of 1K to 100M ohms, the single-pole double-throw switch K3 is controlled by a relay J3 to enable the output performance testing circuit to be in a normal output state or an adjusted output state, and when the output performance testing circuit is in the adjusted output state, the single-pole double-throw switch K4 is controlled by a relay J4 to enable the output performance testing circuit to be in an up-adjusted output state or a down-adjusted output state.
6. The full-parameter one-touch testing device for the module power supply according to any one of claims 2 to 4, wherein an input source of the testing system is set with a specified voltage, an electronic load of the testing system is set with a specified current, and the electronic load and a measurement function carried by the input source are used for testing the accuracy, the voltage regulation rate, the current regulation rate and the efficiency of the output voltage of the module power supply;
the input source of the test system is provided with specified voltage, the electronic load of the test system is provided with specified current, the relay J1 and the relay J2 are controlled, the enabling end of the module power supply is in a suspended state, a grounding state or a high-voltage state, and the enabling control test is completed by utilizing the input source and the input and output parameters of the electronic load measuring device;
the input source of the test system is provided with specified voltage, the electronic load of the test system is provided with specified current, the relay J3 and the relay J4 are controlled, the output adjusting end of the module power supply is connected to the output positive or output negative through an adjustable resistor Rset, the module power supply is in an adjusting working state, and the output voltage adjusting test is completed by utilizing the input source and the input and output parameters of the electronic load measuring device;
the input source of the test system is provided with specified voltage, the electronic load of the test system is provided with specified current, the digital measurement unit of the test system is utilized to measure the parameters of output response when the input of the module power supply is stepped, output response when the load is stepped, ripple voltage and recovery time, and the waveform of each parameter is dynamically displayed;
and the test system generates a test report comprising a data result and test waveform information according to the completed test.
7. The full parameter one-touch testing apparatus of module power according to claim 2, wherein the ports VinS +, VinS-, VinF +, VinF-are correspondingly interfaced with the control system through connectors.
8. The full parameter one-touch testing device of module power of claim 3, wherein the port +12V, the port C1G1, the port C2G1, the port C3G1, the port C4G1 and the port Vcc are connected with the corresponding interfaces of the control system through connectors.
9. The full parameter one-touch testing apparatus of a module power supply of claim 4, wherein the port + S, the port-S, the port Vo +, and the port Vo-are correspondingly interfaced with a control system through connectors.
10. The full parameter one-touch test set for a modular power supply of claim 1, wherein the test system is a NHR5700 power supply module test system.
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