CN214335131U

CN214335131U - Capacitor aging test device

Info

Publication number: CN214335131U
Application number: CN202022658922.5U
Authority: CN
Inventors: 李志刚
Original assignee: Yancheng Xingchen Technology Co ltd
Current assignee: Yancheng Xingchen Technology Co ltd
Priority date: 2020-11-17
Filing date: 2020-11-17
Publication date: 2021-10-01
Anticipated expiration: 2030-11-17

Abstract

The utility model discloses a condenser aging testing device in condenser test equipment field, the on-line screen storage device comprises a base, fixed mounting has high temperature aging testing box on the base, the top is fixed with heating mechanism in the high temperature aging testing box, heating mechanism bottom is provided with the test jig, top fixed mounting has the heat-conducting plate in the test jig, the test jig bottom is provided with the air inlet, and the air inlet is provided with a plurality ofly, equal fixed mounting has first solenoid valve in a plurality of air inlets, be provided with the air pump groove in the inner wall of base bottom, fixed mounting has the air pump in the air pump groove, be provided with intake pipe and outlet duct on the air pump, the beneficial effects of the utility model are that: this kind of aging testing device convenient to use can carry out high temperature aging testing work to the condenser, simultaneously can be quick after the condenser test to the condenser cooling of dispelling the heat for the cooling rate of condenser has shortened the time of taking out of condenser, thereby has further improved the efficiency of software testing of condenser.

Description

Capacitor aging test device

Technical Field

The utility model relates to a condenser test equipment field specifically is a condenser aging testing device.

Background

Two conductors which are close to each other, with a non-conductive insulating medium in between, constitute a capacitor. When a voltage is applied between two plates of a capacitor, the capacitor stores charges, and the capacitor is commonly used in some precise instruments, and in order to ensure that the instruments can be normally used, the capacitor needs to be subjected to an aging test.

At present, the present most high temperature aging test back that carries out to the condenser of present condenser aging test because condenser surface temperature is too high, in order to prevent scalding the staff, need take out again after waiting for the condenser cooling to influenced the efficiency of software testing of condenser, consequently the utility model provides a condenser aging testing device.

SUMMERY OF THE UTILITY MODEL

The utility model provides a condenser aging testing device for solve above-mentioned current convenient for people street lamp single structure, only can provide the effect of illumination, functional singleness, and the stability of street lamp exists not enough, problem of energy-concerving and environment-protective inadequately.

In order to solve the technical problem, the utility model provides a following technical scheme:

the utility model provides a condenser aging testing device, includes the base, fixed mounting has high temperature aging testing box on the base, top fixed mounting has heating mechanism in the high temperature aging testing box, heating mechanism bottom is provided with the test jig, top fixed mounting has the heat-conducting plate in the test jig, the test jig bottom is provided with the air inlet, just the air inlet is provided with a plurality ofly, and is a plurality of equal fixed mounting has first solenoid valve in the air inlet, be provided with the air pump groove in the base bottom inner wall, air pump inslot fixed mounting has the air pump, be provided with intake pipe and outlet duct on the air pump, intake pipe and the interior intercommunication of base on the air pump, the outlet duct on the air pump extends the base front end, the both sides of base all are provided with the through-hole, two equal fixed mounting has the second solenoid valve in the through-hole.

As a further aspect of the present invention: the outside that lies in the air pump groove in the inner wall of base bottom is provided with the mounting groove, just the mounting groove is provided with a plurality ofly, and is a plurality of equal sliding connection has the limiting plate in the mounting groove, and is a plurality of the equal fixed mounting in limiting plate bottom has the spring, and is a plurality of the equal fixed mounting in spring bottom is in the mounting groove, and is a plurality of the equal fixed mounting in limiting plate top has the bracing piece, and is a plurality of in the bracing piece all extends to the base the equal fixed mounting in bracing piece top has the backup pad, and on the backup pad fell down to the test jig, the backup pad drove the bracing piece and pushes down to the mounting groove in, limiting plate extrusion spring utilizes the spring return buffering to in avoiding long-term use, the test jig whereabouts and base bottom inter-end collision damage, influence the life of this equipment.

As a further aspect of the present invention: the top of the heat conducting plate is abutted to the heating mechanism, so that the heat conducting plate can conduct heat on the heating mechanism through the design, and high-temperature aging test and test work is facilitated.

As a further aspect of the present invention: be provided with the net frame in the test jig, just the equal fixed mounting in both sides of net frame is on the inner wall of test jig, is convenient for place the condenser through being provided with the net frame, conveniently carries out aging testing work.

As a further aspect of the present invention: the test jig bottom fixed mounting has the blotter, through the buffer capacity of blotter when further improving the test jig whereabouts, avoids shaking too big damage condenser.

As a further aspect of the present invention: the base front end has the hinge door through hinge connection, just be provided with the observation window on the hinge door, be convenient for observe the condenser through the observation window, be favorable to the use of this equipment.

Advantageous effects

Compared with the prior art, the beneficial effects of the utility model are that:

1. in the utility model, through opening the hinge door, the capacitor to be tested is placed on the grid frame, the hinge door is closed, the switch is opened, at the moment, the air pump works, the air pump conveys the outside air into the base, the pressure in the base is increased, so that the testing frame rises to enter the high-temperature aging testing box, at the moment, the heating mechanism works to transfer the heat to the heat conducting plate, and then the heat conducting plate transfers the heat to the testing frame, the capacitor is heated for aging testing, after the testing is finished, the first electromagnetic valve is opened, the air in the base enters the testing frame through the air inlet, so that the testing frame falls into the base, when the air outlet corresponds to the upper through hole, the second electromagnetic valve is opened, the air pump works again, the air pump conveys the outside air into the testing frame, and then the air is discharged through the through hole, the air circulation in the testing frame is accelerated, thereby the temperature on the capacitor, the aging test device is convenient to use, can perform high-temperature aging test work on the capacitor, and can quickly dissipate heat and cool the capacitor after the capacitor test is finished, so that the cooling speed of the capacitor is increased, the taking-out time of the capacitor is shortened, and the test efficiency of the capacitor is further improved;

2. the utility model discloses in, on the backup pad falls when the test jig, the backup pad drives the bracing piece and pushes down to the mounting groove in, limiting plate extrusion spring utilizes the spring return buffering to in avoiding long-term use, collision damage between test jig whereabouts and base bottom influences the life of this equipment.

Drawings

The accompanying drawings are included to provide a further understanding of the invention, and are incorporated in and constitute a part of this specification, illustrate embodiments of the invention, and together with the description serve to explain the invention and not to limit the invention. In the drawings:

fig. 1 is a schematic structural diagram of the present invention;

fig. 2 is a cross-sectional view of the present invention;

fig. 3 is an enlarged view of a in fig. 2 according to the present invention.

In the figure: 1. a base; 2. a high temperature aging test box; 3. a cushion pad; 4. a first solenoid valve; 5. a grid frame; 6. a heat conducting plate; 7. an air inlet; 8. a through hole; 9. a test jig; 10. a heating mechanism; 11. an air outlet; 12. an air pump groove; 13. a second solenoid valve; 14. an air pump; 15. a hinge door; 16. a support plate; 17. a support bar; 18. mounting grooves; 19. a spring; 20. and a limiting plate.

Detailed Description

The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative work belong to the protection scope of the present invention.

Example (b): as shown in figures 1-3, a capacitor aging test device comprises a base 1, a high temperature aging test box 2 is fixedly arranged on the base 1, a heating mechanism 10 is fixedly arranged at the top end in the high temperature aging test box 2, a test frame 9 is arranged at the bottom of the heating mechanism 10, a heat conducting plate 6 is fixedly arranged at the top end in the test frame 9, an air inlet 7 is arranged at the bottom of the test frame 9, and air inlet 7 is provided with a plurality ofly, equal fixed mounting has first solenoid valve 4 in a plurality of air inlets 7, is provided with air pump groove 12 in the inner wall of 1 bottom of base, and fixed mounting has air pump 14 in air pump groove 12, is provided with intake pipe and outlet duct on the air pump 14, and the intake pipe on the air pump 14 communicates in with base 1, and the outlet duct on the air pump 14 extends base 1 front end, and the both sides of base 1 all are provided with through-hole 8, and equal fixed mounting has second solenoid valve 13 in two through-holes 8.

The outside that lies in air pump groove 12 in the inner wall of base 1 bottom is provided with mounting groove 18, and mounting groove 18 is provided with a plurality ofly, equal sliding connection has limiting plate 20 in a plurality of mounting grooves 18, the equal fixed mounting in a plurality of limiting plate 20 bottoms has spring 19, the equal fixed mounting in mounting groove 18 bottom in a plurality of spring 19 bottoms, the equal fixed mounting in a plurality of limiting plate 20 tops has bracing piece 17, a plurality of bracing pieces 17 all extend to in the base 1, and the equal fixed mounting in a plurality of bracing piece 17 tops has backup pad 16, fall on backup pad 16 when test jig 9, backup pad 16 drives bracing piece 17 and pushes down to mounting groove 18 in, limiting plate 20 extrusion spring 19, utilize spring 19 return buffering, thereby in avoiding long-term use, the collision between test jig 9 whereabouts and base 1 bottom is damaged, influence the life of this equipment.

The top of the heat conducting plate 6 is abutted to the heating mechanism 10, so that the heat conducting plate 6 can conduct heat on the heating mechanism 10 through the design, and high-temperature aging test and test are facilitated.

Be provided with net rack 5 in the test jig 9, and the equal fixed mounting in both sides of net rack 5 is on the inner wall of test jig 9, is convenient for place the condenser through being provided with net rack 5, conveniently carries out aging testing work.

The bottom of the test frame 9 is fixedly provided with a cushion pad 3, the cushion capacity of the test frame 9 during falling is further improved through the cushion pad 3, and the capacitor is prevented from being damaged due to too large vibration.

The front end of the base 1 is connected with a hinge door 15 through a hinge, an observation window is arranged on the hinge door 15, the capacitor can be observed conveniently through the observation window, and the use of the device is facilitated.

Specifically, when the utility model is used, the hinge door 15 is opened, the capacitor to be tested is placed on the grid frame 5, the hinge door 15 is closed, the switch is opened, the air pump 14 works at the moment, the air pump 14 conveys the outside air into the base 1, the pressure in the base 1 is increased, so that the test frame 9 rises to enter the high-temperature aging test box 2, the heating mechanism 10 works to transfer the heat to the heat conducting plate 6 and then to the test frame 9 through the heat conducting plate 6, the capacitor is heated for aging test, after the test is finished, the first electromagnetic valve 4 is opened, the air in the base 1 enters the test frame 9 through the air inlet 7, so that the test frame 9 falls into the base 1, when the air outlet 11 corresponds to the through hole 8, the second electromagnetic valve 13 is opened, the air pump 14 works again, the air pump 14 conveys the outside air into the test frame 9, the aging test device is convenient to use, can carry out high-temperature aging test work on the capacitor, and can quickly carry out heat dissipation and cooling on the capacitor after the capacitor test is finished, so that the cooling speed of the capacitor is increased, the taking-out time of the capacitor is shortened, and the test efficiency of the capacitor is further improved;

on the backup pad 16 falls when test jig 9, backup pad 16 drives bracing piece 17 and pushes down to mounting groove 18 in, limiting plate 20 extrusion spring 19 utilizes the buffering of spring 19 return to in avoiding long-term use, the collision between the bottom end in test jig 9 whereabouts and the base 1 damages, influences the life of this equipment.

Although embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that changes, modifications, substitutions and alterations can be made in these embodiments without departing from the principles and spirit of the invention, the scope of which is defined in the appended claims and their equivalents.

Claims

1. The capacitor aging testing device is characterized by comprising a base (1), wherein a high-temperature aging testing box (2) is fixedly mounted on the base (1), a heating mechanism (10) is fixedly mounted at the top end in the high-temperature aging testing box (2), a testing frame (9) is arranged at the bottom of the heating mechanism (10), a heat conducting plate (6) is fixedly mounted at the top end in the testing frame (9), an air inlet (7) is arranged at the bottom of the testing frame (9), a plurality of air inlets (7) are arranged, a first electromagnetic valve (4) is fixedly mounted in each air inlet (7), an air pump groove (12) is formed in the inner wall of the bottom end of the base (1), an air pump (14) is fixedly mounted in the air pump groove (12), an air inlet pipe and an air outlet pipe are arranged on the air pump (14), and the air inlet pipe on the air pump (14) is communicated with the base (1), an air outlet pipe on the air pump (14) extends out of the front end of the base (1), through holes (8) are formed in the two sides of the base (1), and second electromagnetic valves (13) are fixedly mounted in the through holes (8).

2. The capacitor aging testing device according to claim 1, wherein a mounting groove (18) is formed in the inner wall of the bottom end of the base (1) and located outside the air pump groove (12), the mounting groove (18) is provided with a plurality of limiting plates (20) which are slidably connected in the mounting groove (18), the limiting plates (20) are fixedly mounted at the bottoms of the limiting plates (20) and are provided with springs (19), the springs (19) are fixedly mounted at the bottoms of the mounting groove (18) and are provided with supporting rods (17), the supporting rods (17) are fixedly mounted at the tops of the limiting plates (20) and are provided with supporting plates (16), and the supporting rods (17) are fixedly mounted at the tops of the supporting rods (17) and are provided with supporting plates (16).

3. A capacitor ageing test device according to claim 1, characterized in that the top of the thermally conducting plate (6) is placed against the heating means (10).

4. The capacitor aging testing device according to claim 1, characterized in that a grid frame (5) is arranged in the testing frame (9), and both sides of the grid frame (5) are fixedly installed on the inner wall of the testing frame (9).

5. The capacitor aging test device of claim 1, wherein the bottom of the test frame (9) is fixedly provided with the cushion pad (3).

6. The capacitor aging testing device of claim 1, characterized in that a hinge door (15) is connected to the front end of the base (1) through a hinge, and an observation window is arranged on the hinge door (15).