CN214278249U - High-temperature test chamber - Google Patents
High-temperature test chamber Download PDFInfo
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- CN214278249U CN214278249U CN202023315266.5U CN202023315266U CN214278249U CN 214278249 U CN214278249 U CN 214278249U CN 202023315266 U CN202023315266 U CN 202023315266U CN 214278249 U CN214278249 U CN 214278249U
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Abstract
A high temperature test chamber comprising: the device comprises a box body, a heating mechanism and at least two regulating switches; at least two testing chambers are arranged in the box body, a door body is arranged on each testing chamber, and the door bodies are rotatably connected to the side walls of the testing chambers; each test chamber is internally provided with a heating mechanism; the heating mechanism includes: chassis, resistance wire, two porcelain strips and at least a set of quartzy nest of tubes, the chassis sets up on the lateral wall of test room, and two porcelain strips set up respectively at the both ends on chassis, and the quartzy nest of tubes is fixed between two porcelain strips, and resistance wire evenly distributed forms the return circuit at the quartzy nest of tubes, and an adjustment switch is connected with the resistance wire electricity for a sample can be in different test rooms, accomplishes the aging testing simultaneously under different temperatures, has improved efficiency of software testing.
Description
Technical Field
The utility model relates to a test equipment technical field, in particular to high temperature test case.
Background
The service life of the electronic equipment is an important standard for judging the quality of the electronic equipment. The service life of the electronic equipment is influenced by the conditions of long service life, temperature and humidity of the working environment and the like.
Therefore, at present, after electronic equipment is produced, manufacturers sample the electronic equipment for aging test, that is, the electronic equipment is placed in various parameter environments for testing, so as to test the aging condition of the electronic equipment in the environments, and a high-temperature test chamber is one of the environments.
When the existing high-temperature test box ages the electronic equipment, the aging condition of a sample at one temperature can only be tested by one-time aging, the requirement that the sample completes the aging test at different temperatures at the same time cannot be met, and the aging test needs to be carried out for multiple times when the aging test condition at different temperatures needs to be obtained, so that the test efficiency is lower.
SUMMERY OF THE UTILITY MODEL
Based on this, it is necessary to provide a high temperature test chamber.
The utility model provides an above-mentioned technical problem's technical scheme as follows: a high temperature test chamber comprising: the device comprises a box body, a heating mechanism and at least two regulating switches;
at least two testing chambers are arranged in the box body, a door body is arranged on each testing chamber, and the door bodies are rotatably connected to the side walls of the testing chambers;
the heating mechanism is respectively arranged in each test chamber;
the heating mechanism includes: the testing device comprises a chassis, a resistance wire, two ceramic strips and at least one group of quartz tube set, wherein the chassis is arranged on the side wall of the testing chamber, the two ceramic strips are respectively arranged at two ends of the chassis, the quartz tube set is fixed between the two ceramic strips, the resistance wire is uniformly distributed in the quartz tube set to form a loop, and the regulating switch is electrically connected with the resistance wire.
In one embodiment, the test device further comprises an air duct and an air duct, a cooling chamber is arranged in the box body, a second air inlet is formed in the cooling chamber, a first air inlet and a first air outlet are formed in each test chamber, a first end of the air duct is communicated with the first air inlet, a first end of the air duct is communicated with the first air outlet, a second end of the air duct is communicated with the second air inlet, and switch plates are respectively arranged on the first air inlet and the second air inlet and used for controlling the opening and closing of the first air inlet and the second air inlet.
In one embodiment, a plurality of cooling fins are arranged in the cooling chamber, and each cooling fin is sequentially arranged in the cooling chamber at intervals to form a cooling circuit.
In one embodiment, the cooling fin is one of a copper fin, a silver fin, and an iron fin.
In one embodiment, a phase change material layer is disposed on the cooling sheet.
In one embodiment, the number of the quartz tubes in each quartz tube group is 3.
In one embodiment, a thermal blanket is also included, the thermal blanket being disposed between the quartz tube set and the base pan.
In one embodiment, a detection window is formed in the door body, and a glass plate is arranged on the detection window.
The utility model has the advantages that: the utility model provides a pair of high temperature test box for when electronic equipment carries out ageing under the high temperature condition, be provided with two test chambers in the box at least, each install respectively in the test chamber heating mechanism, the circular telegram back, the quartz tube is organized the resistance wire produces a large amount of heats, regulating switch is through adjusting what the resistance wire produced heat corresponds the regulation temperature in the test chamber makes a sample can be different in the test chamber, accomplish ageing tests simultaneously under different temperatures, improved efficiency of software testing. Simultaneously, a large amount of heats that the resistance wire produced in the quartz nest of tubes heats electronic equipment through outwards sending far infrared radiation, has the advantage that the intensification is fast, the multizone temperature rise is even, generate heat the orientation well and the energy consumption is low, has improved heating efficiency and degree of consistency.
Drawings
FIG. 1 is a schematic structural diagram of a high-temperature test chamber according to an embodiment;
fig. 2 is a schematic structural view of a heating mechanism according to an embodiment.
In the attached drawings, 10 is a high-temperature test chamber; 100. a box body; 200. a door body; 210. a glass plate; 300. a test chamber; 400. a heating mechanism; 410. a chassis; 420. a quartz tube group; 430. and (4) porcelain strips.
Detailed Description
It should be noted that, in the present invention, the embodiments and features of the embodiments may be combined with each other without conflict. The following will combine the drawings of the embodiments of the present invention to further describe the technical solution of the present invention, and the present invention is not limited to the following specific embodiments.
It should be understood that the same or similar reference numerals in the drawings of the embodiments correspond to the same or similar parts. In the description of the present invention, it should be understood that if there are terms such as "upper", "lower", "front", "rear", "left", "right", "top", "bottom", etc., indicating orientations or positional relationships based on the orientations or positional relationships shown in the drawings, the description is merely for convenience of description and simplicity of description, but does not indicate or imply that the equipment or components referred to must have specific orientations, be constructed in specific orientations, and be operated, and therefore, the terms describing the positional relationships in the drawings are only used for illustrative purposes and are not to be construed as limitations of the present patent, and those skilled in the art will understand the specific meanings of the terms according to specific situations.
As shown in fig. 1 and 2, in one embodiment, a high temperature test chamber 10 includes: the box body 100, the heating mechanism 400 and at least two regulating switches; at least two test chambers 300 are arranged in the box body 100, a door body 200 is arranged on each test chamber 300, and the door body 200 is rotatably connected to the side wall of each test chamber 300; the heating mechanism 400 is installed in each testing chamber 300; the heating mechanism 400 includes: the testing chamber comprises a base plate 410, resistance wires, two porcelain strips 430 and at least one group of quartz tube group 420, wherein the base plate 410 is arranged on the side wall of the testing chamber 300, the two porcelain strips 430 are respectively arranged at two ends of the base plate 410, the quartz tube group 420 is fixed between the two porcelain strips 430, the resistance wires are uniformly distributed in the quartz tube group 420 to form a loop, and the adjusting switch is electrically connected with the resistance wires.
In this embodiment, at least two cavities are formed in the box 100, each cavity forms one test chamber 300, each test chamber 300 is not communicated with each other, the temperatures between the test chambers 300 cannot be mutually transmitted, the test chambers 300 form a closed space through the door 200, the chassis 410 is fixed to the top end of the test chamber 300, the two ceramic strips 430 are oppositely arranged at two ends of the chassis 410, the cross section of each ceramic strip 430 is in a shape like a Chinese character 'ao', and two ends of a quartz tube in the quartz tube set 420 are respectively embedded in notches of the ceramic strips 430, so that the quartz tube set 420 is fixed to the chassis 410.
As shown in fig. 2, in this embodiment, the number of the quartz tube groups 420 is set to be multiple groups, the number of the quartz tubes in each quartz tube group 420 is 3, the resistance wires in the quartz tubes in each quartz tube group 420 are connected in series, the circuits between the quartz tube groups 420 are connected in parallel, each adjustment switch is electrically connected to the resistance wire in the test chamber 300, the adjustment switch is used to adjust the current passing through the resistance wire to adjust the heat generation amount of the resistance wire, and the adjustment switch adjusts the connection and adjustment modes of the resistance wire generating different heat amounts. Because the quartz tube has good infrared transmission performance, the unit area can load energy of multiple times, after the resistance wire is electrified and heated, the quartz tube can absorb a large amount of visible light and near infrared light radiated by the resistance wire and can convert the visible light and the near infrared light into far infrared radiation, the heat loss is small in the heat transfer process, and when the electronic equipment is aged, the quartz tube has the advantages of fast temperature rise, uniform multi-area temperature rise and low energy consumption.
Illustratively, the utility model provides a pair of high temperature test box 10 for when electronic equipment ages under the high temperature condition, be provided with two test chambers 300 in the box 100 at least, each install respectively in the test chamber 300 heating mechanism 400, the circular telegram back, in the quartz nest of tubes 420 the resistance wire produces a large amount of heats, regulating switch is through adjusting the resistance wire produces thermal how much, corresponds the regulation temperature in the test chamber 300 for a sample can be in the difference in the test chamber 300, accomplish aging testing under different temperatures simultaneously, improved efficiency of software testing. Simultaneously, a large amount of heats that quartz nest of tubes 420 the resistance wire produced through outwards sending far infrared radiation and heating electronic equipment, have the fast, the multizone temperature rise of intensification is even, generate heat the advantage that orientation is good and the energy consumption is low with the degree of consistency, improved heating efficiency and degree of consistency.
In order to avoid potential safety hazards caused by hot waves in the test chamber 300 when the door body 200 is opened after a test is completed, in one embodiment, the high-temperature test chamber 10 further includes an air duct and an air duct, a cooling chamber is provided in the box body 100, a second air inlet is provided on the cooling chamber, a first air inlet and a first air outlet are provided on each test chamber 300, a first end of the air duct is communicated with the first air inlet, a first end of the air duct is communicated with the first air outlet, a second end of the air duct is communicated with the second air inlet, switch boards are respectively provided on the first air inlet and the second air inlet, and the switch boards are used for controlling the opening and closing of the first air inlet and the second air inlet.
In this embodiment, the air duct is communicated with the testing chamber 300, the testing chamber 300 is communicated with the cooling chamber through the air duct, a plurality of branch air ducts are arranged at the first end of the air duct, the number of the branch air ducts is equal to that of the first air outlets, and each branch air duct is communicated with one of the first air outlets. Like this, when the test is accomplished and needs to be opened when the door body 200, the switch board opens respectively first air inlet reaches the second air inlet, outside fan with vent pipe's second end is connected for the wind that outside fan produced can pass through vent pipe gets into test chamber 300 drives high temperature gas in the test chamber 300 passes through the vent pipe gets into the cooling chamber cools off, makes temperature in the test chamber 300 reduces, thereby avoids opening behind the door body 200, the unrestrained operating personnel's of heat burn condition. It should be noted that the manner in which the switch board controls the opening and closing of the first air inlet and the second air inlet is a technology that can be known to those skilled in the art, and can be realized, and is not described redundantly in this embodiment.
In order to achieve a reduction in temperature within the test chamber 300, in one embodiment, a plurality of cooling fins are disposed within the cooling chamber, and each cooling fin is sequentially disposed at intervals within the cooling chamber to form a cooling circuit. Specifically, each cooling fin is arranged between the inner side walls of the cooling chamber, the width of each cooling fin is smaller than the width between the inner side walls of the cooling chamber, that is, one end of each cooling fin is connected with the inner side wall of the cooling chamber, the other end of each cooling fin is not connected with the inner side wall of the cooling chamber, one end of each cooling fin is connected with one inner side wall of the cooling chamber, and one end of each cooling fin is connected with the other inner side wall of the cooling chamber.
Further, the cooling piece is one of a copper piece, a silver piece and an iron piece. Specifically, the copper sheet, the silver sheet and the iron sheet have good heat conductivity, and can absorb heat entering the cooling chamber, in order to further absorb heat entering the cooling chamber, a phase change material layer is arranged on the cooling sheet, and a phase change material in the phase change material layer is paraffin, and can absorb and release heat by changing a physical form, so that the temperature of the test chamber 300 is reduced.
In one embodiment, a cooling loop is arranged in the cooling sheet, a cooling medium is arranged in the cooling loop, the high-temperature test box further comprises a cooling generator, and the cooling loop is communicated with a cooling channel of the cooling generator. It should be understood that the cooling generator also includes a condenser and a compressor, the implementation principle of which is a technique known to those skilled in the art, and this is not described redundantly in this embodiment.
To avoid thermal deformation of the base plate 410, in one embodiment, the high temperature test chamber 10 further includes a thermal insulation blanket disposed between the quartz tube set 420 and the base plate 410. Specifically, the heat insulation felt is ceramic fiber cotton or quartz fiber, and the ceramic fiber cotton is a high-efficiency heat insulation material and has the advantages of light weight, high strength, oxidation resistance and low heat conductivity; the quartz fiber has the characteristics of heat resistance and corrosion resistance, high strength retention rate at high temperature, stable dimension and good chemical stability, and both the ceramic fiber cotton and the quartz fiber can well protect the chassis 410 when being used as the heat insulation felt. Further, stress holes are formed in the base plate 410 and are uniformly distributed on the base plate 410, so that deformation stress generated by heating the base plate 410 can be eliminated.
In order to place the quartz tube assembly 420 on the bottom plate more stably, baffles for fixing the quartz tube assembly 420 are arranged on two sides of the bottom plate, the two baffles and the two ceramic strips 430 form a quadrangular frame, and the quartz tube assembly 420 is placed in the frame.
In order to better observe the aging condition in the testing chamber 300, in one embodiment, the door 200 is provided with a detection window, and the detection window is provided with a glass plate 210. Specifically, by providing the transparent glass plate 210 on the detection window, the situation within the test can be clearly observed. In order to enable the door 200 to better seal the test chamber 300, a sealing ring is arranged on one surface of the door 200 facing the test chamber 300, and the door 200 can better seal the test chamber 300, so that heat dissipation is avoided, and the stability and reliability of the test can be improved.
It is obvious that the above embodiments of the present invention are only examples for clearly illustrating the present invention, and are not limitations to the embodiments of the present invention. Other variations and modifications will be apparent to persons skilled in the art in light of the above description. And are neither required nor exhaustive of all embodiments. Any modification, equivalent replacement, and improvement made within the spirit and principle of the present invention should be included in the protection scope of the claims of the present invention.
Claims (8)
1. A high temperature test chamber, comprising: the device comprises a box body, a heating mechanism and at least two regulating switches;
at least two testing chambers are arranged in the box body, a door body is arranged on each testing chamber, and the door bodies are rotatably connected to the side walls of the testing chambers;
the heating mechanism is respectively arranged in each test chamber;
the heating mechanism includes: the testing device comprises a chassis, a resistance wire, two ceramic strips and at least one group of quartz tube set, wherein the chassis is arranged on the side wall of the testing chamber, the two ceramic strips are respectively arranged at two ends of the chassis, the quartz tube set is fixed between the two ceramic strips, the resistance wire is uniformly distributed in the quartz tube set to form a loop, and the regulating switch is electrically connected with the resistance wire.
2. The high-temperature test chamber according to claim 1, further comprising an air duct and an air duct, wherein a cooling chamber is disposed in the chamber, a second air inlet is disposed on the cooling chamber, each test chamber is provided with a first air inlet and a first air outlet, a first end of the air duct is communicated with the first air inlet, a first end of the air duct is communicated with the first air outlet, a second end of the air duct is communicated with the second air inlet, the first air inlet and the second air inlet are respectively provided with a switch board, and the switch boards are used for controlling opening and closing of the first air inlet and the second air inlet.
3. A high-temperature test chamber as claimed in claim 2, wherein a plurality of cooling fins are arranged in the cooling chamber, and the cooling fins are sequentially arranged in the cooling chamber at intervals to form a cooling loop.
4. A high temperature test chamber according to claim 3, wherein the cooling plate is one of a copper plate, a silver plate and an iron plate.
5. A high temperature test chamber as claimed in claim 3 or 4, wherein the cooling plate is provided with a layer of phase change material.
6. A high-temperature test chamber according to claim 1, wherein the number of the quartz tubes in each of the quartz tube groups is 3.
7. A high temperature test chamber as claimed in claim 1, further comprising a thermal insulation blanket interposed between the group of quartz tubes and the base pan.
8. The high-temperature test chamber according to claim 1, wherein the door body is provided with a detection window, and a glass plate is arranged on the detection window.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202023315266.5U CN214278249U (en) | 2020-12-31 | 2020-12-31 | High-temperature test chamber |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202023315266.5U CN214278249U (en) | 2020-12-31 | 2020-12-31 | High-temperature test chamber |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN214278249U true CN214278249U (en) | 2021-09-24 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202023315266.5U Active CN214278249U (en) | 2020-12-31 | 2020-12-31 | High-temperature test chamber |
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| Country | Link |
|---|---|
| CN (1) | CN214278249U (en) |
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2020
- 2020-12-31 CN CN202023315266.5U patent/CN214278249U/en active Active
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