CN214277923U - Chip inspection dish convenient to observe - Google Patents
Chip inspection dish convenient to observe Download PDFInfo
- Publication number
- CN214277923U CN214277923U CN202023065657.6U CN202023065657U CN214277923U CN 214277923 U CN214277923 U CN 214277923U CN 202023065657 U CN202023065657 U CN 202023065657U CN 214277923 U CN214277923 U CN 214277923U
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- inspection
- inspection dish
- main part
- chip
- apron
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Abstract
The utility model discloses a chip inspection dish convenient to observe, including inspection dish main part and apron, the middle part of inspection dish main part is the indent, and inspection dish main part middle part is equipped with a plurality of holes of placing, it is the matrix array distribution to place the hole, both ends are equipped with two sets of flutings around the inspection dish main part, the top or the below that the corresponding fluting of group is located respectively to the apron passes, in this chip inspection dish convenient to observe, insert the fluting of corresponding group by the apron, can carry out quick spacing to the chip positive and negative, be convenient for observe afterwards, and then improved the efficiency that detects, the practicality of inspection dish has been improved.
Description
Technical Field
The utility model relates to a power electronic production corollary equipment field, concretely relates to chip inspection dish convenient to observe.
Background
In chip production, whether product plating or appearance inspection, chips are required to be prevented in an inspection tray or a dial plate and inspected by a worker through visual inspection. After one surface is inspected, the chips need to be turned over and then detected, so that the efficiency is low, and the error rate is high.
In conclusion, the chip inspection tray convenient to observe is designed.
SUMMERY OF THE UTILITY MODEL
The utility model discloses an overcome foretell not enough, provide a chip inspection dish convenient to observe.
The utility model discloses a following technical scheme realizes above-mentioned purpose:
the utility model provides a chip inspection dish convenient to observe, includes inspection dish main part and apron, and the middle part of inspection dish main part is the indent, and is equipped with a plurality of holes of placing in inspection dish main part middle part, places the hole and is the matrix array and distributes, and both ends are equipped with two sets of flutings around the inspection dish main part, and the apron passes the fluting that corresponds the group and is located respectively places the top or the below in hole.
Preferably, the front end of inspection dish main part is equipped with two bases, and the base is located between two flutings, all is equipped with a glass pearl screw on the up end of base and the lower terminal surface, is equipped with two spacing grooves on the apron, and the glass pearl screw can be embedded into in the spacing groove that corresponds.
Preferably, the cover plate is made of transparent glass.
Preferably, the notches of the placing holes are all bellmouths.
The utility model has the advantages that: in this chip inspection dish convenient to observe, insert the fluting that corresponds the group by the apron, can carry out quick spacing to the chip positive and negative, be convenient for afterwards observe, and then improved the efficiency that detects, improved the practicality of inspection dish.
Drawings
The invention will now be described, by way of example, with reference to the accompanying drawings, in which:
fig. 1 is a schematic structural diagram of the present invention;
fig. 2 is a top view of the present invention;
fig. 3 is a right side view of the present invention;
fig. 4 is a schematic structural diagram of the cover plate of the present invention.
In the figure: 1. the inspection plate comprises an inspection plate main body, 2 placement holes, 3 cover plates, 4 bases, 5 glass bead screws and 6 limiting grooves.
Detailed Description
The present invention will now be described in further detail with reference to the accompanying drawings. These drawings are simplified schematic drawings and illustrate the basic structure of the present invention only in a schematic manner, and thus show only the components related to the present invention.
As shown in fig. 1-4, a chip inspection plate convenient for observation comprises an inspection plate main body 1 and a cover plate 3, wherein the middle part of the inspection plate main body 1 is concave, a plurality of placing holes 2 are arranged in the middle part of the inspection plate main body 1, the placing holes 2 are distributed in a matrix array, two groups of slots are arranged at the front end and the rear end of the inspection plate main body 1, and the cover plate 3 penetrates through the corresponding group of slots and is positioned above or below the placing holes 2.
The chip inspection plate convenient for observation has the working principle that firstly, the cover plate 3 penetrates through the group of slots on the lower half part of the inspection plate main body 1, the cover plate 3 is close to the lower part of each placing hole 2, then, each chip is placed into the corresponding placing slot, and workers can inspect the chip from the upper part; after the one side of inspection is finished, pass this group's fluting that is located inspection dish main part 1 first half with another apron 3, this apron 3 will be pressed close to each and place the top of hole 2, and inspection dish main part 1 is overturn afterwards, takes out a preceding apron 3, and the staff just can inspect the chip another side rapidly.
Specifically, the front end of inspection dish main part 1 is equipped with two bases 4, and base 4 is located between two flutings, all is equipped with a glass bead screw 5 on the up end of base 4 and the lower terminal surface, is equipped with two spacing grooves 6 on the apron 3, and glass bead screw 5 can be embedded into the spacing groove 6 that corresponds, and after apron 3 passed the fluting of corresponding group, glass bead screw 5 was embedded into the spacing groove 6 that corresponds, and then can realize the location between apron 3 and inspection dish main part 1.
Specifically, the cover plate 3 is made of transparent glass.
Specifically, the notches of the placing holes 2 are all bellmouths.
In light of the above, the present invention is not limited to the above embodiments, and various changes and modifications can be made by the worker without departing from the scope of the present invention. The technical scope of the present invention is not limited to the content of the specification, and must be determined according to the scope of the claims.
Claims (4)
1. The utility model provides a chip inspection dish convenient to observe which characterized in that: including inspection dish main part and apron, the middle part of inspection dish main part is the indent, and inspection dish main part middle part is equipped with a plurality of holes of placing, places the hole and is the matrix array and distributes, and both ends are equipped with two sets of flutings around the inspection dish main part, and the apron passes the fluting that corresponds the group and is located the top or the below of respectively placing the hole.
2. The chip inspection tray facilitating observation according to claim 1, wherein: the front end of inspection dish main part is equipped with two bases, and the base is located between two flutings, all is equipped with a glass pearl screw on the up end of base and the lower terminal surface, is equipped with two spacing grooves on the apron, and the glass pearl screw can be embedded into in the spacing groove that corresponds.
3. The chip inspection tray facilitating observation according to claim 1, wherein: the cover plate is made of transparent glass.
4. The chip inspection tray facilitating observation according to claim 1, wherein: the notches of the placing holes are all horn mouths.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202023065657.6U CN214277923U (en) | 2020-12-18 | 2020-12-18 | Chip inspection dish convenient to observe |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202023065657.6U CN214277923U (en) | 2020-12-18 | 2020-12-18 | Chip inspection dish convenient to observe |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN214277923U true CN214277923U (en) | 2021-09-24 |
Family
ID=77799542
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202023065657.6U Active CN214277923U (en) | 2020-12-18 | 2020-12-18 | Chip inspection dish convenient to observe |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN214277923U (en) |
-
2020
- 2020-12-18 CN CN202023065657.6U patent/CN214277923U/en active Active
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