CN214236077U

CN214236077U - Test bench for electronic information engineering

Info

Publication number: CN214236077U
Application number: CN202120075874.9U
Authority: CN
Inventors: 王艳玲; 李倩
Original assignee: Changchun Gunaghua University
Current assignee: Wuhan Dingxin Co Creation Technology Co.,Ltd.
Priority date: 2021-01-12
Filing date: 2021-01-12
Publication date: 2021-09-21
Anticipated expiration: 2031-01-12

Abstract

The application discloses test bench for electronic information engineering, including the laboratory bench main part, laboratory bench main part top fixed connection operating panel, the fixed first recess that is equipped with in laboratory bench main part top, the laboratory bench main part is located the part fixed connection record board between fixed plate and the first recess, laboratory bench main part top fixed connection fixed plate, the fixed through-hole that is equipped with of fixed plate, the fixed notch that is equipped with in laboratory bench top, laboratory bench main part bottom fixed connection supporting leg. Through the setting of sliding plate, through pressing the clamp plate application of force for cutting blade lapse, and then cut the electric wire of placing in the through-hole, when pressing the clamp plate not being the atress, through the effect of spring, make cutting blade resume original position, and then be convenient for next time cut.

Description

Test bench for electronic information engineering

Technical Field

The application relates to a test bed, in particular to a test bed for electronic information engineering.

Background

Electronic information engineering is a subject of electronic information control and information processing by applying modern technologies such as computers, and mainly studies on acquisition and processing of information, design, development, application and integration of electronic equipment and information systems. The physical requirements are also high due to the solid mathematical knowledge, and are mainly electrical.

When carrying out the teaching of circuit real operation, current information engineering laboratory bench is when teaching, can't cut the electric wire for the operation is very inconvenient, and the dust that produces and the waste material of electric wire are not convenient for collect the processing when carrying out the welding. Therefore, a test stand for electronic information engineering is proposed to solve the above problems.

Disclosure of Invention

The utility model provides a test bench for electronic information engineering, includes the laboratory bench main part, laboratory bench main part top fixed connection operating panel, the fixed first recess that is equipped with in laboratory bench main part top, the laboratory bench main part is located the part fixed connection record board between fixed plate and the first recess, laboratory bench main part top fixed connection fixed plate, the fixed through-hole that is equipped with of fixed plate, the fixed notch that is equipped with in laboratory bench top, laboratory bench main part bottom fixed connection supporting leg.

Furthermore, the top end of the side wall of the experiment table main body is fixedly connected with one end of the insertion column, the other end of the insertion column slides to penetrate through the collection box, and the side wall of the collection box is tightly attached to the side wall of the experiment table main body.

Further, laboratory bench main part lateral wall bottom laminating apron, four turnings of apron all are equipped with the screw hole, apron and laboratory bench main part through-hole bolted connection.

Furthermore, the fixed plate is inserted with a sliding plate in a sliding mode, one end, located on the inner wall of the fixed plate, of the sliding plate is fixedly connected with a cutting blade, one end, located outside the fixed plate, of the sliding plate is fixedly connected with a pressing plate, the sliding plate is located on the inner side wall of the fixed plate and is fixedly connected with a sliding block, the bottom end of the sliding block is fixedly connected with one end of a T-shaped sliding rod, the other end of the T-shaped sliding rod is sleeved with a fixing column in a sliding mode, the other end of the fixing column is fixedly connected to the bottom end of the second groove, and the side wall of the sliding block is connected with the second groove in a sliding mode.

Furthermore, the inner wall of the fixed column is fixedly connected with one end of the spring, the other end of the spring is fixedly connected with the T-shaped sliding rod, and the fixed column, the spring, the second groove, the T-shaped sliding rod and the spring are symmetrically distributed on two sides of the sliding plate in the same connection mode.

Further, the placing plates are symmetrically and fixedly connected inside the experiment table main body.

The beneficial effect of this application is: the application provides a test bench for electronic information engineering.

Drawings

In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the drawings needed to be used in the description of the embodiments or the prior art will be briefly introduced below, and it is obvious that the drawings in the following description are only some embodiments of the present application, and it is obvious for those skilled in the art that other drawings can be obtained according to the drawings without inventive exercise.

FIG. 1 is a schematic overall perspective view of an embodiment of the present application;

FIG. 2 is a schematic diagram of a back structure of a test bed according to an embodiment of the present disclosure;

FIG. 3 is a schematic side view of a fixing plate according to an embodiment of the present application;

fig. 4 is a partial front view structural diagram of an embodiment of the present application.

In the figure: 1. laboratory bench main part, 101, first recess, 102, notch, 2, operating panel, 3, the grafting post, 4, the collecting box, 5, the apron, 501, screw hole, 6, the record board, 7, the fixed plate, 701, the through-hole, 702, the second recess, 8, the pressure board, 9, the sliding plate, 10, cutting blade, 11, the sliding block, 12, T type slide bar, 13, the fixed column, 14, the spring, 15, place the board, 16, the supporting leg.

Detailed Description

In order to make the technical solutions better understood by those skilled in the art, the technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application, and it is obvious that the described embodiments are only partial embodiments of the present application, but not all embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.

It should be noted that the terms "first," "second," and the like in the description and claims of this application and in the drawings described above are used for distinguishing between similar elements and not necessarily for describing a particular sequential or chronological order. It should be understood that the data so used may be interchanged under appropriate circumstances such that embodiments of the application described herein may be used. Furthermore, the terms "comprises," "comprising," and "having," and any variations thereof, are intended to cover a non-exclusive inclusion, such that a process, method, system, article, or apparatus that comprises a list of steps or elements is not necessarily limited to those steps or elements expressly listed, but may include other steps or elements not expressly listed or inherent to such process, method, article, or apparatus.

In this application, the terms "upper", "lower", "left", "right", "front", "rear", "top", "bottom", "inner", "outer", "middle", "vertical", "horizontal", "lateral", "longitudinal", and the like indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings. These terms are used primarily to better describe the present application and its embodiments, and are not used to limit the indicated devices, elements or components to a particular orientation or to be constructed and operated in a particular orientation.

Moreover, some of the above terms may be used to indicate other meanings besides the orientation or positional relationship, for example, the term "on" may also be used to indicate some kind of attachment or connection relationship in some cases. The specific meaning of these terms in this application will be understood by those of ordinary skill in the art as appropriate.

Furthermore, the terms "mounted," "disposed," "provided," "connected," and "sleeved" are to be construed broadly. For example, it may be a fixed connection, a removable connection, or a unitary construction; can be a mechanical connection, or an electrical connection; may be directly connected, or indirectly connected through intervening media, or may be in internal communication between two devices, elements or components. The specific meaning of the above terms in the present application can be understood by those of ordinary skill in the art as appropriate.

It should be noted that the embodiments and features of the embodiments in the present application may be combined with each other without conflict. The present application will be described in detail below with reference to the embodiments with reference to the attached drawings.

Referring to fig. 1-4, a test bed for electronic information engineering includes a test bed main body 1, the top end of the test bed main body 1 is fixedly connected with an operation panel 2, the top end of the test bed main body 1 is fixedly provided with a first groove 101, a part of the test bed main body 1 located between a fixing plate 7 and the first groove 101 is fixedly connected with a recording plate 6, the top end of the test bed main body 1 is fixedly connected with the fixing plate 7, the fixing plate 7 is fixedly provided with a through hole 701, the top end of the test bed is fixedly provided with a notch 102, and the bottom end of the test bed main body 1 is fixedly connected with a support leg 16.

The top end of the side wall of the experiment table main body 1 is fixedly connected with one end of the inserting column 3, the other end of the inserting column 3 slides to penetrate through the collecting box 4, the side wall of the collecting box 4 is tightly attached to the side wall of the experiment table main body 1 so as to be convenient for centralized collection of garbage generated by the experiment table, the bottom end of the side wall of the experiment table main body 1 is attached to the cover plate 5, four corners of the cover plate 5 are respectively provided with a threaded hole 501, the cover plate 5 is in bolted connection with the through hole 701 of the experiment table main body 1 so as to be convenient for maintenance when a circuit in the experiment table main body 1 fails, the fixed plate 7 is slidably inserted into the sliding plate 9, one end of the sliding plate 9, which is positioned on the inner wall of the fixed plate 7, is fixedly connected with the cutting blade 10, one end of the sliding plate 9, which is positioned outside the fixed plate 7, is fixedly connected with the pressing plate 8 so as to facilitate downward sliding of the cutting blade 10 by applying force to the pressing plate 8 so as to cut an electric wire placed in the through hole 701, the sliding plate 9 is positioned on the side wall inside the fixed plate 7 and fixedly connected with a sliding block 11, the bottom end of the sliding block 11 is fixedly connected with one end of a T-shaped sliding rod 12, the other end of the T-shaped sliding rod 12 is slidably sleeved in a fixed column 13, the other end of the fixed column 13 is fixedly connected at the bottom end of a second groove 702, the side wall of the sliding block 11 is slidably connected with the second groove 702, the inner wall of the fixed column 13 is fixedly connected with one end of a spring 14, the other end of the spring 14 is fixedly connected with the T-shaped sliding rod, so that when the pressing plate 8 is not stressed, the cutting blade 10 is restored to the original position under the action of the spring 14, and further the next cutting is facilitated, the fixed column 13, the spring 14, the second groove 702, the T-shaped sliding rod 12 and the spring 14 are all distributed on two sides of the sliding plate 9 symmetrically in the same connection mode, so that the placing plate 15 is symmetrically and fixedly connected inside the experiment table main body 1, the tools can be conveniently placed in a classified mode, and the tools can be conveniently taken when in use.

When the electric appliance component is used, the electric appliance component is externally connected with a power supply and a control switch when in use, whether each device of the whole device can normally work is firstly checked, under the condition that each device can normally work, when in circuit installation practical operation and when the electric wire needs to be cut, a student places the electric wire in the through hole 701, then presses the pressing plate 8 downwards to enable the sliding plate 9 to slide downwards so as to drive the cutting blade 10 to slide downwards, the T-shaped sliding rod 12 enters the fixed column 13 at the moment, the spring 14 starts to contract so as to finish the electric wire cutting, after the electric wire is cut, the pressing plate 8 is not stressed, the spring 14 starts to reset so as to drive the sliding plate 9 and the cutting blade 10 to restore to the original positions, so as to facilitate the next cutting, then a welding tool is taken out from the placing plate 15 for practical welding operation, after the welding practice is finished, the garbage on the surface of the experiment table main body 1 is sent into the collection box 4 through the notch 102 for centralized collection, and after the teaching is finished, the collection box 4 is taken out for cleaning so as to maintain the environment of the whole experiment table main body 1.

The application has the advantages that:

1. through the arrangement of the sliding plate, the cutting blade slides downwards by applying force to the pressing plate, so that the electric wire placed in the through hole is cut, and when the pressing plate is not stressed, the cutting blade is restored to the original position under the action of the spring, so that the next cutting is facilitated;

2. through the setting of collecting box, after the welding practice, the rubbish on laboratory bench main part surface is sent into in the collecting box through the notch and is concentrated the collection, after the teaching finishes, takes out the collecting box and clears up to in the environment of keeping whole laboratory bench main part.

It is well within the skill of those in the art to implement, without undue experimentation, the present application is not directed to software and process improvements, as they relate to circuits and electronic components and modules.

The above description is only a preferred embodiment of the present application and is not intended to limit the present application, and various modifications and changes may be made by those skilled in the art. Any modification, equivalent replacement, improvement and the like made within the spirit and principle of the present application shall be included in the protection scope of the present application.

Claims

1. The utility model provides a test bench for electronic information engineering which characterized in that: including laboratory bench main part (1), laboratory bench main part (1) top fixed connection operating panel (2), fixed first recess (101) that are equipped with in laboratory bench main part (1) top, laboratory bench main part (1) are located part fixed connection record board (6) between fixed plate (7) and first recess (101), laboratory bench main part (1) top fixed connection fixed plate (7), fixed plate (7) are fixed and are equipped with through-hole (701), the fixed notch (102) that are equipped with in laboratory bench top, laboratory bench main part (1) bottom fixed connection supporting leg (16).

2. The test bed for electronic information engineering according to claim 1, characterized in that: the top end of the side wall of the experiment table main body (1) is fixedly connected with one end of the insertion column (3), the other end of the insertion column (3) slides to penetrate through the collection box (4), and the side wall of the collection box (4) is tightly attached to the side wall of the experiment table main body (1).

3. The test bed for electronic information engineering according to claim 1, characterized in that: laboratory bench main part (1) lateral wall bottom laminating apron (5), four turnings of apron (5) all are equipped with screw hole (501), apron (5) and laboratory bench main part (1) through-hole (701) bolted connection.

4. The test bed for electronic information engineering according to claim 1, characterized in that: the fixed plate (7) is slidably inserted with a sliding plate (9), the sliding plate (9) is located at one end of the inner wall of the fixed plate (7) and is fixedly connected with a cutting blade (10), the sliding plate (9) is located at one end of the outer wall of the fixed plate (7) and is fixedly connected with a pressing plate (8), the sliding plate (9) is located at the inner side wall of the fixed plate (7) and is fixedly connected with a sliding block (11), the bottom end of the sliding block (11) is fixedly connected with one end of a T-shaped sliding rod (12), the other end of the T-shaped sliding rod (12) is slidably sleeved with a fixed column (13), the other end of the fixed column (13) is fixedly connected to the bottom end of a second groove (702), and the side wall of the sliding block (11) is slidably connected with the second groove (702).

5. The test bed for electronic information engineering according to claim 4, characterized in that: the inner wall of the fixed column (13) is fixedly connected with one end of a spring (14), the other end of the spring (14) is fixedly connected with a T-shaped sliding rod, and the fixed column (13), the spring (14), the second groove (702), the T-shaped sliding rod (12) and the spring (14) are symmetrically distributed on two sides of the sliding plate (9) in the same connection mode.

6. The test bed for electronic information engineering according to claim 1, characterized in that: the interior of the experiment table main body (1) is symmetrically and fixedly connected with placing plates (15).