CN214227346U

CN214227346U - Reliability test equipment of high-power laser chip

Info

Publication number: CN214227346U
Application number: CN202022917631.3U
Authority: CN
Inventors: 张辉
Original assignee: Xi'an Haiyun Iot Technology Co ltd
Current assignee: Xi'an Haiyun Iot Technology Co ltd
Priority date: 2020-12-08
Filing date: 2020-12-08
Publication date: 2021-09-17
Anticipated expiration: 2030-12-08

Abstract

The utility model relates to a chip testing technology field just discloses a reliability test equipment of high power laser instrument chip, including bottom plate and test equipment main part, the fixed upper surface middle part that sets up in the bottom plate of test equipment main part, the inside upper end of test equipment main part is fixed a plurality of test heads that are provided with from a left side to the right side in proper order, logical groove has all been seted up to the both sides of test equipment main part, the upper surface both sides of bottom plate are all fixed and are provided with two backup pads, two all be provided with the sprocket, two between the backup pad the middle part of sprocket is all fixed and has cup jointed first bull stick, two the both ends of first bull stick all rotate with the backup pad that corresponds through first antifriction bearing and are connected, two the sprocket passes through the chain and rotates the connection, left side front end the outside of backup pad is provided with the motor. The utility model discloses can continuously test a plurality of chips, reduce the down time, improve efficiency of software testing greatly.

Description

Reliability test equipment of high-power laser chip

Technical Field

The utility model relates to a chip test technical field especially relates to a reliability test equipment of high power laser instrument chip.

Background

The burn-in test can be used for detecting the reliability of the device or finding early faults of the device as a production window, and a device generally used for the burn-in test of the chip works together with an external circuit board through a test socket.

Traditional high power laser instrument chip, especially the laser instrument chip more than 1W, its calorific capacity is great, and temperature control is difficult, consequently, in current aging testing equipment, adopts single measuring mode to operate mostly, and equipment switch is frequent, leads to the test efficiency low.

SUMMERY OF THE UTILITY MODEL

The utility model aims at solving the problem that the efficiency of testing of the high-power laser chip in the prior art is low, and the reliability testing equipment of the high-power laser chip who provides.

In order to achieve the above purpose, the utility model adopts the following technical scheme:

a reliability test device for a high-power laser chip comprises a bottom plate and a test device main body, wherein the test device main body is fixedly arranged in the middle of the upper surface of the bottom plate, a plurality of test heads are fixedly arranged at the upper end inside the test device main body from left to right, through grooves are formed in both sides of the test device main body, two support plates are fixedly arranged on both sides of the upper surface of the bottom plate, a chain wheel is arranged between the two support plates on both sides, a first rotating rod is fixedly sleeved in the middle of the two chain wheels, both ends of the two first rotating rods are rotatably connected with the corresponding support plates through first rolling bearings, the two chain wheels are rotatably connected through chains, a motor is arranged on the outer side of the support plate at the front end on the left side, the output end of the motor is fixedly connected with the front end of the first rotating rod on the left side, and a plurality of placing plates are fixedly arranged on the outer side wall of the chains, a plurality of chip grooves are formed in the upper surface of the placing plate, a plurality of contacts are fixedly arranged on the upper surface of the placing plate and on the rear sides of the corresponding chip grooves, the contacts are matched with the corresponding testing heads, and a plurality of pressing mechanisms are arranged on the upper surface of the placing plate.

Preferably, hold-down mechanism includes rotatory strip and layering, the upper surface right side both ends of placing the board are all fixed and are provided with the curb plate, two be provided with the second bull stick between the curb plate, the both ends of second bull stick are all rotated with the curb plate that corresponds through second antifriction bearing and are connected, the both ends of second bull stick all extend to the outside of the curb plate that corresponds and all fixed the cup joints rotatory strip, two fixed two layering that are provided with between the left end of rotatory strip, the rear end pole wall screw thread of second bull stick has cup jointed torque spring, torque spring's both ends respectively with the pole wall and the curb plate fixed connection of the second bull stick that correspond.

Preferably, the inside upper end both sides of test equipment main part all are fixed and are provided with the fixed block, two the lower surface of fixed block all is fixed and is provided with the fan.

Preferably, universal wheels are fixedly arranged on two sides of the lower surface of the bottom plate.

Preferably, the motor is fixedly connected with the corresponding support plate through a fixing plate.

Preferably, the pressing strips are made of rubber materials.

Compared with the prior art, the utility model provides a reliability test equipment of high power laser instrument chip possesses following beneficial effect:

1. this reliability test equipment of high power laser instrument chip drives a plurality of boards of placing that are equipped with the chip through the sprocket and gets into test equipment main part inside in proper order and test to can reduce down time, improve efficiency of software testing greatly.

2. This reliability test equipment of high power laser instrument chip through a plurality of hold-down mechanism who places the board upper surface and set up, conveniently dismantles the chip after the test when can fixing the chip.

The part that does not relate to in the device all is the same with prior art or can adopt prior art to realize, the utility model discloses can continuously test a plurality of chips, reduce down time, improve efficiency of software testing greatly.

Drawings

Fig. 1 is a schematic structural diagram of a reliability testing apparatus for a high power laser chip according to the present invention;

fig. 2 is a schematic top view of the placement board in fig. 1.

In the figure: the testing device comprises a base plate 1, a testing device body 2, a testing head 3, a fixing block 4, a fan 5, a supporting plate 6, a chain wheel 7, a first rotating rod 8, a chain 9, a motor 10, a placing plate 11, a contact 12, a chip groove 13, a side plate 14, a second rotating rod 15, a rotating strip 16, a pressing strip 17, a torsion spring 18 and a universal wheel 19.

Detailed Description

The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments.

In the description of the present invention, it is to be understood that the terms "upper", "lower", "front", "rear", "left", "right", "top", "bottom", "inner", "outer", and the like indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings, and are only for convenience of description and simplicity of description, and do not indicate or imply that the device or element being referred to must have a particular orientation, be constructed and operated in a particular orientation, and therefore, should not be construed as limiting the present invention.

Referring to fig. 1-2, a reliability test device for a high power laser chip comprises a bottom plate 1 and a test device main body 2, the test device main body 2 is fixedly arranged in the middle of the upper surface of the bottom plate 1, a plurality of test heads 3 are fixedly arranged on the upper end inside the test device main body 2 from left to right, through grooves are formed on both sides of the test device main body 2, two support plates 6 are fixedly arranged on both sides of the upper surface of the bottom plate 1, chain wheels 7 are arranged between the two support plates 6 on both sides, a first rotating rod 8 is fixedly sleeved in the middle of the two chain wheels 7, both ends of the two first rotating rods 8 are rotatably connected with the corresponding support plates 6 through first rolling bearings, the two chain wheels 7 are rotatably connected through chains 9, a motor 10 is arranged on the outer side of the left front end support plate 6, and the output end of the motor 10 is fixedly connected with the front end of the left first rotating rod 8, the fixed a plurality of boards 11 of placing that are provided with of lateral wall of chain 9, a plurality of upper surfaces of placing board 11 are seted up and are had chip groove 13, and a plurality of upper surfaces of placing board 11 and the rear side that is located corresponding chip groove 13 all fixedly are provided with contact 12, a plurality of contacts 12 all with the 3 phase-matchs of test head that correspond, a plurality of upper surfaces of placing board 11 all are provided with hold-down mechanism.

Hold-down mechanism includes rotatory strip 16 and layering 17, the upper surface right side both ends of placing board 11 are all fixed and are provided with curb plate 14, be provided with second bull stick 15 between two curb plates 14, the both ends of second bull stick 15 are all rotated with the curb plate 14 that corresponds through second antifriction bearing and are connected, the both ends of second bull stick 15 all extend to the outside of the curb plate 14 that corresponds and all fixed the cup joints have rotatory strip 16, fixed two layering 17 that are provided with between the left end of two rotatory strips 16, torque spring 18 has been cup jointed to the rear end pole wall screw thread of second bull stick 15, torque spring 18's both ends respectively with the pole wall and the curb plate 14 fixed connection of the second bull stick 15 that correspond.

Fixed block 4 is all fixed to the inside upper end both sides of test equipment main part 2, and the lower surface of two fixed blocks 4 is all fixed and is provided with fan 5, can carry out the efficient heat dissipation to the chip when testing.

The universal wheels 19 are fixedly arranged on two sides of the lower surface of the bottom plate 1, and the equipment is convenient to move.

The motor 10 is fixedly connected with the corresponding support plate 6 through the fixing plate, so that the connection between the motor 10 and the corresponding support plate 6 is more stable.

The pressing strips 17 are made of rubber materials, so that the chips are prevented from being damaged by pressing.

The utility model discloses in, during the use, press a plurality of chips in the inside of the chip groove 13 that corresponds, then switch on motor 10's power, motor 10 drives sprocket 7 and rotates, thereby drive chain 9 and remove, drive a plurality of inside of placing board 11 and getting into test equipment main part 2 promptly, when a plurality of test heads 3 and the corresponding contact 12 contact of placing board 11 upper surface, close motor 10's power, test the chip promptly this moment, switch on both sides fan 5's power during the test, both sides fan 5 carries out the efficient heat dissipation to the chip in the test, switch on motor 10's power once more after 2 inside chips of test equipment main part detect, then repeat above-mentioned action and can continuously test a plurality of chips, thereby can improve efficiency of software testing greatly.

The above, only be the concrete implementation of the preferred embodiment of the present invention, but the protection scope of the present invention is not limited thereto, and any person skilled in the art is in the technical scope of the present invention, according to the technical solution of the present invention and the utility model, the concept of which is equivalent to replace or change, should be covered within the protection scope of the present invention.

Claims

1. The reliability test equipment for the high-power laser chip comprises a bottom plate (1) and a test equipment main body (2), and is characterized in that the test equipment main body (2) is fixedly arranged in the middle of the upper surface of the bottom plate (1), a plurality of test heads (3) are fixedly arranged at the upper end inside the test equipment main body (2) from left to right, through grooves are formed in both sides of the test equipment main body (2), two support plates (6) are fixedly arranged on both sides of the upper surface of the bottom plate (1), a chain wheel (7) is arranged between the two support plates (6) on both sides, a first rotating rod (8) is fixedly sleeved in the middle of each chain wheel (7), both ends of the two first rotating rods (8) are rotatably connected with the corresponding support plates (6) through first rolling bearings, and the two chain wheels (7) are rotatably connected through chains (9), the left side front end the outside of backup pad (6) is provided with motor (10), the output of motor (10) and the front end fixed connection of the first bull stick in left side (8), the fixed a plurality of board (11) of placing that are provided with of lateral wall of chain (9), it is a plurality of place the upper surface of board (11) and set up chip groove (13), it is a plurality of place the upper surface of board (11) and be located the rear side of the chip groove (13) that corresponds and all fixedly be provided with contact (12), it is a plurality of contact (12) all with corresponding test head (3) phase-match, it is a plurality of place the upper surface of board (11) and all be provided with hold-down mechanism.

2. The reliability test device of a high power laser chip according to claim 1, characterized in that the pressing mechanism comprises a rotating strip (16) and a pressing strip (17), both ends of the right side of the upper surface of the placing plate (11) are fixedly provided with side plates (14), a second rotating rod (15) is arranged between the two side plates (14), both ends of the second rotating rod (15) are rotationally connected with the corresponding side plates (14) through second rolling bearings, two ends of the second rotating rod (15) extend to the outer side of the corresponding side plate (14) and are fixedly sleeved with rotating strips (16), two pressing strips (17) are fixedly arranged between the left ends of the two rotating strips (16), a torsion spring (18) is sleeved on the rod wall at the rear end of the second rotating rod (15) in a threaded manner, and two ends of the torsion spring (18) are respectively fixedly connected with the rod wall and the side plate (14) of the corresponding second rotating rod (15).

3. The reliability test equipment for the high-power laser chip according to claim 1, wherein the two sides of the upper end inside the test equipment main body (2) are fixedly provided with fixing blocks (4), and the lower surfaces of the two fixing blocks (4) are fixedly provided with fans (5).

4. The reliability test device of the high-power laser chip is characterized in that universal wheels (19) are fixedly arranged on two sides of the lower surface of the bottom plate (1).

5. The reliability testing device of a high power laser chip according to claim 1, characterized in that the motor (10) is fixedly connected with the corresponding support plate (6) through a fixing plate.

6. The reliability testing device of the high-power laser chip as claimed in claim 2, wherein the plurality of the press bars (17) are made of rubber.