CN214150937U

CN214150937U - Switching device for semiconductor testing machine

Info

Publication number: CN214150937U
Application number: CN202022919638.9U
Authority: CN
Inventors: 刘静; 陈伟
Original assignee: Core Crown Suzhou Semiconductor Co ltd
Current assignee: Core Crown Suzhou Semiconductor Co ltd
Priority date: 2020-12-08
Filing date: 2020-12-08
Publication date: 2021-09-07
Anticipated expiration: 2030-12-08

Abstract

The utility model belongs to the technical field of the semiconductor is relevant, concretely relates to switching device for semiconductor test machine, including the test machine body, the central department bolt at test machine body top has the testboard, the top joint of test machine body has the keysets, the keysets is located the testboard directly over, the front and the back of keysets both sides all bolt and have the fixing base, the inner chamber of fixing base is provided with fastening device, first recess has all been seted up all around at test machine body top. The utility model discloses a second recess, fly leaf, locating piece and first spring cooperation, the elastic potential energy of first spring makes the locating piece can fasten the joint with the constant head tank, has further strengthened the fastening effect of fixed block and movable plate to make the keysets more firm with test machine body joint, avoid the keysets to take place to rock, solved the poor problem of switching device fixed effect of traditional semiconductor test machine.

Description

Switching device for semiconductor testing machine

Technical Field

The utility model belongs to the technical field of the semiconductor is relevant, concretely relates to switching device for semiconductor test machine.

Background

The conductor refers to a material with electric conductivity between the conductor and the insulator at normal temperature, and the semiconductor is applied to the fields of integrated circuits, consumer electronics, communication systems, photovoltaic power generation, illumination, high-power conversion and the like, for example, the diode is a device made of the semiconductor, the importance of the semiconductor is very great from the viewpoint of science and technology or economic development, and most electronic products, such as computers, mobile phones or core units in digital recorders, are closely related to the semiconductor.

In order to ensure the product quality of semiconductors, after the production of the semiconductors is finished, various tests can be uniformly performed on the semiconductors, the fixing effect of the switching device of the traditional semiconductor testing machine is poor, most of the switching devices directly guide and position the switching plate and the semiconductor testing machine through the positioning pins, and the switching plate is easy to shake when the semiconductors are tested, so that the accurate test of the semiconductor testing machine on the semiconductors is influenced, and errors are easily caused in test results.

SUMMERY OF THE UTILITY MODEL

An object of the utility model is to provide an adapter device for semiconductor test machine to solve the poor problem of traditional semiconductor test machine's the fixed effect of adapter device that proposes in the above-mentioned background art.

In order to achieve the above object, the utility model provides a following technical scheme:

the switching device for the semiconductor testing machine comprises a testing machine body, wherein a testing table is bolted at the center of the top of the testing machine body, a switching plate is connected to the top of the testing machine body in a clamped mode and located right above the testing table, fixing seats are bolted on the front face and the back face of the two sides of the switching plate, an inner cavity of each fixing seat is provided with a fastening mechanism, first grooves are formed in the periphery of the top of the testing machine body, the bottoms of the fastening mechanisms are connected with the two sides of the inner cavity of the first grooves in a clamped mode, fixing blocks are bolted on the two sides of the inner cavity of the first grooves, positioning pins are bolted on the periphery of the bottom of the switching plate, and pin holes matched with the positioning pins for use are formed in the periphery of the top of the testing machine body.

Preferably, the fastening mechanism comprises a screw rod, a push plate, a movable rod, a movable plate, a second groove, a movable plate, a positioning block and a first spring, the center of the top of the fixed seat is rotatably connected with the screw rod through a bearing, the surface of the screw rod is in threaded connection with a threaded sleeve, the outer side of the threaded sleeve is in bolted connection with the push plate, the periphery of the bottom of the push plate is movably connected with the movable rod through a first movable seat, one side of the movable rod, away from the push plate, is movably connected with the movable plate through a second movable seat, the bottom of one side of the movable plate, opposite to the movable plate, is provided with a through groove, the top and the bottom of the through groove inner cavity are both provided with positioning grooves, the top and the bottom of the fixed block are both provided with the second groove, the two sides of the second groove inner cavity are transversely and slidably connected with the movable plate, one side of the movable plate, close to the positioning block, which is in bolted connection with the positioning grooves for use in cooperation with the positioning grooves, the periphery of one side, far away from the positioning block, of the movable plate is bolted with a first spring, and one side, far away from the movable plate, of the first spring is bolted with an inner cavity of the second groove.

Preferably, the front and the back of one opposite side of the moving plate are both embedded with sliding sleeves, the inner cavities of the sliding sleeves are slidably connected with sliding rods, and the two sides of the sliding rods are bolted with the two sides of the inner cavity of the fixed seat.

Preferably, the sliding grooves are formed in the tops of two sides of the inner cavity of the fixing seat, and the inner cavity of each sliding groove is connected with a sliding block matched with the push plate for use.

Preferably, the periphery of the top of the push plate is bolted with a second spring, and the top of the second spring is bolted with the top of the inner cavity of the fixed seat.

Preferably, the top of the screw rod is bolted with a connecting plate, and the top of the connecting plate is bolted with a knob.

Preferably, the front and the back of the bottom of the outer side of the moving plate are bolted with limiting columns, and the front and the back of the two sides of the inner cavity of the first groove are provided with limiting holes matched with the limiting columns for use.

The utility model has the advantages that:

1. the utility model discloses a cooperation of lead screw and thread bush, the removal for the push pedal provides the manual drive source, through the push pedal, the movable rod, the cooperation of movable plate and logical groove, make the movable plate can fasten the joint with the fixed block, through the second recess, the fly leaf, locating piece and first spring cooperation, the elastic potential energy of first spring makes the locating piece can fasten the joint with the constant head tank, the fastening effect of fixed block and movable plate has further been strengthened, thereby make keysets and test machine body joint more firm, avoid the keysets to take place to rock, thereby effectively guarantee the accuracy to the semiconductor test result, the problem that the switching device fixed effect of traditional semiconductor test machine is poor has been solved.

2. The utility model discloses a cooperation of sliding sleeve and slide bar, prevent that the movable plate from taking place the offset at the removal in-process, stability when further having strengthened the movable plate and removing, cooperation through spout and slider, make the push pedal can steadily remove, also play the spacing effect of slip to the removal of push pedal simultaneously, cooperation through the second spring, prevent that push pedal moving speed is too fast and influence the stable joint of movable plate, also play the effect of elastic buffer to the removal of push pedal simultaneously, cooperation through connecting plate and knob, the person of facilitating the use twists reverse the lead screw, the person of facilitating the use carries out fixed mounting to the fishplate bar, cooperation through spacing post and spacing hole, the fixed effect of movable plate and first recess has further been strengthened, also play effective fixed action to the movable plate.

Drawings

The accompanying drawings are included to provide a further understanding of the invention, and are incorporated in and constitute a part of this specification, illustrate embodiments of the invention, and together with the description, do not constitute a limitation of the invention, in which:

fig. 1 is a schematic view of an adapter for a semiconductor testing machine according to the present invention;

fig. 2 is a partial perspective view of a mechanism of an adapter device for a semiconductor testing machine according to the present invention;

fig. 3 is a partial perspective view of the movable plate, the positioning block and the first spring of the present invention;

fig. 4 is a structural enlarged view of the region a provided by the present invention.

Illustration of the drawings: 1. a tester body; 2. a test bench; 3. an adapter plate; 4. a fixed seat; 5. a fastening mechanism; 51. a screw rod; 52. pushing the plate; 53. a movable rod; 54. moving the plate; 55. a second groove; 56. a movable plate; 57. positioning blocks; 58. a first spring; 6. a first groove; 7. a fixed block; 8. positioning pins; 9. a slide bar; 10. a chute; 11. a slider; 12. a second spring; 13. a knob; 14. a limiting column.

Detailed Description

The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative work belong to the protection scope of the present invention.

Referring to fig. 1 to 4, an adapter device for a semiconductor testing machine includes a testing machine body 1, a testing table 2 is bolted to the center of the top of the testing machine body 1, an adapter plate 3 is fastened to the top of the testing machine body 1, the adapter plate 3 is located right above the testing table 2, fixing seats 4 are bolted to the front and back of the two sides of the adapter plate 3, a fastening mechanism 5 is arranged in an inner cavity of each fixing seat 4, first grooves 6 are formed around the top of the testing machine body 1, the bottoms of the fastening mechanisms 5 are fastened to the two sides of the inner cavity of the first grooves 6, fixing blocks 7 are bolted to the two sides of the inner cavity of the first grooves 6, positioning pins 8 are bolted to the periphery of the bottom of the adapter plate 3, and pin holes matched with the positioning pins 8 are formed around the top of the testing machine body 1. The utility model discloses a cooperation of lead screw 51 and thread bush, the removal for push pedal 52 provides the manual drive source, through push pedal 52, movable rod 53, movable plate 54 and the cooperation that leads to the groove, make movable plate 54 can fasten the joint with fixed block 7, through second recess 55, movable plate 56, locating piece 57 and the cooperation of first spring 58, the elastic potential energy of first spring 58 makes locating piece 57 can fasten the joint with the constant head tank, fixed block 7 and movable plate 54's fastening effect has further been strengthened, thereby it is more firm to make keysets 3 and test machine body 1 joint, avoid keysets 3 to take place to rock, thereby effectively guarantee the accuracy to the semiconductor test result, the problem that the switching device fixed effect of traditional semiconductor test machine is poor has been solved.

The fastening mechanism 5 comprises a screw rod 51, a push plate 52, a movable rod 53, a movable plate 54, a second groove 55, a movable plate 56, a positioning block 57 and a first spring 58, the center of the top of the fixed seat 4 is rotatably connected with the screw rod 51 through a bearing, a threaded sleeve is connected to the surface of the screw rod 51 in a threaded manner to provide a manual driving source for the movement of the push plate 52, the push plate 52 is bolted to the outer side of the threaded sleeve, the movable rod 53 is movably connected to the periphery of the bottom of the push plate 52 through a first movable seat, the movable plate 54 is movably connected to one side of the movable rod 53 away from the push plate 52 through a second movable seat, a through groove is formed in the bottom of the opposite side of the movable plate 54, so that the movable plate 54 can be fastened and clamped with the fixed block 7, positioning grooves are formed in the top and the bottom of the through groove inner cavity, the second groove 55 is formed in the top and the bottom of the fixed block 7, the movable plates 56 are connected to the two sides of the inner cavity of the second groove 55 in a transverse sliding manner, one side of the movable plate 56 close to the positioning groove is bolted with a positioning block 57 matched with the positioning groove for use, the periphery of one side of the movable plate 56 far away from the positioning block 57 is all bolted with a first spring 58, one side of the first spring 58 far away from the movable plate 56 is bolted with the inner cavity of the second groove 55, the elastic potential energy of the first spring 58 enables the positioning block 57 to be fastened and clamped with the positioning groove, the fastening effect of the fixed block 7 and the movable plate 54 is further enhanced, the clamping connection of the adapter plate 3 and the testing machine body 1 is enabled to be firmer, the adapter plate 3 is prevented from shaking, the accuracy of a semiconductor test result is effectively guaranteed, and the problem that the fixing effect of the adapter device of a traditional semiconductor testing machine is poor is solved.

Sliding sleeves are embedded in the front and the back of one opposite side of the moving plate 54, a sliding rod 9 is connected to an inner cavity of each sliding sleeve in a sliding mode, two sides of each sliding rod 9 are bolted to two sides of an inner cavity of the fixed seat 4, the moving plate 54 is prevented from shifting in the moving process, and the stability of the moving plate 54 in the moving process is further improved.

Spout 10 has all been seted up at the top of fixing base 4 inner chamber both sides, and the inner chamber sliding connection of spout 10 has the slider 11 that uses with push pedal 52 cooperation for push pedal 52 can steadily remove, also plays the spacing effect of slip to push pedal 52's removal simultaneously.

The periphery of the top of the push plate 52 is bolted with the second springs 12, the top of the second springs 12 is bolted with the top of the inner cavity of the fixed seat 4, so that the situation that the moving speed of the push plate 52 is too high to influence the stable clamping of the moving plate 54 is prevented, and meanwhile, the movement of the push plate 52 is elastically buffered.

The top of lead screw 51 has bolted the connecting plate, and the top of connecting plate has bolted knob 13, and the person of being convenient for twists reverse lead screw 51, and the person of being convenient for carries out fixed mounting to fishplate bar 3.

The front and the back of the bottom of the outer side of the moving plate 54 are bolted with the limiting columns 14, and the front and the back of the two sides of the inner cavity of the first groove 6 are provided with limiting holes matched with the limiting columns 14, so that the fixing effect of the moving plate 54 and the first groove 6 is further enhanced, and the moving plate 54 is effectively fixed.

The working principle is as follows: firstly, a user inserts the positioning pin 8 into the pin hole, then the user turns the knob 13, the knob 13 drives the screw rod 51 to rotate, then the screw rod 51 drives the push plate 52 to stably move downwards through the slide block 11 by the threaded sleeve, at the same time, the push plate 52 drives the movable rod 53 to synchronously move outwards, the movable rod 53 drives the movable plate 54 to stably move outwards on the slide rod 9 by the slide sleeve, then the fixed block 7 passes through the through groove, at the same time, the movable plate 54 drives the positioning block 57 to synchronously move inwards, the positioning block 57 drives the movable plate 56 to move reversely, the movable plate 56 drives the first spring 58 to press inwards, then when the positioning groove is positioned above the positioning block 57, the elastic potential energy of the first spring 58 drives the movable plate 56 and the positioning block 57 to synchronously elastically reset outwards until the positioning block 57 is clamped into the positioning groove, and then the fastening clamping of the movable plate 54 and the fixed block 7 can be completed, so that the adapter plate 3 can be tightly mounted with the tester body 1.

Although embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that changes, modifications, substitutions and alterations can be made in these embodiments without departing from the principles and spirit of the invention, the scope of which is defined in the appended claims and their equivalents.

Claims

1. An adapter device for a semiconductor testing machine, comprising a testing machine body (1), characterized in that: a test bench (2) is bolted at the center of the top of the test machine body (1), an adapter plate (3) is clamped at the top of the test machine body (1), the adapter plate (3) is positioned right above the test board (2), the front and the back of the two sides of the adapter plate (3) are bolted with fixed seats (4), the inner cavity of the fixed seat (4) is provided with a fastening mechanism (5), the periphery of the top of the tester body (1) is provided with a first groove (6), the bottom of the fastening mechanism (5) is clamped with the two sides of the inner cavity of the first groove (6), both sides of the inner cavity of the first groove (6) are bolted with fixed blocks (7), all bolted connections have locating pin (8) around keysets (3) bottom, the pinhole that uses with locating pin (8) cooperation is all seted up around test machine body (1) top.

2. The changeover device for a semiconductor testing machine according to claim 1, wherein: the fastening mechanism (5) comprises a screw rod (51), a push plate (52), a movable rod (53), a movable plate (54), a second groove (55), a movable plate (56), a positioning block (57) and a first spring (58), the center of the top of the fixed seat (4) is rotatably connected with the screw rod (51) through a bearing, the surface of the screw rod (51) is in threaded connection with a threaded sleeve, the push plate (52) is bolted on the outer side of the threaded sleeve, the movable rod (53) is movably connected with the periphery of the bottom of the push plate (52) through a first movable seat, the movable plate (54) is movably connected with one side of the movable rod (53) far away from the push plate (52) through a second movable seat, a through groove is formed in the bottom of the opposite side of the movable plate (54), positioning grooves are formed in the top and the bottom of an inner cavity of the through groove, and the second grooves (55) are formed in the top and the bottom of the fixed block (7), the two sides of the inner cavity of the second groove (55) are transversely connected with movable plates (56) in a sliding mode, one side, close to the positioning groove, of each movable plate (56) is bolted with a positioning block (57) matched with the positioning groove, the periphery of one side, far away from the positioning block (57), of each movable plate (56) is all bolted with a first spring (58), and one side, far away from the movable plates (56), of each first spring (58) is bolted with the inner cavity of the second groove (55).

3. The changeover device for a semiconductor testing machine according to claim 2, wherein: sliding sleeves are embedded in the front face and the back face of one opposite side of the moving plate (54), a sliding rod (9) is connected to the inner cavity of each sliding sleeve in a sliding mode, and the two sides of each sliding rod (9) are bolted to the two sides of the inner cavity of the fixing seat (4).

4. The changeover device for a semiconductor testing machine according to claim 2, wherein: the top of fixing base (4) inner chamber both sides has all been seted up spout (10), the inner chamber sliding connection of spout (10) has slider (11) with push pedal (52) cooperation use.

5. The changeover device for a semiconductor testing machine according to claim 2, wherein: the periphery of the top of the push plate (52) is bolted with a second spring (12), and the top of the second spring (12) is bolted with the top of the inner cavity of the fixed seat (4).

6. The changeover device for a semiconductor testing machine according to claim 2, wherein: the top of the screw rod (51) is bolted with a connecting plate, and the top of the connecting plate is bolted with a knob (13).

7. The changeover device for a semiconductor testing machine according to claim 2, wherein: the front and the back of the bottom of the outer side of the moving plate (54) are respectively bolted with a limiting column (14), and limiting holes matched with the limiting columns (14) for use are formed in the front and the back of two sides of the inner cavity of the first groove (6).