CN214097702U

CN214097702U - Double-sided device testing device

Info

Publication number: CN214097702U
Application number: CN202022660111.9U
Authority: CN
Inventors: 林飞翔; 江水旺; 郑国龙
Original assignee: SCUD BATTERY CO LTD
Current assignee: SCUD BATTERY CO LTD
Priority date: 2020-11-17
Filing date: 2020-11-17
Publication date: 2021-08-31
Anticipated expiration: 2030-11-17

Abstract

The utility model relates to a two-sided device testing arrangement, including test jig, test faller, test tray apron, test keysets, take shell fragment keysets, test tray and test base, set up respectively in the position corresponding to the PCB board that awaits measuring just, negative pole pad and connector on the test tray and be used for imbedding two recesses of taking shell fragment keysets and a test keysets, corresponding shell fragment keysets and the test keysets of taking are embedded to the recess to when the PCB board is installed on the test tray, take the shell fragment keysets respectively with the PCB board through two, negative pole pad contact, and be connected through the test keysets with the connector lock of PCB board, with the positive test point of PCB board to the back. The device is favorable to simplifying test operation, improves test efficiency, reduces tool design, processing degree of difficulty and manufacturing cost.

Description

Double-sided device testing device

Technical Field

The utility model belongs to the technical field of the PCB board test, concretely relates to two-sided device testing arrangement.

Background

Due to the structural limitation of the PCB, test points cannot be concentrated on the same surface for testing. The existing test scheme basically adopts a double-sided needle implanting mode for testing, namely a test point under a tool is moved to a specific area in a jumper wire mode, and the area is in butt joint with a test needle arranged on the tool, so that conversion testing is realized. This approach has the following disadvantages: 1. the tooling design and wiring are complicated; 2. the tooling has high requirement on machining precision and relatively high cost; 3. the false alarm rate of the test is higher.

Disclosure of Invention

An object of the utility model is to provide a two-sided device testing arrangement, the device do benefit to and simplify test operation, improve efficiency of software testing, reduce frock design, the processing degree of difficulty and manufacturing cost.

In order to achieve the above object, the utility model adopts the following technical scheme: the utility model provides a two-sided device testing arrangement, includes test jig, test faller, test tray apron, test keysets, takes the shell fragment keysets, test tray and test base, the recess that is used for embedding two area shell fragment keysets and a test keysets is offered respectively in the position that corresponds to the PCB board that awaits measuring just, negative pole pad and connector on the test tray, corresponding area shell fragment keysets and the test keysets of embedding are taken to the recess to when the PCB board is installed on test tray, through two area shell fragment keysets respectively with the PCB board just, negative pole pad contact, and be connected through the test keysets and the connector lock of PCB board, with switching the positive test point of PCB board to the back.

Furthermore, the test tray row is provided with a plurality of test stations, and each station is respectively provided with the groove and is embedded into the corresponding adapter plate with the elastic sheet and the test adapter plate so as to test a plurality of PCB plates simultaneously.

Furthermore, an integrated board taking steel sheet is arranged on a plurality of test switching boards on the test stations arranged in one direction, the PCB is arranged on the integrated board taking steel sheet, the through holes formed in the integrated board taking steel sheet are connected with the test switching boards in a buckling mode, and after the test is completed, the integrated board taking steel sheet is used for quickly taking down the PCB buckled with the test switching boards.

Furthermore, the lower side of the test needle plate is provided with a supporting needle corresponding to the pad of the PCB, so that a test tray cover plate and the PCB are tightly pressed on the test tray during installation and test, and the elastic sheet on the elastic sheet adapter plate is ensured to be in good contact with the positive and negative pads of the PCB.

Furthermore, two test points are arranged on the adapter plate with the elastic pieces, the two test points are respectively connected to one test pad, one test point is provided with two elastic pieces, the other test point is provided with one elastic piece, the test point provided with the two elastic pieces is used for carrying out heavy current, and the test point provided with a single elastic piece is used as a compensation signal.

Furthermore, the adapter plate with the elastic sheet is fixedly connected to the test tray by screws.

Compared with the prior art, the utility model discloses following beneficial effect has: the device can change the double-sided test into the single-sided test, has cancelled double-sided test fixture base and need not independent wire jumper, not only realizes simply, has simplified test operation, has improved efficiency of software testing, has reduced the design of test fixture moreover, the processing degree of difficulty and manufacturing cost. Therefore, the utility model discloses very strong practicality and wide application prospect have.

Drawings

Fig. 1 is a schematic structural diagram of an apparatus according to an embodiment of the present invention.

Fig. 2 is the embodiment of the present invention, which is a schematic view of the connection structure of the test tray, the test adapter plate, the adapter plate with the spring plate and the PCB.

Fig. 3 is a schematic structural diagram of a test tray in an embodiment of the present invention.

Fig. 4 is a schematic structural diagram of an interposer with spring pieces according to an embodiment of the present invention.

Fig. 5 is a schematic view of a connection structure of the test adapter plate and the integrated plate-taking steel sheet in the embodiment of the present invention.

Fig. 6 is a schematic front structural view of a PCB board in an embodiment of the present invention.

Detailed Description

The present invention will be described in further detail with reference to the accompanying drawings and specific embodiments.

As shown in figures 1-6, the utility model provides a double-sided device testing device, which comprises a testing frame 1, a testing needle plate 2, a testing tray cover plate 3, a testing adapter plate 4, an adapter plate 5 with spring pieces, a testing tray 6 and a testing base 7, the test tray 6 is provided with

grooves

61, 62 and 63 for embedding two adapter plates 5 with spring pieces and a test adapter plate 4 at the positions corresponding to the positive and negative pads and the connector of the PCB to be tested, the corresponding adapter plate 5 with the spring plate and the test adapter plate 4 are embedded in the groove, so that when the PCB 10 is arranged on the test tray 6, the two adapter plates 5 with the spring pieces are respectively contacted with the positive and negative electrode pads of the PCB and are buckled and connected with the connector of the PCB through the test adapter plate 4, so that pins on the PCB connector are transferred to the test adapter plate 4 and test points on the front side of the PCB are adapted to the back side.

In this embodiment, in order to test a plurality of PCB boards simultaneously, the test tray row is provided with a plurality of test stations, and each station is provided with the groove and is embedded into the corresponding adapter plate with the spring piece and the test adapter plate. Be equipped with an integral type on a plurality of test keysets on the test station of arranging in a direction and get board steel sheet 8, PCB board 10 is located on the integral type gets board steel sheet 8 and gets the through-hole of seting up on the board steel sheet 8 through the integral type and be connected with 4 locks of test keysets, after the test is accomplished, gets the PCB board of board steel sheet lock and take off fast through the integral type and test keysets.

The test board with the elastic pieces 5 is provided with two

test points

51 and 52, the two

test points

51 and 52 are respectively connected to one

test pad

53 and 54, one test point 51 is provided with two elastic pieces, the other test point 52 is provided with one elastic piece, the test point provided with the two elastic pieces runs with large current, and the test point provided with the single elastic piece is a compensation signal. The adapter plate 5 with the elastic sheet is fixedly connected to the test tray 6 through screws.

In this embodiment, the pad position that test faller downside corresponds the PCB board is equipped with and holds in the palm the needle to when the installation test, compress tightly test tray apron and PCB board on test tray, ensure to take the shell fragment on the shell fragment keysets and the good contact of positive, negative pole pad of PCB board.

When the double-sided device testing device of the utility model is installed, two adapter plates with spring pieces and a testing adapter plate are respectively installed in the grooves corresponding to the positions of the positive and negative electrode bonding pads and the connector of the PCB to be tested on each testing station of the testing tray; installing the PCB and the test tray cover plate on the test tray; planting a test needle on the test needle plate corresponding to the center position of the test bonding pad extending out of the adapter plate with the elastic sheet, and welding the test needle on the adapter plate with the elastic sheet with a connector connected with test equipment according to polarity during wiring; two supporting pins are arranged at the positions of the test needle plate corresponding to the positive and negative electrode bonding pads of the PCB, and during testing, the supporting pins support the PCB so that the PCB is in good contact with the elastic sheet on the adapter plate with the elastic sheet.

The utility model discloses cancelled two-sided test fixture base, switched the positive test point of PCB board to the back, changed two-sided test into the single face test.

Above is the utility model discloses a preferred embodiment, all rely on the utility model discloses the change that technical scheme made, produced functional action does not surpass the utility model discloses during technical scheme's scope, all belong to the utility model discloses a protection scope.

Claims

1. The utility model provides a two-sided device testing arrangement, its characterized in that, includes test jig, test faller, test tray apron, test keysets, takes the shell fragment keysets, test tray and test base, the recess that is used for embedding two area shell fragment keysets and a test keysets is offered respectively in the position that corresponds to the PCB board that awaits measuring just, negative pole pad and connector on the test tray, corresponding area shell fragment keysets and the test keysets of taking are embedded to the recess to when the PCB board is installed on the test tray, through two take the shell fragment keysets respectively with the PCB board just, negative pole pad contact, and be connected through the test keysets with the connector lock of PCB board, with the positive test point of PCB board to the back.

2. A double-sided device testing apparatus as claimed in claim 1, wherein the test tray row is provided with a plurality of test stations, each station is provided with the groove and is embedded with a corresponding adapter plate with spring and a corresponding test adapter plate, so as to test a plurality of PCB boards simultaneously.

3. A double-sided device testing apparatus as claimed in claim 2, wherein an integrated board-taking steel sheet is provided on a plurality of testing adapter plates on the testing stations arranged in one direction, the PCB board is provided on the integrated board-taking steel sheet and is connected with the testing adapter plate by fastening through holes provided on the integrated board-taking steel sheet, and after the test is completed, the PCB board fastened with the testing adapter plate is quickly taken down by the integrated board-taking steel sheet.

4. The double-sided device testing device of claim 1, wherein a supporting pin is arranged at a position of the lower side of the testing pin plate corresponding to a pad of the PCB, so that a testing tray cover plate and the PCB are tightly pressed on the testing tray during installation and testing, and good contact between the elastic sheet on the adapter plate with the elastic sheet and positive and negative pads of the PCB is ensured.

5. The double-sided device testing device of claim 1, wherein the adapter plate with the spring pieces is provided with two testing points, the two testing points are respectively connected to a testing pad, one testing point is provided with two spring pieces, the other testing point is provided with one spring piece, the testing point provided with two spring pieces is used for carrying out heavy current, and the testing point provided with a single spring piece is used as a compensation signal.

6. The double-sided device testing apparatus of claim 1, wherein the adapter plate with spring plate is fixedly connected to the test tray by screws.