CN214067316U - Semiconductor component insulation testing device - Google Patents
Semiconductor component insulation testing device Download PDFInfo
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- CN214067316U CN214067316U CN202023039664.9U CN202023039664U CN214067316U CN 214067316 U CN214067316 U CN 214067316U CN 202023039664 U CN202023039664 U CN 202023039664U CN 214067316 U CN214067316 U CN 214067316U
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Abstract
The utility model is suitable for the insulation test field, and provides a semiconductor component insulation test device, a semiconductor component voltage adjusting slide button, a display screen and a test groove are arranged above a case, a negative wiring is arranged on the left side of the test groove, a positive wiring is arranged on the right side of the test groove, a fault alarm lamp and a switch button are arranged below the test groove, a non-slip mat is arranged on the bottom of the case, a display screen main board and a signal converter are arranged below the display screen, a rheostat is arranged on the right side inside the case, the protection device comprises a case, a connecting block is arranged in the center of the case, an ammeter is arranged on each branch line, a voltmeter is arranged below the ammeter, a step-up transformer is arranged at the front end of the case, the ammeter, the voltmeter, the rheostat, the protection device and a test groove are connected through wires, a test groove is arranged above the connecting block, and the wires pass through the direct test groove in the connecting block. Through the utility model discloses a setting has improved the efficiency of semiconductor components and parts insulation test greatly.
Description
Technical Field
The utility model belongs to the insulation test field especially relates to an insulation test device for semiconductor components and parts.
Background
Semiconductor device (semiconductor device) typically, these semiconductor materials are silicon, germanium or gallium arsenide, and are used as devices such as rectifiers, oscillators, light emitters, amplifiers, and photodetectors. For the purpose of distinction from integrated circuits, they are sometimes also referred to as discrete devices. The basic structure of most two-terminal devices (i.e., crystal diodes) is a PN junction. A wide variety of crystal dipoles, varying in functional use, have been developed using different semiconductor materials, using different processes and geometries, and can be used to generate, control, receive, transform, amplify signals, and convert energy. Three-terminal devices are generally active devices, and are typically represented by various transistors (also called transistors). Transistors can be classified into bipolar transistors and field effect transistors. Transistors can be classified into power transistors, microwave transistors and low noise transistors according to their applications. Besides being used as a general transistor for amplification, oscillation and switching, there are some transistors for special purposes. Microwave semiconductor devices have been widely used in air defense systems, electronic warfare systems, C (U3) I systems, etc. due to their characteristics of excellent performance, small size, light weight, and low power consumption.
However, the device for insulation test of semiconductor components is relatively lacking in the market and the efficiency is low.
SUMMERY OF THE UTILITY MODEL
The utility model provides an insulating testing arrangement of semiconductor components and parts aims at solving and lacks insulating testing arrangement of semiconductor components and parts and the problem of inefficiency.
The utility model is realized in such a way, a semiconductor component insulation testing device comprises a case and a testing groove, and is characterized in that a semiconductor component voltage adjusting slide button is arranged on the left side above the case, a display screen is arranged on the right side above the case, the testing groove is arranged in the center above the case, a negative wiring is arranged on the left side of the testing groove, a positive wiring is arranged on the right side of the testing groove, a fault alarm lamp and a switch button are sequentially arranged below the testing groove from left to right, an anti-skid pad is arranged on the bottom of the case, a display screen main board and a signal converter are arranged below the display screen, a rheostat and a protector are sequentially arranged on the right side inside the case from top to bottom, a connecting block is arranged in the center inside the case, an ammeter is arranged on each branch wire on the left side inside the case, a voltmeter is arranged below the ammeter, and a step-up transformer is arranged at the front end inside the case, the ammeter, the voltmeter, the rheostat, the protector and the testing groove are all connected through wires, the testing groove is arranged above the connecting block, and the wires directly reach the testing groove through the inside of the connecting block.
Furthermore, the negative connection terminal and the positive connection terminal are clips.
Furthermore, the case and the connecting block are made of insulating materials.
Further, the wire is a high voltage resistant wire.
Furthermore, the slide button for voltage adjustment of the semiconductor component controls the rheostat.
Further, the fault warning lamp is an LED lamp.
About implementing the utility model discloses a beneficial technological effect does: at first because the utility model discloses set up the display screen, so can directly demonstrate electric current and voltage on each branch road, the staff's record of being convenient for. Because the utility model discloses semiconductor components and parts voltage regulation slide button has been set up, so can realize the free control to the voltage of surveying semiconductor components and parts. Because the utility model discloses step-up transformer has been set up, so can be so that circuit voltage be for being fit for the size to carry out insulation test. Because the utility model discloses a plurality of test grooves have been set up, so can a plurality of semiconductor components and parts carry out insulation test simultaneously, raise the efficiency. Because the utility model discloses set up the rheostat, so can adjust semiconductor components and parts voltage. Because the utility model discloses set up the protector, so can play the guard action when voltage or electric current are too big, prevent the occurence of failure.
Drawings
Fig. 1 is a first view structural diagram of the present invention;
fig. 2 is a second view structural diagram of the present invention;
fig. 3 is a view of the internal first perspective structure of the present invention;
fig. 4 is a second view angle structure diagram of the inside of the present invention.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention more clearly understood, the present invention is further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the invention and are not intended to limit the invention.
It should be noted that the display panel 5, the display panel main board 11, the ammeter 15, the voltmeter 13, the varistor 9, the protector 10, and the step-up transformer 12 are conventional technologies, and are common general knowledge of those skilled in the art, and are not described herein again.
Referring to fig. 1-4, the utility model relates to a semiconductor component insulation testing device, which comprises a case 1 and a testing groove 7, and is characterized in that a semiconductor component voltage adjusting slide button 2 is arranged on the left side above the case 1, a display screen 5 is arranged on the right side above the case 1, the testing groove 7 is arranged in the center above the case 1, a negative wiring 6 is arranged on the left side of the testing groove 7, a positive wiring 17 is arranged on the right side of the testing groove 7, a fault alarm lamp 4 and a switch button 3 are sequentially arranged below the testing groove 7 from left to right, a non-slip mat 8 is arranged at the bottom of the case 1, a display screen mainboard 11 and a signal converter 18 are arranged below the display screen 5, a rheostat 9 and a protector 10 are sequentially arranged on the right side inside the case 1 from top to bottom, a connecting block 16 is arranged in the center inside the case 1, an ammeter 15 is arranged on each branch line on the left side inside the case 1, a voltmeter 13 is arranged below the ammeter 15, a step-up transformer 12 is arranged at the front end inside the case 1, the ammeter 15, the voltmeter 13, the rheostat 9, the protector 10 and the testing groove 7 are all connected through a wire 14, the testing groove 7 is arranged above the connecting block 16, and the wire 14 directly reaches the testing groove 7 through the inside of the connecting block 16.
The ports of the negative connection wire 6 and the positive connection wire 17 are clips for clamping the positive and negative electrodes of the semiconductor component, so that the semiconductor component is firm, difficult to break and convenient.
The surface of the pole box 1 and the connecting block 16 are made of insulating materials, so that unnecessary accidents are prevented.
The wire 14 is a high voltage resistant wire, and the wire is prevented from being burnt due to overhigh voltage.
The semiconductor component voltage adjusting slider 2 controls the varistor 9, and thus adjusts the semiconductor component voltage by changing the resistance value of the varistor 9.
The fault alarm lamp 4 is an LED lamp which is high in brightness and low in energy consumption, and can effectively inform workers.
The utility model discloses a theory of operation does: use the utility model discloses during, be connected positive pole wiring 17 in the test groove 7 earlier, negative pole wiring 6 and the positive negative pole of semiconductor components and parts, rethread semiconductor components and parts voltage regulation draw knob 2 adjusts rheostat 9 to the maximum position of resistance, then will the utility model discloses be connected with external power supply, press shift knob 3, external power supply increases voltage through step up transformer 12, and slip semiconductor components and parts voltage regulation draw knob 2 changes rheostat 9 resistance, then changes semiconductor components and parts voltage, is measured by voltmeter 13, and rethread display screen 5 shows, adjusts semiconductor components and parts voltage to suitable size, treats each branch road current size of observing after stabilizing to this carries out insulation test.
About implementing the utility model discloses a beneficial technological effect does: at first because the utility model discloses set up display screen 5, so can directly demonstrate electric current and voltage on each branch road, the staff's record of being convenient for. Because the utility model discloses semiconductor components and parts voltage regulation slide button 2 has been set up, so can realize the free control to the voltage of surveying semiconductor components and parts. Because the utility model discloses step-up transformer 12 has been set up, so can be so that circuit voltage be for being fit for the size to carry out insulation test. Because the utility model discloses a plurality of test recess 7 have been set up, so can a plurality of semiconductor components and parts carry out insulation test simultaneously, raise the efficiency. Because the utility model discloses set up rheostat 9, so can adjust semiconductor components and parts voltage. Because the utility model discloses set up protector 10, so can play the guard action when voltage or electric current are too big, prevent the occurence of failure.
The above description is only exemplary of the present invention and should not be taken as limiting the scope of the present invention, as any modifications, equivalents, improvements and the like made within the spirit and principles of the present invention are intended to be included within the scope of the present invention.
Claims (6)
1. The insulation testing device for the semiconductor element comprises a case (1) and a testing groove (7), and is characterized in that a voltage regulating slide button (2) for the semiconductor element is arranged on the left side above the case (1), a display screen (5) is arranged on the right side above the case (1), the testing groove (7) is arranged in the center above the case (1), a negative wiring (6) is arranged on the left side of the testing groove (7), a positive wiring (17) is arranged on the right side of the testing groove (7), a fault alarm lamp (4) and a switch button (3) are sequentially arranged below the testing groove (7) from left to right, an anti-skid pad (8) is arranged at the bottom of the case (1), a display screen main board (11) and a signal converter (18) are arranged below the display screen (5), and a rheostat (9) and a signal converter (18) are sequentially arranged on the right side inside the case (1) from top to bottom, The testing device comprises a protector (10), a connecting block (16) is arranged in the center inside the case (1), an ammeter (15) is arranged on each branch line on the left side inside the case (1), a voltmeter (13) is arranged below the ammeter (15), a step-up transformer (12) is arranged at the front end inside the case (1), the ammeter (15), the voltmeter (13), the rheostat (9), the protector (10) and the testing groove (7) are connected through a wire (14), the testing groove (7) is arranged above the connecting block (16), and the wire (14) passes through the connecting block (16) and directly reaches the testing groove (7).
2. The insulation testing device for the semiconductor component as recited in claim 1, wherein: the ports of the negative connection wire (6) and the positive connection wire (17) are clips.
3. The insulation testing device for the semiconductor component as recited in claim 1, wherein: the case (1) and the connecting block (16) are made of insulating materials.
4. The insulation testing device for the semiconductor component as recited in claim 1, wherein: the lead (14) is a high-voltage-resistant lead.
5. The insulation testing device for the semiconductor component as recited in claim 1, wherein: the semiconductor component voltage adjusting slide button (2) controls the rheostat (9).
6. The insulation testing device for the semiconductor component as recited in claim 1, wherein: the fault alarm lamp (4) is an LED lamp.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202023039664.9U CN214067316U (en) | 2020-12-16 | 2020-12-16 | Semiconductor component insulation testing device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202023039664.9U CN214067316U (en) | 2020-12-16 | 2020-12-16 | Semiconductor component insulation testing device |
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| Publication Number | Publication Date |
|---|---|
| CN214067316U true CN214067316U (en) | 2021-08-27 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202023039664.9U Active CN214067316U (en) | 2020-12-16 | 2020-12-16 | Semiconductor component insulation testing device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN214067316U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116500396A (en) * | 2023-06-30 | 2023-07-28 | 新河县珠兴铜业有限公司 | Finished product insulativity detection device for insulating material production |
-
2020
- 2020-12-16 CN CN202023039664.9U patent/CN214067316U/en active Active
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116500396A (en) * | 2023-06-30 | 2023-07-28 | 新河县珠兴铜业有限公司 | Finished product insulativity detection device for insulating material production |
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