CN214041662U - Testing arrangement of intelligence circuit breaker - Google Patents
Testing arrangement of intelligence circuit breaker Download PDFInfo
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- CN214041662U CN214041662U CN202120031203.2U CN202120031203U CN214041662U CN 214041662 U CN214041662 U CN 214041662U CN 202120031203 U CN202120031203 U CN 202120031203U CN 214041662 U CN214041662 U CN 214041662U
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- circuit breaker
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- intelligent circuit
- testing device
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Abstract
The utility model discloses a testing device of an intelligent circuit breaker, which comprises an intelligent circuit breaker and a testing device, wherein the testing device is electrically connected with the intelligent circuit breaker through a data line; the testing device comprises a shell and a main control board arranged in the shell, wherein the main control board is provided with a liquid crystal display, a key and an external interface; the intelligent circuit breaker comprises a main chip MCU, a level converter U10 and a quick tripping circuit. The utility model discloses a beneficial effect is when testing arrangement sets to the quick-release mode, as long as will the external interface pass through the data line and link to each other with intelligent circuit breaker, and testing arrangement sends the dropout instruction immediately for intelligent circuit breaker can quick dropout, and this kind of mode is fit for workshop mass production's quick dropout very much and detects.
Description
Technical Field
The utility model relates to a low-voltage apparatus field, in particular to testing arrangement of intelligent circuit breaker.
Background
At present, electronic intelligent circuit breakers are applied more and more widely, however, most of the electronic circuit breakers are of a knob type, namely parameters of setting current, overload long-delay protection, short-circuit short-delay protection, short-circuit instantaneous protection, pre-alarming and the like of the circuit breakers are adjusted through knobs, meanwhile, a controller is provided with a test port, the test port is provided with two probes, and a 12V power supply is applied to the probes to test whether a tripper is tripped or not. There are two problems with circuit breaker controllers of this type:
1. for the parameter setting value, the judgment can be only carried out by observing whether the knob is screwed to the designated gear, but the general knob has ten gears, the quality problem of the self gear of the knob causes the failure of the parameter setting value, and the failure of the setting value caused by the welding problem of the knob and the circuit board, and the problem cannot be found by the observation mode.
2. The test port can only test the tripper, but not the tripping instruction sent by the controller, but the external 12V power supply is directly added on the tripper, so that the tripper is tripped, but whether the controller has a problem or not can not be judged.
SUMMERY OF THE UTILITY MODEL
The utility model aims to overcome the not enough of prior art, provide a rational in infrastructure, low cost, an effective testing arrangement of intelligent circuit breaker.
The utility model provides a testing device of an intelligent circuit breaker, which comprises an intelligent circuit breaker and a testing device, wherein the testing device is electrically connected with the intelligent circuit breaker through a data line;
the testing device comprises a shell and a main control board arranged in the shell, wherein the main control board is provided with a liquid crystal display, a key and an external interface;
the intelligent circuit breaker comprises a main chip MCU, a level converter U10 and a quick tripping circuit.
Preferably, the external interface comprises a +12V pin, a G pin and a TX pin, wherein the +12V pin, the G pin and the TX pin are respectively connected with the intelligent circuit breaker through data lines in a signal mode.
Preferably, the testing device is electrically connected with the intelligent circuit breaker through a +12V pin and a G pin.
Preferably, the testing device is in signal connection with the intelligent circuit breaker through a TX pin.
Preferably, the 51 pin TX1 of the main chip MCU is connected to the 1 pin of the level shifter U10, the 15 pin TTL _ OE of the main chip MCU is connected to the 6 pin OE of the level shifter U10, and the 8 pin E _ TX of the level shifter U10 is connected to the 5 pins of the external terminal.
Preferably, the pin 51 of the main chip MCU is connected to the pin 5 of the external terminal through pins 1 and 8 of the level shifter U10, and the pin 5 of the external terminal is connected to the controller of the intelligent circuit breaker through a data line.
Preferably, the 14-pin Quick of the main chip MCU is connected to the front end Quick of the R76 of the Quick release circuit, the R76 and R77 of the Quick release circuit are connected in series to divide the voltage to provide a base current for the base of the transistor Q8, the collector of the transistor Q8 is connected to the 5-pin of the external terminal through R78, and the emitter of the transistor Q8 is grounded
The utility model has the advantages that: this testing arrangement of intelligent circuit breaker, through testing arrangement's LCD screen inquiry intelligent circuit breaker in knob positional information, protection parameter, fault record, communication parameter information. When the testing device is set to be in a quick tripping mode, as long as the external interface is connected with the intelligent circuit breaker through the data line, the testing device immediately sends a tripping instruction, so that the intelligent circuit breaker can be quickly tripped, and the mode is very suitable for quick tripping detection in mass production in workshops.
Drawings
FIG. 1 is a schematic diagram of a test device connected to a smart circuit breaker;
FIG. 2 is a schematic diagram of a main control board;
FIG. 3 is a main chip control circuit;
fig. 4 is an external communication control circuit;
fig. 5 is a quick release control circuit.
Description of reference numerals: 1-a smart circuit breaker; 2-a testing device; 21 a housing; 22-main control board 22; 221-a liquid crystal screen; 222-key press; 223-external interface; and 3, data lines.
Detailed Description
In the following, an embodiment of the present invention will be described in detail with reference to the drawings, but it should be understood that the scope of the present invention is not limited by the embodiment.
As shown in fig. 1 and fig. 2, the testing device of the intelligent circuit breaker provided by the embodiment of the present invention includes an intelligent circuit breaker 1 and a testing device 2, wherein the testing device 2 is electrically connected to the intelligent circuit breaker 1 through a data line 3;
the testing device 2 comprises a shell 21 and a main control board 22 arranged in the shell 21, wherein a liquid crystal display 221, a key 222 and an external interface 223 are arranged on the main control board 22;
the intelligent circuit breaker 1 comprises a main chip MCU, a level converter U10 and a quick tripping circuit.
In this embodiment, external interface 223 includes +12V stitch, G stitch and TX stitch, +12V stitch, G stitch and TX stitch pass through data line 3 and intelligent circuit breaker 1 signal connection respectively.
In this embodiment, the testing device 2 is electrically connected to the intelligent circuit breaker 1 through a +12V pin and a G pin.
In this embodiment, the testing device 2 is in signal connection with the intelligent circuit breaker 1 through a TX pin.
In this embodiment, the 51 pin TX1 of the main chip MCU is connected to the 1 pin of the level shifter U10, the 15 pin TTL _ OE of the main chip MCU is connected to the 6 pin OE of the level shifter U10, and the 8 pin E _ TX of the level shifter U10 is connected to the 5 pins of the external terminal.
In this embodiment, the pin 51 of the main chip MCU is connected to the pin 5 of the external terminal through the pins 1 and 8 of the level shifter U10, and the pin 5 of the external terminal is connected to the controller of the intelligent circuit breaker 1 through the data line 3.
In this embodiment, the 14-pin Quick of the main chip MCU is connected to the Quick at the front end of R76 of the Quick trip circuit, R76 and R77 of the Quick trip circuit are connected in series to divide the voltage to provide a base current for the base of the transistor Q8, the collector of the transistor Q8 is connected to the 5-pin of the external terminal through R78, and the emitter of the transistor Q8 is grounded
The working principle is as follows: according to the testing device of the intelligent circuit breaker, information such as the position information, the protection parameters, the fault records and the communication parameters of the rotary button in the intelligent circuit breaker is inquired through the liquid crystal screen 221 of the testing device. When the testing device 2 is set to be in the rapid tripping mode, as long as the external interface 223 is connected with the intelligent circuit breaker 1 through the data line 3, the testing device 2 immediately sends out a tripping instruction, so that the intelligent circuit breaker 1 can be rapidly tripped, and the mode is very suitable for rapid tripping detection in mass production in a workshop.
The specific implementation modes of communication and quick release are as follows:
as shown in fig. 3, 4 and 5, the 51 pin TX1 of the master chip MCU is connected to the 1 pin of the level shifter U10, the 15 pin TTL _ OE of the master chip MCU is connected to the 6 pin OE of the level shifter U10, and the 8 pin E _ TX of the level shifter U10 is connected to the 5 pins of the external terminal.
The level shifter U10 is regarded as an electronic switch, when the testing device is set to be in a communication mode, a 15 pin of the main chip MCU outputs a high level, after a 6 pin of the level shifter U10 receives a high level signal sent by the main chip MCU, the on state of the level shifter U10 is triggered, namely, a 51 pin of the main chip MCU is connected with 5 pins of an external terminal through a 1 pin and an 8 pin of the level shifter U10, and the 5 pins of the external terminal are connected with a controller of the intelligent circuit breaker 1 through a data line 3, so that the communication between the controller of the intelligent circuit breaker and the testing device is realized.
The 14-pin Quick of the main chip MCU is connected with the front end Quick of the R76 of the Quick tripping circuit, the R76 and the R77 are connected in series to divide voltage to provide base current for the base electrode of the triode Q8, the collector electrode of the triode Q8 is connected with the 5-pin of the external terminal through the R78, and the emitter electrode of the Q8 of the triode is grounded. The triode Q8 is regarded as an electronic switch, and when the testing device is set to the quick-release mode, the 14-pin quick of the main chip MCU outputs a high level, and the 6-pin of the main chip MCU sends a low level signal. At this time, the base of the transistor Q8 gets a high level signal, the collector and emitter of the transistor are turned on, and at this time, E _ TX of the external interface 223 is connected to ground, and E _ TX is pulled to a low level. Meanwhile, after the pin 6 of the level shifter U10 receives the low level signal sent by the main chip MCU, the off state of the level shifter U10 is triggered, that is, the pin 51 of the main chip MCU cannot be connected to the pin 5 of the external terminal through the pins 1 and 8 of the level shifter U10, so that the communication function with the controller and the testing device of the intelligent circuit breaker 1 is turned off. Since the smart circuit breaker 1 has been designed to be a quick trip command, i.e., to execute a trip command, when the E _ TX low level signal is received within 200ms of the instant of power-on. Therefore, under the condition, the testing device completes the quick tripping of the intelligent circuit breaker.
The above disclosure is only for the specific embodiments of the present invention, however, the embodiments of the present invention are not limited thereto, and any changes that can be considered by those skilled in the art should fall into the protection scope of the present invention.
Claims (7)
1. The utility model provides a testing arrangement of intelligent circuit breaker which characterized in that: the intelligent circuit breaker testing device comprises an intelligent circuit breaker (1) and a testing device (2), wherein the testing device (2) is in electric signal connection with the intelligent circuit breaker (1) through a data line (3);
the testing device (2) comprises a shell (21) and a main control board (22) arranged in the shell (21), wherein a liquid crystal screen (221), a key (222) and an external interface (223) are arranged on the main control board (22);
the intelligent circuit breaker (1) comprises a main chip MCU, a level converter U10 and a quick tripping circuit.
2. The testing device of the intelligent circuit breaker as claimed in claim 1, wherein the external interface (223) comprises a +12V pin, a G pin and a TX pin, and the +12V pin, the G pin and the TX pin are respectively in signal connection with the intelligent circuit breaker (1) through the data line (3).
3. The testing device of the intelligent circuit breaker according to claim 2, wherein the testing device (2) is electrically connected with the intelligent circuit breaker (1) through a +12V pin and a G pin.
4. The testing device of the intelligent circuit breaker according to claim 2, characterized in that the testing device (2) is connected with the intelligent circuit breaker (1) through a TX pin.
5. The testing device of an intelligent circuit breaker as claimed in claim 1, wherein the 51 pin TX1 of the main chip MCU is connected to the 1 pin of the level shifter U10, the 15 pin TTL _ OE of the main chip MCU is connected to the 6 pin OE of the level shifter U10, and the 8 pin E _ TX of the level shifter U10 is connected to the 5 pins of the external terminal 3.
6. The testing device of the intelligent circuit breaker according to claim 1, wherein the pin 51 of the main chip MCU is connected to the pin 5 of the external terminal through pins 1 and 8 of the level shifter U10, and the pin 5 of the external terminal is connected to the controller of the intelligent circuit breaker (1) through the data line (3).
7. The testing device of the intelligent circuit breaker as claimed in claim 1, wherein the 14-pin Quick of the main chip MCU is connected to the front end Quick of R76 of the Quick release circuit, the R76 and R77 of the Quick release circuit are connected in series to divide the voltage to provide the base current for the base of the transistor Q8, the collector of the transistor Q8 is connected to the 5-pin of the external terminal through R78, and the emitter of the transistor Q8 is grounded.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202120031203.2U CN214041662U (en) | 2021-01-07 | 2021-01-07 | Testing arrangement of intelligence circuit breaker |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202120031203.2U CN214041662U (en) | 2021-01-07 | 2021-01-07 | Testing arrangement of intelligence circuit breaker |
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| CN214041662U true CN214041662U (en) | 2021-08-24 |
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| CN202120031203.2U Active CN214041662U (en) | 2021-01-07 | 2021-01-07 | Testing arrangement of intelligence circuit breaker |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN115712063A (en) * | 2023-01-09 | 2023-02-24 | 石家庄科林电气股份有限公司 | Detection method and device of intelligent circuit breaker, electronic equipment and intelligent circuit breaker |
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2021
- 2021-01-07 CN CN202120031203.2U patent/CN214041662U/en active Active
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN115712063A (en) * | 2023-01-09 | 2023-02-24 | 石家庄科林电气股份有限公司 | Detection method and device of intelligent circuit breaker, electronic equipment and intelligent circuit breaker |
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