CN213843459U - Electric device testing arrangement - Google Patents
Electric device testing arrangement Download PDFInfo
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- CN213843459U CN213843459U CN202022934981.0U CN202022934981U CN213843459U CN 213843459 U CN213843459 U CN 213843459U CN 202022934981 U CN202022934981 U CN 202022934981U CN 213843459 U CN213843459 U CN 213843459U
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Abstract
The utility model discloses an electrical device testing device, which comprises a direct current power supply, a capacitor cabinet, a system control cabinet and a plurality of load cabinets, wherein the output end of the direct current power supply is electrically connected with the capacitor cabinet, the capacitor cabinet is electrically connected with the system control cabinet, the plurality of load cabinets are electrically connected with the system control cabinet, a tested object is connected between the capacitor cabinet and the load cabinets, and the system control cabinet is electrically connected with the control end of the tested object; the utility model has the advantages that: the automatic test efficiency is higher, and test condition uniformity is higher, improves the measuring accuracy, reduces the test error.
Description
Technical Field
The utility model relates to an electrical performance test field, more specifically relate to an electrical device testing arrangement.
Background
The contactor is divided into an alternating current contactor and a direct current contactor, is a device with a high-current control circuit which is quickly connected and disconnected, and is often applied to power distribution and power related industries as a load control object; and because the contactor has the characteristics of large control capacity, high durability and high reliability, has the function of low-voltage release protection, is suitable for frequent operation and remote control, and is one of important elements in an automatic control system.
However, when the alternating current/direct current contactor is switched on and off with a load exceeding the breaking capacity, main contact contacts of the contactor are easily welded together due to overlarge current, so that the contactor cannot normally cut off a power supply, and accidents such as burning, explosion and the like occur.
SUMMERY OF THE UTILITY MODEL
The utility model discloses the technical problem that will solve lies in prior art electrical device testing arrangement and mostly is the manual test of miniwatt platform, and it is less to have test operating mode point, can't satisfy test standard's requirement, and manual test exists inefficiency, and the test condition uniformity is not high, the problem that precision error can't be guaranteed.
The utility model discloses a following technical means realizes solving above-mentioned technical problem: the utility model provides an electrical device testing arrangement, includes DC power supply, electric capacity cabinet, system control cabinet and a plurality of load cabinets, DC power supply's output is connected with the electric capacity cabinet electricity, and the electric capacity cabinet is connected with the system control cabinet electricity, and a plurality of load cabinets all are connected with the system control cabinet electricity, are connected between electric capacity cabinet and load cabinet by the measured object, and the system control cabinet is connected with the control end electricity of measured object.
The utility model discloses a DC power supply charges for the capacitor box, the capacitor box is by DC power supply energy storage that charges, the resistance value of adjustment load cabinet sets for the electric current size through measurand, through whether switch-on of system control cabinet control load cabinet and the disjunction of control measurand, realize impulse current's break-make test, realize automatic test, test condition point is more, satisfy test standard's requirement, and automatic efficiency of software testing is higher, test condition uniformity is higher, thereby improve the test accuracy, reduce the test error.
Furthermore, a super capacitor bank is placed in the capacitor cabinet, the anode of the super capacitor bank is connected with the anode of the direct-current power supply, the cathode of the super capacitor bank is connected with the cathode of the direct-current power supply, each load cabinet is internally provided with a load, one end of each load is connected with the cathode of the super capacitor bank through a switch device and is grounded, the other end of each load is connected with one end of a plurality of parallel-connected tested objects, the other ends of the plurality of parallel-connected tested objects are connected with the anode of the super capacitor bank, a single chip microcomputer is arranged in the control cabinet, and all the tested objects and the loads are connected with the single chip microcomputer.
Further, the object to be measured is a contactor, and the contactor is an ac contactor or a dc contactor.
Further, the switching device is a field effect transistor or a triode.
Furthermore, the singlechip is an AT89C20 series.
And furthermore, all the tested objects and the control ends of the loads are connected with the IO port of the single chip microcomputer.
And furthermore, the output ends of all the tested objects and the load are connected with the sampling port of the singlechip.
Furthermore, the direct current power supply adopts a rectification and DC/DC double-stage circuit.
Furthermore, a radiator is further arranged in the system control cabinet.
Further, the electric device testing device further comprises an upper computer, and the upper computer is in communication connection with the single chip microcomputer through an RS485 communication circuit.
The utility model has the advantages that: the utility model discloses a DC power supply charges for the capacitor box, the capacitor box is by DC power supply energy storage that charges, the resistance value of adjustment load cabinet sets for the electric current size through measurand, through whether switch-on of system control cabinet control load cabinet and the disjunction of control measurand, realize impulse current's break-make test, realize automatic test, test condition point is more, satisfy test standard's requirement, and automatic efficiency of software testing is higher, test condition uniformity is higher, thereby improve the test accuracy, reduce the test error.
Drawings
Fig. 1 is a block diagram of an electrical device testing apparatus according to an embodiment of the present invention;
fig. 2 is an electrical schematic diagram of an electrical device testing apparatus according to an embodiment of the present invention.
Detailed Description
To make the purpose, technical solution and advantages of the embodiments of the present invention clearer, the embodiments of the present invention are combined to clearly and completely describe the technical solution in the embodiments of the present invention, and obviously, the described embodiments are some embodiments of the present invention, not all embodiments. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative efforts belong to the protection scope of the present invention.
As shown in fig. 1, an electrical device testing apparatus includes a dc power supply 1, a capacitor box 2, a system control cabinet 3 and a plurality of load cabinets 4, an output end of the dc power supply 1 is electrically connected to the capacitor box 2, the capacitor box 2 is electrically connected to the system control cabinet 3, the plurality of load cabinets 4 are electrically connected to the system control cabinet 3, a tested object 5 is connected between the capacitor box 2 and the load cabinets 4, and the system control cabinet 3 is electrically connected to a control end of the tested object 5.
As shown in fig. 2, control1, control2, control3 and control4 in the figure indicate that a single chip microcomputer applies a control signal, which is generally a switching signal, and the start time of the operation of the switching device 402 and the object 5 can be controlled by setting different operation timings for the control1, the control2, the control3 and the control4, and the DC power supply 1 adopts a DC/DC dual stage circuit, and has the characteristics of wide output voltage range, high accuracy and fast dynamic response, and has functions of local operation and upper computer operation, and is provided with upper computer software and an external communication function.
The super capacitor bank 202 is placed in the capacitor cabinet 2, and has the characteristics of high power density, short charging and discharging time, long cycle life, wide working temperature range and the like, the capacitor cabinet 2 contains a high-precision A/D conversion module and a special voltage measurement chip, and the voltage detection precision is less than 0.5% FSR, so that the state and the change of the capacitor module in the using process are accurately and timely monitored, and the capacitor is effectively prevented from being improperly used. The positive pole of super capacitor group 202 is connected with the positive pole of DC power supply 1, and the negative pole of super capacitor group 202 is connected with the negative pole of DC power supply 1, has all set up load 401 in every load cabinet 4, and the one end of every load 401 all is connected and ground connection with the negative pole of super capacitor group 202 through switching device 402, and the other end of every load 401 is connected to being in the same place and being connected the one end of a plurality of parallel connection's measurand 5, and the other end of a plurality of parallel connection's measurand 5 is connected with the positive pole of super capacitor group 202, be provided with the singlechip in the system control cabinet 3, all measurand 5 and load 401 are connected with the singlechip. The system control cabinet 3 has the functions of testing voltage and current sampling, monitoring a testing process, automatically stopping and protecting faults and the like, and is a core component for realizing one-key automatic testing.
In this embodiment, the object 5 to be measured is a contactor, and the contactor is an ac contactor or a dc contactor. The switching device 402 is a field effect transistor or a triode. The single-chip microcomputer is an AT89C20 series, control ends of all the tested objects 5 and the load 401 are connected with IO ports of the single-chip microcomputer, output ends of all the tested objects 5 and the load 401 are connected with sampling ports of the single-chip microcomputer, the single-chip microcomputer collects voltage and current signals of the tested objects 5 and the load 401 through collecting ports, and the collecting ports of the single-chip microcomputer are provided with AD sampling modules built in the single-chip microcomputer.
As a further improvement of the present invention, a heat sink is further provided in the system control cabinet 3.
As a further improvement, the electrical device testing device further comprises an upper computer, the upper computer is connected with the single chip microcomputer through the communication of the RS485 communication circuit, and the upper computer is used for data display, parameter adjustment and instruction issuing and the like.
Through the technical scheme, the utility model provides an electric device testing arrangement, in order to carry out the electric property test of contactor, charge for electric capacity cabinet 2 through DC power supply 1, electric capacity cabinet 2 is by DC power supply 1 energy storage that charges, the resistance value of adjustment load cabinet 4 is set for the electric current size through measurand 5, through the switch-on of system control cabinet 3 control load cabinet 4 whether and control measurand 5 the branch of breaking, realize impulse current's break-make test, realize automatic test, test condition point is more, satisfy test standard's requirement, and automatic test efficiency is higher, test condition uniformity is higher, thereby improve the measuring accuracy, reduce the test error.
The above embodiments are only used to illustrate the technical solution of the present invention, and not to limit it; although the present invention has been described in detail with reference to the foregoing embodiments, it should be understood by those skilled in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some technical features may be equivalently replaced; such modifications and substitutions do not depart from the spirit and scope of the present invention in its corresponding aspects.
Claims (10)
1. The utility model provides an electrical device testing arrangement, its characterized in that includes DC power supply, capacitor box, system control cabinet and a plurality of load cabinets, DC power supply's output is connected with the capacitor box electricity, and the capacitor box is connected with the system control cabinet electricity, and a plurality of load cabinets all are connected with the system control cabinet electricity, and the measurand is connected between capacitor box and load cabinet, and the system control cabinet is connected with the control end electricity of measurand.
2. The electrical device testing device according to claim 1, wherein a super capacitor bank is disposed in the capacitor box, the anode of the super capacitor bank is connected to the anode of the dc power supply, the cathode of the super capacitor bank is connected to the cathode of the dc power supply, each load box is provided with a load, one end of each load is connected to the cathode of the super capacitor bank through a switch device and grounded, the other end of each load is connected to one end of a plurality of parallel-connected objects to be tested, the other end of the plurality of parallel-connected objects to be tested is connected to the anode of the super capacitor bank, a single chip microcomputer is disposed in the control box, and all the objects to be tested and the loads are connected to the single chip microcomputer.
3. An electrical device testing apparatus according to claim 2, wherein the object to be tested is a contactor, and the contactor is an ac contactor or a dc contactor.
4. An electrical device testing apparatus as claimed in claim 2, wherein the switching device is a field effect transistor or a triode.
5. The electrical device testing device of claim 2, wherein the single chip microcomputer is of the AT89C20 series.
6. The electrical device testing apparatus of claim 5, wherein all the tested objects and the control terminals of the loads are connected to the IO port of the single chip microcomputer.
7. The electrical device testing apparatus of claim 5, wherein the output terminals of all the objects to be tested and the load are connected to the sampling port of the single chip microcomputer.
8. An electrical device testing apparatus as claimed in claim 2, wherein said DC power supply is a rectified and DC/DC dual stage circuit.
9. An electrical device testing apparatus as claimed in claim 2, wherein a heat sink is further provided in the system control cabinet.
10. The electrical device testing device of claim 2, further comprising an upper computer, wherein the upper computer is in communication connection with the single chip microcomputer through an RS485 communication circuit.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202022934981.0U CN213843459U (en) | 2020-12-09 | 2020-12-09 | Electric device testing arrangement |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202022934981.0U CN213843459U (en) | 2020-12-09 | 2020-12-09 | Electric device testing arrangement |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN213843459U true CN213843459U (en) | 2021-07-30 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202022934981.0U Active CN213843459U (en) | 2020-12-09 | 2020-12-09 | Electric device testing arrangement |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN213843459U (en) |
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2020
- 2020-12-09 CN CN202022934981.0U patent/CN213843459U/en active Active
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Address after: 230088 No.8 DALONGSHAN Road, hi tech Zone, Hefei City, Anhui Province Patentee after: Cowell Technology Co.,Ltd. Address before: 230088 No.8 DALONGSHAN Road, hi tech Zone, Hefei City, Anhui Province Patentee before: Hefei Kewei Power System Co.,Ltd. |